Moon-Hyun Yoo

Person

Suwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting a mask
- Patent number 8,526,707
- Issue date Sep 3, 2013
- Samsung Electronics Co., Ltd.
- Yoonna Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of designing a mask layout
- Patent number 8,234,595
- Issue date Jul 31, 2012
- Samsung Electronics Co., Ltd.
- Young-Ile Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for analyzing mask topography and method of forming image us...
- Patent number 8,045,787
- Issue date Oct 25, 2011
- Samsung Electronics Co., Ltd.
- Soo-han Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for verifying logic circuit
- Patent number 7,913,207
- Issue date Mar 22, 2011
- Samsung Electronics Co., Ltd.
- Sang-ho Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask set for microarray, method of fabricating mask set, and method...
- Patent number 7,844,940
- Issue date Nov 30, 2010
- Samsung Electronics Co., Ltd.
- Jae-pil Shin
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methodology for estimating statistical distribution characteristics...
- Patent number 7,617,065
- Issue date Nov 10, 2009
- Samsung Electronics Co., Ltd.
- Dae-Wook Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for designing fine pattern
- Patent number 7,610,574
- Issue date Oct 27, 2009
- Samsung Electronics Co., Ltd.
- Jae-pil Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask for forming fine pattern and method of forming the same
- Patent number 7,536,671
- Issue date May 19, 2009
- Samsung Electronics Co., Ltd.
- Jae-pil Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Event driven switch level simulation method and simulator
- Patent number 7,506,284
- Issue date Mar 17, 2009
- Samsung Electronics Co., Ltd.
- Seuk-Whan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of creating a layout of a set of masks
- Patent number 7,361,435
- Issue date Apr 22, 2008
- Samsung Electronics Co., Ltd.
- Chul-Hong Park
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methothology for estimating statistical distribution characteristic...
- Patent number 7,343,215
- Issue date Mar 11, 2008
- Samsung Electronics Co., Ltd.
- Sung-Hee Yun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, apparatus and computer program products for generating sel...
- Patent number 7,159,202
- Issue date Jan 2, 2007
- Samsung Electronics Co., Ltd.
- Jong-bae Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase edge phase shift mask enforcing a width of a field gate image...
- Patent number 7,097,949
- Issue date Aug 29, 2006
- Samsung Electronics Co., Ltd.
- Dong-Hyun Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Aggressor classification method for analyzing crosstalk of circuit
- Patent number 7,100,125
- Issue date Aug 29, 2006
- Samsung Electronics Co., Ltd.
- Jae-Seok Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask for manufacturing a highly-integrated circuit device
- Patent number 6,998,199
- Issue date Feb 14, 2006
- Samsung Electronics Co., Ltd.
- Chul-Hong Park
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Continuously variable dummy pattern density generating systems, met...
- Patent number 6,567,964
- Issue date May 20, 2003
- Samsung Electronics Co., Ltd.
- Jae-pil Shin
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INSPECTING A MASK
- Publication number 20110142325
- Publication date Jun 16, 2011
- SAMSUNG ELECTRONICS CO., LTD.
- Yoonna OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Designing a Mask Layout
- Publication number 20100005441
- Publication date Jan 7, 2010
- Young-Ile Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK SET FOR MICROARRAY, METHOD OF FABRICATING MASK SET, AND METHOD...
- Publication number 20080193864
- Publication date Aug 14, 2008
- Jae-pil Shin
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Application
MASK SET FOR MICROARRAY, METHOD OF FABRICATING MASK SET, AND METHOD...
- Publication number 20080193863
- Publication date Aug 14, 2008
- Jae-pil Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System for analyzing mask topography and method of forming image us...
- Publication number 20080175432
- Publication date Jul 24, 2008
- Samsung Electronics Co., Ltd.
- Soo-han Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask for forming fine pattern and method of forming the same
- Publication number 20080082953
- Publication date Apr 3, 2008
- SAMSUNG ELECTRONICS CO., LTD.
- Jae-pil Shin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for designing fine pattern
- Publication number 20080082954
- Publication date Apr 3, 2008
- SAMSUNG ELECTRONICS CO., LTD.
- Jae-pil Shin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of forming image contour for predicting semiconductor device...
- Publication number 20080076047
- Publication date Mar 27, 2008
- SAMSUNG ELECTRONICS CO., LTD.
- Yong-jin Chun
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF CORRECTING A DESIGNED PATTERN OF A MASK
- Publication number 20080052660
- Publication date Feb 28, 2008
- Samsung Electronics Co., Ltd.
- Woo-seok SHIM
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methodology for estimating statistical distribution characteristics...
- Publication number 20070192077
- Publication date Aug 16, 2007
- Samsung Electronics, Co., Ltd.
- Dae-Wook Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ADJUSTING PATTERN DENSITY
- Publication number 20070174802
- Publication date Jul 26, 2007
- Jae-Pil SHIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methothology for estimating statistical distribution characteristic...
- Publication number 20070174030
- Publication date Jul 26, 2007
- Samsung Electronics Co., Ltd.
- Sung-Hee Yun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for verifying logic circuit
- Publication number 20070168896
- Publication date Jul 19, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Sang-ho Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods, Apparatus and Computer Program Products for Generating Sel...
- Publication number 20070094622
- Publication date Apr 26, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Jong-bae Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Event driven switch level simulation method and simulator
- Publication number 20060190862
- Publication date Aug 24, 2006
- Seuk-Whan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mask used in manufacturing highly-integrated circuit device, method...
- Publication number 20060099522
- Publication date May 11, 2006
- Samsung Electronics Co., Ltd.
- Chul-Hong Park
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods, apparatus and computer program products for generating sel...
- Publication number 20040111688
- Publication date Jun 10, 2004
- Jong-Bae Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Phase edge phase shift mask enforcing a width of a field gate image...
- Publication number 20040091794
- Publication date May 13, 2004
- SAMSUNG ELECTRONICS CO., LTD.
- Dong-Hyun Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask used in manufacturing highly-integrated circuit device, method...
- Publication number 20040043305
- Publication date Mar 4, 2004
- Samsung Electronics Co., Ltd.
- Chul-Hong Park
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Aggressor classification method for analyzing crosstalk of circuit
- Publication number 20030229869
- Publication date Dec 11, 2003
- SAMSUNG ELECTRONICS CO., LTD.
- Jae-Seok Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Continuously variable dummy pattern density generating systems, met...
- Publication number 20020116686
- Publication date Aug 22, 2002
- Jae-Pil Shin
- G06 - COMPUTING CALCULATING COUNTING

