Seiji Ishikawa

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pneumatic tire
- Patent number 9,440,500
- Issue date Sep 13, 2016
- Bridgestone Corporation
- Toshiyuki Watanabe
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Pneumatic tire
- Patent number 9,327,556
- Issue date May 3, 2016
- Bridgestone Corporation
- Fumio Takahashi
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Diagnosis system and diagnosis method for lithium ion secondary bat...
- Patent number 9,147,913
- Issue date Sep 29, 2015
- Hitachi, Ltd.
- Toshiharu Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Maskless exposure method
- Patent number 8,274,642
- Issue date Sep 25, 2012
- Hitachi Displays, Ltd.
- Hiroyasu Matsuura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pneumatic tire
- Patent number 8,151,842
- Issue date Apr 10, 2012
- Bridgestone Corporation
- Fumio Takahashi
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method of manufacturing display unit
- Patent number 7,993,179
- Issue date Aug 9, 2011
- Hitachi Displays, Ltd.
- Seiji Ishikawa
- G02 - OPTICS
Information Patent Grant
Semiconductor device yield prediction system and method
- Patent number 7,945,410
- Issue date May 17, 2011
- Hitachi, Ltd.
- Natsuyo Morioka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Polishing apparatus including turntable with polishing surface of d...
- Patent number RE39262
- Issue date Sep 5, 2006
- Ebara Corporation
- Masayoshi Hirose
- 451 - Abrading
Information Patent Grant
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Patent number 6,966,821
- Issue date Nov 22, 2005
- Kabushiki Kaisha Toshiba
- Katsuya Okumura
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing apparatus
- Patent number RE38878
- Issue date Nov 15, 2005
- Ebara Corporation
- Masayoshi Hirose
- 451 - Abrading
Information Patent Grant
Process management system
- Patent number 6,757,621
- Issue date Jun 29, 2004
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,628,817
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Polishing apparatus
- Patent number RE38228
- Issue date Aug 19, 2003
- Ebara Corporation
- Masayoshi Hirose
- 451 - Abrading
Information Patent Grant
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Patent number 6,547,638
- Issue date Apr 15, 2003
- Ebara Corporation
- Katsuya Okumura
- B24 - GRINDING POLISHING
Information Patent Grant
Process control system
- Patent number 6,542,830
- Issue date Apr 1, 2003
- Hitachi, Ltd.
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,529,619
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Patent number 6,443,808
- Issue date Sep 3, 2002
- Kabushiki Kaisha Toshiba
- Katsuya Okumura
- B08 - CLEANING
Information Patent Grant
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Patent number 6,439,971
- Issue date Aug 27, 2002
- Kabushiki Kaisha Toshiba
- Katsuya Okumura
- B08 - CLEANING
Information Patent Grant
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Patent number 6,425,806
- Issue date Jul 30, 2002
- Kabushiki Kaisha Toshiba
- Katsuya Okumura
- B08 - CLEANING
Information Patent Grant
Semiconductor failure analysis system
- Patent number 6,404,911
- Issue date Jun 11, 2002
- Hitachi, Ltd.
- Kazuko Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,339,653
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,330,352
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for holding workpiece
- Patent number 6,290,583
- Issue date Sep 18, 2001
- Ebara Corporation
- Hiroo Suzuki
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Patent number 6,273,802
- Issue date Aug 14, 2001
- Kabushiki Kaisha Toshiba
- Katsuya Okumura
- B08 - CLEANING
Information Patent Grant
Inspection system and method using separate processors for processi...
- Patent number 6,185,322
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis system
- Patent number 6,185,324
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Kazuko Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Polishing apparatus including turntable with polishing surface of d...
- Patent number 6,102,786
- Issue date Aug 15, 2000
- Ebara Corporation
- Masayoshi Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
System for quality control where inspection frequency of inspection...
- Patent number 6,002,989
- Issue date Dec 14, 1999
- Hitachi, Ltd.
- Masataka Shiba
- G05 - CONTROLLING REGULATING
Information Patent Grant
Polishing apparatus including turntable with polishing surface of d...
- Patent number 5,888,126
- Issue date Mar 30, 1999
- Ebara Corporation
- Masayoshi Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Patent number 5,885,138
- Issue date Mar 23, 1999
- Ebara Corporation
- Katsuya Okumura
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
PNEUMATIC TIRE
- Publication number 20140224400
- Publication date Aug 14, 2014
- Bridgestone Corporation
- Toshiyuki WATANABE
- B60 - VEHICLES IN GENERAL
Information Patent Application
PNEUMATIC TIRE AND METHOD OF PRODUCING THE SAME
- Publication number 20140166179
- Publication date Jun 19, 2014
- Bridgestone Corporation
- Toshiyuki WATANABE
- B60 - VEHICLES IN GENERAL
Information Patent Application
DIAGNOSIS SYSTEM AND DIAGNOSIS METHOD FOR LITHIUM ION SECONDARY BAT...
- Publication number 20120259569
- Publication date Oct 11, 2012
- Toshiharu Miwa
- G01 - MEASURING TESTING
Information Patent Application
MASKLESS EXPOSURE METHOD
- Publication number 20090262319
- Publication date Oct 22, 2009
- Hiroyasu Matsuura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PNEUMATIC TIRE
- Publication number 20090165909
- Publication date Jul 2, 2009
- BRIDGESTONE CORPORATION
- Fumio Takahashi
- B60 - VEHICLES IN GENERAL
Information Patent Application
PNEUMATIC TIRE
- Publication number 20090165908
- Publication date Jul 2, 2009
- BRIDGESTONE CORPORATION
- Fumio Takahashi
- B60 - VEHICLES IN GENERAL
Information Patent Application
Liquid Crystal Display Device with Evaluation Patterns Disposed The...
- Publication number 20080241486
- Publication date Oct 2, 2008
- Seiji Ishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING DISPLAY UNIT
- Publication number 20080176478
- Publication date Jul 24, 2008
- Seiji ISHIKAWA
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR DEVICE YIELD PREDICTION SYSTEM AND METHOD
- Publication number 20080140330
- Publication date Jun 12, 2008
- Natsuyo Morioka
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Publication number 20080090501
- Publication date Apr 17, 2008
- Katsuya Okumura
- B08 - CLEANING
Information Patent Application
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Publication number 20060009130
- Publication date Jan 12, 2006
- Katsuya Okumura
- B08 - CLEANING
Information Patent Application
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Publication number 20030148714
- Publication date Aug 7, 2003
- Katsuya Okumura
- B08 - CLEANING
Information Patent Application
Process management system
- Publication number 20030130806
- Publication date Jul 10, 2003
- Hitachi, Ltd
- Fumio Mizuno
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20020034326
- Publication date Mar 21, 2002
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010038708
- Publication date Nov 8, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Publication number 20010014572
- Publication date Aug 16, 2001
- Katsuya Okumura
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Publication number 20010010996
- Publication date Aug 2, 2001
- Katsuya Okumura
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Publication number 20010011000
- Publication date Aug 2, 2001
- Katsuya Okumura
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Method and apparatus for dry-in, dry-out polishing and washing of a...
- Publication number 20010010997
- Publication date Aug 2, 2001
- Katsuya Okumura
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Inspection data analyzing system
- Publication number 20010001015
- Publication date May 10, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis system
- Publication number 20010000460
- Publication date Apr 26, 2001
- Kazuko Ishihara
- G01 - MEASURING TESTING

