Tohru Ishitani

Person

Hitachinaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Gas field ionization ion source and ion beam device
- Patent number 9,196,453
- Issue date Nov 24, 2015
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ionization ion source and ion beam device
- Patent number 8,809,801
- Issue date Aug 19, 2014
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,796,651
- Issue date Aug 5, 2014
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ion beam device
- Patent number 8,563,944
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source, charged particle microscope, and apparatus
- Patent number 8,530,865
- Issue date Sep 10, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device
- Patent number 8,263,943
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas field ion source, charged particle microscope, and apparatus
- Patent number 8,115,184
- Issue date Feb 14, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam orbit corrector and charged particle beam app...
- Patent number 7,947,964
- Issue date May 24, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample manufacturing method
- Patent number 7,928,377
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Methods for sample preparation and observation, charged particle ap...
- Patent number 7,915,581
- Issue date Mar 29, 2011
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,897,936
- Issue date Mar 1, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Image evaluation method and microscope
- Patent number 7,805,023
- Issue date Sep 28, 2010
- Hitachi, Ltd.
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion gun
- Patent number 7,804,073
- Issue date Sep 28, 2010
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ION beam apparatus
- Patent number 7,550,740
- Issue date Jun 23, 2009
- Hitachi High-Technologies Corporation
- Koichiro Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for sample preparation and observation, charged particle ap...
- Patent number 7,482,586
- Issue date Jan 27, 2009
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Liquid metal ion gun
- Patent number 7,420,181
- Issue date Sep 2, 2008
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus and focused ion beam irradiation method
- Patent number 7,411,192
- Issue date Aug 12, 2008
- Hitachi High-Technologies Corporation
- Koichiro Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image evaluation method and microscope
- Patent number 7,340,111
- Issue date Mar 4, 2008
- Hitachi, Ltd.
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 7,301,146
- Issue date Nov 27, 2007
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,268,356
- Issue date Sep 11, 2007
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Focused ion beam apparatus
- Patent number 7,235,798
- Issue date Jun 26, 2007
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image evaluation method and microscope
- Patent number 7,236,651
- Issue date Jun 26, 2007
- Hitachi, Ltd.
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion gun
- Patent number 7,211,805
- Issue date May 1, 2007
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning charged-particle microscope
- Patent number 7,186,975
- Issue date Mar 6, 2007
- Hitachi, Ltd.
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam apparatus and sample processing method
- Patent number 7,084,399
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion gun
- Patent number 7,005,651
- Issue date Feb 28, 2006
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for inspecting defects of devices and method of inspectin...
- Patent number 6,970,004
- Issue date Nov 29, 2005
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Probe driving method, and probe apparatus
- Patent number 6,960,765
- Issue date Nov 1, 2005
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Combination perpendicular magnetic head having shield material form...
- Patent number 6,839,200
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Ion beam apparatus and sample processing method
- Patent number 6,822,245
- Issue date Nov 23, 2004
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE
- Publication number 20140326897
- Publication date Nov 6, 2014
- Yoshimi KAWANAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...
- Publication number 20130087704
- Publication date Apr 11, 2013
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY
Information Patent Application
ION BEAM DEVICE
- Publication number 20120319003
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE MICROSCOPE
- Publication number 20120217391
- Publication date Aug 30, 2012
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE
- Publication number 20120199758
- Publication date Aug 9, 2012
- Hitachi High-Technologies Corporation
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD IONIZATION ION SOURCE APPARATUS AND SCANNING CHARGED PART...
- Publication number 20120132802
- Publication date May 31, 2012
- Noriaki Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS
- Publication number 20120119086
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION BEAM DEVICE
- Publication number 20110266465
- Publication date Nov 3, 2011
- Hitachi High-Technologies Corporation
- Hiroyasu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING CHARGED PARTICLE MICROSCOPE
- Publication number 20110254944
- Publication date Oct 20, 2011
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20110114476
- Publication date May 19, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Gas field ion source, charged particle microscope, and apparatus
- Publication number 20090173888
- Publication date Jul 9, 2009
- Hitachi High-Technologies Corporation
- Hiroyasu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gas field ionization ion source, scanning charged particle microsco...
- Publication number 20090152462
- Publication date Jun 18, 2009
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY
Information Patent Application
Methods for Sample Preparation and Observation, Charged Particle Ap...
- Publication number 20090127458
- Publication date May 21, 2009
- Hitachi High-Technologies
- Tohru ISHITANI
- G01 - MEASURING TESTING
Information Patent Application
Liquid metal ion gun
- Publication number 20080210883
- Publication date Sep 4, 2008
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20080191151
- Publication date Aug 14, 2008
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Charged Particle Beam Orbit Corrector and Charged Particle Beam App...
- Publication number 20080116391
- Publication date May 22, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ION Beam Apparatus
- Publication number 20080023641
- Publication date Jan 31, 2008
- Hitachi High-Technologies Corporation
- Koichiro TAKEUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Image evaluation method and microscope
- Publication number 20070280559
- Publication date Dec 6, 2007
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid metal ion gun
- Publication number 20070257200
- Publication date Nov 8, 2007
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for sample preparation and observation, charged particle ap...
- Publication number 20070023651
- Publication date Feb 1, 2007
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Liquid metal ion gun
- Publication number 20060097186
- Publication date May 11, 2006
- Hitachi High-Technologies
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and sample manufacturing method
- Publication number 20060097166
- Publication date May 11, 2006
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam apparatus and focused ion beam irradiation method
- Publication number 20060022150
- Publication date Feb 2, 2006
- Hitachi High-Technologies Corporation
- Koichiro Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ion beam apparatus
- Publication number 20050279952
- Publication date Dec 22, 2005
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe driving method, and probe apparatus
- Publication number 20050269511
- Publication date Dec 8, 2005
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Image evaluation method and microscope
- Publication number 20050199811
- Publication date Sep 15, 2005
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid metal ion gun
- Publication number 20050127304
- Publication date Jun 16, 2005
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam apparatus and sample processing method
- Publication number 20050092922
- Publication date May 5, 2005
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20050006600
- Publication date Jan 13, 2005
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus for inspecting defects of devices and method of inspectin...
- Publication number 20040178811
- Publication date Sep 16, 2004
- Tohru Ishitani
- G01 - MEASURING TESTING

