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G01J3/0237
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G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/0237
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Patents Grants
last 30 patents
Information
Patent Grant
Raman spectroscopy equipment
Patent number
11,946,803
Issue date
Apr 2, 2024
Answeray Inc.
Seong Ho Cho
G01 - MEASURING TESTING
Information
Patent Grant
Color measurement apparatus
Patent number
11,927,484
Issue date
Mar 12, 2024
Seiko Epson Corporation
Haruki Miyasaka
G01 - MEASURING TESTING
Information
Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
Patent number
11,885,681
Issue date
Jan 30, 2024
Pendar Technologies, LLC
Daryoosh Vakhshoori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mirror unit and optical module
Patent number
11,879,731
Issue date
Jan 23, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical array waveguide grating-type multiplexer and demultiplexer...
Patent number
11,828,982
Issue date
Nov 28, 2023
LG Innotek Co., Ltd
Lee Im Kang
G01 - MEASURING TESTING
Information
Patent Grant
Dual-optical-path spectrophotometer and color measurement method th...
Patent number
11,815,396
Issue date
Nov 14, 2023
CaiPu Technology (Zhejiang) Co., Ltd.
Kun Yuan
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for active line scan imaging
Patent number
11,788,891
Issue date
Oct 17, 2023
The United States of America, as represented by the Secretary of Agriculture
Moon S. Kim
G01 - MEASURING TESTING
Information
Patent Grant
Self-adaptive electromagnetic energy attenuator
Patent number
11,781,906
Issue date
Oct 10, 2023
Elbit Systems Ltd.
Noam Yona Gross
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Support structure and method for focus adjustment
Patent number
11,781,909
Issue date
Oct 10, 2023
Thermo Electron Scientific Instruments LLC
Matthew Meyer
G01 - MEASURING TESTING
Information
Patent Grant
Optical component mount
Patent number
11,747,584
Issue date
Sep 5, 2023
OPTOS PLC
Rainer Heidemann
G01 - MEASURING TESTING
Information
Patent Grant
Differential interference imaging system capable of rapidly changin...
Patent number
11,740,129
Issue date
Aug 29, 2023
SOUTH CHINA NORMAL UNIVERSITY
Xiaoxu Lv
G01 - MEASURING TESTING
Information
Patent Grant
Optical module
Patent number
11,635,290
Issue date
Apr 25, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical device
Patent number
11,629,947
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,629,946
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,624,605
Issue date
Apr 11, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
System and method for conformal vision
Patent number
11,607,136
Issue date
Mar 21, 2023
ChemImage Corporation
Matthew Nelson
G01 - MEASURING TESTING
Information
Patent Grant
Nanoelectromechanical interferometer for visible to infrared wavele...
Patent number
11,549,848
Issue date
Jan 10, 2023
Danmarks Tekniske Universitet
Marcus Albrechtsen
G01 - MEASURING TESTING
Information
Patent Grant
Optical device allowing the angular and spectral emission of an obj...
Patent number
11,525,734
Issue date
Dec 13, 2022
ELDIM
Thierry Leroux
G01 - MEASURING TESTING
Information
Patent Grant
Reflectometry instrument and method for measuring macular pigment
Patent number
11,490,810
Issue date
Nov 8, 2022
ZeaVision, LLC.
Scott J. Huter
G01 - MEASURING TESTING
Information
Patent Grant
Mode matching method for absorption spectroscopy systems
Patent number
11,441,944
Issue date
Sep 13, 2022
Li-Cor, Inc.
Ahmed Bouzid
G02 - OPTICS
Information
Patent Grant
Apparatus and method for measuring Raman spectrum
Patent number
11,439,327
Issue date
Sep 13, 2022
Samsung Electronics Co., Ltd.
Yun S Park
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Interferometer and method for producing an interferometer
Patent number
11,391,629
Issue date
Jul 19, 2022
Robert Bosch GmbH
Ralf Noltemeyer
G01 - MEASURING TESTING
Information
Patent Grant
Integration of optical components within a folded optical path
Patent number
11,353,362
Issue date
Jun 7, 2022
CHROMATION INC.
