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Sammy L. Mok
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Probe card test apparatus and method
Patent number
8,531,202
Issue date
Sep 10, 2013
VeraConnex, LLC
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Construction structures and manufacturing processes for integrated...
Patent number
7,952,373
Issue date
May 31, 2011
Verigy (Singapore) Pte. Ltd.
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
High density interconnect system having rapid fabrication cycle
Patent number
7,884,634
Issue date
Feb 8, 2011
Verigy (Singapore) PTE, Ltd.
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
Probe card repair using coupons with spring contacts and separate a...
Patent number
7,876,087
Issue date
Jan 25, 2011
Innoconnex, Inc.
Sammy Mok
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
High density interconnect system having rapid fabrication cycle
Patent number
7,872,482
Issue date
Jan 18, 2011
Verigy (Singapore) Pte. Ltd.
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
High density interconnect system for IC packages and interconnect a...
Patent number
7,812,626
Issue date
Oct 12, 2010
Verigy (Singapore) Pte. Ltd.
Wilmer R. Bottoms
G01 - MEASURING TESTING
Information
Patent Grant
Massively parallel interface for electronic circuit
Patent number
7,772,860
Issue date
Aug 10, 2010
NanoNexus, Inc.
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
Systems for testing and packaging integrated circuits
Patent number
7,621,761
Issue date
Nov 24, 2009
NanoNexus, Inc.
Sammy Mok
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
High density interconnect system for IC packages and interconnect a...
Patent number
7,579,848
Issue date
Aug 25, 2009
NanoNexus, Inc.
Wilmer R. Bottoms
G01 - MEASURING TESTING
Information
Patent Grant
Massively parallel interface for electronic circuit
Patent number
7,403,029
Issue date
Jul 22, 2008
Nanonexus Corporation
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
High density interconnect system having rapid fabrication cycle
Patent number
7,382,142
Issue date
Jun 3, 2008
NanoNexus, Inc.
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced stress metal spring contactor
Patent number
7,247,035
Issue date
Jul 24, 2007
NanoNexus, Inc.
Sammy Mok
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Miniaturized contact spring
Patent number
7,137,830
Issue date
Nov 21, 2006
NanoNexus, Inc.
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Massively parallel interface for electronic circuit
Patent number
7,138,818
Issue date
Nov 21, 2006
NanoNexus, Inc.
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
Miniaturized contact spring
Patent number
7,126,220
Issue date
Oct 24, 2006
NanoNexus, Inc.
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Construction structures and manufacturing processes for integrated...
Patent number
7,126,358
Issue date
Oct 24, 2006
NanoNexus, Inc.
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Massively parallel interface for electronic circuit
Patent number
7,009,412
Issue date
Mar 7, 2006
NanoNexus, Inc.
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
Construction structures and manufacturing processes for probe card...
Patent number
6,917,525
Issue date
Jul 12, 2005
NanoNexus, Inc.
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Construction structures and manufacturing processes for integrated...
Patent number
6,815,961
Issue date
Nov 9, 2004
NanoNexus, Inc.
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Massively parallel interface for electronic circuits
Patent number
6,812,718
Issue date
Nov 2, 2004
NanoNexus, Inc.
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Grant
Construction structures and manufacturing processes for integrated...
Patent number
6,799,976
Issue date
Oct 5, 2004
NanoNexus, Inc.
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Systems for testing and packaging integrated circuits
Patent number
6,791,171
Issue date
Sep 14, 2004
NanoNexus, Inc.
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Mosaic decal probe
Patent number
6,710,609
Issue date
Mar 23, 2004
NanoNexus, Inc.
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Grant
Multiple chip module assembly for top of mother board
Patent number
5,729,433
Issue date
Mar 17, 1998
Micromodule Systems, Inc.
Sammy L. Mok
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mounting assembly for multiple chip module with more than one subst...
Patent number
5,703,753
Issue date
Dec 30, 1997
MicroModule Systems Inc.
