William C. Leipold

Person

Enosburg Falls, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 8,201,132
- Issue date Jun 12, 2012
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Shapes-based migration of aluminum designs to copper damascene
- Patent number 7,709,967
- Issue date May 4, 2010
- International Business Machines Corporation
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing pattern sensitive algorithms for semiconductor design
- Patent number 7,685,544
- Issue date Mar 23, 2010
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
IC tiling pattern method, IC so formed and analysis method
- Patent number 7,669,159
- Issue date Feb 23, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical design characterization system
- Patent number 7,584,077
- Issue date Sep 1, 2009
- International Business Machines Corporation
- Betty L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,552,417
- Issue date Jun 23, 2009
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shapes-based migration of aluminum designs to copper damascene
- Patent number 7,498,250
- Issue date Mar 3, 2009
- International Business Machines Corporation
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask defect analysis system
- Patent number 7,492,940
- Issue date Feb 17, 2009
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask defect analysis system
- Patent number 7,492,941
- Issue date Feb 17, 2009
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,415,695
- Issue date Aug 19, 2008
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
method for generating a set of test patterns for an optical proximi...
- Patent number 7,404,174
- Issue date Jul 22, 2008
- International Business Machines Corporation
- David L. DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for testing pattern sensitive algorithms for semi...
- Patent number 7,353,472
- Issue date Apr 1, 2008
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Shapes-based migration of aluminum designs to copper damascene
- Patent number 7,312,141
- Issue date Dec 25, 2007
- International Business Machines Corporation
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for search and analysis of systematic defects in integrated...
- Patent number 7,284,230
- Issue date Oct 16, 2007
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask defect analysis system
- Patent number 7,257,247
- Issue date Aug 14, 2007
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Autonomic graphical partitioning
- Patent number 7,051,307
- Issue date May 23, 2006
- International Business Machines Corporation
- Gary S. Ditlow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shapes-based migration of aluminum designs to copper damascence
- Patent number 6,992,002
- Issue date Jan 31, 2006
- International Business Machines Corporation
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simplified tiling pattern method
- Patent number 6,948,146
- Issue date Sep 20, 2005
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Physical design characterization system
- Patent number 6,823,496
- Issue date Nov 23, 2004
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trough adjusted optical proximity correction for vias
- Patent number 6,760,901
- Issue date Jul 6, 2004
- International Business Machines Corporation
- Bette L. Bergman Reuter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interactive optical proximity correction design method
- Patent number 6,704,695
- Issue date Mar 9, 2004
- International Business Machines Corporation
- Orest Bula
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method to control nested to isolated line printing
- Patent number 6,667,136
- Issue date Dec 23, 2003
- International Business Machines Corporation
- Orest Bula
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
FinFET layout generation
- Patent number 6,662,350
- Issue date Dec 9, 2003
- International Business Machines Corporation
- David M. Fried
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for edge bias correction of topography-induced linewidth var...
- Patent number 6,539,321
- Issue date Mar 25, 2003
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Shapes-based migration of aluminum designs to copper damascene
- Patent number 6,528,883
- Issue date Mar 4, 2003
- International Business Machines Corporation
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to control nested to isolated line printing
- Patent number 6,458,493
- Issue date Oct 1, 2002
- International Business Machines Corporation
- Orest Bula
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical Proximity Correction Structures Having Decoupling Capacitors
- Patent number 6,429,469
- Issue date Aug 6, 2002
- International Business Machines Corporation
- Archibald J. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto correction of error checked simulated printed images
- Patent number 6,425,112
- Issue date Jul 23, 2002
- International Business Machines Corporation
- Orest Bula
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of etch bias proximity correction
- Patent number 6,395,438
- Issue date May 28, 2002
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Error checking of simulated printed images with process window effe...
- Patent number 6,373,975
- Issue date Apr 16, 2002
- International Business Machines Corporation
- Orest Bula
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...
- Publication number 20100095254
- Publication date Apr 15, 2010
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTICAL PROXIMI...
- Publication number 20080247633
- Publication date Oct 9, 2008
- David L DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20080232675
- Publication date Sep 25, 2008
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN
- Publication number 20080104555
- Publication date May 1, 2008
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SHAPES-BASED MIGRATION OF ALUMINUM DESIGNS TO COPPER DAMASCENE
- Publication number 20070275551
- Publication date Nov 29, 2007
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SHAPES-BASED MIGRATION OF ALUMINUM DESIGNS TO COPPER DAMASCENE
- Publication number 20070273048
- Publication date Nov 29, 2007
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASK DEFECT ANALYSIS SYSTEM
- Publication number 20070248257
- Publication date Oct 25, 2007
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MASK DEFECT ANALYSIS SYSTEM
- Publication number 20070237384
- Publication date Oct 11, 2007
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20070211933
- Publication date Sep 13, 2007
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for testing pattern sensitive algorithms for semi...
- Publication number 20070038970
- Publication date Feb 15, 2007
- International Business Machines Corporation
- David L. DeMaris
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Shapes-based migration of aluminum designs to copper damascene
- Publication number 20060081988
- Publication date Apr 20, 2006
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTI...
- Publication number 20060023932
- Publication date Feb 2, 2006
- International Business Machines Corporation
- David L. DeMaris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC TILING PATTERN METHOD, IC SO FORMED AND ANALYSIS METHOD
- Publication number 20050273744
- Publication date Dec 8, 2005
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTONOMIC GRAPHICAL PARTITIONING
- Publication number 20050125756
- Publication date Jun 9, 2005
- International Business Machines Corporation
- Gary S. Ditlow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...
- Publication number 20050094863
- Publication date May 5, 2005
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHYSICAL DESIGN CHARACTERIZATION SYSTEM
- Publication number 20040221250
- Publication date Nov 4, 2004
- International Business Machines Corporation
- Betty L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMPLIFIED TILING PATTERN METHOD
- Publication number 20040139417
- Publication date Jul 15, 2004
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Physical design characterization system
- Publication number 20030200513
- Publication date Oct 23, 2003
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Trough adjusted optical proximity correction for vias
- Publication number 20030196178
- Publication date Oct 16, 2003
- International Business Machines Corporation
- Bette L. Bergman Reuter
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Mask defect analysis system
- Publication number 20030161525
- Publication date Aug 28, 2003
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Finfet layout generation
- Publication number 20030145299
- Publication date Jul 31, 2003
- David M. Fried
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Shapes-based migration of aluminum designs to copper damascene
- Publication number 20030080435
- Publication date May 1, 2003
- Timothy G. Dunham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EDGE BIAS CORRECTION OF TOPOGRAPHY-INDUCED LINEWIDTH VAR...
- Publication number 20030018443
- Publication date Jan 23, 2003
- International Business Machines Corporation
- James A. Bruce
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method to control nested to isolated line printing
- Publication number 20030008220
- Publication date Jan 9, 2003
- Orest Bula
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD TO CONTROL NESTED TO ISOLATED LINE PRINTING
- Publication number 20010044053
- Publication date Nov 22, 2001
- OREST BULA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

