MONA EISSA

Person

ALLEN, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Gate oxide fabrication and system
- Patent number 11,972,942
- Issue date Apr 30, 2024
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC having trench-based metal-insulator-metal capacitor
- Patent number 11,616,011
- Issue date Mar 28, 2023
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated fluxgate device
- Patent number 11,508,721
- Issue date Nov 22, 2022
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC having trench-based metal-insulator-metal capacitor
- Patent number 11,075,157
- Issue date Jul 27, 2021
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated fluxgate device
- Patent number 10,978,448
- Issue date Apr 13, 2021
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for NiFe fluxgate device
- Patent number 10,266,950
- Issue date Apr 23, 2019
- Texas Instruments Incorporated
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Magnetic core
- Patent number 10,199,573
- Issue date Feb 5, 2019
- Texas Instruments Incorporated
- Mona Eissa
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field annealing for integrated fluxgate sensors
- Patent number 10,017,851
- Issue date Jul 10, 2018
- Texas Instruments Incorporated
- Dok Won Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Selective patterning of titanium encapsulation layers
- Patent number 10,005,662
- Issue date Jun 26, 2018
- Texas Instruments Incorporated
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Process for NiFe fluxgate device
- Patent number 9,840,781
- Issue date Dec 12, 2017
- Texas Instruments Incorporated
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Selective patterning of an integrated fluxgate device
- Patent number 9,771,261
- Issue date Sep 26, 2017
- Texas Instruments Incorporated
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Aluminum enhanced palladium CMP process
- Patent number 8,288,283
- Issue date Oct 16, 2012
- Texas Instruments Incorporated
- Mona M. Eissa
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
TSVS having chemically exposed TSV tips for integrated circuit devices
- Patent number 7,833,895
- Issue date Nov 16, 2010
- Texas Instruments Incorporated
- Thomas D. Bonifield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective dry etching of tantalum and tantalum nitride
- Patent number 7,354,853
- Issue date Apr 8, 2008
- Texas Instruments Incorporated
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Post-polish treatment for inhibiting copper corrosion
- Patent number 7,268,073
- Issue date Sep 11, 2007
- Texas Instruments Incorporated
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hydrogen plasma photoresist strip and polymeric residue cleanup pro...
- Patent number 7,232,768
- Issue date Jun 19, 2007
- Texas Instruments Incorporated
- Patricia B. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hydrogen plasma photoresist strip and polymeric residue cleanup pro...
- Patent number 7,179,751
- Issue date Feb 20, 2007
- Texas Instruments Incorporated
- Patricia B. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Effective solution and process to wet-etch metal-alloy films in sem...
- Patent number 7,153,782
- Issue date Dec 26, 2006
- Texas Instruments Incorporated
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Control of dissolved gas levels in deionized water
- Patent number 6,997,192
- Issue date Feb 14, 2006
- Texas Instruments Incorporated
- Nilesh S. Doke
- B08 - CLEANING
Information Patent Grant
Hydrogen plasma photoresist strip and polymeric residue cleanup pro...
- Patent number 6,967,173
- Issue date Nov 22, 2005
- Texas Instruments Incorporated
- Patricia B. Smith
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selective dry etching of tantalum and tantalum nitride
- Patent number 6,939,795
- Issue date Sep 6, 2005
- Texas Instruments Incorporated
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
CMP in-situ conditioning with pad and retaining ring clean
- Patent number 6,806,193
- Issue date Oct 19, 2004
- Texas Instruments Incorporated
- Vincent C. Korthuis
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Gate structure and method
- Patent number 6,723,658
- Issue date Apr 20, 2004
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Effective solution and process to wet-etch metal-alloy films in sem...
- Patent number 6,624,086
- Issue date Sep 23, 2003
- Texas Instruments Incorporated
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Treatment of low-k dielectric films to enable patterning of deep su...
- Patent number 6,605,536
- Issue date Aug 12, 2003
- Texas Instruments Incorporated
- Mona Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Processes for chemical-mechanical polishing of a semiconductor wafer
- Patent number 6,579,798
- Issue date Jun 17, 2003
- Texas Instruments Incorporated
- Basab Chatterjee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wet clean of organic silicate glass films
- Patent number 6,551,943
- Issue date Apr 22, 2003
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post copper CMP clean
- Patent number 6,383,928
- Issue date May 7, 2002
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post fuse slag etch
- Patent number 6,316,350
- Issue date Nov 13, 2001
- Texas Instruments Incorporated
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit insulator
- Patent number 6,150,010
- Issue date Nov 21, 2000
- Texas Instruments Incorporated
- Mona Eissa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...

