Arrangements for measuring quantities of charge

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CPC
G01R29/24

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00

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G01R29/24Arrangements for measuring quantities of charge

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods of dynamic adaptive fast charging in batteries...
- Patent number 12,224,616
- Issue date Feb 11, 2025
- Eatron Technologies Limited
- Muharrem Ugur Yavas
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Charge detection sensor and potential measurement system
- Patent number 12,163,992
- Issue date Dec 10, 2024
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Jun Ogi
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic charge sensor with high impedance contact pads
- Patent number 12,130,319
- Issue date Oct 29, 2024
- STMicroelectronics S.r.l.
- Massimo Orio
- G01 - MEASURING TESTING
Information Patent Grant
Static electricity visualization device
- Patent number 12,123,903
- Issue date Oct 22, 2024
- Semes Co., Ltd.
- Jun Ho Oh
- G01 - MEASURING TESTING
Information Patent Grant
Measuring system and method of measuring static charges
- Patent number 12,020,962
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Tzu-Sou Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring energy discharge in a fire control system
- Patent number 12,007,187
- Issue date Jun 11, 2024
- Biofire Technologies Inc.
- Jack Hugo Thiesen
- F41 - WEAPONS
Information Patent Grant
Self-test for electrostatic charge variation sensors
- Patent number 11,965,923
- Issue date Apr 23, 2024
- STMicroelectronics S.r.l.
- Fabio Passaniti
- G01 - MEASURING TESTING
Information Patent Grant
Charge sensing device with gate voltage selected to operate around...
- Patent number 11,892,473
- Issue date Feb 6, 2024
- FUNDACIÓ INSTITUT DE CIÈNCIES FOTÒNIQUES
- Stijn Goossens
- G01 - MEASURING TESTING
Information Patent Grant
Substrate processing apparatus and charge neutralization method for...
- Patent number 11,862,439
- Issue date Jan 2, 2024
- Tokyo Electron Limited
- Takahiro Kawawa
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for presence detection in an environment to be mo...
- Patent number 11,847,897
- Issue date Dec 19, 2023
- STMicroelectronics S.r.l.
- Fabio Passaniti
- G08 - SIGNALLING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,821,911
- Issue date Nov 21, 2023
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical systems and methods of characterizing high-k dielectrics
- Patent number 11,808,706
- Issue date Nov 7, 2023
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Static electricity-visualizing material, static electricity-visuali...
- Patent number 11,789,058
- Issue date Oct 17, 2023
- National Institute of Advanced Industrial Science and Technology
- Nao Terasaki
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Charge detection sensor and potential measurement system
- Patent number 11,754,610
- Issue date Sep 12, 2023
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Jun Ogi
- G01 - MEASURING TESTING
Information Patent Grant
Active probe and method for measurement of space charge distributio...
- Patent number 11,698,402
- Issue date Jul 11, 2023
- Tongji University
- Yewen Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic charge sensor with high impedance contact pads
- Patent number 11,693,039
- Issue date Jul 4, 2023
- STMicroelectronics S.r.l.
- Massimo Orio
- G01 - MEASURING TESTING
Information Patent Grant
Measurement and adjustment of a charge of a workpiece
- Patent number 11,680,975
- Issue date Jun 20, 2023
- Advanced Energy Industries, Inc.
- Donnie Herman
- G01 - MEASURING TESTING
Information Patent Grant
System and method for touch-gesture recognition
- Patent number 11,669,168
- Issue date Jun 6, 2023
- STMicroelectronics S.r.l.
- Fabio Passaniti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrostatic detections
- Patent number 11,656,261
- Issue date May 23, 2023
- Hewlett-Packard Development Company, L.P.
- Nick Thamma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for electrostatic alignment and surface assembly...
- Patent number 11,506,698
- Issue date Nov 22, 2022
- The Regents of the University of California
- Yadong Yin
- G01 - MEASURING TESTING
Information Patent Grant
Trapped charge estimation
- Patent number 11,476,655
- Issue date Oct 18, 2022
- Schweitzer Engineering Laboratories, Inc.
- Ritwik Chowdhury
- G05 - CONTROLLING REGULATING
Information Patent Grant
Solid-state charge detector
- Patent number 11,443,930
- Issue date Sep 13, 2022
- Brigham Young University
- Yixin Song
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,415,617
- Issue date Aug 16, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cable junction with integrated space charge detector
- Patent number 11,385,274
- Issue date Jul 12, 2022
- NEXANS
- Pierre Mirebeau
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for detecting the mass center of a beam of electr...
- Patent number 11,360,125
- Issue date Jun 14, 2022
- ENEA—AGENZIA NAZIONALE PER LE NUOVE TECNOLOGIE, L'ENERGIA E LO SVILUPPO ECONO...
- Marcello Artioli
- G01 - MEASURING TESTING
Information Patent Grant
Wafer metrology technologies
- Patent number 11,293,965
- Issue date Apr 5, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corona detection system and method
- Patent number 11,280,820
- Issue date Mar 22, 2022
- Woods Hole Oceanographic Institution
- Edward C. Brainard
- G01 - MEASURING TESTING
Information Patent Grant
Pump and probe type second harmonic generation metrology
- Patent number 11,150,287
- Issue date Oct 19, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Grant
System for measuring charge-to-mass ratio of electrostatic atomizat...
- Patent number 11,150,288
- Issue date Oct 19, 2021
- JIANGSU UNIVERSITY
- Mingxiong Ou
