Salvatore P. Rizzo

Person

Norwood, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Burn-in test socket apparatus
- Patent number 5,865,639
- Issue date Feb 2, 1999
- Texas Instruments Incorporated
- Masahiro Fuchigami
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive interconnect system for semiconductor devices
- Patent number 5,571,027
- Issue date Nov 5, 1996
- Texas Instruments Incorporated
- Randal D. Roebuck
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive interconnect system for semiconductor devices
- Patent number 5,468,157
- Issue date Nov 21, 1995
- Texas Instruments Incorporated
- Randal D. Roebuck
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive interconnect system for semiconductor devices
- Patent number 5,468,158
- Issue date Nov 21, 1995
- Texas Instruments Incorporated
- Randal D. Roebuck
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive interconnect system for semiconductor devices
- Patent number 5,397,245
- Issue date Mar 14, 1995
- Texas Instruments Incorporated
- Randal D. Roebuck
- G01 - MEASURING TESTING
Information Patent Grant
Attachable, circuit-terminating, circuit board edge member
- Patent number 4,425,015
- Issue date Jan 10, 1984
- Texas Instruments Incorporated
- Salvatore P. Rizzo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask for an attachable, circuit-terminating, circuit board edge member
- Patent number 4,340,164
- Issue date Jul 20, 1982
- Texas Instruments Incorporated
- Salvatore P. Rizzo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for mounting electrically conductive wires to a substrate
- Patent number 4,193,181
- Issue date Mar 18, 1980
- Texas Instruments Incorporated
- Henry J. Boulanger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Keyboard apparatus
- Patent number 4,123,627
- Issue date Oct 31, 1978
- Texas Instruments Incorporated
- Henry J. Boulanger
- H01 - BASIC ELECTRIC ELEMENTS

Salvatore P. Rizzo

Person

Patents Grantslast 30 patents

Burn-in test socket apparatus

Non-destructive interconnect system for semiconductor devices

Non-destructive interconnect system for semiconductor devices

Non-destructive interconnect system for semiconductor devices

Non-destructive interconnect system for semiconductor devices

Attachable, circuit-terminating, circuit board edge member

Mask for an attachable, circuit-terminating, circuit board edge member

Method for mounting electrically conductive wires to a substrate

Keyboard apparatus