Adaptations of individual semiconductor devices to facilitate the testing thereof

Industry

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G01R31/2644

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2644Adaptations of individual semiconductor devices to facilitate the testing thereof

Industries

Patents Grantslast 30 patents

Information Patent Grant
Power semi-conductor module, mask, measurement method, computer sof...
- Patent number 11,927,619
- Issue date Mar 12, 2024
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Gyroscope with self-test
- Patent number 11,920,931
- Issue date Mar 5, 2024
- Murata Manufacturing Co., Ltd.
- Heikki Kuisma
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for detecting defects in semiconductor device
- Patent number 11,854,913
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yang-Che Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor base plate and test method thereof
- Patent number 11,821,937
- Issue date Nov 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Qiang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for testing components under elevated gas pressure
- Patent number 11,815,542
- Issue date Nov 14, 2023
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for test pattern forming and film property me...
- Patent number 11,699,622
- Issue date Jul 11, 2023
- Active Layer Parametrics, Inc.
- Bulent Mehmet Basol
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Predictive chip-maintenance
- Patent number 11,531,056
- Issue date Dec 20, 2022
- Infineon Technologies AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of determining operating conditions of silicon carbide powe...
- Patent number 11,474,145
- Issue date Oct 18, 2022
- Board of Regents, The University of Texas System
- Enes Ugur
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor devices including through electrodes
- Patent number 11,422,181
- Issue date Aug 23, 2022
- SK hynix Inc.
- Chang Hyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of monitoring conditions associated with aging of silicon c...
- Patent number 11,397,209
- Issue date Jul 26, 2022
- Board of Regents, The University of Texas System
- Bilal Akin
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for monitoring the health of a power semiconducto...
- Patent number 11,378,612
- Issue date Jul 5, 2022
- Mitsubishi Electric Corporation
- Nicolas Degrenne
- G01 - MEASURING TESTING
Information Patent Grant
Testing method of a semiconductor device
- Patent number 11,327,107
- Issue date May 10, 2022
- Samsung Electronics Co., Ltd.
- Juhun Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for test pattern forming and film property me...
- Patent number 11,289,386
- Issue date Mar 29, 2022
- Active Layer Parametrics, Inc.
- Bulent Mehmet Basol
- G01 - MEASURING TESTING
Information Patent Grant
Functional prober chip
- Patent number 11,280,825
- Issue date Mar 22, 2022
- Xallent LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining device operability via metal-induced layer exchange
- Patent number 11,221,359
- Issue date Jan 11, 2022
- International Business Machines Corporation
- Dexin Kong
- G01 - MEASURING TESTING
Information Patent Grant
Vertical-cavity surface-emitting laser layout for high bandwidth ou...
- Patent number 11,165,224
- Issue date Nov 2, 2021
- Mellanox Technologies, Ltd.
- Itshak Kalifa
- G01 - MEASURING TESTING
Information Patent Grant
Insulator applied in a probe base and the probe base
- Patent number 11,143,675
- Issue date Oct 12, 2021
- C.C.P. CONTACT PROBES CO., LTD.
- Chien-Yu Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
Failure positioning method
- Patent number 11,125,804
- Issue date Sep 21, 2021
- Shanghai Huali Integrated Circuit Mfg. Co. Ltd.
- Lingye Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dummy element and method of examining defect of resistive element
- Patent number 11,114,351
- Issue date Sep 7, 2021
- Fuji Electric Co., Ltd.
- Osamu Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having probe pads and seal ring
- Patent number 11,088,037
- Issue date Aug 10, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yang-Che Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for detecting cracks
- Patent number 11,061,064
- Issue date Jul 13, 2021
- NANYA TECHNOLOGY CORPORATION
- Chih-Wei Huang
- G01 - MEASURING TESTING
Information Patent Grant
Display device
- Patent number 11,056,424
- Issue date Jul 6, 2021
- SAMSUNG DISPLAY CO., LTD.
- Kyung Mok Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Reference circuit for metrology system
- Patent number 11,022,503
- Issue date Jun 1, 2021
- Apple Inc.
- Daniel J. Fritchman
- G01 - MEASURING TESTING
Information Patent Grant
Ring oscillator temperature sensor
- Patent number 10,998,889
- Issue date May 4, 2021
- Birad—Research & Development Company Ltd.
- Joseph Shor
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test structure and evaluation method for semiconductor photo overlay
- Patent number 10,930,571
- Issue date Feb 23, 2021
- Samsung Electronics Co., Ltd.
- Ki-Don Lee
- G01 - MEASURING TESTING
Information Patent Grant
Embedded photodetector as device health monitor for hot carrier inj...
- Patent number 10,928,438
- Issue date Feb 23, 2021
- International Business Machines Corporation
- Justin E. Henspeter
- G01 - MEASURING TESTING
Information Patent Grant
Sensor with self diagnostic function
- Patent number 10,890,615
- Issue date Jan 12, 2021
- Melexis Technologies NV
- Vincenzo Sacco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrical component testing in stacked semiconductor arrangement
- Patent number 10,886,185
- Issue date Jan 5, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Shao-Yu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display substrate motherboard, display substrate and fabrication me...
- Patent number 10,872,910
- Issue date Dec 22, 2020
- MIANYANG BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Yansheng Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Functional prober chip
- Patent number 10,866,273
