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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

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Patents Grantslast 30 patents

Information Patent Grant
Hyperspectral imager method and apparatus
- Patent number 12,306,043
- Issue date May 20, 2025
- Technological Resources Pty. Limited
- Richard J. Murphy
- G01 - MEASURING TESTING
Information Patent Grant
Optical device
- Patent number 12,298,132
- Issue date May 13, 2025
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Imager and spot sampler with translatable stage
- Patent number 12,271,004
- Issue date Apr 8, 2025
- Westboro Photonics Inc.
- Timothy Moggridge
- G02 - OPTICS
Information Patent Grant
Illuminator method and device for semiconductor package testing
- Patent number 12,228,610
- Issue date Feb 18, 2025
- UTAC HEADQUARTERS PTE. LTD.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Grant
Focus plane equalizer apparatus with prismatic focus corrector
- Patent number 12,206,963
- Issue date Jan 21, 2025
- Urugus S.A.
- Gerardo Gabriel Richarte
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for advanced autofocusing spectroscopy
- Patent number 12,196,612
- Issue date Jan 14, 2025
- Impossible Sensing LLC
- Pablo Sobron
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 12,152,878
- Issue date Nov 26, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Focus scanning apparatus recording color
- Patent number 12,150,836
- Issue date Nov 26, 2024
- 3Shape A/S
- Bo Esbech
- G01 - MEASURING TESTING
Information Patent Grant
Autofocusing method, spectroscopic camera, and computer program
- Patent number 12,044,571
- Issue date Jul 23, 2024
- Seiko Epson Corporation
- Takeshi Nozawa
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for hyperspectral imaging based on a metasurface-integrated...
- Patent number 12,007,276
- Issue date Jun 11, 2024
- Purdue Research Foundation
- Rohith Chandrasekar
- G01 - MEASURING TESTING
Information Patent Grant
Hyperspectral imager method and apparatus
- Patent number 12,007,277
- Issue date Jun 11, 2024
- Technological Resources Pty. Limited
- Richard J. Murphy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reflectometry instrument and method for measuring macular pigment
- Patent number 11,998,276
- Issue date Jun 4, 2024
- ZeaVision, LLC.
- Scott J. Huter
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy equipment
- Patent number 11,946,803
- Issue date Apr 2, 2024
- Answeray Inc.
- Seong Ho Cho
- G01 - MEASURING TESTING
Information Patent Grant
Color measurement apparatus
- Patent number 11,927,484
- Issue date Mar 12, 2024
- Seiko Epson Corporation
- Haruki Miyasaka
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
- Patent number 11,885,681
- Issue date Jan 30, 2024
- Pendar Technologies, LLC
- Daryoosh Vakhshoori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical array waveguide grating-type multiplexer and demultiplexer...
- Patent number 11,828,982
- Issue date Nov 28, 2023
- LG Innotek Co., Ltd
- Lee Im Kang
- G01 - MEASURING TESTING
Information Patent Grant
Dual-optical-path spectrophotometer and color measurement method th...
- Patent number 11,815,396
- Issue date Nov 14, 2023
- CaiPu Technology (Zhejiang) Co., Ltd.
- Kun Yuan
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for active line scan imaging
- Patent number 11,788,891
- Issue date Oct 17, 2023
- The United States of America, as represented by the Secretary of Agriculture
- Moon S. Kim
- G01 - MEASURING TESTING
Information Patent Grant
Self-adaptive electromagnetic energy attenuator
- Patent number 11,781,906
- Issue date Oct 10, 2023
- Elbit Systems Ltd.
- Noam Yona Gross
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Support structure and method for focus adjustment
- Patent number 11,781,909
- Issue date Oct 10, 2023
- Thermo Electron Scientific Instruments LLC
- Matthew Meyer
- G01 - MEASURING TESTING
Information Patent Grant
Optical component mount
- Patent number 11,747,584
- Issue date Sep 5, 2023
- OPTOS PLC
- Rainer Heidemann
- G01 - MEASURING TESTING
Information Patent Grant
Differential interference imaging system capable of rapidly changin...
- Patent number 11,740,129
- Issue date Aug 29, 2023
- SOUTH CHINA NORMAL UNIVERSITY
- Xiaoxu Lv
- G01 - MEASURING TESTING
Information Patent Grant
Optical module
- Patent number 11,635,290
- Issue date Apr 25, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,629,947
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,629,946
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,624,605
- Issue date Apr 11, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
System and method for conformal vision
- Patent number 11,607,136
- Issue date Mar 21, 2023
- ChemImage Corporation
- Matthew Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Nanoelectromechanical interferometer for visible to infrared wavele...
- Patent number 11,549,848
- Issue date Jan 10, 2023
- Danmarks Tekniske Universitet
- Marcus Albrechtsen
- G01 - MEASURING TESTING
Information Patent Grant
Optical device allowing the angular and spectral emission of an obj...
- Patent number 11,525,734
- Issue date Dec 13, 2022
- ELDIM
- Thierry Leroux
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPIC CONFOCAL FLUORESCENCE SPECTROMETER
