Yoshitsugu Yamamoto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,508,564
- Issue date Nov 29, 2016
- Mitsubishi Electric Corporation
- Yoshinori Yokoyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,159,654
- Issue date Oct 13, 2015
- Mitsubishi Electric Corporation
- Youichi Nogami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor with shortened recovery time
- Patent number 9,117,742
- Issue date Aug 25, 2015
- MITSUBISHI ELECTRIC CORPORATION
- Hiroyuki Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 8,912,099
- Issue date Dec 16, 2014
- Mitsubishi Electric Corporation
- Kenichiro Kurahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having improved RF characteristics and moistur...
- Patent number 8,878,333
- Issue date Nov 4, 2014
- Mitsubishi Electric Corporation
- Youichi Nogami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,816,493
- Issue date Aug 26, 2014
- Mitsubishi Electric Corporation
- Yoichi Nogami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 8,247,844
- Issue date Aug 21, 2012
- Mitsubishi Electric Corporation
- Toshiyuki Oishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including field effect transistor with reduced...
- Patent number 8,232,609
- Issue date Jul 31, 2012
- Mitsubishi Electric Corporation
- Tetsuo Kunii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,700,972
- Issue date Apr 20, 2010
- Mitsubishi Electric Corporation
- Hideo Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for evaluating semiconductor layers
- Patent number 7,656,514
- Issue date Feb 2, 2010
- Mitsubishi Electric Corporation
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency switch
- Patent number 7,612,633
- Issue date Nov 3, 2009
- Mitsubishi Electric Corporation
- Masatake Hangai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with recessed gate and shield electrode
- Patent number 7,528,443
- Issue date May 5, 2009
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kunii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring surface carrier recombination ve...
- Patent number 7,420,684
- Issue date Sep 2, 2008
- Mitsubishi Denki Kabushiki Kaisha
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring method for semiconductor multiple layer structure...
- Patent number 7,038,768
- Issue date May 2, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating piezoelectric fields
- Patent number 6,998,615
- Issue date Feb 14, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating and adjusting microwave integra...
- Patent number 6,911,837
- Issue date Jun 28, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Takahide Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating a crystalline semiconductor substrate
- Patent number 6,819,119
- Issue date Nov 16, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring surface leakage current of sample
- Patent number 6,570,390
- Issue date May 27, 2003
- Rigaku Corporation
- Taisei Hirayama
- G01 - MEASURING TESTING
Information Patent Grant
III-V heterojunction bipolar transistor having a GaAs emitter ballast
- Patent number 6,043,520
- Issue date Mar 28, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making hetero-structure
- Patent number 6,037,242
- Issue date Mar 14, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Norio Hayafuji
- C30 - CRYSTAL GROWTH
Information Patent Grant
Field effect transistor
- Patent number 5,874,753
- Issue date Feb 23, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Norio Hayafuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field effect transistor
- Patent number 5,811,843
- Issue date Sep 22, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor
- Patent number 5,796,127
- Issue date Aug 18, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Norio Hayafuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 5,729,030
- Issue date Mar 17, 1998
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Yamamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of fabricating semiconductor device and semiconductor device...
- Patent number 5,682,045
- Issue date Oct 28, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Norio Hayafuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device strucutre having a two-dimensional electron ga...
- Patent number 5,677,553
- Issue date Oct 14, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MBE apparatus and gas branch piping apparatus
- Patent number 5,616,181
- Issue date Apr 1, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Yamamoto
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170294887
- Publication date Oct 12, 2017
- Mitsubishi Electric Corporation
- Yoshitaka KAMO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20150243530
- Publication date Aug 27, 2015
- Mitsubishi Electric Corporation
- Yoshinori Yokoyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20150054137
- Publication date Feb 26, 2015
- Mitsubishi Electric Corporation
- Youichi NOGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140353674
- Publication date Dec 4, 2014
- Mitsubishi Electric Corporation
- Hiroyuki Kinoshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20140175615
- Publication date Jun 26, 2014
- Mitsubishi Electric Corporation
- Yoichi Nogami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20140134835
- Publication date May 15, 2014
- Mitsubishi Electric Corporation
- Kenichiro Kurahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140077280
- Publication date Mar 20, 2014
- Yoichi Nogami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20130056875
- Publication date Mar 7, 2013
- Mitsubishi Electric Corporation
- Youichi NOGAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110006351
- Publication date Jan 13, 2011
- Mitsubishi Electric Corporation
- Tetsuo Kunii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20100244041
- Publication date Sep 30, 2010
- MITSUBISHI ELECTRIC CORPORATION
- Toshiyuki OISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20090218578
- Publication date Sep 3, 2009
- Mitsubishi Electric Corporation
- Hideo Takeuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-FREQUENCY SWITCH
- Publication number 20080106353
- Publication date May 8, 2008
- Mitsubishi Electric Corporation
- Masatake Hangai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the semiconductor...
- Publication number 20070132021
- Publication date Jun 14, 2007
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kunii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for evaluating semiconductor layers
- Publication number 20070026594
- Publication date Feb 1, 2007
- Mitsubishi Electric Corporation
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Heterojunction bipolar transistor and amplifier including the same
- Publication number 20060237747
- Publication date Oct 26, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Satoshi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring surface carrier recombination ve...
- Publication number 20060094133
- Publication date May 4, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Heterojunction field effect semiconductor device
- Publication number 20050263788
- Publication date Dec 1, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Tetsuo Kunii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical measuring method for semiconductor multiple layer structure...
- Publication number 20050099623
- Publication date May 12, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING AND ADJUSTING MICROWAVE INTEGRA...
- Publication number 20050046435
- Publication date Mar 3, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Takahide Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for evaluating piezoelectric fields
- Publication number 20040155194
- Publication date Aug 12, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hideo Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Method for evaluating a crystalline semiconductor substrate
- Publication number 20040029390
- Publication date Feb 12, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Yoshitsugu Yamamoto
- G01 - MEASURING TESTING

