Lynne Marie Gignac

Person

Beacon, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Crystalline film of carbon nanotubes
- Patent number 11,820,663
- Issue date Nov 21, 2023
- International Business Machines Corporation
- Abram L. Falk
- B32 - LAYERED PRODUCTS
Information Patent Grant
Non-destructive determination of components of integrated circuits
- Patent number 10,386,409
- Issue date Aug 20, 2019
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Grant
Discontinuous/non-uniform metal cap structure and process for inter...
- Patent number 8,889,546
- Issue date Nov 18, 2014
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System involving electrically reprogrammable fuses
- Patent number 8,866,257
- Issue date Oct 21, 2014
- International Business Machines Corporation
- Kaushik Chanda
- G11 - INFORMATION STORAGE
Information Patent Grant
Discontinuous/non-uniform metal cap structure and process for inter...
- Patent number 8,823,176
- Issue date Sep 2, 2014
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems involving electrically reprogrammable fuses
- Patent number 8,716,071
- Issue date May 6, 2014
- International Business Machines Corporation
- Kaushik Chanda
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure and process for conductive contact integration
- Patent number 8,679,970
- Issue date Mar 25, 2014
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems involving electrically reprogrammable fuses
- Patent number 8,535,991
- Issue date Sep 17, 2013
- International Business Machines Corporation
- Kaushik Chanda
- G11 - INFORMATION STORAGE
Information Patent Grant
Efficient interconnect structure for electrical fuse applications
- Patent number 8,133,767
- Issue date Mar 13, 2012
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Efficient interconnect structure for electrical fuse applications
- Patent number 7,893,520
- Issue date Feb 22, 2011
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for SEM measurement of features using magnetically filtered...
- Patent number 7,767,962
- Issue date Aug 3, 2010
- International Business Machines Corporation
- Lynne Gignac
- G01 - MEASURING TESTING
Information Patent Grant
Control of liner thickness for improving thermal cycle reliability
- Patent number 7,345,305
- Issue date Mar 18, 2008
- International Business Machines Corporation
- Ronald Gene Filippi
- G01 - MEASURING TESTING
Information Patent Grant
On-chip Cu interconnection using 1 to 5 nm thick metal cap
- Patent number 7,247,946
- Issue date Jul 24, 2007
- International Business Machines Corporation
- John Bruley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming images in a scanning electron microscope
- Patent number 7,105,817
- Issue date Sep 12, 2006
- International Business Machines Inc.
- Lynne Gignac
- G01 - MEASURING TESTING
Information Patent Grant
Control of liner thickness for improving thermal cycle reliability
- Patent number 6,989,282
- Issue date Jan 24, 2006
- International Business Machines Corporation
- Ronald Gene Filippi
- G01 - MEASURING TESTING
Information Patent Grant
Method for plating copper conductors and devices formed
- Patent number 6,979,393
- Issue date Dec 27, 2005
- International Business Machines Corporation
- Kenneth P. Rodbell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Diffusion barrier layer and semiconductor device containing same
- Patent number 6,784,485
- Issue date Aug 31, 2004
- International Business Machines Corporation
- Stephan Alan Cohen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for SEM measurement of topological features
- Patent number 6,768,111
- Issue date Jul 27, 2004
- International Business Machines Corp.
- Oliver C. Wells
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming interconnects on semiconductor substrates and st...
- Patent number 6,570,255
- Issue date May 27, 2003
- International Business Machines Corporation
- Panayotis Constantinou Andricacos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for manufacturing a contact barrier
- Patent number 6,509,265
- Issue date Jan 21, 2003
- International Business Machines Corporation
- Patrick W. DeHaven
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aluminum-based metallization exhibiting reduced electromigration an...
- Patent number 6,448,173
- Issue date Sep 10, 2002
- International Business Machines Corporation
- Lawrence Alfred Clevenger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a TiN layer on top of a metal silicide layer in...
- Patent number 6,436,823
- Issue date Aug 20, 2002
- International Business Machines Corporation
- Cyril Cabral
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming interconnects on semiconductor substrates and st...
- Patent number 6,429,523
- Issue date Aug 6, 2002
- International Business Machines Corp.
- Panayotis Constantinou Andricacos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flat interface for a metal-silicon contract barrier film
- Patent number 6,417,567
- Issue date Jul 9, 2002
- International Business Machines Corporation
- Anthony G. Domenicucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for plating copper conductors and devices formed
- Patent number 6,344,129
- Issue date Feb 5, 2002
- International Business Machines Corporation
- Kenneth P. Rodbell
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Process for manufacturing a contact barrier