- Issue date Dec 15, 2020
- Xallent, LLC
- Kwame Amponsah
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...
- Publication number 20240110970
- Publication date Apr 4, 2024
- DENSO CORPORATION
- Masataka DEGUCHI
- G01 - MEASURING TESTING
Information Patent Application
WAFER ASSEMBLY AND METHOD FOR PRODUCING A PLURALITY OF SEMICONDUCTO...
- Publication number 20240096681
- Publication date Mar 21, 2024
- ams-OSRAM International GmbH
- Teresa Baur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE FOR INSPECTION
- Publication number 20240014081
- Publication date Jan 11, 2024
- ROHM CO., LTD.
- Toshiro TAKAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME
- Publication number 20230176108
- Publication date Jun 8, 2023
- Samsung Electronics Co.,Ltd.
- SEUNGHYUN CHO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, METHOD OF TESTING THE SAME, AND METHOD OF DES...
- Publication number 20230095204
- Publication date Mar 30, 2023
- RENESAS ELECTRONICS CORPORATION
- Hiroko YOSHINAGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR BASE PLATE AND TEST METHOD THEREOF
- Publication number 20230046754
- Publication date Feb 16, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qiang LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING RESISTANCE VALUE OF CONTACT PLUG AND TESTING S...
- Publication number 20230016770
- Publication date Jan 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Qiang Long
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING ABNORMITY, METHOD FOR REPAIRING AND SYSTEM FOR...
- Publication number 20230016663
- Publication date Jan 19, 2023
- Changxin Memory Technologies, Inc.
- Shisheng WANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...
- Publication number 20220216118
- Publication date Jul 7, 2022
- Active Layer Parametrics, Inc.
- Bulent Mehmet BASOL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE, SEMICONDUCTOR PACKAGE, AND ME...
- Publication number 20220165629
- Publication date May 26, 2022
- Fuji Electric Co., Ltd.
- Makoto UTSUMI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A TEST DUMMY PATTERN, METHOD OF MANU...
- Publication number 20220130733
- Publication date Apr 28, 2022
- SK HYNIX INC.
- Jae Taek KIM
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR TESTING COMPONENTS UNDER ELEVATED GAS PRESSURE
- Publication number 20220034955
- Publication date Feb 3, 2022
- Rainer Gaggl
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR DEVICE
- Publication number 20210366794
- Publication date Nov 25, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- YANG-CHE CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREDICTIVE CHIP-MAINTENANCE
- Publication number 20210325445
- Publication date Oct 21, 2021
- INFINEON TECHNOLOGIES AG
- Irmgard Escher-Poeppel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING METHOD OF A SEMICONDUCTOR DEVICE
- Publication number 20210231727
- Publication date Jul 29, 2021
- Samsung Electronics Co., Ltd.
- JUHUN PARK
- G01 - MEASURING TESTING
Information Patent Application
POWER SEMI-CONDUCTOR MODULE, MASK, MEASUREMENT METHOD, COMPUTER SOF...
- Publication number 20210223307
- Publication date Jul 22, 2021
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT AND METHOD FOR RECORDING ELECTRICAL EVENTS
- Publication number 20210215749
- Publication date Jul 15, 2021
- Semiconductor Components Industries, LLC
- Jeffrey Peter GAMBINO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR MONITORING POWER SEMICONDUCTOR DIE
- Publication number 20210172994
- Publication date Jun 10, 2021
- Mitsubishi Electric Corporation
- Nicolas DEGRENNE
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CHIP AND CIRCUIT AND METHOD FOR ELECTRICALLY TESTING...
- Publication number 20210156902
- Publication date May 27, 2021
- Changxin Memory Technologies, Inc.
- Weibao KE
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL PROBER CHIP
- Publication number 20210063470
- Publication date Mar 4, 2021
- Xallent LLC
- Kwame Amponsah
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES INCLUDING THROUGH ELECTRODES
- Publication number 20210011074
- Publication date Jan 14, 2021
- SK HYNIX INC.
- Chang Hyun KIM
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF DETERMINING OPERATING CONDITIONS OF SILICON CARBIDE POWE...
- Publication number 20200408829
- Publication date Dec 31, 2020
- Board of Regents, The University of Texas System
- Enes Ugur
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF MONITORING CONDITIONS ASSOCIATED WITH AGING OF SILICON C...
- Publication number 20200400738
- Publication date Dec 24, 2020
- Board of Regents, The University of Texas System
- Bilal Akin
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR DETECTING CRACKS
- Publication number 20200363464
- Publication date Nov 19, 2020
- NANYA TECHNOLOGY CORPORATION
- CHIH-WEI HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING RESIDUAL TEST PATTERN
- Publication number 20200303268
- Publication date Sep 24, 2020
- SAMSUNG ELECTRONICS CO., LTD.
- Myoungsoo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETERMINING DEVICE OPERABILITY VIA METAL-INDUCED LAYER EXCHANGE
- Publication number 20200292611
- Publication date Sep 17, 2020
- International Business Machines Corporation
- Dexin Kong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOVEL TEST STRUCTURE AND EVALUATION METHOD FOR SEMICONDUCTOR PHOTO...
- Publication number 20200251391
- Publication date Aug 6, 2020
- Samsung Electronics Co., Ltd.
- Ki-Don LEE
- G01 - MEASURING TESTING
Information Patent Application
Reference Circuit for Metrology System
- Publication number 20200217729
- Publication date Jul 9, 2020
- Apple Inc.
- Daniel J. Fritchman
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...
- Publication number 20200219778
- Publication date Jul 9, 2020
- Active Layer Parametrics, Inc.
- Bulent Mehmet BASOL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAILURE POSITIONING METHOD
- Publication number 20200191859
- Publication date Jun 18, 2020
- Shanghai Huali Integrated Circuit Mfg. Co., Ltd.
- Lingye YANG
- G06 - COMPUTING CALCULATING COUNTING

