Amorphous materials

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H01L29/263

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier

Current Industry

H01L29/263Amorphous materials

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor structure with wraparound backside amorphous layer
- Patent number 12,148,805
- Issue date Nov 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Chuan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device comprising silicon and oxide semiconductor in...
- Patent number 12,080,802
- Issue date Sep 3, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method of manufacturing the same
- Patent number 11,915,928
- Issue date Feb 27, 2024
- Kioxia Corporation
- Masahiro Koike
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon carbide semiconductor device
- Patent number 11,888,035
- Issue date Jan 30, 2024
- Fuji Electric Co., Ltd.
- Yasuyuki Kawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FDSOI device structure and preparation method thereof
- Patent number 11,855,212
- Issue date Dec 26, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure with wraparound backside amorphous layer
- Patent number 11,777,003
- Issue date Oct 3, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Chuan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxide semiconductor film, thin film transistor, oxide sintered body...
- Patent number 11,728,390
- Issue date Aug 15, 2023
- Idemitsu Kosan Co., Ltd.
- Kazuyoshi Inoue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device comprising oxide semiconductor with c-axis-ali...
- Patent number 11,710,795
- Issue date Jul 25, 2023
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FDSOI device structure and preparation method thereof
- Patent number 11,569,385
- Issue date Jan 31, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage-free implantation-free ETSOI transistors
- Patent number 11,502,171
- Issue date Nov 15, 2022
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 11,133,419
- Issue date Sep 28, 2021
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device provided with oxide semiconductor TFT
- Patent number 11,043,600
- Issue date Jun 22, 2021
- SHARP KABUSHIKI KAISHA
- Shinji Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage-free implantation-free ETSOI transistors
- Patent number 10,937,864
- Issue date Mar 2, 2021
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor-on-insulator (SOI) substrate comprising a trap-rich l...
- Patent number 10,923,503
- Issue date Feb 16, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Hung Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage-free implantation-free ETSOI transistors
- Patent number 10,651,273
- Issue date May 12, 2020
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 10,608,118
- Issue date Mar 31, 2020
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device and method for manufa...
- Patent number 10,263,120
- Issue date Apr 16, 2019
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 10,205,030
- Issue date Feb 12, 2019
- Semiconductor Energy Laboratory Co., Ltd.
- Hidekazu Miyairi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxide semiconductor film including indium, tungsten and zinc and th...
- Patent number 10,192,994
- Issue date Jan 29, 2019
- Sumitomo Electric Industries, Ltd
- Miki Miyanaga
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Semiconductor device including write access transistor whose oxide...
- Patent number 10,056,385
- Issue date Aug 21, 2018
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Reduction of defect induced leakage in III-V semiconductor devices
- Patent number 10,002,929
- Issue date Jun 19, 2018
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduction of defect induced leakage in III-V semiconductor devices
- Patent number 9,905,637
- Issue date Feb 27, 2018
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 9,887,298
- Issue date Feb 6, 2018
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,812,533
- Issue date Nov 7, 2017
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,793,416
- Issue date Oct 17, 2017
- Semiconductor Energy Laboratory Co., Ltd.
- Hidekazu Miyairi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leakage-free implantation-free ETSOI transistors
- Patent number 9,768,254
- Issue date Sep 19, 2017
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,691,904
- Issue date Jun 27, 2017
- Semiconductor Energy Laboratory Co., Ltd.
- Shinya Sasagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing thin film transistor, thin film transistor, dis...
- Patent number 9,673,048
- Issue date Jun 6, 2017
- FUJIFILM Corporation
- Masashi Ono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 9,647,095
- Issue date May 9, 2017
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including write access transistor having chann...
- Patent number 9,589,961
- Issue date Mar 7, 2017
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240421231
- Publication date Dec 19, 2024
