Juri Kato

Person

Suwa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor device
- Patent number 10,393,688
- Issue date Aug 27, 2019
- Seiko Epson Corporation
- Juri Kato
- G01 - MEASURING TESTING
Information Patent Grant
Corrosion detection sensor device
- Patent number 9,442,060
- Issue date Sep 13, 2016
- Seiko Epson Corporation
- Juri Kato
- G01 - MEASURING TESTING
Information Patent Grant
Corrosion detection sensor device
- Patent number 9,297,741
- Issue date Mar 29, 2016
- Seiko Epson Corporation
- Juri Kato
- G01 - MEASURING TESTING
Information Patent Grant
Corrosion detection sensor device
- Patent number 9,194,788
- Issue date Nov 24, 2015
- Seiko Epson Corporation
- Juri Kato
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device
- Patent number 9,030,204
- Issue date May 12, 2015
- Seiko Epson Corporation
- Takao Miyazawa
- G01 - MEASURING TESTING
Information Patent Grant
Corrosion detection sensor device having coating film and measureme...
- Patent number 8,937,476
- Issue date Jan 20, 2015
- Seiko Epson Corporation
- Juri Kato
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a semiconductor device
- Patent number 8,017,505
- Issue date Sep 13, 2011
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate, semiconductor device, method for manufactu...
- Patent number 7,956,414
- Issue date Jun 7, 2011
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a first circuit block isolating a plura...
- Patent number 7,906,813
- Issue date Mar 15, 2011
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS semiconductor non-volatile memory device
- Patent number 7,898,016
- Issue date Mar 1, 2011
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 7,863,669
- Issue date Jan 4, 2011
- Seiko Epson Corporation
- Juri Kato
- G11 - INFORMATION STORAGE
Information Patent Grant
Piezoelectric oscillator and method for manufacturing the same
- Patent number 7,830,215
- Issue date Nov 9, 2010
- Seiko Epson Corporation
- Takamitsu Higuchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and method of manufacturing semiconductor device
- Patent number 7,687,866
- Issue date Mar 30, 2010
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,666,795
- Issue date Feb 23, 2010
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with buried conductive layer
- Patent number 7,638,845
- Issue date Dec 29, 2009
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,622,359
- Issue date Nov 24, 2009
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing semiconductor device
- Patent number 7,563,665
- Issue date Jul 21, 2009
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 7,491,609
- Issue date Feb 17, 2009
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 7,425,484
- Issue date Sep 16, 2008
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of making semiconductor devices
- Patent number 7,368,340
- Issue date May 6, 2008
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate, semiconductor device, method for manufactu...
- Patent number 7,351,616
- Issue date Apr 1, 2008
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate, semiconductor device, method for manufactu...
- Patent number 7,344,997
- Issue date Mar 18, 2008
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor substrate and method for m...
- Patent number 7,332,399
- Issue date Feb 19, 2008
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,271,447
- Issue date Sep 18, 2007
- Seiko Epson Corporation
- Teruo Takizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing semiconductor device
- Patent number 7,227,264
- Issue date Jun 5, 2007
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device containing CMOS elem...
- Patent number 6,156,592
- Issue date Dec 5, 2000
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device containing CMOS elem...
- Patent number 5,879,979
- Issue date Mar 9, 1999
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making N-type semiconductor region by implantation
- Patent number 5,654,209
- Issue date Aug 5, 1997
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having a gate electrode having a low dopant co...
- Patent number 5,641,983
- Issue date Jun 24, 1997
- Seiko Epson Corporation
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing interconnect metallization comprising metal...
- Patent number 5,312,772
- Issue date May 17, 1994
- Seiko Epson Corporation
- Kenji Yokoyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SENSOR DEVICE
- Publication number 20160103086
- Publication date Apr 14, 2016
- SEIKO EPSON CORPORATION
- Juri KATO
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE
- Publication number 20150153399
- Publication date Jun 4, 2015
- SEIKO EPSON CORPORATION
- Takao MIYAZAWA
- G01 - MEASURING TESTING
Information Patent Application
CORROSION DETECTION SENSOR DEVICE
- Publication number 20150123683
- Publication date May 7, 2015
- SEIKO EPSON CORPORATION
- Juri KATO
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE
- Publication number 20130009647
- Publication date Jan 10, 2013
- SEIKO EPSON CORPORATION
- Takao MIYAZAWA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE
- Publication number 20120286804
- Publication date Nov 15, 2012
- SEIKO EPSON CORPORATION
- Juri KATO
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE
- Publication number 20120242319
- Publication date Sep 27, 2012
- SEIKO EPSON CORPORATION
- Juri KATO
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE AND MEASUREMENT METHOD
- Publication number 20120242355
- Publication date Sep 27, 2012
- SEIKO EPSON CORPORATION
- Juri KATO
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC OSCILLATOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20100194248
- Publication date Aug 5, 2010
- SEIKO EPSON CORPORATION
- Takamitsu HIGUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor substrate, semiconductor device, method for manufactu...
- Publication number 20080203521
- Publication date Aug 28, 2008
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20080194082
- Publication date Aug 14, 2008
- SEIKO EPSON CORPORATION
- Juri KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIEZOELECTRIC OSCILLATOR AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080180186
- Publication date Jul 31, 2008
- SEIKO EPSON CORPORATION
- Takamitsu HIGUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20080176385
- Publication date Jul 24, 2008
- SEIKO EPSON CORPORATION
- Juri KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20080146017
- Publication date Jun 19, 2008
- SEIKO EPSON CORPORATION
- Juri KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20080146035
- Publication date Jun 19, 2008
- SEIKO EPSON CORPORATION
- Juri KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20080145999
- Publication date Jun 19, 2008
- SEIKO EPSON CORPORATION
- Juri KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20080128787
- Publication date Jun 5, 2008
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTU...
- Publication number 20080122024
- Publication date May 29, 2008
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing semiconductor device
- Publication number 20070262380
- Publication date Nov 15, 2007
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20070194383
- Publication date Aug 23, 2007
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of fabricating the same background
- Publication number 20070132011
- Publication date Jun 14, 2007
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20070080402
- Publication date Apr 12, 2007
- SEIKO EPSON CORPORATION
- Juri KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20070075380
- Publication date Apr 5, 2007
- SEIKO EPSON CORPORATION
- Juri KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and semiconductor device manufacturing method
- Publication number 20070075317
- Publication date Apr 5, 2007
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD TH...
- Publication number 20070076482
- Publication date Apr 5, 2007
- SEIKO EPSON CORPORATION
- Juri Kato
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20070029617
- Publication date Feb 8, 2007
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and semiconductor device manufacturing method
- Publication number 20070018246
- Publication date Jan 25, 2007
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor substrate, semiconductor device, method for manufactu...
- Publication number 20060220128
- Publication date Oct 5, 2006
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of making semiconductor devices
- Publication number 20060202276
- Publication date Sep 14, 2006
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing semiconductor device
- Publication number 20060202271
- Publication date Sep 14, 2006
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing semiconductor device
- Publication number 20060197163
- Publication date Sep 7, 2006
- SEIKO EPSON CORPORATION
- Juri Kato
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Sensor device

