Tim Lesher

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-conductor transmission line probe
- Patent number 11,486,898
- Issue date Nov 1, 2022
- FormFactor, Inc.
- Tim Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing method using improved contact
- Patent number 8,451,017
- Issue date May 28, 2013
- Cascade Microtech, Inc.
- K. Reed Gleason
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe testing structure
- Patent number 8,069,491
- Issue date Nov 29, 2011
- Cascade Microtech, Inc.
- Timothy E. Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 7,898,273
- Issue date Mar 1, 2011
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,876,115
- Issue date Jan 25, 2011
- Cascade Microtech, Inc.
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing method using improved contact
- Patent number 7,761,986
- Issue date Jul 27, 2010
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,681,312
- Issue date Mar 23, 2010
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,550,984
- Issue date Jun 23, 2009
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,518,387
- Issue date Apr 14, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,501,842
- Issue date Mar 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,498,829
- Issue date Mar 3, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Chuck for holding a device under test
- Patent number 7,492,172
- Issue date Feb 17, 2009
- Cascade Microtech, Inc.
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,489,149
- Issue date Feb 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,482,823
- Issue date Jan 27, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe with low contact resistance for testing a device und...
- Patent number 7,436,194
- Issue date Oct 14, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,400,155
- Issue date Jul 15, 2008
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 7,394,269
- Issue date Jul 1, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for high-frequency testing of a device under test
- Patent number 7,304,488
- Issue date Dec 4, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,295,025
- Issue date Nov 13, 2007
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,271,603
- Issue date Sep 18, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 7,266,889
- Issue date Sep 11, 2007
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe testing structure
- Patent number 7,250,626
- Issue date Jul 31, 2007
- Cascade Microtech, Inc.
- Timothy E. Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 7,161,363
- Issue date Jan 9, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 7,138,810
- Issue date Nov 21, 2006
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,057,404
- Issue date Jun 6, 2006
- Sharp Laboratories of America, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe construction using a recess
- Patent number 6,860,009
- Issue date Mar 1, 2005
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe station with low noise characteristics
- Patent number 6,847,219
- Issue date Jan 25, 2005
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Grant
Membrane probing system
- Patent number 6,825,677
- Issue date Nov 30, 2004
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 6,815,963
- Issue date Nov 9, 2004
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Method for probing an electrical device having a layer of oxide the...
- Patent number 6,708,386
- Issue date Mar 23, 2004
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE, RADIO-FREQUENCY TRANSITIONS AND ELECTRONIC SYSTEMS THAT I...
- Publication number 20240396221
- Publication date Nov 28, 2024
- FormFactor, Inc.
- Pratik Bakul Ghate
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Abbreviated Loopback Attenuation
- Publication number 20230393174
- Publication date Dec 7, 2023
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
Multi-Conductor Transmission Line Probe
- Publication number 20210389348
- Publication date Dec 16, 2021
- FormFactor, Inc.
- Tim Lesher
- G01 - MEASURING TESTING
Information Patent Application
MEMBRANE PROBING METHOD USING IMPROVED CONTACT
- Publication number 20130321018
- Publication date Dec 5, 2013
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
MEMBRANE PROBING METHOD USING IMPROVED CONTACT
- Publication number 20100271060
- Publication date Oct 28, 2010
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20090267625
- Publication date Oct 29, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20090153167
- Publication date Jun 18, 2009
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Application
Probe testing structure
- Publication number 20080218187
- Publication date Sep 11, 2008
- Cascade Microtech, Inc.
- Timothy E. Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054929
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054923
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20080054922
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080048692
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080042671
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080042672
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080024149
- Publication date Jan 31, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20070283555
- Publication date Dec 13, 2007
- Cascade Microtech, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20070273399
- Publication date Nov 29, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20070245536
- Publication date Oct 25, 2007
- Cascade Microtech,, Inc.
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20070075716
- Publication date Apr 5, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20070018665
- Publication date Jan 25, 2007
- Cascade Microtech, Inc.
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20060170439
- Publication date Aug 3, 2006
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20050136562
- Publication date Jun 23, 2005
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe station with low noise characteristics
- Publication number 20050104610
- Publication date May 19, 2005
- Timothy Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20050099191
- Publication date May 12, 2005
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe testing structure
- Publication number 20050088191
- Publication date Apr 28, 2005
- Timothy E. Lesher
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20040232927
- Publication date Nov 25, 2004
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Chuck for holding a device under test
- Publication number 20040232935
- Publication date Nov 25, 2004
- Craig Stewart
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20040154155
- Publication date Aug 12, 2004
- Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Membrane probing system
- Publication number 20040093716
- Publication date May 20, 2004
- Reed Gleason
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Multi-conductor transmission line probe

Membrane probing method using improved contact

Probe testing structure

Probe for testing a device under test

Chuck for holding a device under test

Membrane probing method using improved contact

Membrane probing system

Probe station with low noise characteristics

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Chuck for holding a device under test

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Shielded probe with low contact resistance for testing a device und...

Membrane probing system

Probe for testing a device under test

Shielded probe for high-frequency testing of a device under test

Probe station with low noise characteristics

Shielded probe for testing a device under test

Membrane probing system

Probe testing structure

Probe for testing a device under test

Probe station with low noise characteristics

Shielded probe for testing a device under test

Probe construction using a recess

Probe station with low noise characteristics

Membrane probing system

Probe for testing a device under test

Method for probing an electrical device having a layer of oxide the...

Patents Applicationslast 30 patents

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

FLEXIBLE, RADIO-FREQUENCY TRANSITIONS AND ELECTRONIC SYSTEMS THAT I...

Abbreviated Loopback Attenuation

Multi-Conductor Transmission Line Probe

MEMBRANE PROBING METHOD USING IMPROVED CONTACT

MEMBRANE PROBING METHOD USING IMPROVED CONTACT

Probe for testing a device under test

Chuck for holding a device under test

Probe testing structure

Probe for testing a device under test

Probe for testing a device under test

Probe station with low noise characteristics

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Membrane probing system

Probe for testing a device under test

Membrane probing system

Probe for testing a device under test

Probe station with low noise characteristics

Probe for testing a device under test

Membrane probing system

Probe station with low noise characteristics

Probe for testing a device under test

Probe testing structure

Probe for testing a device under test

Chuck for holding a device under test

Membrane probing system

Membrane probing system