- Publication number 20250146868
- Publication date May 8, 2025
- Shanxi University
- Yongming Fu
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC RADIATION MEASUREMENT DEVICE
- Publication number 20250102359
- Publication date Mar 27, 2025
- NPL Management Limited
- Yameng CAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ADVANCED AUTOFOCUSING SPECTROSCOPY
- Publication number 20250093202
- Publication date Mar 20, 2025
- Impossible Sensing LLC
- Pablo Sobron
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ENHANCING A RAMAN CONTRIBUTION IN A SPECTRUM, SPECTROSCO...
- Publication number 20250093269
- Publication date Mar 20, 2025
- SERSTECH AB
- Katja SZYBEK
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASUREMENT DEVICE
- Publication number 20250076115
- Publication date Mar 6, 2025
- HTC CORPORATION
- Bo-Wen Xiao
- G01 - MEASURING TESTING
Information Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
- Publication number 20250064560
- Publication date Feb 27, 2025
- 3SHAPE A/S
- Bo ESBECH
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20250044074
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
AUTO-FOCUS SPECTROMETER
- Publication number 20250027812
- Publication date Jan 23, 2025
- Zolix Instruments Co., Ltd.
- Fei Tong
- G01 - MEASURING TESTING
Information Patent Application
Multi Spectral Digital Autocollimator
- Publication number 20240426657
- Publication date Dec 26, 2024
- Oren Aharon
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD
- Publication number 20240426658
- Publication date Dec 26, 2024
- Urugus S.A.
- Nicola Palombo Blascetta
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF ASSEMBLY
- Publication number 20240410755
- Publication date Dec 12, 2024
- Nikira Labs Inc.
- John Brian Leen
- G01 - MEASURING TESTING
Information Patent Application
BROAD-SPECTRUM IMAGING SPECTROMETER BASED ON TRANSMISSION AND REFLE...
- Publication number 20240393176
- Publication date Nov 28, 2024
- Jiangsu Dualix Spectral Imaging Technology Co., Ltd.
- Xinghai CHEN
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPIC RAMAN DEVICE
- Publication number 20240385036
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Ryuta SHIBUTANI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR QUANTUM ABSORPTION SPECTROSCOPY
- Publication number 20240385043
- Publication date Nov 21, 2024
- KYOTO UNIVERSITY
- Shigeki TAKEUCHI
- G01 - MEASURING TESTING
Information Patent Application
Optical Wavelength Measurement Apparatus and Method, Optical Wavele...
- Publication number 20240295437
- Publication date Sep 5, 2024
- Huawei Technologies Co., Ltd
- Lei Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYPERSPECTRAL IMAGER METHOD AND APPARATUS
- Publication number 20240295438
- Publication date Sep 5, 2024
- TECHNOLOGICAL RESOURCES PTY. LIMITED
- Richard J. Murphy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM
- Publication number 20240288309
- Publication date Aug 29, 2024
- Purdue Research Foundation
- Xueji Wang
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
- Publication number 20240271999
- Publication date Aug 15, 2024
- Tsubasa SAITO
- G01 - MEASURING TESTING
Information Patent Application
IMAGER AND SPOT SAMPLER WITH TRANSLATABLE STAGE
- Publication number 20240264454
- Publication date Aug 8, 2024
- Westboro Photonics Inc.
- Timothy Moggridge
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
STYLUS AND COLOR INFORMATION TRANSMITTING METHOD
- Publication number 20240231512
- Publication date Jul 11, 2024
- WACOM CO., LTD.
- Vanio Kirilov Ivanov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
- Publication number 20240159588
- Publication date May 16, 2024
- Pendar Technologies, LLC
- Daryoosh VAKHSHOORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTONOMOUS PHENOTYPE IMAGING SYSTEM
- Publication number 20240151581
- Publication date May 9, 2024
- Purdue Research Foundation
- Jian Jin
- G01 - MEASURING TESTING
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20240110779
- Publication date Apr 4, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
- Publication number 20230363866
- Publication date Nov 16, 2023
- 3SHAPE A/S
- Bo ESBECH
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MICROSPECTROSCOPIC MEASUREMENT DEVICE, AND METHOD FOR CALIBRA...
- Publication number 20230314219
- Publication date Oct 5, 2023
- SHIMADZU CORPORATION
- Tomoki SASAYAMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPECTROMETER BASED ON ALTERNATING DIFFRACTIVE OPTICAL ELEMENTS
- Publication number 20230296433
- Publication date Sep 21, 2023
- ORTA DOGU TEKNIK UNIVERSITESI
- Emre YUCE
- G01 - MEASURING TESTING
Information Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
- Publication number 20230285125
- Publication date Sep 14, 2023
- 3SHAPE A/S
- Bo ESBECH
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
RAMAN MICROSCOPE
- Publication number 20230194339
- Publication date Jun 22, 2023
- Shimadzu Corporation
- Naoya FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
Auto-focus for Spectrometers
- Publication number 20230194346
- Publication date Jun 22, 2023
- Thermo Electron Scientific Instruments LLC
- Alexander GRENOV
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Hyperspectral imager method and apparatus