Seiji Ishikawa

Person

Patents Grantslast 30 patents

Pneumatic tire

Pneumatic tire

Diagnosis system and diagnosis method for lithium ion secondary bat...

Maskless exposure method

Pneumatic tire

Method of manufacturing display unit

Semiconductor device yield prediction system and method

Polishing apparatus including turntable with polishing surface of d...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Polishing apparatus

Process management system

Inspection data analyzing system

Polishing apparatus

Method and apparatus for dry-in, dry-out polishing and washing of a...

Process control system

Inspection data analyzing system

Method and apparatus for dry-in, dry-out polishing and washing of a...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Semiconductor failure analysis system

Inspection data analyzing system

Inspection data analyzing system

Apparatus for holding workpiece

Method and apparatus for dry-in, dry-out polishing and washing of a...

Inspection system and method using separate processors for processi...

Semiconductor failure analysis system

Polishing apparatus including turntable with polishing surface of d...

System for quality control where inspection frequency of inspection...

Polishing apparatus including turntable with polishing surface of d...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Patents Applicationslast 30 patents

PNEUMATIC TIRE

PNEUMATIC TIRE AND METHOD OF PRODUCING THE SAME

DIAGNOSIS SYSTEM AND DIAGNOSIS METHOD FOR LITHIUM ION SECONDARY BAT...

MASKLESS EXPOSURE METHOD

PNEUMATIC TIRE

PNEUMATIC TIRE

Liquid Crystal Display Device with Evaluation Patterns Disposed The...

METHOD OF MANUFACTURING DISPLAY UNIT

SEMICONDUCTOR DEVICE YIELD PREDICTION SYSTEM AND METHOD

Method and apparatus for dry-in, dry-out polishing and washing of a...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Process management system

Inspection data analyzing system

Inspection data analyzing system

Method and apparatus for dry-in, dry-out polishing and washing of a...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Method and apparatus for dry-in, dry-out polishing and washing of a...

Inspection data analyzing system

Semiconductor failure analysis system