Kenneth E. Beilstein Jr.

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional SRAM trench structure and fabrication method ther...
- Patent number 6,174,763
- Issue date Jan 16, 2001
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for burn-in stressing and simultaneous testin...
- Patent number 5,923,181
- Issue date Jul 13, 1999
- International Business Machine Corporation
- Kenneth Edward Beilstein
- G01 - MEASURING TESTING
Information Patent Grant
Structure for making sub-lithographic images by the intersection of...
- Patent number 5,920,101
- Issue date Jul 6, 1999
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure for making sub-lithographic images by the intersection of...
- Patent number 5,834,818
- Issue date Nov 10, 1998
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip kerf clear method for forming semiconductor chip...
- Patent number 5,804,464
- Issue date Sep 8, 1998
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and workpiece for connecting a thin layer to a monolithic el...
- Patent number 5,786,628
- Issue date Jul 28, 1998
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and workpiece for connecting a thin layer to a monolithic el...
- Patent number 5,719,438
- Issue date Feb 17, 1998
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for making sub-lithographic images by etching the intersecti...
- Patent number 5,714,039
- Issue date Feb 3, 1998
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for burn-in stressing and simultaneous testin...
- Patent number 5,686,843
- Issue date Nov 11, 1997
- International Business Machines Corporation
- Kenneth Edward Beilstein
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional SRAM trench structure and fabrication method ther...
- Patent number 5,670,803
- Issue date Sep 23, 1997
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip kerf clear method and resultant semiconductor ch...
- Patent number 5,670,428
- Issue date Sep 23, 1997
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip having chip metal layer and transfer metal layer...
- Patent number 5,644,162
- Issue date Jul 1, 1997
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monolithic electronic modules--fabrication and structures
- Patent number 5,614,277
- Issue date Mar 25, 1997
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip having a chip metal layer and a transfer metal a...
- Patent number 5,596,226
- Issue date Jan 21, 1997
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and workpiece for connecting a thin layer to a monolithic el...
- Patent number 5,567,654
- Issue date Oct 22, 1996
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication processes for monolithic electronic modules
- Patent number 5,517,754
- Issue date May 21, 1996
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic modules with interconnected surface metallization layers
- Patent number 5,517,057
- Issue date May 14, 1996
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic modules with interconnected surface metallization layers...
- Patent number 5,466,634
- Issue date Nov 14, 1995
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multichip integrated circuit packages and systems
- Patent number 5,426,566
- Issue date Jun 20, 1995
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermally enhanced semiconductor chip package
- Patent number 5,309,318
- Issue date May 3, 1994
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fault tolerant logic system
- Patent number 5,260,952
- Issue date Nov 9, 1993
- IBM Corporation
- Kenneth E. Beilstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process for positioning a mask within a concave semiconductor struc...
- Patent number 5,096,849
- Issue date Mar 17, 1992
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
DRAM memory cell having a horizontal SOI transfer device disposed o...
- Patent number 5,055,898
- Issue date Oct 8, 1991
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quaternary FET read only memory
- Patent number RE32401
- Issue date Apr 14, 1987
- International Business Machines Corporation
- Kenneth E. Beilstein
- 365 - Static information storage and retrieval
Information Patent Grant
Method of making a MOSFET device with reduced sensitivity of thresh...
- Patent number 4,276,095
- Issue date Jun 30, 1981
- International Business Machines Corporation
- Kenneth E. Beilstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quaternary FET read only memory
- Patent number 4,202,044
- Issue date May 6, 1980
- International Business Machines Corporation
- Kenneth E. Beilstein
- G11 - INFORMATION STORAGE
Information Patent Grant
Substrate bias modulation to improve mosfet circuit performance
- Patent number 4,092,548
- Issue date May 30, 1978
- International Business Machines Corporation
- Kenneth Edward Beilstein
- H03 - BASIC ELECTRONIC CIRCUITRY

Kenneth E. Beilstein Jr.

Person

Patents Grantslast 30 patents

Three-dimensional SRAM trench structure and fabrication method ther...

Methods and apparatus for burn-in stressing and simultaneous testin...

Structure for making sub-lithographic images by the intersection of...

Structure for making sub-lithographic images by the intersection of...

Semiconductor chip kerf clear method for forming semiconductor chip...

Method and workpiece for connecting a thin layer to a monolithic el...

Method and workpiece for connecting a thin layer to a monolithic el...

Method for making sub-lithographic images by etching the intersecti...

Methods and apparatus for burn-in stressing and simultaneous testin...

Three-dimensional SRAM trench structure and fabrication method ther...

Semiconductor chip kerf clear method and resultant semiconductor ch...

Semiconductor chip having chip metal layer and transfer metal layer...

Monolithic electronic modules--fabrication and structures

Semiconductor chip having a chip metal layer and a transfer metal a...

Method and workpiece for connecting a thin layer to a monolithic el...

Fabrication processes for monolithic electronic modules

Electronic modules with interconnected surface metallization layers

Electronic modules with interconnected surface metallization layers...

Multichip integrated circuit packages and systems

Thermally enhanced semiconductor chip package

Fault tolerant logic system

Process for positioning a mask within a concave semiconductor struc...

DRAM memory cell having a horizontal SOI transfer device disposed o...

Quaternary FET read only memory

Method of making a MOSFET device with reduced sensitivity of thresh...

Quaternary FET read only memory

Substrate bias modulation to improve mosfet circuit performance