William C. Leipold

Person

Patents Grantslast 30 patents

System and method for testing pattern sensitive algorithms for semi...

Shapes-based migration of aluminum designs to copper damascene

Testing pattern sensitive algorithms for semiconductor design

IC tiling pattern method, IC so formed and analysis method

Physical design characterization system

System for search and analysis of systematic defects in integrated...

Shapes-based migration of aluminum designs to copper damascene

Mask defect analysis system

Mask defect analysis system

System for search and analysis of systematic defects in integrated...

method for generating a set of test patterns for an optical proximi...

System and method for testing pattern sensitive algorithms for semi...

Shapes-based migration of aluminum designs to copper damascene

System for search and analysis of systematic defects in integrated...

Mask defect analysis system

Autonomic graphical partitioning

Shapes-based migration of aluminum designs to copper damascence

Simplified tiling pattern method

Physical design characterization system

Trough adjusted optical proximity correction for vias

Interactive optical proximity correction design method

Method to control nested to isolated line printing

FinFET layout generation

Method for edge bias correction of topography-induced linewidth var...

Shapes-based migration of aluminum designs to copper damascene

Method to control nested to isolated line printing

Optical Proximity Correction Structures Having Decoupling Capacitors

Auto correction of error checked simulated printed images

Method of etch bias proximity correction

Error checking of simulated printed images with process window effe...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMI...

SYSTEM FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTICAL PROXIMI...

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

TESTING PATTERN SENSITIVE ALGORITHMS FOR SEMICONDUCTOR DESIGN

SHAPES-BASED MIGRATION OF ALUMINUM DESIGNS TO COPPER DAMASCENE

SHAPES-BASED MIGRATION OF ALUMINUM DESIGNS TO COPPER DAMASCENE

MASK DEFECT ANALYSIS SYSTEM

MASK DEFECT ANALYSIS SYSTEM

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

System and method for testing pattern sensitive algorithms for semi...

Shapes-based migration of aluminum designs to copper damascene

SYSTEM AND METHOD FOR GENERATING A SET OF TEST PATTERNS FOR AN OPTI...

IC TILING PATTERN METHOD, IC SO FORMED AND ANALYSIS METHOD

AUTONOMIC GRAPHICAL PARTITIONING

SYSTEM FOR SEARCH AND ANALYSIS OF SYSTEMATIC DEFECTS IN INTEGRATED...

PHYSICAL DESIGN CHARACTERIZATION SYSTEM

SIMPLIFIED TILING PATTERN METHOD

Physical design characterization system

Trough adjusted optical proximity correction for vias

Mask defect analysis system

Finfet layout generation

Shapes-based migration of aluminum designs to copper damascene

METHOD FOR EDGE BIAS CORRECTION OF TOPOGRAPHY-INDUCED LINEWIDTH VAR...

Method to control nested to isolated line printing

METHOD TO CONTROL NESTED TO ISOLATED LINE PRINTING