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Stephen Kenneth Sunter
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Ontario, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Activity coverage assessment of circuit designs under test stimuli
Patent number
11,455,447
Issue date
Sep 27, 2022
SIEMENS INDUSTRY SOFTWARE INC.
Stephen Kenneth Sunter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Analog fault simulation control with multiple circuit representations
Patent number
10,353,789
Issue date
Jul 16, 2019
Mentor Graphics Corporation
Tina Najibi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect injection for transistor-level fault simulation
Patent number
9,372,946
Issue date
Jun 21, 2016
Mentor Graphics Corporation
Stephen Kenneth Sunter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit and method for measuring delays between edges of signals of...
Patent number
9,134,374
Issue date
Sep 15, 2015
Mentor Graphics Corporation
Stephen Kenneth Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Defect injection for transistor-level fault simulation
Patent number
8,984,460
Issue date
Mar 17, 2015
Mentor Graphics Corporation
Stephen Kenneth Sunter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit and method for simultaneously measuring multiple changes in...
Patent number
8,489,947
Issue date
Jul 16, 2013
Mentor Graphics Corporation
Stephen Kenneth Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for measuring delay of high speed signals
Patent number
7,453,255
Issue date
Nov 18, 2008
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Boundary scan with strobed pad driver enable
Patent number
7,219,282
Issue date
May 15, 2007
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for measuring jitter of high speed signals
Patent number
7,158,899
Issue date
Jan 2, 2007
LogicVision, Inc.
Stephen K. Sunter
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Circuit and method for adding parametric test capability to digital...
Patent number
7,159,159
Issue date
Jan 2, 2007
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Method, system and program product for testing and/or diagnosing ci...
Patent number
6,961,871
Issue date
Nov 1, 2005
LogicVision, Inc.
Givargis A. Danialy
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for testing high speed data circuits
Patent number
6,895,535
Issue date
May 17, 2005
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for accurately applying a voltage to a node of a...
Patent number
6,885,213
Issue date
Apr 26, 2005
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for determining the location of defect in a circuit
Patent number
6,717,415
Issue date
Apr 6, 2004
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit for testing high frequency mixed signal circuits...
Patent number
6,703,820
Issue date
Mar 9, 2004
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Method for scan controlled sequential sampling of analog signals an...
Patent number
6,691,269
Issue date
Feb 10, 2004
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for detecting transient voltages on a dc power s...
Patent number
6,590,412
Issue date
Jul 8, 2003
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit for testing DC parameters of circuit input and o...
Patent number
6,586,921
Issue date
Jul 1, 2003
LogicVision, Inc.
Stephen Kenneth Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Circuit synthesis method using technology parameters extracting cir...
Patent number
6,567,971
Issue date
May 20, 2003
LogicVision, Inc.
Walter H. Banzhaf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and circuit for testing high frequency mixed signal circuits...
Patent number
6,492,798
Issue date
Dec 10, 2002
LogicVision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit for built in self test of phase locked loops
Patent number
6,396,889
Issue date
May 28, 2002
LogicVision, Inc.
Stephen Kenneth Sunter
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Test circuit and method for measuring switching point voltages and...
Patent number
6,211,803
Issue date
Apr 3, 2001
LogicVision, Inc.
Stephen Kenneth Sunter
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable clock signal generation circuits and methods for gener...
Patent number
6,204,694
Issue date
Mar 20, 2001
LogicVision, Inc.
Stephen Kenneth Sunter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Bist architecture for measurement of integrated circuit delays
Patent number
5,923,676
Issue date
Jul 13, 1999
Logic Vision, Inc.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing digital to analog and analog to di...
Patent number
5,659,312
Issue date
Aug 19, 1997
LogicVision, Inc.
Stephen K. Sunter
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Multiple clock rate test apparatus for testing digital systems
Patent number
5,349,587
Issue date
Sep 20, 1994
Northern Telecom Limited
Benoit Nadeau-Dostie
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Circuit for generating non-overlapping two-phase clocks
Patent number
4,912,340
Issue date
Mar 27, 1990
Northern Telecom
Philip S. Wilcox
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Integrated circuit chip manufacture
Patent number
4,885,625
Issue date
Dec 5, 1989
Northern Telecom Limited
Stephen K. Sunter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Current-mirror-biased pre-charged logic circuit
Patent number
4,797,580
Issue date
Jan 10, 1989
Northern Telecom Limited
Stephen K. Sunter
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Programmable logic array
Patent number
4,659,948
Issue date
Apr 21, 1987
Northern Telecom Limited
Stephen K. Sunter
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
ANALOG FAULT SIMULATION CONTROL WITH MULTIPLE CIRCUIT REPRESENTATIONS
Publication number
20190236232
Publication date
Aug 1, 2019
Mentor Graphics Corporation
Tina Najibi
G01 - MEASURING TESTING
Information
Patent Application
Activity Coverage Assessment of Circuit Designs Under Test Stimuli
Publication number
20190179987
Publication date
Jun 13, 2019
Mentor Graphics Corporation
Stephen Kenneth Sunter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Circuit and Method for Measuring Delays between Edges of Signals of...
Publication number
20140208178
Publication date
Jul 24, 2014
Mentor Graphics Corporation
Stephen Kenneth Sunter
G01 - MEASURING TESTING
Information
Patent Application
Defect Injection For Transistor-Level Fault Simulation
Publication number
20140059507
Publication date
Feb 27, 2014
Mentor Graphics Corporation
Stephen Kenneth Sunter
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Circuit And Method For Simultaneously Measuring Multiple Changes In...
Publication number
20130305111
Publication date
Nov 14, 2013
Mentor Graphics Corporation
Stephen Kenneth Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit And Method For Simultaneously Measuring Multiple Changes In...
Publication number
20110202804
Publication date
Aug 18, 2011
Mentor Graphics Corporation
Stephen Kenneth Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for low frequency testing of high frequency sign...
Publication number
20050229053
Publication date
Oct 13, 2005
LogicVision, Inc., 101 Metro Drive, 3rd Floor, San Jose, CA, 95110
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for measuring delay of high speed signals
Publication number
20050111537
Publication date
May 26, 2005
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for measuring jitter of high speed signals
Publication number
20050069031
Publication date
Mar 31, 2005
Stephen K. Sunter
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Method for testing parameters of high speed data signals
Publication number
20040119455
Publication date
Jun 24, 2004
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for testing high speed data circuits
Publication number
20040123197
Publication date
Jun 24, 2004
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Boundary scan with strobed pad driver enable
Publication number
20040098648
Publication date
May 20, 2004
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for accurately applying a voltage to a node of a...
Publication number
20040051551
Publication date
Mar 18, 2004
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for adding parametric test capability to digital...
Publication number
20030208708
Publication date
Nov 6, 2003
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for determining the location of defect in a circuit
Publication number
20030146763
Publication date
Aug 7, 2003
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Method and circuit for testing high frequency mixed signal circuits...
Publication number
20030071606
Publication date
Apr 17, 2003
LOGICVISION, INC.
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Circuit and method for detecting transient voltages on a dc power s...
Publication number
20020196048
Publication date
Dec 26, 2002
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Method and circuit for testing high frequency mixed signal circuits...
Publication number
20020158620
Publication date
Oct 31, 2002
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Method for scan controlled sequential sampling of analog signals an...
Publication number
20020099990
Publication date
Jul 25, 2002
Stephen K. Sunter
G01 - MEASURING TESTING
Information
Patent Application
Method,system and program product for testing and/or diagnosing cir...
Publication number
20020073374
Publication date
Jun 13, 2002
Givargis A. Danialy
G01 - MEASURING TESTING