- Patent number 6,180,521
- Issue date Jan 30, 2001
- International Business Machines Corporation
- Patrick W. DeHaven
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flat interface for a metal-silicon contact barrier film
- Patent number 6,124,639
- Issue date Sep 26, 2000
- International Business Machines Corporation
- Anthony G. Domenicucci
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an atomically flat interface for a highly disord...
- Patent number 6,022,801
- Issue date Feb 8, 2000
- International Business Machines Corporation
- Anthony G. Domenicucci
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPLYING INERT ION BEAM ETCHING FOR IMPROVING A PROFILE AND REPAIRI...
- Publication number 20230165169
- Publication date May 25, 2023
- International Business Machines Corporation
- Luxherta Buzi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTALLINE FILM OF CARBON NANOTUBES
- Publication number 20190248654
- Publication date Aug 15, 2019
- International Business Machines Corporation
- Abram L. Falk
- B32 - LAYERED PRODUCTS
Information Patent Application
NON-DESTRUCTIVE DETERMINATION OF COMPONENTS OF INTEGRATED CIRCUITS
- Publication number 20170074927
- Publication date Mar 16, 2017
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES
- Publication number 20140177373
- Publication date Jun 26, 2014
- International Business Machines Corporation
- Kaushik Chanda
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND SYSTEMS INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES
- Publication number 20130176805
- Publication date Jul 11, 2013
- International Business Machines Corporation
- Kaushik Chanda
- G11 - INFORMATION STORAGE
Information Patent Application
DISCONTINUOUS/NON-UNIFORM METAL CAP STRUCTURE AND PROCESS FOR INTER...
- Publication number 20120329271
- Publication date Dec 27, 2012
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EFFICIENT INTERCONNECT STRUCTURE FOR ELECTRICAL FUSE APPLICATIONS
- Publication number 20110092031
- Publication date Apr 21, 2011
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems Involving Electrically Reprogrammable Fuses
- Publication number 20100118636
- Publication date May 13, 2010
- International Business Machines Corporation
- Kaushik Chanda
- G11 - INFORMATION STORAGE
Information Patent Application
DISCONTINUOUS/NON-UNIFORM METAL CAP STRUCTURE AND PROCESS FOR INTER...
- Publication number 20100084767
- Publication date Apr 8, 2010
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE AND PROCESS FOR CONDUCTIVE CONTACT INTEGRATION
- Publication number 20090289365
- Publication date Nov 26, 2009
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EFFICIENT INTERCONNECT STRUCTURE FOR ELECTRICAL FUSE APPLICATIONS
- Publication number 20090278229
- Publication date Nov 12, 2009
- International Business Machines Corporation
- Chih-Chao Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES
- Publication number 20090045484
- Publication date Feb 19, 2009
- International Business Machines Corporation
- Kaushik Chanda
- G11 - INFORMATION STORAGE
Information Patent Application
Method for SEM measurement of features using magnetically filtered...
- Publication number 20070029479
- Publication date Feb 8, 2007
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FORMING IMAGES IN A SCANNING ELECTRON MICROSCOPE
- Publication number 20060169894
- Publication date Aug 3, 2006
- International Business Machines Corporation
- Lynne M. Gignac
- G01 - MEASURING TESTING
Information Patent Application
On-chip Cu interconnection using 1 to 5 nm thick metal cap
- Publication number 20060160350
- Publication date Jul 20, 2006
- International Business Machines Corporation
- John Bruley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Control of liner thickness for improving thermal cycle reliability
- Publication number 20060027842
- Publication date Feb 9, 2006
- Ronald Gene Filippi
- G01 - MEASURING TESTING
Information Patent Application
Control of liner thickness for improving thermal cycle reliability
- Publication number 20050227380
- Publication date Oct 13, 2005
- Ronald Gene Filippi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for forming uniformly thick anodized films on...
- Publication number 20040077140
- Publication date Apr 22, 2004
- Panayotis C. Andricacos
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Method for producing a flat interface for a metal-silicon contact b...
- Publication number 20020180046
- Publication date Dec 5, 2002
- International Business Machines Corporation
- Yun-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for forming interconnects on semiconductor substrates and st...
- Publication number 20020171151
- Publication date Nov 21, 2002
- International Business Machines Corporation
- Panayotis Constantinou Andricacos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING INTERCONNECTS ON SEMICONDUCTOR SUBSTRATES AND ST...
- Publication number 20020105082
- Publication date Aug 8, 2002
- International Business Machines Corporation
- Panayotis Constantinou Andricacos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for plating copper conductors and devices formed
- Publication number 20020066673
- Publication date Jun 6, 2002
- International Business Machines Corporation
- Kenneth P. Rodbell
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Lynne Marie Gignac

