Tsuyoshi Ohnishi

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Negative-electrode material and lithium secondary battery using same
- Patent number 8,771,872
- Issue date Jul 8, 2014
- National Institute for Materials Science
- Kazunori Takada
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Micro-sample processing method, observation method and apparatus
- Patent number 8,686,360
- Issue date Apr 1, 2014
- Hitachi High-Technologies Corporation
- Tsuyoshi Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, and sample processing and observat...
- Patent number 8,455,824
- Issue date Jun 4, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Muto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and sample manufacturing method
- Patent number 7,928,377
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Methods for sample preparation and observation, charged particle ap...
- Patent number 7,915,581
- Issue date Mar 29, 2011
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,902,505
- Issue date Mar 8, 2011
- Hitachi High-Technologies Corporation
- Tsuyoshi Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Micro-sample processing method, observation method and apparatus
- Patent number 7,872,230
- Issue date Jan 18, 2011
- Hitachi High-Technologies Corporation
- Tsuyoshi Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam system and a method of sample preparation and obse...
- Patent number 7,612,337
- Issue date Nov 3, 2009
- Hitachi High-Technologies Corporation
- Yuya Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for sample preparation and observation, charged particle ap...
- Patent number 7,482,586
- Issue date Jan 27, 2009
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,442,928
- Issue date Oct 28, 2008
- Hitachi High-Technologies Corporation
- Tsuyoshi Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combination perpendicular magnetic head having shield material form...
- Patent number 6,839,200
- Issue date Jan 4, 2005
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head having track width defined by trench portions filled...
- Patent number 6,665,141
- Issue date Dec 16, 2003
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of fabricating a magnetic head by focused ion beam etching
- Patent number 6,538,844
- Issue date Mar 25, 2003
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Focused ion beam machining method and focused ion beam machining ap...
- Patent number 6,521,890
- Issue date Feb 18, 2003
- Hitachi, Ltd.
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Grant
Projecting type charged particle microscope and projecting type sub...
- Patent number 6,310,341
- Issue date Oct 30, 2001
- Hitachi, Ltd.
- Hideo Todokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Narrow track thin film head including magnetic poles machined by fo...
- Patent number 6,307,707
- Issue date Oct 23, 2001
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Narrow track thin film head having a focused ion beam etched air be...
- Patent number 6,278,578
- Issue date Aug 21, 2001
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Narrow track thin film magnetic head suitable for high density reco...
- Patent number 6,111,723
- Issue date Aug 29, 2000
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Focused ion beam apparatus and method for irradiating focused ion beam
- Patent number 5,852,297
- Issue date Dec 22, 1998
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Narrow track thin film magnetic head suitable for high density reco...
- Patent number 5,850,326
- Issue date Dec 15, 1998
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Grant
Treatment and observation apparatus using scanning probe
- Patent number 5,532,494
- Issue date Jul 2, 1996
- Hitachi, Ltd.
- Yoshimi Kawanami
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Observation method and apparatus for removing an oxidation layer an...
- Patent number 5,495,110
- Issue date Feb 27, 1996
- Tsuyoshi Ohnishi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for separating specimen and method for analyzing the specime...
- Patent number 5,270,552
- Issue date Dec 14, 1993
- Hitachi, Ltd.
- Tsuyoshi Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Signal generator and method of generating signal voltages using the...
- Patent number 5,198,672
- Issue date Mar 30, 1993
- Hitachi, Ltd.
- Tsuyoshi Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Methods for device transplantation
- Patent number 5,120,925
- Issue date Jun 9, 1992
- Hitachi, Ltd.
- Tsuyoshi Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 5,065,034
- Issue date Nov 12, 1991
- Hitachi, Ltd.
- Yoshimi Kawanami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen or substrate cutting method using focused charged particle...
- Patent number 4,939,364
- Issue date Jul 3, 1990
- Hitachi, Ltd.
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-beam machining method and apparatus
- Patent number 4,936,968
- Issue date Jun 26, 1990
- Hitachi, Ltd.
- Tsuyoshi Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ALL SOLID LITHIUM BATTERY
- Publication number 20130065135
- Publication date Mar 14, 2013
- TOYOTA JIDOSHA KABUSHIKI KAISHA
- Kazunori Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...
- Publication number 20120326028
- Publication date Dec 27, 2012
- Hiroyuki MUTO
- G01 - MEASURING TESTING
Information Patent Application
Negative-Electrode Material And Lithium Secondary Battery Using Same
- Publication number 20120064400
- Publication date Mar 15, 2012
- NATIONAL INSTITUTE FOR MATERIALS SCIENCE
- Kazunori Takada
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
MICRO-SAMPLE PROCESSING METHOD, OBSERVATION METHOD AND APPARATUS
- Publication number 20110073758
- Publication date Mar 31, 2011
- Hitachi High-Technologies Corporation
- Tsuyoshi OHNISHI
- G01 - MEASURING TESTING
Information Patent Application
Methods for Sample Preparation and Observation, Charged Particle Ap...
- Publication number 20090127458
- Publication date May 21, 2009
- Hitachi High-Technologies
- Tohru ISHITANI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20090039260
- Publication date Feb 12, 2009
- Hitachi High-Technologies Corporation
- Tsuyoshi Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...
- Publication number 20090020698
- Publication date Jan 22, 2009
- Hitachi High-Technologies Corporation
- Hiroyuki MUTO
- G01 - MEASURING TESTING
Information Patent Application
MICRO-SAMPLE PROCESSING METHOD, OBSERVATION METHOD AND APPARATUS
- Publication number 20080283746
- Publication date Nov 20, 2008
- Hitachi High-Technologies Corporation
- Tsuyoshi OHNISHI
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam system and a method of sample preparation and obse...
- Publication number 20070187597
- Publication date Aug 16, 2007
- Hitachi High-Technologies Corporation
- Yuya Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20070069158
- Publication date Mar 29, 2007
- Hitachi High-Technologies Corporation
- Tsuyoshi Ohnishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for sample preparation and observation, charged particle ap...
- Publication number 20070023651
- Publication date Feb 1, 2007
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus and sample manufacturing method
- Publication number 20060097166
- Publication date May 11, 2006
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- G01 - MEASURING TESTING
Information Patent Application
Narrow track thin film magnetic head and fabrication method thereof
- Publication number 20040080865
- Publication date Apr 29, 2004
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Application
Narrow track thin film magnetic head and fabrication method thereof
- Publication number 20030099063
- Publication date May 29, 2003
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Application
FOCUSED ION BEAM MACHINING METHOD AND FOCUSED ION BEAM MACHINING AP...
- Publication number 20020092985
- Publication date Jul 18, 2002
- TOHRU ISHITANI
- G01 - MEASURING TESTING
Information Patent Application
Narrow track thin film magnetic head and fabrication method thereof
- Publication number 20020080521
- Publication date Jun 27, 2002
- Hitachi, Ltd.
- Hisashi Takano
- G11 - INFORMATION STORAGE
Information Patent Application
Processing/observing instrument
- Publication number 20020017619
- Publication date Feb 14, 2002
- Hiroshi Hirose
- H01 - BASIC ELECTRIC ELEMENTS

