Membership
Tour
Register
Log in
Karam M. Noujeim
Follow
Person
Los Altos, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Accelerated measurements through adaptive test parameter selection
Patent number
11,435,394
Issue date
Sep 6, 2022
Anritsu Company
Karam Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Radar object classification and communication using smart targets
Patent number
11,372,100
Issue date
Jun 28, 2022
BAIDU USA LLC
Karam Noujeim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radar sensor array for interference hunting and detection
Patent number
11,269,048
Issue date
Mar 8, 2022
BAIDU USA LLC
Karam Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Extended perception based on radar communication of autonomous driv...
Patent number
11,221,405
Issue date
Jan 11, 2022
BAIDU USA LLC
Karam Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Nonlinear transmission line (NLTL)-based miniature reflectometers w...
Patent number
10,871,508
Issue date
Dec 22, 2020
Anritsu Company
Thomas Roberts
G01 - MEASURING TESTING
Information
Patent Grant
Miniature nonlinear transmission line (NLTL)-based frequency-scalab...
Patent number
10,837,998
Issue date
Nov 17, 2020
Anritsu Company
Kyle Stickle
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for radar simulation and object classification
Patent number
10,754,030
Issue date
Aug 25, 2020
BAIDU USA LLC
Karam Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Nonlinear transmission line-based harmonic phase standard
Patent number
10,634,757
Issue date
Apr 28, 2020
Anritsu Company
Jon Martens
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency-scalable NLTL-based mm-wave vector signal de-modulator
Patent number
10,469,296
Issue date
Nov 5, 2019
Anritsu Company
Karam Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Frequency-scalable imaging radar
Patent number
10,267,910
Issue date
Apr 23, 2019
Anritsu Company
Karam Noujeim
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Frequency-scalable transition for dissimilar media
Patent number
9,287,604
Issue date
Mar 15, 2016
Anritsu Company
Karam M. Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and methods for simultaneously measuring forward and revers...
Patent number
9,176,174
Issue date
Nov 3, 2015
Anritsu Company
Donald Anthony Bradley
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for improved power control in millimeter wave t...
Patent number
9,103,873
Issue date
Aug 11, 2015
Anritsu Company
Jon S Martens
G01 - MEASURING TESTING
Information
Patent Grant
System and method of communicating information about an object conc...
Patent number
8,903,149
Issue date
Dec 2, 2014
Anritsu Company
Karam Noujeim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus for enhancing the dynamic range of shockline-based sampli...
Patent number
8,718,586
Issue date
May 6, 2014
Anritsu Company
Jon Martens
G01 - MEASURING TESTING
Information
Patent Grant
Frequency-scalable shockline-based VNA
Patent number
8,417,189
Issue date
Apr 9, 2013
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analyzer having multiplexed reflectometers for impro...
Patent number
8,278,944
Issue date
Oct 2, 2012
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Method and system to extend a useable bandwidth of a signal generator
Patent number
8,027,390
Issue date
Sep 27, 2011
Anritsu Company
Karam Michael Noujeim
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Interleaved non-linear transmission lines for simultaneous rise and...
Patent number
7,764,141
Issue date
Jul 27, 2010
Anritsu Company
Karam Michael Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus for extending the bandwidth of a spectrum analyzer
Patent number
7,746,052
Issue date
Jun 29, 2010
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Broadband micro-machined thermal power sensor
Patent number
7,705,582
Issue date
Apr 27, 2010
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for extending the bandwidth of vector network analyzer re...
Patent number
7,683,633
Issue date
Mar 23, 2010
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced isolation level between sampling channels in a vector netw...
Patent number
7,088,111
Issue date
Aug 8, 2006
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Grant
Fixed-frequency beam-steerable leaky-wave microstrip antenna
Patent number
7,002,517
Issue date
Feb 21, 2006
Anritsu Company
Karam Michael Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monolithic nonlinear transmission lines and sampling circuits with...
