Shunichi Watanabe

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam generating apparatus, charged particle beam a...
- Patent number 9,548,182
- Issue date Jan 17, 2017
- Hitachi High-Technologies Corporation
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam radiation apparatus
- Patent number 8,803,411
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Shunichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun
- Patent number 8,669,535
- Issue date Mar 11, 2014
- Hitachi High-Technologies Corporation
- Mikio Ichihashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron gun and electron beam applied device using...
- Patent number 7,732,764
- Issue date Jun 8, 2010
- Hitachi, Ltd.
- Tadashi Fujieda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and scanning electron microscope for measuring width of mate...
- Patent number 7,385,196
- Issue date Jun 10, 2008
- Hitachi High-Technologies Corporation
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and electron energy loss...
- Patent number 7,285,776
- Issue date Oct 23, 2007
- Hitachi High-Technologies Corporation
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and scanning electron microscope for measuring dimension of...
- Patent number 6,791,084
- Issue date Sep 14, 2004
- Hitachi High-Technologies Corporation
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240379318
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Voltage Insulating Structure, Charged Particle Gun, and Charge...
- Publication number 20240242917
- Publication date Jul 18, 2024
- Hitachi High-Tech Corporation
- Yasuchika SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM GENERATING APPARATUS, CHARGED PARTICLE BEAM A...
- Publication number 20150179387
- Publication date Jun 25, 2015
- Hitachi High-Technologies Corporation
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM RADIATION APPARATUS
- Publication number 20130140977
- Publication date Jun 6, 2013
- Hitachi High-Technologies Corporation
- Shunichi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20130087703
- Publication date Apr 11, 2013
- Takashi Onishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN
- Publication number 20120062094
- Publication date Mar 15, 2012
- Mikio Ichihashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIELD EMISSION ELECTRON GUN AND ELECTRON BEAM APPLIED DEVICE USING...
- Publication number 20080029700
- Publication date Feb 7, 2008
- TADASHI FUJIEDA
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning transmission electron microscope and electron energy loss...
- Publication number 20050285037
- Publication date Dec 29, 2005
- Kuniyasu Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and scanning electron microscope for measuring width of mate...
- Publication number 20050006581
- Publication date Jan 13, 2005
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and scanning electron microscope for measuring width of mate...
- Publication number 20030071214
- Publication date Apr 17, 2003
- Goroku Shimoma
- H01 - BASIC ELECTRIC ELEMENTS

Shunichi Watanabe

Person

Patents Grantslast 30 patents

Charged particle beam generating apparatus, charged particle beam a...

Charged particle beam radiation apparatus

Electron gun

Field emission electron gun and electron beam applied device using...

Method and scanning electron microscope for measuring width of mate...

Scanning transmission electron microscope and electron energy loss...

Method and scanning electron microscope for measuring dimension of...

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

High-Voltage Insulating Structure, Charged Particle Gun, and Charge...

CHARGED PARTICLE BEAM GENERATING APPARATUS, CHARGED PARTICLE BEAM A...

CHARGED PARTICLE BEAM RADIATION APPARATUS

ELECTRON MICROSCOPE

ELECTRON GUN

FIELD EMISSION ELECTRON GUN AND ELECTRON BEAM APPLIED DEVICE USING...

Scanning transmission electron microscope and electron energy loss...

Method and scanning electron microscope for measuring width of mate...

Method and scanning electron microscope for measuring width of mate...