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ELEMENT AND PRODUCTION METHOD FOR SEMICONDUCTOR ELEMENT
- Publication number 20240290843
- Publication date Aug 29, 2024
- AIR WATER INC.
- Keisuke KAWAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE WITH WRAPAROUND BACKSIDE AMORPHOUS LAYER
- Publication number 20230387225
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Chuan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING TELLURIUM-BASED SEMICONDUCTOR DEVICE, TELL...
- Publication number 20230352596
- Publication date Nov 2, 2023
- IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY)
- Jae Kyeong JEONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20230299207
- Publication date Sep 21, 2023
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FDSOI DEVICE STRUCTURE AND PREPARATION METHOD THEREOF
- Publication number 20230126031
- Publication date Apr 27, 2023
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE WITH WRAPAROUND BACKSIDE AMORPHOUS LAYER
- Publication number 20220384590
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Chuan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20220301869
- Publication date Sep 22, 2022
- KIOXIA Corporation
- Masahiro KOIKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FDSOI DEVICE STRUCTURE AND PREPARATION METHOD THEREOF
- Publication number 20220093799
- Publication date Mar 24, 2022
- Shanghai Huali Integrated Circuit Corporation
- Zhonghua LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON CARBIDE SEMICONDUCTOR DEVICE
- Publication number 20220069089
- Publication date Mar 3, 2022
- Fuji Electric Co., Ltd.
- Yasuyuki KAWADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20210202746
- Publication date Jul 1, 2021
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE-FREE IMPLANTATION-FREE ETSOI TRANSISTORS
- Publication number 20210151564
- Publication date May 20, 2021
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE PROVIDED WITH OXIDE SEMICONDUCTOR TFT
- Publication number 20210135013
- Publication date May 6, 2021
- Sharp Kabushiki Kaisha
- Shinji NAKAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20200212222
- Publication date Jul 2, 2020
- SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OXIDE SEMICONDUCTOR FILM, THIN FILM TRANSISTOR, OXIDE SINTERED BODY...
- Publication number 20190348505
- Publication date Nov 14, 2019
- Idemitsu Kosan Co., Ltd.
- Kazuyoshi INOUE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20190172952
- Publication date Jun 6, 2019
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ARRAY SUBSTRATE, MANUFACTURING METHOD, AND LCD PANEL
- Publication number 20190019893
- Publication date Jan 17, 2019
- Shenzhen china Star Optoelectronics Semiconductor Display Technology Co., Ltd.
- Longqiang SHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20180166580
- Publication date Jun 14, 2018
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20180040741
- Publication date Feb 8, 2018
- Semiconductor Energy Laboratory Co., Ltd.
- Hidekazu MIYAIRI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE-FREE IMPLANTATION-FREE ETSOI TRANSISTORS
- Publication number 20170317171
- Publication date Nov 2, 2017
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF DEFECT INDUCED LEAKAGE IN III-V SEMICONDUCTOR DEVICES
- Publication number 20170110546
- Publication date Apr 20, 2017
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEAKAGE-FREE IMPLANTATION-FREE ETSOI TRANSISTORS
- Publication number 20170033177
- Publication date Feb 2, 2017
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REDUCTION OF DEFECT INDUCED LEAKAGE IN III-V SEMICONDUCTOR DEVICES
- Publication number 20160336408
- Publication date Nov 17, 2016
- International Business Machines Corporation
- Joel P. de Souza
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Systems for Evaluating IGZO with Respect to NBIS
- Publication number 20150177311
- Publication date Jun 25, 2015
- Intermolecular, Inc.
- Khaled Ahmed
- G01 - MEASURING TESTING
Information Patent Application
IGZO Devices with Composite Channel Layers and Methods for Forming...
- Publication number 20150171227
- Publication date Jun 18, 2015
- Intermolecular, Inc.
- Khaled Ahmed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20140346501
- Publication date Nov 27, 2014
- Shunpei YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20140231800
- Publication date Aug 21, 2014
- Semiconductor Energy Laboratory Co., Ltd.
- Hidekazu MIYAIRI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140169100
- Publication date Jun 19, 2014
- Semiconductor Energy Laboratoy Co., Ltd.
- Shunpei Yamazaki
- G11 - INFORMATION STORAGE
Information Patent Application
Active-matrix Panel Display Device, TFT and Method for Forming the...
- Publication number 20140117348
- Publication date May 1, 2014
- Shenzhen China Star Optoelectronics Technology Co. Ltd.
- Cheng-Lung Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20140103339
- Publication date Apr 17, 2014
- Semiconductor Energy Laboratory Co., Ltd.
- Shunpei Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS

