Seizi Huzino

Person

Okazaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor substrate structure for producing two isolated circui...
- Patent number 5,461,253
- Issue date Oct 24, 1995
- Nippon Steel Inc.
- Kazuhiro Tsuruta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor circuit structure and method for making the same
- Patent number 5,204,282
- Issue date Apr 20, 1993
- Nippon Soken, Inc.
- Kazuhiro Tsuruta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal-etched matching faces on semiconductor chip and supporting...
- Patent number 5,153,700
- Issue date Oct 6, 1992
- Nippondenso Co., Ltd.
- Fumio Ohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polycrystalline silicon active layer for good carrier mobility
- Patent number 4,992,846
- Issue date Feb 12, 1991
- Nippon Soken, Inc.
- Nobuyoshi Sakakibara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor pressure sensor and method for bonding semiconductor...
- Patent number 4,986,861
- Issue date Jan 22, 1991
- Nippon Soken, Inc.
- Minoru Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Thin film electroluminescent element
- Patent number 4,983,469
- Issue date Jan 8, 1991
- Nippon Soken, Inc.
- Seizi Huzino
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Direct-heated flow measuring apparatus having improved response cha...
- Patent number 4,912,975
- Issue date Apr 3, 1990
- Nippon Soken, Inc.
- Minoru Ohta
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Direct-heated flow measuring apparatus having improved response cha...
- Patent number 4,870,860
- Issue date Oct 3, 1989
- Nippon Soken, Inc.
- Minoru Ohta
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Direct-heated flow measuring apparatus having improved sensitivity...
- Patent number 4,843,882
- Issue date Jul 4, 1989
- Nippon Soken, Inc.
- Minoru Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor pressure sensor with method diaphragm
- Patent number 4,840,067
- Issue date Jun 20, 1989
- Nippon Soken, Inc.
- Minoru Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Direct-heated gas-flow measuring apparatus
- Patent number 4,785,662
- Issue date Nov 22, 1988
- Nippon Soken, Inc.
- Minoru Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Direct-heated flow measuring apparatus having uniform characteristics
- Patent number 4,756,190
- Issue date Jul 12, 1988
- Nippon Soken, Inc.
- Minoru Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Direct-heated gas-flow measuring apparatus
- Patent number 4,735,099
- Issue date Apr 5, 1988
- Nippon Soken, Inc.
- Minoru Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Microwave probe and rotary body detecting apparatus using the same
- Patent number 4,700,127
- Issue date Oct 13, 1987
- Nippon Soken, Inc.
- Kunihiko Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Direct-heated flow measuring apparatus having film resistor
- Patent number 4,688,425
- Issue date Aug 25, 1987
- Nippon Soken, Inc.
- Kenji Kanehara
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Direct-heated gas-flow measuring apparatus
- Patent number 4,627,279
- Issue date Dec 9, 1986
- Nippon Soken, Inc.
- Minoru Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for output control of internal combustion engine
- Patent number 4,489,695
- Issue date Dec 25, 1984
- Nippon Soken, Inc.
- Tokio Kohama
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Output control system for multicylinder internal combustion engine
- Patent number 4,434,767
- Issue date Mar 6, 1984
- Nippon Soken, Inc.
- Tokio Kohama
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS

Seizi Huzino

Person

Patents Grantslast 30 patents

Semiconductor substrate structure for producing two isolated circui...

Semiconductor circuit structure and method for making the same

Crystal-etched matching faces on semiconductor chip and supporting...

Polycrystalline silicon active layer for good carrier mobility

Semiconductor pressure sensor and method for bonding semiconductor...

Thin film electroluminescent element

Direct-heated flow measuring apparatus having improved response cha...

Direct-heated flow measuring apparatus having improved response cha...

Direct-heated flow measuring apparatus having improved sensitivity...

Semiconductor pressure sensor with method diaphragm

Direct-heated gas-flow measuring apparatus

Direct-heated flow measuring apparatus having uniform characteristics

Direct-heated gas-flow measuring apparatus

Microwave probe and rotary body detecting apparatus using the same

Direct-heated flow measuring apparatus having film resistor

Direct-heated gas-flow measuring apparatus

Method and system for output control of internal combustion engine

Output control system for multicylinder internal combustion engine