James Scholtz
G02 - OPTICS
Information
Patent Grant
System for performing spectroscopy
Patent number
11,333,551
Issue date
May 17, 2022
The General Hospital Corporation
Seok-Hyun Yun
G01 - MEASURING TESTING
Information
Patent Grant
Far-infrared spectroscopy device
Patent number
11,320,309
Issue date
May 3, 2022
HITACHI HIGH-TECH CORPORATION
Kei Shimura
G02 - OPTICS
Information
Patent Grant
Methods and devices for standoff differential Raman spectroscopy wi...
Patent number
11,300,448
Issue date
Apr 12, 2022
Pendar Technologies, LLC
Daryoosh Vakhshoori
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Variable aperture mask
Patent number
11,268,901
Issue date
Mar 8, 2022
KLA Corporation
Barry Blasenheim
G01 - MEASURING TESTING
Information
Patent Grant
Confocal measuring apparatus
Patent number
11,226,233
Issue date
Jan 18, 2022
Omron Corporation
Shinya Furukawa
G01 - MEASURING TESTING
Information
Patent Grant
Focus plane equalizer apparatus with prismatic focus corrector
Patent number
11,218,652
Issue date
Jan 4, 2022
Urugus S.A.
Gerardo Gabriel Richarte
G01 - MEASURING TESTING
Information
Patent Grant
Optical module having high-accuracy spectral analysis
Patent number
11,209,260
Issue date
Dec 28, 2021
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20240110779
Publication date
Apr 4, 2024
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
Publication number
20230363866
Publication date
Nov 16, 2023
3SHAPE A/S
Bo ESBECH
G01 - MEASURING TESTING
Information
Patent Application
RAMAN MICROSPECTROSCOPIC MEASUREMENT DEVICE, AND METHOD FOR CALIBRA...
Publication number
20230314219
Publication date
Oct 5, 2023
SHIMADZU CORPORATION
Tomoki SASAYAMA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SPECTROMETER BASED ON ALTERNATING DIFFRACTIVE OPTICAL ELEMENTS
Publication number
20230296433
Publication date
Sep 21, 2023
ORTA DOGU TEKNIK UNIVERSITESI
Emre YUCE
G01 - MEASURING TESTING
Information
Patent Application
FOCUS SCANNING APPARATUS RECORDING COLOR
Publication number
20230285125
Publication date
Sep 14, 2023
3SHAPE A/S
Bo ESBECH
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20230221106
Publication date
Jul 13, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
RAMAN MICROSCOPE
Publication number
20230194339
Publication date
Jun 22, 2023
Shimadzu Corporation
Naoya FUJIWARA
G01 - MEASURING TESTING
Information
Patent Application
Auto-focus for Spectrometers
Publication number
20230194346
Publication date
Jun 22, 2023
Thermo Electron Scientific Instruments LLC
Alexander GRENOV
G01 - MEASURING TESTING
Information
Patent Application
RAMAN MICROSCOPE
Publication number
20230194345
Publication date
Jun 22, 2023
Shimadzu Corporation
Naoya FUJIWARA
G01 - MEASURING TESTING
Information
Patent Application
SELF-ADAPTIVE ELECTROMAGNETIC ENERGY ATTENUATOR
Publication number
20230139136
Publication date
May 4, 2023
Elbit Systems Ltd.
Noam Yona GROSS
G01 - MEASURING TESTING
Information
Patent Application
REFLECTOMETRY INSTRUMENT AND METHOD FOR MEASURING MACULAR PIGMENT
Publication number
20230116541
Publication date
Apr 13, 2023
ZeaVision, LLC.
Scott J. Huter
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
ADVANCED SPECTROSCOPY USING A CAMERA OF A PERSONAL DEVICE
Publication number
20230078133
Publication date
Mar 16, 2023
Arizona Board of Regents on behalf of The University of Arizona
Richard John Koshel
G01 - MEASURING TESTING
Information
Patent Application
RAMAN SPECTROMETER
Publication number
20230039380
Publication date
Feb 9, 2023
PerkinElmer Singapore Pte. Ltd.