Patents Applicationslast 30 patents

Information Patent Application
SMALL GRAIN SIZE POLYSILICON ENGINEERING FOR THRESHOLD VOLTAGE MISM...
- Publication number 20230245891
- Publication date Aug 3, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Bhaskar Srinivasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE OXIDE FABRICATION AND SYSTEM
- Publication number 20230087463
- Publication date Mar 23, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BCD IC WITH GATE ETCH AND SELF-ALIGNED IMPLANT INTEGRATION
- Publication number 20220068649
- Publication date Mar 3, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IC HAVING TRENCH-BASED METAL-INSULATOR-METAL CAPACITOR
- Publication number 20210327802
- Publication date Oct 21, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Fluxgate Device
- Publication number 20210233903
- Publication date Jul 29, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- G01 - MEASURING TESTING
Information Patent Application
IC HAVING TRENCH-BASED METAL-INSULATOR-METAL CAPACITOR
- Publication number 20210074630
- Publication date Mar 11, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR NiFe FLUXGATE DEVICE
- Publication number 20190211458
- Publication date Jul 11, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. EISSA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROCESS FOR NiFe FLUXGATE DEVICE
- Publication number 20180087161
- Publication date Mar 29, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. EISSA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MAGNETIC CORE
- Publication number 20170346000
- Publication date Nov 30, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Mona Eissa
- G01 - MEASURING TESTING
Information Patent Application
SELECTIVE PATTERNING OF TITANIUM ENCAPSULATION LAYERS
- Publication number 20170341934
- Publication date Nov 30, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Selective Patterning of an Integrated Fluxgate Device
- Publication number 20170267521
- Publication date Sep 21, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Lee Alan Stringer
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Integrated Fluxgate Device
- Publication number 20170213956
- Publication date Jul 27, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC FIELD ANNEALING FOR INTEGRATED FLUXGATE SENSORS
- Publication number 20170175259
- Publication date Jun 22, 2017
- TEXAS INSTRUMENTS INCORPORATED
- DOK WON LEE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROCESS FOR NiFe FLUXGATE DEVICE
- Publication number 20160155935
- Publication date Jun 2, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. EISSA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HIGH PERFORMANCE FLUXGATE DEVICE
- Publication number 20160154069
- Publication date Jun 2, 2016
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. EISSA
- G01 - MEASURING TESTING
Information Patent Application
THROUGH SILICON VIA FILLING
- Publication number 20130249096
- Publication date Sep 26, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Mona Eissa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALUMINUM ENHANCED PALLADIUM CMP PROCESS
- Publication number 20120142183
- Publication date Jun 7, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. EISSA
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
TSVS Having Chemically Exposed TSV Tips for Integrated Circuit Devices
- Publication number 20110018107
- Publication date Jan 27, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Thomas D. Bonifield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TSVS HAVING CHEMICALLY EXPOSED TSV TIPS FOR INTEGRATED CIRCUIT DEVICES
- Publication number 20090278238
- Publication date Nov 12, 2009
- Texas Instruments Inc.
- THOMAS D. BONIFIELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dummy Contact Fill to Improve Post Contact Chemical Mechanical Poli...
- Publication number 20090087956
- Publication date Apr 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Satyavolu Srinivas Papa Rao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CMP CLEAN PROCESS FOR HIGH PERFORMANCE COPPER/LOW-K DEVICES
- Publication number 20070181532
- Publication date Aug 9, 2007
- Texas Instruments, Incorporated
- Mona M. EISSA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
HYDROGEN PLASMA PHOTORESIST STRIP AND POLYMERIC RESIDUE CLEANUP PRO...
- Publication number 20070117341
- Publication date May 24, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Patricia B. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Post-polish treatment for inhibiting copper corrosion
- Publication number 20060099804
- Publication date May 11, 2006
- Texas Instruments Inc.
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Selective dry etching of tantalum and tantalum nitride
- Publication number 20050250337
- Publication date Nov 10, 2005
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Treatment of dies prior to nickel silicide formation
- Publication number 20050247675
- Publication date Nov 10, 2005
- TEXAS INSTRUMENTS INCORPORATED
- Mona M. Eissa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Control of dissolved gas levels in deionized water
- Publication number 20050217694
- Publication date Oct 6, 2005
- Nilesh S. Doke
- B08 - CLEANING
Information Patent Application
Hydrogen plasma photoresist strip and polymeric residue cleanup pro...
- Publication number 20050215050
- Publication date Sep 29, 2005
- Patricia B. Smith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CMP in-situ conditioning with pad and retaining ring clean
- Publication number 20040137739
- Publication date Jul 15, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Vincent C. Korthuis
- B24 - GRINDING POLISHING
Information Patent Application
Control of dissolved gas levels in deionized water
- Publication number 20040112404
- Publication date Jun 17, 2004
- Nilesh S. Doke
- B08 - CLEANING
Information Patent Application
Surfactants for post-chemical mechanical polishing storage and clea...
- Publication number 20040074518
- Publication date Apr 22, 2004
- TEXAS INSTRUMENTS INCORPORATED
- Vincent C. Korthuis
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...

