John A. Woollam

Person

Lincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Birefringence imaging chromatography based on highly ordered 3D nan...
- Patent number 10,101,265
- Issue date Oct 16, 2018
- BOARD OF REGENTS FOR THE UNIVERSITY OF NEBRASKA
- Mathias M. Schubert
- G01 - MEASURING TESTING
Information Patent Grant
Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...
- Patent number 10,073,120
- Issue date Sep 11, 2018
- Board of Regents for the University of Nebraska
- Tino Hofmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Combined use of oscillating means and ellipsometry to determine unc...
- Patent number 10,048,059
- Issue date Aug 14, 2018
- J. A. Woollam Co., Inc.
- Mathias M. Schubert
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method of obtaining micrographs of transparent or semi-transparent...
- Patent number 10,026,167
- Issue date Jul 17, 2018
- Board of Regents of the University of Nebraska
- Tino Hofmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated mid-infrared, far infrared and terahertz optical Hall ef...
- Patent number 9,851,294
- Issue date Dec 26, 2017
- J. A. Woollam Co., Inc.
- Tino Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 9,041,927
- Issue date May 26, 2015
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,934,096
- Issue date Jan 13, 2015
- University of Nebraska Board of Regents
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,705,032
- Issue date Apr 22, 2014
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,488,119
- Issue date Jul 16, 2013
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,416,408
- Issue date Apr 9, 2013
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,169,611
- Issue date May 1, 2012
- University of Nebraska Board of Regents
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system and method of use
- Patent number 8,159,672
- Issue date Apr 17, 2012
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive approach to ellipsometric monitoring of a film coat...
- Patent number 7,768,660
- Issue date Aug 3, 2010
- J. A. Woollam Co., Inc.
- Gregory K. Pribil
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,746,472
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,746,471
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,633,625
- Issue date Dec 15, 2009
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Sample investigating system
- Patent number 7,623,237
- Issue date Nov 24, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,616,319
- Issue date Nov 10, 2009
- James D. Welch
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,522,279
- Issue date Apr 21, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for and method of investigating the exact same point on a sa...
- Patent number 7,508,510
- Issue date Mar 24, 2009
- J.A. Wooliam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,505,134
- Issue date Mar 17, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Sample masking in ellipsometer and the like systems including detec...
- Patent number 7,477,388
- Issue date Jan 13, 2009
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System and method of selectively monitoring sample front and backsi...
- Patent number 7,385,698
- Issue date Jun 10, 2008
- J. A. Woollam Co., Inc.
- James D. Welch
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis methodology utilizing electromagnetic radiation
- Patent number 7,385,697
- Issue date Jun 10, 2008
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
System for reducing stress induced effects during determination of...
- Patent number 7,349,092
- Issue date Mar 25, 2008
- J. A. Woollam Co., Inc.
- Thomas E. Tiwald
- G01 - MEASURING TESTING
Information Patent Grant
Control of beam spot size in ellipsometer and the like systems
- Patent number 7,345,762
- Issue date Mar 18, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Spectroscopic ellipsometer and polarimeter systems
- Patent number 7,336,361
- Issue date Feb 26, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometer, ellipsometer, polarimeter and the like systems
- Patent number 7,327,456
- Issue date Feb 5, 2008
- J. A. Woollam Co., Inc.
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Grant
Aspects of producing, directing, conditioning, impinging and detect...
- Patent number 7,317,529
- Issue date Jan 8, 2008
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for sequentially providing aberation corrected electromagnet...
- Patent number 7,304,792
- Issue date Dec 4, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE
- Publication number 20150153230
- Publication date Jun 4, 2015
- REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20140027644
- Publication date Jan 30, 2014
- REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20120261580
- Publication date Oct 18, 2012
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20120206724
- Publication date Aug 16, 2012
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20100220313
- Publication date Sep 2, 2010
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Application
Combined spatial filter and relay systems in rotating compensator e...
- Publication number 20060268272
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Combined use of oscillating means and ellipsometry to determine unc...
- Publication number 20060268273
- Publication date Nov 30, 2006
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Application
Sample analysis methodology utilizing electromagnetic radiation
- Publication number 20040257567
- Publication date Dec 23, 2004
- John A. Woollam
- G01 - MEASURING TESTING

John A. Woollam

Person

Patents Grantslast 30 patents

Birefringence imaging chromatography based on highly ordered 3D nan...

Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...

Combined use of oscillating means and ellipsometry to determine unc...

Method of obtaining micrographs of transparent or semi-transparent...

Integrated mid-infrared, far infrared and terahertz optical Hall ef...

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Sample investigating system and method of use

Non-destructive approach to ellipsometric monitoring of a film coat...

Automated ellipsometer and the like systems

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

Spectroscopic ellipsometer and polarimeter systems

Sample investigating system

Spectroscopic ellipsometer and polarimeter systems

System for and method of investigating the exact same point on a sa...

System for and method of investigating the exact same point on a sa...

Automated ellipsometer and the like systems

Sample masking in ellipsometer and the like systems including detec...

System and method of selectively monitoring sample front and backsi...

Sample analysis methodology utilizing electromagnetic radiation

System for reducing stress induced effects during determination of...

Control of beam spot size in ellipsometer and the like systems

Spectroscopic ellipsometer and polarimeter systems

Spectrophotometer, ellipsometer, polarimeter and the like systems

Aspects of producing, directing, conditioning, impinging and detect...

System for sequentially providing aberation corrected electromagnet...

Patents Applicationslast 30 patents

TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

System for and method of investigating the exact same point on a sa...

Combined spatial filter and relay systems in rotating compensator e...

Combined use of oscillating means and ellipsometry to determine unc...

Sample analysis methodology utilizing electromagnetic radiation