Ben PERSTON
G01 - MEASURING TESTING
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20230003504
Publication date
Jan 5, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHOD AND SYSTEM FOR ACTIVE LINE SCAN IMAGING
Publication number
20220397457
Publication date
Dec 15, 2022
The United States of America, as Represented by the Secretary of Agriculture
MOON S. KIM
G01 - MEASURING TESTING
Information
Patent Application
AUTOFOCUSING METHOD, SPECTROSCOPIC CAMERA, AND COMPUTER PROGRAM
Publication number
20220397456
Publication date
Dec 15, 2022
SEIKO EPSON CORPORATION
Takeshi NOZAWA
G01 - MEASURING TESTING
Information
Patent Application
Illuminator Method and Device for Semiconductor Package Testing
Publication number
20220390510
Publication date
Dec 8, 2022
UTAC Headquarters Pte. Ltd.
Boon Chew Goh
G01 - MEASURING TESTING
Information
Patent Application
NANOELECTROMECHANICAL INTERFEROMETER FOR VISIBLE TO INFRARED WAVELE...
Publication number
20220349751
Publication date
Nov 3, 2022
Danmarks Tekniske Universitet
Marcus Albrechtsen
G01 - MEASURING TESTING
Information
Patent Application
Methods and Devices for Standoff Differential Raman Spectroscopy wi...
Publication number
20220333985
Publication date
Oct 20, 2022
Pendar Technologies, LLC
Daryoosh VAKHSHOORI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAVELENGTH SELECTION MODULE, ILLUMINATION SYSTEM AND METROLOGY SYSTEM
Publication number
20220299365
Publication date
Sep 22, 2022
ASML NETHERLANDS B.V.
Gerbrand VAN DER ZOUW
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SUPPORT STRUCTURE AND METHOD FOR FOCUS ADJUSTMENT
Publication number
20220283026
Publication date
Sep 8, 2022
THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC
Matthew Meyer
G01 - MEASURING TESTING
Information
Patent Application
DUAL-OPTICAL-PATH SPECTROPHOTOMETER AND COLOR MEASUREMENT METHOD TH...
Publication number
20220214216
Publication date
Jul 7, 2022
China Jiliang University
Kun YUAN
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MODULATION MICRO-NANO STRUCTURE, MICRO-INTEGRATED SPECTROME...
Publication number
20220178748
Publication date
Jun 9, 2022
TSINGHUA UNIVERSITY
Kaiyu CUI
G01 - MEASURING TESTING
Information
Patent Application
COLOR MEASUREMENT APPARATUS
Publication number
20220146314
Publication date
May 12, 2022
SEIKO EPSON CORPORATION
Haruki MIYASAKA
G01 - MEASURING TESTING
Information
Patent Application
FOCUS PLANE EQUALIZER APPARATUS WITH PRISMATIC FOCUS CORRECTOR
Publication number
20220124263
Publication date
Apr 21, 2022
Urugus S.A.
Gerardo Gabriel Richarte
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR ADVANCED AUTOFOCUSING SPECTROSCOPY
Publication number
20220082435
Publication date
Mar 17, 2022
Impossible Sensing LLC
Pablo Sobron
G01 - MEASURING TESTING
Information
Patent Application
HYPERSPECTRAL IMAGER METHOD AND APPARATUS
Publication number
20220034717
Publication date
Feb 3, 2022
TECHNOLOGICAL RESOURCES PTY. LIMITED
Richard J. Murphy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Differential Interference Imaging System Capable of Rapidly Changin...
Publication number
20220003607
Publication date
Jan 6, 2022
SOUTH CHINA NORMAL UNIVERSITY
Xiaoxu Lv
G01 - MEASURING TESTING
Information
Patent Application
FAR-INFRARED SPECTROSCOPY DEVICE
Publication number
20210310865
Publication date
Oct 7, 2021
HITACHI HIGH-TECH CORPORATION
Kei SHIMURA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COMPONENT MOUNT
Publication number
20210286146
Publication date
Sep 16, 2021
OPTOS PLC
RAINER HEIDEMANN
G01 - MEASURING TESTING