Adaptations of individual semiconductor devices to facilitate the testing thereof

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Power semi-conductor module, mask, measurement method, computer sof...

Gyroscope with self-test

Method for detecting defects in semiconductor device

Semiconductor base plate and test method thereof

Device for testing components under elevated gas pressure

Methods and apparatus for test pattern forming and film property me...

Predictive chip-maintenance

Methods of determining operating conditions of silicon carbide powe...

Semiconductor devices including through electrodes

Methods of monitoring conditions associated with aging of silicon c...

Device and method for monitoring the health of a power semiconducto...

Testing method of a semiconductor device

Methods and apparatus for test pattern forming and film property me...

Functional prober chip

Determining device operability via metal-induced layer exchange

Vertical-cavity surface-emitting laser layout for high bandwidth ou...

Insulator applied in a probe base and the probe base

Failure positioning method

Dummy element and method of examining defect of resistive element

Semiconductor device having probe pads and seal ring

Semiconductor device and method for detecting cracks

Display device

Reference circuit for metrology system

Ring oscillator temperature sensor

Test structure and evaluation method for semiconductor photo overlay

Embedded photodetector as device health monitor for hot carrier inj...

Sensor with self diagnostic function

Electrical component testing in stacked semiconductor arrangement

Display substrate motherboard, display substrate and fabrication me...

Functional prober chip

Patents Applicationslast 30 patents

METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICOND...

WAFER ASSEMBLY AND METHOD FOR PRODUCING A PLURALITY OF SEMICONDUCTO...

SEMICONDUCTOR STRUCTURE FOR INSPECTION

SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME

SEMICONDUCTOR DEVICE, METHOD OF TESTING THE SAME, AND METHOD OF DES...

SEMICONDUCTOR BASE PLATE AND TEST METHOD THEREOF

METHOD FOR MEASURING RESISTANCE VALUE OF CONTACT PLUG AND TESTING S...

METHOD FOR DETECTING ABNORMITY, METHOD FOR REPAIRING AND SYSTEM FOR...

METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...

SILICON CARBIDE SEMICONDUCTOR DEVICE, SEMICONDUCTOR PACKAGE, AND ME...

SEMICONDUCTOR DEVICE INCLUDING A TEST DUMMY PATTERN, METHOD OF MANU...

DEVICE FOR TESTING COMPONENTS UNDER ELEVATED GAS PRESSURE

METHOD FOR DETECTING DEFECTS IN SEMICONDUCTOR DEVICE

PREDICTIVE CHIP-MAINTENANCE

TESTING METHOD OF A SEMICONDUCTOR DEVICE

POWER SEMI-CONDUCTOR MODULE, MASK, MEASUREMENT METHOD, COMPUTER SOF...

CIRCUIT AND METHOD FOR RECORDING ELECTRICAL EVENTS

DEVICE AND METHOD FOR MONITORING POWER SEMICONDUCTOR DIE

SEMICONDUCTOR CHIP AND CIRCUIT AND METHOD FOR ELECTRICALLY TESTING...

FUNCTIONAL PROBER CHIP

SEMICONDUCTOR DEVICES INCLUDING THROUGH ELECTRODES

METHODS OF DETERMINING OPERATING CONDITIONS OF SILICON CARBIDE POWE...

METHODS OF MONITORING CONDITIONS ASSOCIATED WITH AGING OF SILICON C...

SEMICONDUCTOR DEVICE AND METHOD FOR DETECTING CRACKS

SEMICONDUCTOR DEVICE INCLUDING RESIDUAL TEST PATTERN

DETERMINING DEVICE OPERABILITY VIA METAL-INDUCED LAYER EXCHANGE

NOVEL TEST STRUCTURE AND EVALUATION METHOD FOR SEMICONDUCTOR PHOTO...

Reference Circuit for Metrology System

METHODS AND APPARATUS FOR TEST PATTERN FORMING AND FILM PROPERTY ME...

FAILURE POSITIONING METHOD