Vladimir Alexeevich Ukraintsev

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Through process flow intra-chip and inter-chip electrical analysis...
- Patent number 10,539,589
- Issue date Jan 21, 2020
- FEI EFA, Inc.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Optical nanoprobing of integrated circuits
- Patent number 10,175,295
- Issue date Jan 8, 2019
- FEI Company
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Probe-based data collection system with adaptive mode of probing co...
- Patent number 9,891,280
- Issue date Feb 13, 2018
- FEI EFA, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 9,506,947
- Issue date Nov 29, 2016
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing dimensions of structures via scanning probe microscopy
- Patent number 9,347,897
- Issue date May 24, 2016
- Texas Instruments Incorporated
- Duncan M Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Probe-based data collection system with adaptive mode of probing
- Patent number 9,057,740
- Issue date Jun 16, 2015
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Simple scatterometry structure for Si recess etch control
- Patent number 9,006,001
- Issue date Apr 14, 2015
- Texas Instruments Incorporated
- Vladimir Alexeevich Ukraintsev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 8,895,923
- Issue date Nov 25, 2014
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating an inspection tool
- Patent number 8,305,097
- Issue date Nov 6, 2012
- Texas Instruments Incorporated
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Nanotip repair and characterization using field ion microscopy
- Patent number 7,921,465
- Issue date Apr 5, 2011
- Texas Instruments Incorporated
- Vladimir Ukraintsev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Rocking Y-shaped probe for critical dimension atomic force microscopy
- Patent number 7,797,991
- Issue date Sep 21, 2010
- Texas Instruments Incorporated
- Vladimir Alexeevich Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Characterizing dimensions of structures via scanning probe microscopy
- Patent number 7,381,950
- Issue date Jun 3, 2008
- Texas Instruments Incorporated
- Duncan M. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating a multi-level integrated circuit having scat...
- Patent number 6,967,349
- Issue date Nov 22, 2005
- Texas Instruments Incorporated
- Thomas D. Bonifield
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...
- Publication number 20170082685
- Publication date Mar 23, 2017
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL NANOPROBING OF INTEGRATED CIRCUITS
- Publication number 20160377675
- Publication date Dec 29, 2016
- FEI Company
- Vladimir A. Ukraintsev
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle Beam Heating to Identify Defects
- Publication number 20160370425
- Publication date Dec 22, 2016
- DCG SYSTEMS, INC.
- Richard Stallcup
- G01 - MEASURING TESTING
Information Patent Application
THROUGH PROCESS FLOW INTRA-CHIP AND INTER-CHIP ELECTRICAL ANALYSIS...
- Publication number 20150377921
- Publication date Dec 31, 2015
- DCG SYSTEMS, INC.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR NANOPROBING OF ELECTRONIC DEVICES
- Publication number 20150377958
- Publication date Dec 31, 2015
- DCG SYSTEMS, INC.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20150301078
- Publication date Oct 22, 2015
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING
- Publication number 20150168444
- Publication date Jun 18, 2015
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...
- Publication number 20140380531
- Publication date Dec 25, 2014
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20140143912
- Publication date May 22, 2014
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
Characterizing Dimensions of Structures Via Scanning Probe Microscopy
- Publication number 20120137396
- Publication date May 31, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Duncan M. Rogers
- G01 - MEASURING TESTING
Information Patent Application
NANOTIP REPAIR AND CHARACTERIZATION USING FIELD ION MICROSCOPY
- Publication number 20100038536
- Publication date Feb 18, 2010
- Texas Instruments Inc.
- Vladimir Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
HOLOGRAPHIC SCATTEROMETER
- Publication number 20090262335
- Publication date Oct 22, 2009
- Vladimir Alexeevich UKRAINTSEV
- G01 - MEASURING TESTING
Information Patent Application
Simple Scatterometry Structure for Si Recess Etch Control
- Publication number 20090159937
- Publication date Jun 25, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Vladimir Alexeevich Ukraintsev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROCKING Y-SHAPED PROBE FOR CRITICAL DIMENSION ATOMIC FORCE MICROSCOPY
- Publication number 20090100917
- Publication date Apr 23, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Vladimir Alexeevich Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING AN INSPECTION TOOL
- Publication number 20090061543
- Publication date Mar 5, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
USE OF SCATTEROMETRY FOR IN-LINE DETECTION OF POLY-SI STRINGS LEFT...
- Publication number 20090053834
- Publication date Feb 26, 2009
- Vladimir Alexeevich Ukraintsev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Layout modification to eliminate line bending caused by line materi...
- Publication number 20060292885
- Publication date Dec 28, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Vladimir Alexeevich Ukraintsev
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Characterizing Dimensions of Structures Via Scanning Probe Microscopy
- Publication number 20060237645
- Publication date Oct 26, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Duncan M. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Characterizing dimensions of structures via scanning probe microscopy
- Publication number 20060071164
- Publication date Apr 6, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Duncan M. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Scatterometry test structures stacked over same footprint area
- Publication number 20040058460
- Publication date Mar 25, 2004
- Thomas D. Bonifield
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Vladimir Alexeevich Ukraintsev

Person

Patents Grantslast 30 patents

Through process flow intra-chip and inter-chip electrical analysis...

Optical nanoprobing of integrated circuits

Probe-based data collection system with adaptive mode of probing co...

System and method for non-contact microscopy for three-dimensional...

Characterizing dimensions of structures via scanning probe microscopy

Probe-based data collection system with adaptive mode of probing

Simple scatterometry structure for Si recess etch control

System and method for non-contact microscopy for three-dimensional...

Method for calibrating an inspection tool

Nanotip repair and characterization using field ion microscopy

Rocking Y-shaped probe for critical dimension atomic force microscopy

Characterizing dimensions of structures via scanning probe microscopy

Method for fabricating a multi-level integrated circuit having scat...

Patents Applicationslast 30 patents

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...

OPTICAL NANOPROBING OF INTEGRATED CIRCUITS

Particle Beam Heating to Identify Defects

THROUGH PROCESS FLOW INTRA-CHIP AND INTER-CHIP ELECTRICAL ANALYSIS...

APPARATUS AND METHOD FOR NANOPROBING OF ELECTRONIC DEVICES

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...

Characterizing Dimensions of Structures Via Scanning Probe Microscopy

NANOTIP REPAIR AND CHARACTERIZATION USING FIELD ION MICROSCOPY

HOLOGRAPHIC SCATTEROMETER

Simple Scatterometry Structure for Si Recess Etch Control

ROCKING Y-SHAPED PROBE FOR CRITICAL DIMENSION ATOMIC FORCE MICROSCOPY

METHOD FOR CALIBRATING AN INSPECTION TOOL

USE OF SCATTEROMETRY FOR IN-LINE DETECTION OF POLY-SI STRINGS LEFT...

Layout modification to eliminate line bending caused by line materi...

Characterizing Dimensions of Structures Via Scanning Probe Microscopy

Characterizing dimensions of structures via scanning probe microscopy

Scatterometry test structures stacked over same footprint area