Amorphous materials

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Semiconductor structure with wraparound backside amorphous layer

Semiconductor device comprising silicon and oxide semiconductor in...

Semiconductor memory device and method of manufacturing the same

Silicon carbide semiconductor device

FDSOI device structure and preparation method thereof

Semiconductor structure with wraparound backside amorphous layer

Oxide semiconductor film, thin film transistor, oxide sintered body...

Semiconductor device comprising oxide semiconductor with c-axis-ali...

FDSOI device structure and preparation method thereof

Leakage-free implantation-free ETSOI transistors

Semiconductor device

Semiconductor device provided with oxide semiconductor TFT

Leakage-free implantation-free ETSOI transistors

Semiconductor-on-insulator (SOI) substrate comprising a trap-rich l...

Leakage-free implantation-free ETSOI transistors

Semiconductor device

Method for manufacturing semiconductor device and method for manufa...

Method for manufacturing semiconductor device

Oxide semiconductor film including indium, tungsten and zinc and th...

Semiconductor device including write access transistor whose oxide...

Reduction of defect induced leakage in III-V semiconductor devices

Reduction of defect induced leakage in III-V semiconductor devices

Semiconductor device and manufacturing method thereof

Method for manufacturing semiconductor device

Method for manufacturing semiconductor device

Leakage-free implantation-free ETSOI transistors

Semiconductor device

Method of producing thin film transistor, thin film transistor, dis...

Semiconductor device and method for manufacturing the same

Semiconductor device including write access transistor having chann...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR ELEMENT AND PRODUCTION METHOD FOR SEMICONDUCTOR ELEMENT

SEMICONDUCTOR STRUCTURE WITH WRAPAROUND BACKSIDE AMORPHOUS LAYER

METHOD FOR MANUFACTURING TELLURIUM-BASED SEMICONDUCTOR DEVICE, TELL...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

FDSOI DEVICE STRUCTURE AND PREPARATION METHOD THEREOF

SEMICONDUCTOR STRUCTURE WITH WRAPAROUND BACKSIDE AMORPHOUS LAYER

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

FDSOI DEVICE STRUCTURE AND PREPARATION METHOD THEREOF

SILICON CARBIDE SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

LEAKAGE-FREE IMPLANTATION-FREE ETSOI TRANSISTORS

SEMICONDUCTOR DEVICE PROVIDED WITH OXIDE SEMICONDUCTOR TFT

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

OXIDE SEMICONDUCTOR FILM, THIN FILM TRANSISTOR, OXIDE SINTERED BODY...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

ARRAY SUBSTRATE, MANUFACTURING METHOD, AND LCD PANEL

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

LEAKAGE-FREE IMPLANTATION-FREE ETSOI TRANSISTORS

REDUCTION OF DEFECT INDUCED LEAKAGE IN III-V SEMICONDUCTOR DEVICES

LEAKAGE-FREE IMPLANTATION-FREE ETSOI TRANSISTORS

REDUCTION OF DEFECT INDUCED LEAKAGE IN III-V SEMICONDUCTOR DEVICES

Methods and Systems for Evaluating IGZO with Respect to NBIS

IGZO Devices with Composite Channel Layers and Methods for Forming...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

Active-matrix Panel Display Device, TFT and Method for Forming the...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME