Takashi YAMATO

Person

Kakogawa-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample measuring apparatus and sample measuring method
- Patent number 11,422,143
- Issue date Aug 23, 2022
- Sysmex Corporation
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and liquid aspirating method
- Patent number 10,908,175
- Issue date Feb 2, 2021
- Sysmex Corporation
- Hiroshi Kurono
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzing method and specimen analyzing apparatus
- Patent number 10,261,016
- Issue date Apr 16, 2019
- Sysmex Corporation
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer with liquid aspirating unit and liquid surface dete...
- Patent number 9,541,567
- Issue date Jan 10, 2017
- SYSMEX CORPORATION
- Hiroshi Kurono
- G01 - MEASURING TESTING
Information Patent Grant
Specimen processing apparatus that determines whether a moveable se...
- Patent number 9,395,380
- Issue date Jul 19, 2016
- SYSMEX CORPORATION
- Takashi Yamato
- G05 - CONTROLLING REGULATING
Information Patent Grant
Specimen analyzing method and specimen analyzing apparatus
- Patent number 9,316,583
- Issue date Apr 19, 2016
- Sysmex Corporation
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus
- Patent number 9,176,155
- Issue date Nov 3, 2015
- Sysmex Corporation
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus
- Patent number 9,157,924
- Issue date Oct 13, 2015
- Sysmex Corporation
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Grant
Throughput information generating apparatus of sample analyzer, sam...
- Patent number 9,097,689
- Issue date Aug 4, 2015
- SYSMEX CORPORATION
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzing apparatus and specimen analyzing method
- Patent number 9,068,956
- Issue date Jun 30, 2015
- Sysmex Corporation
- Kazuya Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzing method and specimen analyzing apparatus
- Patent number 9,028,756
- Issue date May 12, 2015
- Sysmex Corporation
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzing method and specimen analyzing apparatus
- Patent number 8,545,760
- Issue date Oct 1, 2013
- Sysmex Corporation
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing apparatus and sample rack transporting method
- Patent number 8,455,256
- Issue date Jun 4, 2013
- Sysmex Corporation
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Grant
Specimen analyzing apparatus and specimen analyzing method
- Patent number 8,234,941
- Issue date Aug 7, 2012
- Sysmex Corporation
- Kazuya Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and sample analyzing method
- Patent number 8,064,061
- Issue date Nov 22, 2011
- Sysmex Corporation
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Dispenser, reagent dispenser and sample analyzer
- Patent number 7,850,921
- Issue date Dec 14, 2010
- Sysmex Corporation
- Satoshi Iguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Cuvette
- Patent number 7,787,116
- Issue date Aug 31, 2010
- Sysmex Corporation
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Cuvette
- Patent number D583481
- Issue date Dec 23, 2008
- Sysmex Corporation
- Norimasa Yamamoto
- D24 - Medical and laboratory equipment