Yoshitsugu Yamamoto

Person

Patents Grantslast 30 patents

Method for manufacturing semiconductor device

Semiconductor device

High electron mobility transistor with shortened recovery time

Method of manufacturing semiconductor device

Semiconductor device having improved RF characteristics and moistur...

Semiconductor device

Semiconductor device and manufacturing method thereof

Semiconductor device including field effect transistor with reduced...

Semiconductor device

Method and apparatus for evaluating semiconductor layers

High-frequency switch

Semiconductor device with recessed gate and shield electrode

Method and apparatus for measuring surface carrier recombination ve...

Optical measuring method for semiconductor multiple layer structure...

Method for evaluating piezoelectric fields

Method and apparatus for evaluating and adjusting microwave integra...

Method for evaluating a crystalline semiconductor substrate

Method for measuring surface leakage current of sample

III-V heterojunction bipolar transistor having a GaAs emitter ballast

Method of making hetero-structure

Field effect transistor

Field effect transistor

High electron mobility transistor

Semiconductor device

Method of fabricating semiconductor device and semiconductor device...

Semiconductor device strucutre having a two-dimensional electron ga...

MBE apparatus and gas branch piping apparatus

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE

HIGH-FREQUENCY SWITCH

Semiconductor device and method of manufacturing the semiconductor...

Method and apparatus for evaluating semiconductor layers

Heterojunction bipolar transistor and amplifier including the same

Method and apparatus for measuring surface carrier recombination ve...

Heterojunction field effect semiconductor device

Optical measuring method for semiconductor multiple layer structure...

METHOD AND APPARATUS FOR EVALUATING AND ADJUSTING MICROWAVE INTEGRA...

Method for evaluating piezoelectric fields

Method for evaluating a crystalline semiconductor substrate