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Toyokazu Nakamura
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Pattern inspecting apparatus and inspecting method
Patent number
6,188,785
Issue date
Feb 13, 2001
NEC Corporation
Toyokazu Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus method for testing opening state for hole in semiconducto...
Patent number
6,177,681
Issue date
Jan 23, 2001
NEC Corporation
Toyokazu Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Fine pattern inspection device capable of carrying out inspection w...
Patent number
5,949,900
Issue date
Sep 7, 1999
NEC Corporation
Toyokazu Nakamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for fault analysis of semiconductor integrated ci...
Patent number
5,703,492
Issue date
Dec 30, 1997
NEC Corporation
Toyokazu Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic fault imaging system using electron beam and method of anal...
Patent number
5,548,211
Issue date
Aug 20, 1996
NEC Corporation
Tohru Tujide
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit fault analyzing apparatus and meth...
Patent number
5,521,516
Issue date
May 28, 1996
NEC Corporation
Yasuko Hanagama
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for diagnosing interconnections of semiconductor integrat...
Patent number
5,422,498
Issue date
Jun 6, 1995
NEC Corporation
Kiyoshi Nikawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Apparatus for optically checking a pattern and method of doing the...
Publication number
20010002700
Publication date
Jun 7, 2001
NEC Corporation
Toyokazu Nakamura
G01 - MEASURING TESTING