Tohru Ishitani

Person

Patents Grantslast 30 patents

Gas field ionization ion source and ion beam device

Gas field ionization ion source and ion beam device

Method and apparatus for specimen fabrication

Ion beam device

Gas field ion source, charged particle microscope, and apparatus

Ion beam device

Gas field ion source, charged particle microscope, and apparatus

Charged particle beam orbit corrector and charged particle beam app...

Charged particle beam apparatus and sample manufacturing method

Methods for sample preparation and observation, charged particle ap...

Method and apparatus for specimen fabrication

Image evaluation method and microscope

Liquid metal ion gun

Focused ION beam apparatus

Methods for sample preparation and observation, charged particle ap...

Liquid metal ion gun

Focused ion beam apparatus and focused ion beam irradiation method

Image evaluation method and microscope

Probe driving method, and probe apparatus

Method and apparatus for specimen fabrication

Focused ion beam apparatus

Image evaluation method and microscope

Liquid metal ion gun

Scanning charged-particle microscope

Ion beam apparatus and sample processing method

Liquid metal ion gun

Apparatus for inspecting defects of devices and method of inspectin...

Probe driving method, and probe apparatus

Combination perpendicular magnetic head having shield material form...

Ion beam apparatus and sample processing method

Patents Applicationslast 30 patents

GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE

GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...

ION BEAM DEVICE

CHARGED PARTICLE MICROSCOPE

GAS FIELD IONIZATION ION SOURCE AND ION BEAM DEVICE

GAS FIELD IONIZATION ION SOURCE APPARATUS AND SCANNING CHARGED PART...

GAS FIELD ION SOURCE, CHARGED PARTICLE MICROSCOPE, AND APPARATUS

ION BEAM DEVICE

SCANNING CHARGED PARTICLE MICROSCOPE

Method and apparatus for specimen fabrication

Gas field ion source, charged particle microscope, and apparatus

Gas field ionization ion source, scanning charged particle microsco...

Methods for Sample Preparation and Observation, Charged Particle Ap...

Liquid metal ion gun

Method and apparatus for specimen fabrication

Charged Particle Beam Orbit Corrector and Charged Particle Beam App...

Focused ION Beam Apparatus

Image evaluation method and microscope

Liquid metal ion gun

Methods for sample preparation and observation, charged particle ap...

Liquid metal ion gun

Charged particle beam apparatus and sample manufacturing method

Focused ion beam apparatus and focused ion beam irradiation method

Focused ion beam apparatus

Probe driving method, and probe apparatus

Image evaluation method and microscope

Liquid metal ion gun

Ion beam apparatus and sample processing method

Method and apparatus for specimen fabrication

Apparatus for inspecting defects of devices and method of inspectin...