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Lancy Tsung
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Plano, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Chemical etch solution and technique for imaging a device's shallow...
Patent number
7,262,409
Issue date
Aug 28, 2007
Texas Instruments Incorporated
Lancy Y. Tsung
G01 - MEASURING TESTING
Information
Patent Grant
Mass production of cross-section TEM samples by focused ion beam de...
Patent number
6,884,362
Issue date
Apr 26, 2005
Texas Instruments Incorporated
Lancy Tsung
G01 - MEASURING TESTING
Information
Patent Grant
Method to salicide source-line in flash memory with STI
Patent number
6,803,273
Issue date
Oct 12, 2004
Texas Instruments Incorporated
Thomas M. Ambrose
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass production of cross-section TEM samples by focused ion beam de...
Patent number
6,786,978
Issue date
Sep 7, 2004
Texas Instruments Incorporated
Lancy Tsung
G01 - MEASURING TESTING
Information
Patent Grant
Method to form an embedded flash memory circuit with reduced proces...
Patent number
6,380,031
Issue date
Apr 30, 2002
Texas Instruments Incorporated
Freidoon Mehrad
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to reduce source-line resistance in flash memory with sti
Patent number
6,306,737
Issue date
Oct 23, 2001
Texas Instruments Incorporated
Freidoon Mehrad
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Chemical etch solution and technique for imaging a device's shallow...
Publication number
20080011717
Publication date
Jan 17, 2008
TEXAS INSTRUMENTS INCORPORATED
Lancy Y. Tsung
G01 - MEASURING TESTING
Information
Patent Application
Chemical etch solution and technique for imaging a device's shallow...
Publication number
20060145073
Publication date
Jul 6, 2006
Texas Instruments, Inc.
Lancy Y. Tsung
G01 - MEASURING TESTING
Information
Patent Application
Mass production of cross-section TEM samples by focused ion beam de...
Publication number
20030150836
Publication date
Aug 14, 2003
Lancy Tsung
G01 - MEASURING TESTING
Information
Patent Application
Mass production of cross-section TEM samples by focused ion beam de...
Publication number
20020019137
Publication date
Feb 14, 2002
Lancy Tsung
G01 - MEASURING TESTING