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DELAMINATION DETECTION STRUCTURE
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Publication number 20250140684
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Publication date May 1, 2025
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Chi-Hui Lai
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H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR TEST APPARATUS
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Publication number 20250130268
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Publication date Apr 24, 2025
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Samsung Electronics Co., Ltd.
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Chunghyun KIM
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G01 - MEASURING TESTING
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SACRIFICIAL TEST PAD
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Publication number 20250132208
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Publication date Apr 24, 2025
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Taiwan Semiconductor Manufacturing Company, Ltd.
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Tzu-Ting Liu
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H01 - BASIC ELECTRIC ELEMENTS
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ELECTRONIC DEVICE
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Publication number 20250118605
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Publication date Apr 10, 2025
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InnoLux Corporation
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Yeong-E CHEN
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H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE
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Publication number 20250096169
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Publication date Mar 20, 2025
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Fuji Electric Co., Ltd.
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Tohru SHIRAKAWA
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H01 - BASIC ELECTRIC ELEMENTS
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SCAN TESTABLE THROUGH SILICON VIAS
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Publication number 20250087539
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Publication date Mar 13, 2025
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TEXAS INSTRUMENTS INCORPORATED
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Lee D. Whetsel
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H01 - BASIC ELECTRIC ELEMENTS
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CIRCUIT FOR DETECTING DEFECTS
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Publication number 20250085340
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Publication date Mar 13, 2025
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Samsung Electronics Co., Ltd.
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Takuya FAUTATSUYAMA
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H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR PACKAGES
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Publication number 20250046659
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Publication date Feb 6, 2025
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Samsung Electronics Co., Ltd.
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Se Ra Lee
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H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR PACKAGE
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Publication number 20250029879
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Publication date Jan 23, 2025
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Samsung Electronics Co., Ltd.
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Dongkuk Lee
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H01 - BASIC ELECTRIC ELEMENTS
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SEMICONDUCTOR DEVICE
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Publication number 20250022758
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Publication date Jan 16, 2025
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Samsung Electronics Co., Ltd.
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Yongho KIM
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H01 - BASIC ELECTRIC ELEMENTS