John T. Martin

Person

  • Portland, OR, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    WAFER PROBE

    • Publication number 20100251545
    • Publication date Oct 7, 2010
    • Cascade Microtech, Inc.
    • Leonard Hayden
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20090267625
    • Publication date Oct 29, 2009
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20080054929
    • Publication date Mar 6, 2008
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20080054923
    • Publication date Mar 6, 2008
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20080048692
    • Publication date Feb 28, 2008
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20080042671
    • Publication date Feb 21, 2008
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer probe

    • Publication number 20080042677
    • Publication date Feb 21, 2008
    • Cascade Microtech, Inc.
    • Leonard Hayden
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer probe

    • Publication number 20080045028
    • Publication date Feb 21, 2008
    • Cascade Microtech, Inc.
    • Leonard Hayden
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20080042672
    • Publication date Feb 21, 2008
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer probe

    • Publication number 20080042678
    • Publication date Feb 21, 2008
    • Cascade Microtech, Inc.
    • Leonard Hayden
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20080024149
    • Publication date Jan 31, 2008
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20070273399
    • Publication date Nov 29, 2007
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Wafer probe

    • Publication number 20070200580
    • Publication date Aug 30, 2007
    • Cascade Microtech, Inc.
    • Leonard Hayden
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20070075716
    • Publication date Apr 5, 2007
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Fluid dispensing system

    • Publication number 20070003447
    • Publication date Jan 4, 2007
    • K. Reed Gleason
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20060170439
    • Publication date Aug 3, 2006
    • Cascade Microtech, Inc.
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Fiber optic wafer probe

    • Publication number 20060008226
    • Publication date Jan 12, 2006
    • Cascade Microtech, Inc.
    • Peter R. McCann
    • G02 - OPTICS
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20050099191
    • Publication date May 12, 2005
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20040232927
    • Publication date Nov 25, 2004
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe for testing a device under test

    • Publication number 20040004491
    • Publication date Jan 8, 2004
    • K. Reed Gleason
    • G01 - MEASURING TESTING
  • Information Patent Application

    Waveguide adapter

    • Publication number 20030184404
    • Publication date Oct 2, 2003
    • Mike Andrews
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Waveguide with adjustable backshort

    • Publication number 20030128086
    • Publication date Jul 10, 2003
    • John T. Martin
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Waveguide with adjustable backshort

    • Publication number 20030043002
    • Publication date Mar 6, 2003
    • John T. Martin
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Fiber optic wafer probe

    • Publication number 20020164145
    • Publication date Nov 7, 2002
    • Peter R. McCann
    • G02 - OPTICS
  • Information Patent Application

    Wafer probe

    • Publication number 20020075019
    • Publication date Jun 20, 2002
    • Leonard Hayden
    • G01 - MEASURING TESTING