Membership
Tour
Register
Log in
Nagesh Tamarapalli
Follow
Person
Wilsonville, OR, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Enhanced diagnosis with limited failure cycles
Patent number
8,438,438
Issue date
May 7, 2013
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Compactor independent fault diagnosis
Patent number
8,301,414
Issue date
Oct 30, 2012
Mentor Graphics Corporation
Wu-Tung Cheng
G01 - MEASURING TESTING
Information
Patent Grant
Fault dictionaries for integrated circuit yield and quality analysi...
Patent number
7,987,442
Issue date
Jul 26, 2011
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced diagnosis with limited failure cycles
Patent number
7,840,862
Issue date
Nov 23, 2010
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Grant
Phase shifter with reduced linear dependency
Patent number
7,805,651
Issue date
Sep 28, 2010
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Phase shifter with reduced linear dependency
Patent number
7,653,851
Issue date
Jan 26, 2010
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Phase shifter with reduced linear dependency
Patent number
7,523,372
Issue date
Apr 21, 2009
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Determining and analyzing integrated circuit yield and quality
Patent number
7,512,508
Issue date
Mar 31, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for at-speed testing of digital circuits
Patent number
7,437,636
Issue date
Oct 14, 2008
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Phase shifter with reduced linear dependency
Patent number
7,263,641
Issue date
Aug 28, 2007
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Compactor independent fault diagnosis
Patent number
7,239,978
Issue date
Jul 3, 2007
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for at-speed testing of digital circuits
Patent number
6,966,021
Issue date
Nov 15, 2005
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Uniform testing of tristate nets in logic BIST
Patent number
6,920,597
Issue date
Jul 19, 2005
Thomas Hans Rinderknecht
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Phase shifter with reduced linear dependency
Patent number
6,874,109
Issue date
Mar 29, 2005
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for switching between multiple clocks
Patent number
6,452,426
Issue date
Sep 17, 2002
Nagesh Tamarapalli
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-phase test point insertion for built-in self test of integrat...
Patent number
6,070,261
Issue date
May 30, 2000
Mentor Graphics Corporation
Nagesh Tamarapalli
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multi-phase test point insertion for built-in self test of integrat...
Patent number
5,737,340
Issue date
Apr 7, 1998
Mentor Graphics Corporation
Nagesh Tamarapalli
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
ENHANCED DIAGNOSIS WITH LIMITED FAILURE CYCLES
Publication number
20130246869
Publication date
Sep 19, 2013
Mentor Graphics Corporation
Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
ENHANCED DIAGNOSIS WITH LIMITED FAILURE CYCLES
Publication number
20110126064
Publication date
May 26, 2011
Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
PHASE SHIFTER WITH REDUCED LINEAR DEPENDENCY
Publication number
20100083063
Publication date
Apr 1, 2010
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING AND ANALYZING INTEGRATED CIRCUIT YIELD AND QUALITY
Publication number
20090210183
Publication date
Aug 20, 2009
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PHASE SHIFTER WITH REDUCED LINEAR DEPENDENCY
Publication number
20090187800
Publication date
Jul 23, 2009
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
Phase shifter with reduced linear dependency
Publication number
20070300110
Publication date
Dec 27, 2007
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
COMPACTOR INDEPENDENT FAULT DIAGNOSIS
Publication number
20070283202
Publication date
Dec 6, 2007
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Enhanced diagnosis with limited failure cycles
Publication number
20070220381
Publication date
Sep 20, 2007
Yu Huang
G01 - MEASURING TESTING
Information
Patent Application
Determining and analyzing integrated circuit yield and quality
Publication number
20060066339
Publication date
Mar 30, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Fault dictionaries for integrated circuit yield and quality analysi...
Publication number
20060066338
Publication date
Mar 30, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for at-speed testing of digital circuits
Publication number
20060064616
Publication date
Mar 23, 2006
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
Integrated circuit yield and quality analysis methods and systems
Publication number
20060053357
Publication date
Mar 9, 2006
Janusz Rajski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Compactor independent fault diagnosis
Publication number
20050222816
Publication date
Oct 6, 2005
Wu-Tung Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Phase shifter with reduced linear dependency
Publication number
20050015688
Publication date
Jan 20, 2005
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
Uniform testing of tristate nets in logic BIST
Publication number
20040025096
Publication date
Feb 5, 2004
Thomas Hans Rinderknecht
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for at-speed testing of digital circuits
Publication number
20030097614
Publication date
May 22, 2003
Mentor Graphics Corporation
Janusz Rajski
G01 - MEASURING TESTING
Information
Patent Application
At-speed test using on-chip controller
Publication number
20030084390
Publication date
May 1, 2003
Mentor Graphics Corporation
Nagesh Tamarapalli
G06 - COMPUTING CALCULATING COUNTING