Toru Kaga

Person

Hachioji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron beam apparatus and sample observation method using the same
- Patent number 9,194,826
- Issue date Nov 24, 2015
- Ebara Corporation
- Toru Kaga
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam apparatus and a device manufacturing method using the...
- Patent number 7,385,197
- Issue date Jun 10, 2008
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,894,334
- Issue date May 17, 2005
- Hitachi, Ltd.
- Jun Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 6,878,586
- Issue date Apr 12, 2005
- Renesas Technology Corp.
- Shinichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with recessed array region
- Patent number RE38296
- Issue date Nov 4, 2003
- Hitachi, Ltd.
- Noboru Moriuchi
- 257 - Active solid-state devices
Information Patent Grant
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A FIRST WIRING STRIP...
- Patent number 6,548,847
- Issue date Apr 15, 2003
- Hitachi, Ltd.
- Jun Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,342,412
- Issue date Jan 29, 2002
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,169,324
- Issue date Jan 2, 2001
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 6,127,255
- Issue date Oct 3, 2000
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming teos oxide and silicon nitride passivation layer...
- Patent number 5,811,316
- Issue date Sep 22, 1998
- Hitachi Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,780,882
- Issue date Jul 14, 1998
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device process for fabricating the...
- Patent number 5,739,589
- Issue date Apr 14, 1998
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,700,705
- Issue date Dec 23, 1997
- Hitachi, Ltd.
- Satoshi Meguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,646,423
- Issue date Jul 8, 1997
- Hitachi, Ltd.
- Satoshi Meguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,619,055
- Issue date Apr 8, 1997
- Hitachi, Ltd.
- Satoshi Meguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 5,591,998
- Issue date Jan 7, 1997
- Hitachi, Ltd.
- Shinichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having stacked capacitors
- Patent number 5,583,358
- Issue date Dec 10, 1996
- Hitachi, Ltd.
- Shinichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,557,147
- Issue date Sep 17, 1996
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor memory device and method of manufacturing same
- Patent number 5,523,965
- Issue date Jun 4, 1996
- Hitachi, Ltd.
- Toru Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,483,083
- Issue date Jan 9, 1996
- Hitachi, Ltd.
- Satoshi Meguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device having silicon islands
- Patent number 5,466,621
- Issue date Nov 14, 1995
- Hitachi, Ltd.
- Dai Hisamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating stacked capacitor cell memory devices
- Patent number 5,374,576
- Issue date Dec 20, 1994
- Hitachi, Ltd.
- Shinichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device and a semiconductor...
- Patent number 5,346,834
- Issue date Sep 13, 1994
- Hitachi, Ltd.
- Dai Hisamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,331,191
- Issue date Jul 19, 1994
- Hitachi, Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor integrated circuit device, process for fabricating th...
- Patent number 5,202,275
- Issue date Apr 13, 1993
- Hitachi Ltd.
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device having a low-resistivity planar wiring structure
- Patent number 5,200,635
- Issue date Apr 6, 1993
- Hitachi, Ltd.
- Toru Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with recessed array region
- Patent number 5,196,910
- Issue date Mar 23, 1993
- Hitachi, Ltd.
- Noboru Moriuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,194,749
- Issue date Mar 16, 1993
- Hitachi, Ltd.
- Satoshi Meguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic random access memory having trench capacitors and vertical...
- Patent number 5,177,576
- Issue date Jan 5, 1993
- Hitachi, Ltd.
- Shin'ichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having stacked capacitor cells
- Patent number 5,140,389
- Issue date Aug 18, 1992
- Hitachi, Ltd.
- Shinichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROJECTION ELECTRON BEAM APPARATUS AND DEFECT INSPECTION SYSTEM USI...
- Publication number 20090212213
- Publication date Aug 27, 2009
- Ebara Corporation
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME
- Publication number 20090152595
- Publication date Jun 18, 2009
- EBARA CORPORATION
- Toru Kaga
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM APPARATUS
- Publication number 20090014649
- Publication date Jan 15, 2009
- EBARA CORPORATION
- Mamoru Nakasuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING THE SAME
- Publication number 20080251718
- Publication date Oct 16, 2008
- EBARA CORPORATION
- Toru KAGA
- G01 - MEASURING TESTING
Information Patent Application
Electron beam apparatus and a device manufacturing method using the...
- Publication number 20060016989
- Publication date Jan 26, 2006
- EBARA CORPORATION
- Mamoru Nakasuji
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device
- Publication number 20030205751
- Publication date Nov 6, 2003
- Hitachi, Ltd.
- Shinichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device, process for fabricating th...
- Publication number 20030189255
- Publication date Oct 9, 2003
- Jun Sugiura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Semiconductor integrated circuit device, process for fabricating th...
- Publication number 20020017669
- Publication date Feb 14, 2002
- Jun Sugiura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device having memory cells
- Publication number 20010008288
- Publication date Jul 19, 2001
- Hitachi, Ltd.
- Shinichiro Kimura
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Electron beam apparatus and sample observation method using the same

Electron beam apparatus and a device manufacturing method using the...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor memory device

Semiconductor memory device with recessed array region

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A FIRST WIRING STRIP...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Method of forming teos oxide and silicon nitride passivation layer...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device process for fabricating the...

Semiconductor integrated circuit device

Semiconductor integrated circuit device

Semiconductor integrated circuit device

Semiconductor memory device

Semiconductor memory device having stacked capacitors

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor memory device and method of manufacturing same

Semiconductor integrated circuit device

Method of manufacturing a semiconductor device having silicon islands

Method of fabricating stacked capacitor cell memory devices

Method for manufacturing a semiconductor device and a semiconductor...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor device having a low-resistivity planar wiring structure

Semiconductor memory device with recessed array region

Semiconductor integrated circuit device

Dynamic random access memory having trench capacitors and vertical...

Semiconductor memory device having stacked capacitor cells

Patents Applicationslast 30 patents

PROJECTION ELECTRON BEAM APPARATUS AND DEFECT INSPECTION SYSTEM USI...

SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME

ELECTRON BEAM APPARATUS

ELECTRON BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING THE SAME

Electron beam apparatus and a device manufacturing method using the...

Semiconductor memory device

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device, process for fabricating th...

Semiconductor integrated circuit device having memory cells