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
- Publication number 20190265264
- Publication date Aug 29, 2019
- SYSMEX CORPORATION
- Takashi YAMATO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND LIQUID ASPIRATING METHOD
- Publication number 20170074895
- Publication date Mar 16, 2017
- SYSMEX CORPORATION
- Hiroshi KURONO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS
- Publication number 20160195560
- Publication date Jul 7, 2016
- SYSMEX CORPORATION
- Norimasa YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS
- Publication number 20150211995
- Publication date Jul 30, 2015
- SYSMEX CORPORATION
- Norimasa YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS
- Publication number 20140004612
- Publication date Jan 2, 2014
- SYSMEX CORPORATION
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD
- Publication number 20120294763
- Publication date Nov 22, 2012
- SYSMEX CORPORATION
- Kazuya FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER AND POSITION CONFIRMING METHOD
- Publication number 20120222773
- Publication date Sep 6, 2012
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Application
THROUGHPUT INFORMATION GENERATING APPARATUS OF SAMPLE ANALYZER, SAM...
- Publication number 20120004857
- Publication date Jan 5, 2012
- Takashi Yamato
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND LIQUID ASPIRATING METHOD
- Publication number 20110318845
- Publication date Dec 29, 2011
- SYSMEX CORPORATION
- Hiroshi Kurono
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND SAMPLE RACK TRANSPORTING METHOD
- Publication number 20110123397
- Publication date May 26, 2011
- SYSMEX CORPORATION
- Takashi YAMATO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS, SAMPLE RACK TRANSPORTING METHOD, AND A...
- Publication number 20110076780
- Publication date Mar 31, 2011
- SYSMEX CORPORATION
- Takashi YAMATO
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS AND CONTROL METHOD FOR THE SAME
- Publication number 20110053277
- Publication date Mar 3, 2011
- SYSMEX CORPORATION
- Takashi YAMATO
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PROCESSING APPARATUS AND CONTROL METHOD FOR THE SAME
- Publication number 20110020948
- Publication date Jan 27, 2011
- SYSMEX CORPORATION
- Takashi YAMATO
- G05 - CONTROLLING REGULATING
Information Patent Application
SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD
- Publication number 20100107744
- Publication date May 6, 2010
- SYSMEX CORPORATION
- Kazuya FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
CUVETTE
- Publication number 20080123091
- Publication date May 29, 2008
- SYSMEX CORPORATION
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Dispenser, reagent dispenser and sample analyzer
- Publication number 20080044311
- Publication date Feb 21, 2008
- Sysmex Corporation
- Satoshi Iguchi
- G05 - CONTROLLING REGULATING
Information Patent Application
Specimen analyzing method and specimen analyzing apparatus
- Publication number 20080020481
- Publication date Jan 24, 2008
- SYSMEX CORPORATION
- Norimasa Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
Sample analyzer and sample analyzing method
- Publication number 20070229830
- Publication date Oct 4, 2007
- SYSMEX CORPORATION
- Norimasa Yamamoto
- G01 - MEASURING TESTING

Takashi YAMATO

Person

Patents Grantslast 30 patents

Sample measuring apparatus and sample measuring method

Sample analyzer and liquid aspirating method

Specimen analyzing method and specimen analyzing apparatus

Sample analyzer with liquid aspirating unit and liquid surface dete...

Specimen processing apparatus that determines whether a moveable se...

Specimen analyzing method and specimen analyzing apparatus

Sample processing apparatus

Analyzing apparatus

Throughput information generating apparatus of sample analyzer, sam...

Specimen analyzing apparatus and specimen analyzing method

Specimen analyzing method and specimen analyzing apparatus

Specimen analyzing method and specimen analyzing apparatus

Sample processing apparatus and sample rack transporting method

Specimen analyzing apparatus and specimen analyzing method

Sample analyzer and sample analyzing method

Dispenser, reagent dispenser and sample analyzer

Cuvette

Cuvette

Patents Applicationslast 30 patents

SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD

SAMPLE ANALYZER AND LIQUID ASPIRATING METHOD

SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS

SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS

SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING APPARATUS

SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD

ANALYZER AND POSITION CONFIRMING METHOD

THROUGHPUT INFORMATION GENERATING APPARATUS OF SAMPLE ANALYZER, SAM...

SAMPLE ANALYZER AND LIQUID ASPIRATING METHOD

SAMPLE PROCESSING APPARATUS AND SAMPLE RACK TRANSPORTING METHOD

SAMPLE PROCESSING APPARATUS, SAMPLE RACK TRANSPORTING METHOD, AND A...

ANALYZING APPARATUS AND CONTROL METHOD FOR THE SAME

SPECIMEN PROCESSING APPARATUS AND CONTROL METHOD FOR THE SAME

SPECIMEN ANALYZING APPARATUS AND SPECIMEN ANALYZING METHOD

CUVETTE

Dispenser, reagent dispenser and sample analyzer

Specimen analyzing method and specimen analyzing apparatus

Sample analyzer and sample analyzing method