Corrosion detection sensor device

Corrosion detection sensor device

Corrosion detection sensor device

Sensor device

Corrosion detection sensor device having coating film and measureme...

Method for manufacturing a semiconductor device

Semiconductor substrate, semiconductor device, method for manufactu...

Semiconductor device having a first circuit block isolating a plura...

CMOS semiconductor non-volatile memory device

Nonvolatile semiconductor memory device

Piezoelectric oscillator and method for manufacturing the same

Semiconductor device and method of manufacturing semiconductor device

Method for manufacturing semiconductor device

Semiconductor device with buried conductive layer

Method for manufacturing semiconductor device

Semiconductor device and method for manufacturing semiconductor device

Semiconductor device and method for manufacturing the same

Method of manufacturing semiconductor device

Semiconductor device and method of making semiconductor devices

Semiconductor substrate, semiconductor device, method for manufactu...

Semiconductor substrate, semiconductor device, method for manufactu...

Method for manufacturing a semiconductor substrate and method for m...

Semiconductor device

Semiconductor device and method for manufacturing semiconductor device

Method of manufacturing a semiconductor device containing CMOS elem...

Method of manufacturing a semiconductor device containing CMOS elem...

Method of making N-type semiconductor region by implantation

Semiconductor device having a gate electrode having a low dopant co...

Method of manufacturing interconnect metallization comprising metal...

Patents Applicationslast 30 patents

SENSOR DEVICE

SENSOR DEVICE

CORROSION DETECTION SENSOR DEVICE

SENSOR DEVICE

SENSOR DEVICE

SENSOR DEVICE

SENSOR DEVICE AND MEASUREMENT METHOD

PIEZOELECTRIC OSCILLATOR AND METHOD FOR MANUFACTURING THE SAME

Semiconductor substrate, semiconductor device, method for manufactu...

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

PIEZOELECTRIC OSCILLATOR AND METHOD FOR MANUFACTURING THE SAME

METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE

Semiconductor device and manufacturing method thereof

SEMICONDUCTOR SUBSTRATE, SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTU...

Semiconductor device and method for manufacturing semiconductor device

Semiconductor device

Semiconductor device and method of fabricating the same background

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

Semiconductor device and semiconductor device manufacturing method

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD TH...

Semiconductor device and manufacturing method thereof

Semiconductor device and semiconductor device manufacturing method

Semiconductor substrate, semiconductor device, method for manufactu...

Semiconductor device and method of making semiconductor devices

Semiconductor device and method of manufacturing semiconductor device

Semiconductor device and method for manufacturing semiconductor device