Moon-Hyun Yoo

Person

Patents Grantslast 30 patents

Method of inspecting a mask

Method of designing a mask layout

System for analyzing mask topography and method of forming image us...

Method and apparatus for verifying logic circuit

Mask set for microarray, method of fabricating mask set, and method...

Methodology for estimating statistical distribution characteristics...

Method and apparatus for designing fine pattern

Mask for forming fine pattern and method of forming the same

Event driven switch level simulation method and simulator

Method of creating a layout of a set of masks

Methothology for estimating statistical distribution characteristic...

Methods, apparatus and computer program products for generating sel...

Phase edge phase shift mask enforcing a width of a field gate image...

Aggressor classification method for analyzing crosstalk of circuit

Mask for manufacturing a highly-integrated circuit device

Continuously variable dummy pattern density generating systems, met...

Patents Applicationslast 30 patents

METHOD OF INSPECTING A MASK

Method of Designing a Mask Layout

MASK SET FOR MICROARRAY, METHOD OF FABRICATING MASK SET, AND METHOD...

MASK SET FOR MICROARRAY, METHOD OF FABRICATING MASK SET, AND METHOD...

System for analyzing mask topography and method of forming image us...

Mask for forming fine pattern and method of forming the same

Method and apparatus for designing fine pattern

Method of forming image contour for predicting semiconductor device...

METHOD OF CORRECTING A DESIGNED PATTERN OF A MASK

Methodology for estimating statistical distribution characteristics...

METHOD OF ADJUSTING PATTERN DENSITY

Methothology for estimating statistical distribution characteristic...

Method and apparatus for verifying logic circuit

Methods, Apparatus and Computer Program Products for Generating Sel...

Event driven switch level simulation method and simulator

Mask used in manufacturing highly-integrated circuit device, method...

Methods, apparatus and computer program products for generating sel...

Phase edge phase shift mask enforcing a width of a field gate image...

Mask used in manufacturing highly-integrated circuit device, method...

Aggressor classification method for analyzing crosstalk of circuit

Continuously variable dummy pattern density generating systems, met...