Tohru Furuyama

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamic random access memory
- Patent number 6,381,186
- Issue date Apr 30, 2002
- Kabushiki Kaisha Toshiba
- Junichi Okamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory
- Patent number 6,317,366
- Issue date Nov 13, 2001
- Kabushiki Kaisha Toshiba
- Junichi Okamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory
- Patent number 6,307,796
- Issue date Oct 23, 2001
- Kabushiki Kaisha Toshiba
- Junichi Okamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory and screening test method thereof
- Patent number RE37184
- Issue date May 22, 2001
- Kabushiki Kaisha Toshiba
- Natsuki Kushiyama
- 365 - Static information storage and retrieval
Information Patent Grant
Dynamic random access memory
- Patent number 6,166,975
- Issue date Dec 26, 2000
- Kabushiki Kaisha Toshiba
- Junichi Okamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory
- Patent number 6,101,148
- Issue date Aug 8, 2000
- Kabushiki Kaisha Toshiba
- Junichi Okamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory
- Patent number 5,673,229
- Issue date Sep 30, 1997
- Kabushiki Kaisha Toshiba
- Junichi Okamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method of screening the same
- Patent number 5,568,436
- Issue date Oct 22, 1996
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory utilizing RAS and CAS signals to control the l...
- Patent number 5,553,024
- Issue date Sep 3, 1996
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory and screening test method thereof
- Patent number 5,532,963
- Issue date Jul 2, 1996
- Kabushiki Kaisha Toshiba
- Natsuki Kushiyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory cell
- Patent number 5,525,820
- Issue date Jun 11, 1996
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Bias voltage generation circuit
- Patent number 5,506,540
- Issue date Apr 9, 1996
- Kabushiki Kaisha Toshiba
- Kiyofumi Sakurai
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor memory
- Patent number 5,500,815
- Issue date Mar 19, 1996
- Kabushiki Kaisha Toshiba
- Satoru Takase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory with bypass circuit
- Patent number 5,479,370
- Issue date Dec 26, 1995
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a memory cell unit including a p...
- Patent number 5,444,652
- Issue date Aug 22, 1995
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device
- Patent number 5,432,733
- Issue date Jul 11, 1995
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method of screening the same
- Patent number 5,428,576
- Issue date Jun 27, 1995
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a memory cell unit including a p...
- Patent number 5,410,505
- Issue date Apr 25, 1995
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,410,512
- Issue date Apr 25, 1995
- Kabushiki Kaisha Toshiba
- Satoru Takase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having groups of pads which receive the same s...
- Patent number 5,386,127
- Issue date Jan 31, 1995
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory
- Patent number 5,383,160
- Issue date Jan 17, 1995
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory and screening test method thereof
- Patent number 5,377,152
- Issue date Dec 27, 1994
- Kabushiki Kaisha Toshiba
- Natsuki Kushiyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,369,612
- Issue date Nov 29, 1994
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory with complementary bit lines and capac...
- Patent number 5,367,481
- Issue date Nov 22, 1994
- Kabushiki Kaisha Toshiba
- Satoru Takase
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory
- Patent number 5,359,566
- Issue date Oct 25, 1994
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and circuitry for screening a dynamic memory device for defe...
- Patent number 5,343,430
- Issue date Aug 30, 1994
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having a substrate bias generator
- Patent number 5,343,087
- Issue date Aug 30, 1994
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor memory having memory cell units each including cascad...
- Patent number 5,341,326
- Issue date Aug 23, 1994
- Kabushiki Kaisha Toshiba
- Satoru Takase
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,317,540
- Issue date May 31, 1994
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing semiconductor devices
- Patent number 5,298,433
- Issue date Mar 29, 1994
- Kabushiki Kaisha Toshiba
- Tohru Furuyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROGRAM CODE CONVERSION APPARATUS, PROGRAM CODE CONVERSION METHOD A...
- Publication number 20080250231
- Publication date Oct 9, 2008
- Kabushiki Kaisha Toshiba
- Hiroki TAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DYNAMIC RANDOM ACCESS MEMORY
- Publication number 20020048205
- Publication date Apr 25, 2002
- KABUSHIKI KAISHA TOSHIBA
- Junichi Okamura
- G11 - INFORMATION STORAGE

Tohru Furuyama

Person

Patents Grantslast 30 patents

Dynamic random access memory

Dynamic random access memory

Dynamic random access memory

Semiconductor memory and screening test method thereof

Dynamic random access memory

Dynamic random access memory

Dynamic random access memory

Semiconductor device and method of screening the same

Semiconductor memory utilizing RAS and CAS signals to control the l...

Semiconductor memory and screening test method thereof

Semiconductor memory cell

Bias voltage generation circuit

Semiconductor memory

Semiconductor memory with bypass circuit

Semiconductor memory device having a memory cell unit including a p...

Semiconductor memory device

Semiconductor device and method of screening the same

Semiconductor memory device having a memory cell unit including a p...

Semiconductor memory device

Semiconductor device having groups of pads which receive the same s...

Dynamic random access memory

Semiconductor memory and screening test method thereof

Semiconductor memory device

Dynamic random access memory with complementary bit lines and capac...

Dynamic random access memory

Method and circuitry for screening a dynamic memory device for defe...

Semiconductor device having a substrate bias generator

Semiconductor memory having memory cell units each including cascad...

Semiconductor memory device

Method for testing semiconductor devices

Patents Applicationslast 30 patents

PROGRAM CODE CONVERSION APPARATUS, PROGRAM CODE CONVERSION METHOD A...

DYNAMIC RANDOM ACCESS MEMORY