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Landon Vines
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San Antonio, TX, US
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last 30 patents
Information
Patent Grant
Method for forming strapless anti-fuse structure
Patent number
6,444,502
Issue date
Sep 3, 2002
Koninklijke Philips Electronics N.V.
Ivan Sanchez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated circuit manufacture method with aqueous hydrogen fluorid...
Patent number
6,429,144
Issue date
Aug 6, 2002
Koninklijke Philips Electronics N.V.
Landon B. Vines
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
IC interconnect formation with chemical-mechanical polishing and si...
Patent number
6,048,789
Issue date
Apr 11, 2000
VLSI Technology, Inc.
Landon B. Vines
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metal to amorphous silicon to metal anti-fuse structure
Patent number
6,016,001
Issue date
Jan 18, 2000
VLSI Technology, Inc.
Ivan Sanchez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated-circuit manufacture method with aqueous hydrogen-fluorid...
Patent number
6,007,641
Issue date
Dec 28, 1999
VLSI Technology, Inc.
Landon B. Vines
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming pairs of transistors, and methods of forming pai...
Patent number
5,989,948
Issue date
Nov 23, 1999
VLSI Technology, Inc.
Landon Vines
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for making doped antifuse structures
Patent number
5,899,707
Issue date
May 4, 1999
VLSI Technology, Inc.
Ivan Sanchez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Titanium boride and titanium silicide contact barrier formation for...
Patent number
5,745,990
Issue date
May 5, 1998
VLSI Technology, Inc.
Chang-Ou Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor wafer manufacturing process with high-flow-rate low-p...
Patent number
5,728,602
Issue date
Mar 17, 1998
VLSI Technology, Inc.
Craig A. Bellows
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Densification in an intermetal dielectric film
Patent number
5,610,105
Issue date
Mar 11, 1997
VLSI Technology, Inc.
Landon B. Vines
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of identifying a weakest interface where delamination is mos...
Patent number
5,493,926
Issue date
Feb 27, 1996
VLSI Technology, Inc.
Landon B. Vines
G01 - MEASURING TESTING
Information
Patent Grant
Method of using corrosion prohibiters in aluminum alloy films
Patent number
5,434,104
Issue date
Jul 18, 1995
VLSI Technology, Inc.
John L. Cain
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Molybdenum boride barrier layers between aluminum and silicon at co...
Patent number
5,329,161
Issue date
Jul 12, 1994
VLSI Technology, Inc.
Landon Vines
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Rapid thermal oxidation of silicon in an ozone ambient
Patent number
5,294,571
Issue date
Mar 15, 1994
VLSI Technology, Inc.
Felix Fujishiro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated-circuit processing with progressive intermetal-dielectri...
Patent number
5,286,518
Issue date
Feb 15, 1994
VLSI Technology, Inc.
John Cain
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...