Membership
Tour
Register
Log in
Steven L. Hamren
Follow
Person
Boise, ID, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Electronic component assemblies with electrically conductive bonds
Patent number
7,456,504
Issue date
Nov 25, 2008
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Methods for processing semiconductor devices in a singulated form
Patent number
7,135,345
Issue date
Nov 14, 2006
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for processing semiconductor devices in a sing...
Patent number
7,129,721
Issue date
Oct 31, 2006
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for processing semiconductor devices in a singulated form
Patent number
7,126,228
Issue date
Oct 24, 2006
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Method for processing semiconductor devices in a singulated form
Patent number
7,122,389
Issue date
Oct 17, 2006
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for handling semiconductor components
Patent number
6,579,399
Issue date
Jun 17, 2003
Steven L. Hamren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Carrier, method and system for handling semiconductor components
Patent number
6,543,512
Issue date
Apr 8, 2003
Micron Technology, Inc.
Steven L. Hamren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,504,391
Issue date
Jan 7, 2003
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,504,390
Issue date
Jan 7, 2003
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,492,826
Issue date
Dec 10, 2002
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor devices having mirrored terminal arrangements, device...
Patent number
6,490,188
Issue date
Dec 3, 2002
Micron Technology, Inc.
James P. Nuxoll
G11 - INFORMATION STORAGE
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,483,332
Issue date
Nov 19, 2002
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,459,289
Issue date
Oct 1, 2002
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,459,288
Issue date
Oct 1, 2002
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor devices having mirrored terminal arrangements, device...
Patent number
6,442,056
Issue date
Aug 27, 2002
Micron Technology, Inc.
James P. Nuxoll
G11 - INFORMATION STORAGE
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,388,459
Issue date
May 14, 2002
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Compliant contactor for testing semiconductors
Patent number
6,362,639
Issue date
Mar 26, 2002
Micron Technology, Inc.
Justin L. Lawrence
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor devices having mirrored terminal arrangements, device...
Patent number
6,307,769
Issue date
Oct 23, 2001
Micron Technology, Inc.
James P. Nuxoll
G11 - INFORMATION STORAGE
Information
Patent Grant
Extended length, high frequency contactor block
Patent number
6,293,817
Issue date
Sep 25, 2001
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Conductive bump array contactors having an ejector and methods of t...
Patent number
6,265,886
Issue date
Jul 24, 2001
Micron Technology, Inc.
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Grant
Compliant contactor for testing semiconductors
Patent number
6,259,263
Issue date
Jul 10, 2001
Micron Technology, Inc.
Justin L. Lawrence
G01 - MEASURING TESTING
Information
Patent Grant
Tray for processing and/or shipping integrated circuit device
Patent number
5,927,503
Issue date
Jul 27, 1999
Micron Technology, Inc.
Leland R. Nevill
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for processing and/or shipping integrated circuit devices
Patent number
5,731,230
Issue date
Mar 24, 1998
Micron Technology, Inc.
Leland R. Nevill
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Methods for processing semiconductor devices in a singulated form
Publication number
20070155029
Publication date
Jul 5, 2007
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Imaging test socket, system, and method of testing an image sensor...
Publication number
20060284631
Publication date
Dec 21, 2006
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for processing semiconductor devices in a sing...
Publication number
20050042782
Publication date
Feb 24, 2005
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for processing semiconductor devices in a sing...
Publication number
20050017739
Publication date
Jan 27, 2005
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for processing semiconductor devices in a sing...
Publication number
20050014301
Publication date
Jan 20, 2005
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for processing semiconductor devices in a sing...
Publication number
20040212389
Publication date
Oct 28, 2004
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor devices having mirrored terminal arrangements, device...
Publication number
20020044476
Publication date
Apr 18, 2002
James P. Nuxoll
G11 - INFORMATION STORAGE
Information
Patent Application
Conductive bump array contactors having an ejector and methods of t...
Publication number
20020011860
Publication date
Jan 31, 2002
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Conductive bump array contactors having an ejector and methods of t...
Publication number
20020008532
Publication date
Jan 24, 2002
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Conductive bump array contactors having an ejector and methods of t...
Publication number
20020008531
Publication date
Jan 24, 2002
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Conductive bump array contactors having an ejector and methods of t...
Publication number
20020000817
Publication date
Jan 3, 2002
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Conductive bump array contactors having an ejector and methods of t...
Publication number
20010045838
Publication date
Nov 29, 2001
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Conductive bump array contactors having an ejector and methods of t...
Publication number
20010040463
Publication date
Nov 15, 2001
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Compliant contactor for testing semiconductors
Publication number
20010026167
Publication date
Oct 4, 2001
Justin L. Lawrence
G01 - MEASURING TESTING
Information
Patent Application
Conductive bump array contactors having an ejector and methods of t...
Publication number
20010024128
Publication date
Sep 27, 2001
Steven L. Hamren
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor devices having mirrored terminal arrangements, device...
Publication number
20010022740
Publication date
Sep 20, 2001
James P. Nuxoll
G11 - INFORMATION STORAGE