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Takenori Okusa

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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,188,953
    • Issue date Jan 7, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Nakano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 12,163,971
    • Issue date Dec 10, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 12,061,208
    • Issue date Aug 13, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,044,692
    • Issue date Jul 23, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Susumu Sakairi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,953,508
    • Issue date Apr 9, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Sunao Funakoshi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automated analyzing device
    • Patent number 11,933,800
    • Issue date Mar 19, 2024
    • Hitachi High-Technologies Corporation
    • Taichiro Yamashita
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,927,032
    • Issue date Mar 12, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analysis device
    • Patent number 11,913,966
    • Issue date Feb 27, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Susumu Sakairi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,906,534
    • Issue date Feb 20, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Sunao Funakoshi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 11,860,179
    • Issue date Jan 2, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Ayaka Hashimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,686,741
    • Issue date Jun 27, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Takenori Okusa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis apparatus
    • Patent number 11,555,824
    • Issue date Jan 17, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Ayaka Hashimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,525,837
    • Issue date Dec 13, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,486,890
    • Issue date Nov 1, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,474,119
    • Issue date Oct 18, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Kumagai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,446,668
    • Issue date Sep 20, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,402,397
    • Issue date Aug 2, 2022
    • Hitachi High-Technologies Corporation
    • Yoshihiro Kabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,360,108
    • Issue date Jun 14, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takenori Okusa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,340,241
    • Issue date May 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,300,488
    • Issue date Apr 12, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Koki Yokoyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,215,629
    • Issue date Jan 4, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro Kabe
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 11,169,168
    • Issue date Nov 9, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro Yamashita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,161,118
    • Issue date Nov 2, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Fujita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,890,594
    • Issue date Jan 12, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Yu Niiyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,846,170
    • Issue date Dec 19, 2017
    • Hitachi High-Technologies Corporation
    • Takenori Okusa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chemical analysis apparatus and chemical analysis method
    • Patent number 9,291,634
    • Issue date Mar 22, 2016
    • Hitachi High-Technologies Corporation
    • Hajime Katou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chemical analyzer
    • Patent number 8,916,113
    • Issue date Dec 23, 2014
    • Hitachi High-Technologies Corporation
    • Hironobu Yamakawa
    • B08 - CLEANING
  • Information Patent Grant

    Chemical analyzer
    • Patent number 8,747,744
    • Issue date Jun 10, 2014
    • Hitachi High-Technologies Corporation
    • Hironobu Yamakawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chemical analysis apparatus and chemical analysis method
    • Patent number 8,658,102
    • Issue date Feb 25, 2014
    • Hitachi High-Technologies Corporation
    • Hajime Katou
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Input and output buffer module for clinical analyzer
    • Patent number D685495
    • Issue date Jul 2, 2013
    • Hitachi High-Technologies Corporation
    • Mitsuru Oonuma
    • D24 - Medical and laboratory equipment

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20240310393
    • Publication date Sep 19, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF DRYING REAGENT REFRIGERATOR
    • Publication number 20240288459
    • Publication date Aug 29, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Katsumi MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzing Device
    • Publication number 20240183874
    • Publication date Jun 6, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20240091826
    • Publication date Mar 21, 2024
    • Hitachi High-Tech Corporation
    • Tsukasa SUENARI
    • B08 - CLEANING
  • Information Patent Application

    HOUSING BOX
    • Publication number 20240076118
    • Publication date Mar 7, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yuki SHIMA
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20240027484
    • Publication date Jan 25, 2024
    • Hitachi High-Tech Corporation
    • Koki YOKOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230417783
    • Publication date Dec 28, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shugo OKABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230408539
    • Publication date Dec 21, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Tomoaki IWAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230408535
    • Publication date Dec 21, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Marina NAKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230341432
    • Publication date Oct 26, 2023
    • Hitachi High-Tech Corporation
    • Shugo OKABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230324428
    • Publication date Oct 12, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Tsukasa SUENARI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20230266349
    • Publication date Aug 24, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Sunao FUNAKOSHI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    OPENING AND CLOSING LID DEVICE AND AUTOMATIC ANALYZER INCLUDING SAME
    • Publication number 20230258675
    • Publication date Aug 17, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20230095937
    • Publication date Mar 30, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Ayaka HASHIMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20230102788
    • Publication date Mar 30, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Koki YOKOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230067353
    • Publication date Mar 2, 2023
    • Hitachi High-Tech Corporation
    • Yuki YOKOTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20220404382
    • Publication date Dec 22, 2022
    • Hitachi High-Tech Corporation
    • Tomoaki IWAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220219167
    • Publication date Jul 14, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shugo Okabe
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20220214371
    • Publication date Jul 7, 2022
    • Hitachi High-Tech Corporation
    • Tsukasa SUENARI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220214369
    • Publication date Jul 7, 2022
    • Hitachi High-Tech Corporation
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220206028
    • Publication date Jun 30, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Shugo OKABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    INTERLOCK UNIT AND AUTOMATED ANALYZER EQUIPPED WITH SAME
    • Publication number 20220206022
    • Publication date Jun 30, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • E05 - LOCKS KEYS WINDOW OR DOOR FITTINGS SAFES
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220196695
    • Publication date Jun 23, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Yoshihiro KABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20220187285
    • Publication date Jun 16, 2022
    • Hitachi High-Tech Corporation
    • Koki YOKOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220178955
    • Publication date Jun 9, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Tsukasa Suenari
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220057419
    • Publication date Feb 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Daisuke KANAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20210382078
    • Publication date Dec 9, 2021
    • Hitachi High-Tech Corporation
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210349116
    • Publication date Nov 11, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Taichiro YAMASHITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210302457
    • Publication date Sep 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210239727
    • Publication date Aug 5, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Susumu SAKAIRI
    • G01 - MEASURING TESTING