Tsuyoshi Ohnishi

Person

Patents Grantslast 30 patents

Negative-electrode material and lithium secondary battery using same

Micro-sample processing method, observation method and apparatus

Charged particle beam apparatus, and sample processing and observat...

Charged particle beam apparatus and sample manufacturing method

Methods for sample preparation and observation, charged particle ap...

Charged particle beam apparatus

Micro-sample processing method, observation method and apparatus

Focused ion beam system and a method of sample preparation and obse...

Methods for sample preparation and observation, charged particle ap...

Charged particle beam apparatus

Combination perpendicular magnetic head having shield material form...

Magnetic head having track width defined by trench portions filled...

Method of fabricating a magnetic head by focused ion beam etching

Focused ion beam machining method and focused ion beam machining ap...

Projecting type charged particle microscope and projecting type sub...

Narrow track thin film head including magnetic poles machined by fo...

Narrow track thin film head having a focused ion beam etched air be...

Narrow track thin film magnetic head suitable for high density reco...

Focused ion beam apparatus and method for irradiating focused ion beam

Narrow track thin film magnetic head suitable for high density reco...

Treatment and observation apparatus using scanning probe

Observation method and apparatus for removing an oxidation layer an...

Method for separating specimen and method for analyzing the specime...

Signal generator and method of generating signal voltages using the...

Methods for device transplantation

Charged particle beam apparatus

Specimen or substrate cutting method using focused charged particle...

Ion-beam machining method and apparatus

Patents Applicationslast 30 patents

ALL SOLID LITHIUM BATTERY

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...

Negative-Electrode Material And Lithium Secondary Battery Using Same

MICRO-SAMPLE PROCESSING METHOD, OBSERVATION METHOD AND APPARATUS

Methods for Sample Preparation and Observation, Charged Particle Ap...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVAT...

MICRO-SAMPLE PROCESSING METHOD, OBSERVATION METHOD AND APPARATUS

Focused ion beam system and a method of sample preparation and obse...

Charged particle beam apparatus

Methods for sample preparation and observation, charged particle ap...

Charged particle beam apparatus and sample manufacturing method

Narrow track thin film magnetic head and fabrication method thereof

Narrow track thin film magnetic head and fabrication method thereof

FOCUSED ION BEAM MACHINING METHOD AND FOCUSED ION BEAM MACHINING AP...

Narrow track thin film magnetic head and fabrication method thereof

Processing/observing instrument