Optical device

Imager and spot sampler with translatable stage

Illuminator method and device for semiconductor package testing

Focus plane equalizer apparatus with prismatic focus corrector

Method and system for advanced autofocusing spectroscopy

Mirror unit and optical module

Focus scanning apparatus recording color

Autofocusing method, spectroscopic camera, and computer program

Sensor for hyperspectral imaging based on a metasurface-integrated...

Hyperspectral imager method and apparatus

Reflectometry instrument and method for measuring macular pigment

Raman spectroscopy equipment

Color measurement apparatus

Methods and devices for standoff differential Raman spectroscopy wi...

Mirror unit and optical module

Optical array waveguide grating-type multiplexer and demultiplexer...

Dual-optical-path spectrophotometer and color measurement method th...

Method and system for active line scan imaging

Self-adaptive electromagnetic energy attenuator

Support structure and method for focus adjustment

Optical component mount

Differential interference imaging system capable of rapidly changin...

Optical module

Optical device

Mirror unit and optical module

Mirror unit and optical module

System and method for conformal vision

Nanoelectromechanical interferometer for visible to infrared wavele...

Optical device allowing the angular and spectral emission of an obj...

Patents Applicationslast 30 patents

MICROSCOPIC CONFOCAL FLUORESCENCE SPECTROMETER

ELECTROMAGNETIC RADIATION MEASUREMENT DEVICE

METHOD AND SYSTEM FOR ADVANCED AUTOFOCUSING SPECTROSCOPY

METHOD FOR ENHANCING A RAMAN CONTRIBUTION IN A SPECTRUM, SPECTROSCO...

SPECTRUM MEASUREMENT DEVICE

FOCUS SCANNING APPARATUS RECORDING COLOR

MIRROR UNIT AND OPTICAL MODULE

AUTO-FOCUS SPECTROMETER

Multi Spectral Digital Autocollimator

ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD

OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF ASSEMBLY

BROAD-SPECTRUM IMAGING SPECTROMETER BASED ON TRANSMISSION AND REFLE...

MICROSCOPIC RAMAN DEVICE

SYSTEM AND METHOD FOR QUANTUM ABSORPTION SPECTROSCOPY

Optical Wavelength Measurement Apparatus and Method, Optical Wavele...

HYPERSPECTRAL IMAGER METHOD AND APPARATUS

TUNABLE HYPERSPECTRAL-POLARIMETRIC IMAGING SYSTEM

SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...

IMAGER AND SPOT SAMPLER WITH TRANSLATABLE STAGE

STYLUS AND COLOR INFORMATION TRANSMITTING METHOD

Methods and Devices for Standoff Differential Raman Spectroscopy wi...

AUTONOMOUS PHENOTYPE IMAGING SYSTEM

MIRROR UNIT AND OPTICAL MODULE

FOCUS SCANNING APPARATUS RECORDING COLOR

RAMAN MICROSPECTROSCOPIC MEASUREMENT DEVICE, AND METHOD FOR CALIBRA...

OPTICAL SPECTROMETER BASED ON ALTERNATING DIFFRACTIVE OPTICAL ELEMENTS

FOCUS SCANNING APPARATUS RECORDING COLOR

OPTICAL DEVICE

RAMAN MICROSCOPE

Auto-focus for Spectrometers