Sammy L. Mok
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple chip module mounting assembly and computer using same
Patent number
5,619,399
Issue date
Apr 8, 1997
Micromodule Systems, Inc.
Sammy L. Mok
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Probe Card Test Apparatus And Method
Publication number
20100213960
Publication date
Aug 26, 2010
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
HIGH DENSITY INTERCONNECT SYSTEM FOR IC PACKAGES AND INTERCONNECT A...
Publication number
20100066393
Publication date
Mar 18, 2010
W. R. Bottoms
G01 - MEASURING TESTING
Information
Patent Application
High Density Interconnect System Having Rapid Fabrication Cycle
Publication number
20090153165
Publication date
Jun 18, 2009
Fu Chiung CHONG
G01 - MEASURING TESTING
Information
Patent Application
Membrane spring fabrication process
Publication number
20090064498
Publication date
Mar 12, 2009
InnoConnex, Inc.
Sammy Mok
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
MASSIVELY PARALLEL INTERFACE FOR ELECTRONIC CIRCUIT
Publication number
20080297186
Publication date
Dec 4, 2008
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Application
HIGH DENSITY INTERCONNECT SYSTEM HAVING RAPID FABRICATION CYCLE
Publication number
20080246500
Publication date
Oct 9, 2008
Fu Chiung CHONG
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS FOR TESTING AND PACKAGING INTEGRATED CIRCUITS
Publication number
20080090429
Publication date
Apr 17, 2008
Sammy Mok
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Compliance partitioning in testing of integrated circuits
Publication number
20080061808
Publication date
Mar 13, 2008
Sammy Mok
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Miniaturized Contact Spring
Publication number
20070144841
Publication date
Jun 28, 2007
Fu Chiung Chong
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MASSIVELY PARALLEL INTERFACE FOR ELECTRONIC CIRCUIT
Publication number
20070057684
Publication date
Mar 15, 2007
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Application
Construction Structures and Manufacturing Processes for Integrated...
Publication number
20070046304
Publication date
Mar 1, 2007
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
Systems for testing and packaging integrated circuits
Publication number
20060240690
Publication date
Oct 26, 2006
Sammy Mok
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
High density interconnect system for IC packages and interconnect a...
Publication number
20060186906
Publication date
Aug 24, 2006
W. R. Bottoms
G01 - MEASURING TESTING
Information
Patent Application
Massively parallel interface for electronic circuit
Publication number
20060119377
Publication date
Jun 8, 2006
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Application
High density interconnect system having rapid fabrication cycle
Publication number
20050275418
Publication date
Dec 15, 2005
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Application
Standardized layout patterns and routing structures for integrated...
Publication number
20050068054
Publication date
Mar 31, 2005
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
Massively parallel interface for electronic circuit
Publication number
20050051353
Publication date
Mar 10, 2005
Fu Chiung Chong
G01 - MEASURING TESTING
Information
Patent Application
Construction structures and manufacturing processes for integrated...
Publication number
20050042932
Publication date
Feb 24, 2005
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
Systems for testing and packaging integrated circuits
Publication number
20050026476
Publication date
Feb 3, 2005
Sammy Mok
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Mosaic decal probe
Publication number
20040075455
Publication date
Apr 22, 2004
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
Construction structures and manufacturing processes for integrated...
Publication number
20040022042
Publication date
Feb 5, 2004
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
MOSAIC DECAL PROBE
Publication number
20040008045
Publication date
Jan 15, 2004
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
Miniaturized contact spring
Publication number
20030218244
Publication date
Nov 27, 2003
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Miniaturized contact spring
Publication number
20030214045
Publication date
Nov 20, 2003
Syamal Kumar Lahiri
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Construction structures and manufacturing processes for probe card...
Publication number
20030099097
Publication date
May 29, 2003
Sammy Mok
G01 - MEASURING TESTING
Information
Patent Application
Systems for testing and packaging integrated circuits
Publication number
20020171133
Publication date
Nov 21, 2002
Sammy Mok
G01 - MEASURING TESTING