Patent number
6,894,581
Issue date
May 17, 2005
Anritsu Company
Karam Michael Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Leaky wave microstrip antenna with a prescribable pattern
Patent number
6,839,030
Issue date
Jan 4, 2005
Anritsu Company
Karam Michael Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated multiple-up/down conversion radar test system
Patent number
6,700,531
Issue date
Mar 2, 2004
Anritsu Company
Ramzi Abou-Jaoude
G01 - MEASURING TESTING
Information
Patent Grant
Microstrip dot termination usable with optical modulators
Patent number
6,593,829
Issue date
Jul 15, 2003
Anritsu Company
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automotive radar antenna alignment system
Patent number
6,335,705
Issue date
Jan 1, 2002
Anritsu Company
Martin I. Grace
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
EXTENDED PERCEPTION BASED ON RADAR COMMUNICATION OF AUTONOMOUS DRIV...
Publication number
20200132830
Publication date
Apr 30, 2020
BAIDU USA LLC
KARAM NOUJEIM
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR RADAR SIMULATION AND OBJECT CLASSIFICATION
Publication number
20200124718
Publication date
Apr 23, 2020
BAIDU USA LLC
Karam Noujeim
G05 - CONTROLLING REGULATING
Information
Patent Application
RADAR OBJECT CLASSIFICATION AND COMMUNICATION USING SMART TARGETS
Publication number
20200124719
Publication date
Apr 23, 2020
BAIDU USA LLC
Karam Noujeim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADAR SENSOR ARRAY FOR INTERFERENCE HUNTING AND DETECTION
Publication number
20200124698
Publication date
Apr 23, 2020
BAIDU USA LLC
Karam Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FREQUENCY-SCALABLE IMAGING RADAR
Publication number
20180217252
Publication date
Aug 2, 2018
Anritsu Company
Karam Noujeim
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FREQUENCY-SCALABLE SHOCKLINE-BASED VNA
Publication number
20110306314
Publication date
Dec 15, 2011
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY-SCALABLE SHOCKLINE-BASED SIGNAL-SOURCE EXTENSIONS
Publication number
20110304318
Publication date
Dec 15, 2011
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR ENHANCING THE DYNAMIC RANGE OF SHOCKLINE-BASED SAMPLI...
Publication number
20100330944
Publication date
Dec 30, 2010
Anritsu Company
Jon Martens
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM TO EXTEND A USEABLE BANDWIDTH OF A SIGNAL GENERATOR
Publication number
20090296829
Publication date
Dec 3, 2009
Anritsu Company
Karam Michael Noujeim
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND METHOD FOR ACCELERATING AN ELECTRICAL MEASUREMENT INSTRU...
Publication number
20090234603
Publication date
Sep 17, 2009
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR PROTOTYPING AND TESTING ELECTRICAL CIRCUITS...
Publication number
20090199141
Publication date
Aug 6, 2009
Anritsu Company
Karam Michael Noujeim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR EXTENDING THE BANDWIDTH OF A SPECTRUM ANALYZER
Publication number
20090098847
Publication date
Apr 16, 2009
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND MICRO-MACHINED THERMAL POWER SENSOR
Publication number
20080252298
Publication date
Oct 16, 2008
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Application
INTERLEAVED NON-LINEAR TRANSMISSION LINES FOR SIMULTANEOUS RISE AND...
Publication number
20080246551
Publication date
Oct 9, 2008
Anritsu Company
Karam Michael Noujeim
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
APPARATUS FOR EXTENDING THE BANDWIDTH OF VECTOR NETWORK ANALYZER RE...
Publication number
20080094072
Publication date
Apr 24, 2008
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Application
Fixed-frequency beam-steerable leaky-wave microstrip antenna
Publication number
20050012667
Publication date
Jan 20, 2005
Anritsu Company
Karam Michael Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LEAKY WAVE MICROSTRIP ANTENNA WITH A PRESCRIBABLE PATTERN
Publication number
20040227664
Publication date
Nov 18, 2004
Karam Michael Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Monolithic nonlinear transmission lines and sampling circuits with...
Publication number
20040227581
Publication date
Nov 18, 2004
Karam Michael Noujeim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Enhanced isolation level between sampling channels in a vector netw...
Publication number
20040222800
Publication date
Nov 11, 2004
Anritsu Company
Karam Michael Noujeim
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED MULTIPLE-UP/DOWN CONVERSION RADAR TEST SYSTEM
Publication number
20040012517
Publication date
Jan 22, 2004
Ramzi Abou-Jaoude
G01 - MEASURING TESTING
Information
Patent Application
Microstrip dot termination usable with optical modulators
Publication number
20030048146
Publication date
Mar 13, 2003
William Oldfield
H01 - BASIC ELECTRIC ELEMENTS