Person

Patents Grantslast 30 patents

Crystalline film of carbon nanotubes

Non-destructive determination of components of integrated circuits

Discontinuous/non-uniform metal cap structure and process for inter...

System involving electrically reprogrammable fuses

Discontinuous/non-uniform metal cap structure and process for inter...

Methods and systems involving electrically reprogrammable fuses

Structure and process for conductive contact integration

Methods and systems involving electrically reprogrammable fuses

Efficient interconnect structure for electrical fuse applications

Efficient interconnect structure for electrical fuse applications

Method for SEM measurement of features using magnetically filtered...

Control of liner thickness for improving thermal cycle reliability

On-chip Cu interconnection using 1 to 5 nm thick metal cap

Method of forming images in a scanning electron microscope

Control of liner thickness for improving thermal cycle reliability

Method for plating copper conductors and devices formed

Diffusion barrier layer and semiconductor device containing same

Method for SEM measurement of topological features

Method for forming interconnects on semiconductor substrates and st...

Process for manufacturing a contact barrier

Aluminum-based metallization exhibiting reduced electromigration an...

Method for forming a TiN layer on top of a metal silicide layer in...

Method for forming interconnects on semiconductor substrates and st...

Flat interface for a metal-silicon contract barrier film

Method for plating copper conductors and devices formed

Process for manufacturing a contact barrier

Flat interface for a metal-silicon contact barrier film

Method for forming an atomically flat interface for a highly disord...

Patents Applicationslast 30 patents

APPLYING INERT ION BEAM ETCHING FOR IMPROVING A PROFILE AND REPAIRI...

CRYSTALLINE FILM OF CARBON NANOTUBES

NON-DESTRUCTIVE DETERMINATION OF COMPONENTS OF INTEGRATED CIRCUITS

SYSTEM INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES

METHODS AND SYSTEMS INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES

DISCONTINUOUS/NON-UNIFORM METAL CAP STRUCTURE AND PROCESS FOR INTER...

EFFICIENT INTERCONNECT STRUCTURE FOR ELECTRICAL FUSE APPLICATIONS

Methods and Systems Involving Electrically Reprogrammable Fuses

DISCONTINUOUS/NON-UNIFORM METAL CAP STRUCTURE AND PROCESS FOR INTER...

STRUCTURE AND PROCESS FOR CONDUCTIVE CONTACT INTEGRATION

EFFICIENT INTERCONNECT STRUCTURE FOR ELECTRICAL FUSE APPLICATIONS

METHODS AND SYSTEMS INVOLVING ELECTRICALLY REPROGRAMMABLE FUSES

Method for SEM measurement of features using magnetically filtered...

METHOD OF FORMING IMAGES IN A SCANNING ELECTRON MICROSCOPE

On-chip Cu interconnection using 1 to 5 nm thick metal cap

Control of liner thickness for improving thermal cycle reliability

Control of liner thickness for improving thermal cycle reliability

Apparatus and method for forming uniformly thick anodized films on...

Method for producing a flat interface for a metal-silicon contact b...

Method for forming interconnects on semiconductor substrates and st...

METHOD FOR FORMING INTERCONNECTS ON SEMICONDUCTOR SUBSTRATES AND ST...

Method for plating copper conductors and devices formed