Person

Patents Grantslast 30 patents

Gate oxide fabrication and system

IC having trench-based metal-insulator-metal capacitor

Integrated fluxgate device

IC having trench-based metal-insulator-metal capacitor

Integrated fluxgate device

Process for NiFe fluxgate device

Magnetic core

Magnetic field annealing for integrated fluxgate sensors

Selective patterning of titanium encapsulation layers

Process for NiFe fluxgate device

Selective patterning of an integrated fluxgate device

Aluminum enhanced palladium CMP process

TSVS having chemically exposed TSV tips for integrated circuit devices

Selective dry etching of tantalum and tantalum nitride

Post-polish treatment for inhibiting copper corrosion

Hydrogen plasma photoresist strip and polymeric residue cleanup pro...

Hydrogen plasma photoresist strip and polymeric residue cleanup pro...

Effective solution and process to wet-etch metal-alloy films in sem...

Control of dissolved gas levels in deionized water

Hydrogen plasma photoresist strip and polymeric residue cleanup pro...

Selective dry etching of tantalum and tantalum nitride

CMP in-situ conditioning with pad and retaining ring clean

Gate structure and method

Effective solution and process to wet-etch metal-alloy films in sem...

Treatment of low-k dielectric films to enable patterning of deep su...

Processes for chemical-mechanical polishing of a semiconductor wafer

Wet clean of organic silicate glass films

Post copper CMP clean

Post fuse slag etch

Integrated circuit insulator

Patents Applicationslast 30 patents

SMALL GRAIN SIZE POLYSILICON ENGINEERING FOR THRESHOLD VOLTAGE MISM...

GATE OXIDE FABRICATION AND SYSTEM

BCD IC WITH GATE ETCH AND SELF-ALIGNED IMPLANT INTEGRATION

IC HAVING TRENCH-BASED METAL-INSULATOR-METAL CAPACITOR

Integrated Fluxgate Device

IC HAVING TRENCH-BASED METAL-INSULATOR-METAL CAPACITOR

PROCESS FOR NiFe FLUXGATE DEVICE

PROCESS FOR NiFe FLUXGATE DEVICE

MAGNETIC CORE

SELECTIVE PATTERNING OF TITANIUM ENCAPSULATION LAYERS

Selective Patterning of an Integrated Fluxgate Device

Integrated Fluxgate Device

MAGNETIC FIELD ANNEALING FOR INTEGRATED FLUXGATE SENSORS

PROCESS FOR NiFe FLUXGATE DEVICE

HIGH PERFORMANCE FLUXGATE DEVICE

THROUGH SILICON VIA FILLING

ALUMINUM ENHANCED PALLADIUM CMP PROCESS

TSVS Having Chemically Exposed TSV Tips for Integrated Circuit Devices

TSVS HAVING CHEMICALLY EXPOSED TSV TIPS FOR INTEGRATED CIRCUIT DEVICES

Dummy Contact Fill to Improve Post Contact Chemical Mechanical Poli...

CMP CLEAN PROCESS FOR HIGH PERFORMANCE COPPER/LOW-K DEVICES

HYDROGEN PLASMA PHOTORESIST STRIP AND POLYMERIC RESIDUE CLEANUP PRO...

Post-polish treatment for inhibiting copper corrosion

Selective dry etching of tantalum and tantalum nitride

Treatment of dies prior to nickel silicide formation

Control of dissolved gas levels in deionized water

Hydrogen plasma photoresist strip and polymeric residue cleanup pro...

CMP in-situ conditioning with pad and retaining ring clean

Control of dissolved gas levels in deionized water

Surfactants for post-chemical mechanical polishing storage and clea...