- G01 - MEASURING TESTING
Information Patent Grant
Field-biased second harmonic generation metrology
- Patent number 11,092,637
- Issue date Aug 17, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGE MONITORING CIRCUIT
- Publication number 20240418761
- Publication date Dec 19, 2024
- ams-OSRAM AG
- Dominik RUCK
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES
- Publication number 20240304480
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- TZU-SOU CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ESTIMATING INTERNAL STATE OF BATTERY BY US...
- Publication number 20240241182
- Publication date Jul 18, 2024
- Samsung SDI Co., Ltd.
- Changyoon Chun
- G01 - MEASURING TESTING
Information Patent Application
CHARGE SENSOR
- Publication number 20240183892
- Publication date Jun 6, 2024
- GUARDION, INC.
- Daniel C. Cohen
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES OF SAMPLE...
- Publication number 20240053394
- Publication date Feb 15, 2024
- Beijing Institute of Nanoenergy and Nanosystems
- Zhonglin Wang
- G01 - MEASURING TESTING
Information Patent Application
CHARGE DETECTION SENSOR AND POTENTIAL MEASUREMENT SYSTEM
- Publication number 20240036096
- Publication date Feb 1, 2024
- Sony Semiconductor Solutions Corporation
- JUN OGI
- G01 - MEASURING TESTING
Information Patent Application
CHARGE SENSOR
- Publication number 20240012041
- Publication date Jan 11, 2024
- Mitsubishi Electric Corporation
- Jun KAMIOKA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTROSTATIC CHARGE SENSOR WITH HIGH IMPEDANCE CONTACT PADS
- Publication number 20230288467
- Publication date Sep 14, 2023
- STMicroelectronics S.r.l.
- Massimo ORIO
- G01 - MEASURING TESTING
Information Patent Application
SELF-TEST FOR ELECTROSTATIC CHARGE VARIATION SENSORS
- Publication number 20230236234
- Publication date Jul 27, 2023
- STMicroelectronics S.r.l.
- Fabio PASSANITI
- G01 - MEASURING TESTING
Information Patent Application
STATIC ELECTRICITY VISUALIZATION DEVICE
- Publication number 20230204648
- Publication date Jun 29, 2023
- SEMES CO., LTD.
- Jun Ho OH
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC CHARGE SENSOR WITH HIGH IMPEDANCE CONTACT PADS
- Publication number 20230168290
- Publication date Jun 1, 2023
- STMicroelectronics S.r.l.
- Massimo ORIO
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES
- Publication number 20230063350
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- TZU-SOU CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ELECTROSTATIC ALIGNMENT AND SURFACE ASSEMBLY...
- Publication number 20230068148
- Publication date Mar 2, 2023
- The Regents of the University of California
- Yadong YIN
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR AUTOMATIC DETECTION OF ROAD CONDITIONS FOR VE...
- Publication number 20230045861
- Publication date Feb 16, 2023
- STMicroelectronics S.r.l.
- Fabio PASSANITI
- B60 - VEHICLES IN GENERAL
Information Patent Application
ELECTROSTATIC DETECTIONS
- Publication number 20230035435
- Publication date Feb 2, 2023
- Hewlett-Packard Development Company, L.P.
- Nick Thamma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20220413029
- Publication date Dec 29, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE PROBE AND METHOD FOR MEASUREMENT OF SPACE CHARGE DISTRIBUTIO...
- Publication number 20220317171
- Publication date Oct 6, 2022
- Tongji University
- Yewen ZHANG
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20220260626
- Publication date Aug 18, 2022
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
CHARGE SENSING DEVICE WITH GATE VOLTAGE SELECTED TO OPERATE AROUND...
- Publication number 20220137098
- Publication date May 5, 2022
- FUNDACIÓ INSTITUT DE CIÈNCIES FOTÒNIQUES
- Stijn Goossens
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS
- Publication number 20220003678
- Publication date Jan 6, 2022
- California Institute of Technology
- Philippe C. Adell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Corona Detection System and Method
- Publication number 20210333311
- Publication date Oct 28, 2021
- Woods Hole Oceanographic Institution
- Edward C. BRAINARD II
- G08 - SIGNALLING
Information Patent Application
MEASUREMENT AND ADJUSTMENT OF A CHARGE OF A WORKPIECE
- Publication number 20210318370
- Publication date Oct 14, 2021
- Advanced Energy Industries, Inc.
- Donnie Herman
- G01 - MEASURING TESTING
Information Patent Application
TRAPPED CHARGE ESTIMATION
- Publication number 20210218239
- Publication date Jul 15, 2021
- Schweitzer Engineering Laboratories, Inc.
- Ritwik Chowdhury
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING TRAP PARAMETERS IN XLPE CABLE BASED ON POLARIZ...
- Publication number 20210165030
- Publication date Jun 3, 2021
- Sichuan University
- Kai Zhou
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING CHARGE-TO-MASS RATIO OF ELECTROSTATIC ATOMIZAT...
- Publication number 20210148961
- Publication date May 20, 2021
- JIANGSU UNIVERSITY
- Mingxiong OU
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING THE MASS CENTER OF A BEAM OF ELECTR...
- Publication number 20210072291
- Publication date Mar 11, 2021
- ENEA - Agenzia Nazionale Per Le Nuove Tecnologie, L'energia E Lo Sviluppo Eco...
- Marcello ARTIOLI
- G01 - MEASURING TESTING
Information Patent Application
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
- Publication number 20210055338
- Publication date Feb 25, 2021
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID-STATE CHARGE DETECTOR
- Publication number 20210050200
- Publication date Feb 18, 2021
- Yixin Song
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20200400732
- Publication date Dec 24, 2020
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
INDEPENDENT AND WEARABLE ELECTRIC SHOCK ALERTING AND PROTECTING DEV...
- Publication number 20200380837
- Publication date Dec 3, 2020
- Falah Yaser Ahmed ROBA
- G01 - MEASURING TESTING

Arrangements for measuring quantities of charge

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods of dynamic adaptive fast charging in batteries...

Charge detection sensor and potential measurement system

Electrostatic charge sensor with high impedance contact pads

Static electricity visualization device

Measuring system and method of measuring static charges

Monitoring energy discharge in a fire control system

Self-test for electrostatic charge variation sensors

Charge sensing device with gate voltage selected to operate around...

Substrate processing apparatus and charge neutralization method for...

System and method for presence detection in an environment to be mo...

Pump and probe type second harmonic generation metrology

Optical systems and methods of characterizing high-k dielectrics

Static electricity-visualizing material, static electricity-visuali...

Charge detection sensor and potential measurement system

Active probe and method for measurement of space charge distributio...

Electrostatic charge sensor with high impedance contact pads

Measurement and adjustment of a charge of a workpiece

System and method for touch-gesture recognition

Electrostatic detections

System and method for electrostatic alignment and surface assembly...

Trapped charge estimation

Solid-state charge detector

Field-biased second harmonic generation metrology

Cable junction with integrated space charge detector

Device and method for detecting the mass center of a beam of electr...

Wafer metrology technologies

Corona detection system and method

Pump and probe type second harmonic generation metrology

System for measuring charge-to-mass ratio of electrostatic atomizat...

Field-biased second harmonic generation metrology

Patents Applicationslast 30 patents

CHARGE MONITORING CIRCUIT

MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES

METHOD AND APPARATUS FOR ESTIMATING INTERNAL STATE OF BATTERY BY US...

CHARGE SENSOR

METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES OF SAMPLE...

CHARGE DETECTION SENSOR AND POTENTIAL MEASUREMENT SYSTEM

CHARGE SENSOR

ELECTROSTATIC CHARGE SENSOR WITH HIGH IMPEDANCE CONTACT PADS

SELF-TEST FOR ELECTROSTATIC CHARGE VARIATION SENSORS

STATIC ELECTRICITY VISUALIZATION DEVICE

ELECTROSTATIC CHARGE SENSOR WITH HIGH IMPEDANCE CONTACT PADS

MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES

SYSTEM AND METHOD FOR ELECTROSTATIC ALIGNMENT AND SURFACE ASSEMBLY...

DEVICE AND METHOD FOR AUTOMATIC DETECTION OF ROAD CONDITIONS FOR VE...

ELECTROSTATIC DETECTIONS

WAFER METROLOGY TECHNOLOGIES

ACTIVE PROBE AND METHOD FOR MEASUREMENT OF SPACE CHARGE DISTRIBUTIO...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

CHARGE SENSING DEVICE WITH GATE VOLTAGE SELECTED TO OPERATE AROUND...

OPTICAL SYSTEMS AND METHODS OF CHARACTERIZING HIGH-K DIELECTRICS

Corona Detection System and Method

MEASUREMENT AND ADJUSTMENT OF A CHARGE OF A WORKPIECE

TRAPPED CHARGE ESTIMATION

METHOD FOR MEASURING TRAP PARAMETERS IN XLPE CABLE BASED ON POLARIZ...

SYSTEM FOR MEASURING CHARGE-TO-MASS RATIO OF ELECTROSTATIC ATOMIZAT...

DEVICE AND METHOD FOR DETECTING THE MASS CENTER OF A BEAM OF ELECTR...

PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY

SOLID-STATE CHARGE DETECTOR

WAFER METROLOGY TECHNOLOGIES

INDEPENDENT AND WEARABLE ELECTRIC SHOCK ALERTING AND PROTECTING DEV...