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G01N2223/501

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/501array

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection for spectroscopic techniques
- Patent number 12,117,406
- Issue date Oct 15, 2024
- VG Systems Limited
- Bryan Barnard
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Contact imaging sensor head for computed radiography
- Patent number 12,044,637
- Issue date Jul 23, 2024
- Leidos, Inc.
- Rex David Richardson
- G01 - MEASURING TESTING
Information Patent Grant
Measurement arrangement for X-ray radiation for gap-free 1D measure...
- Patent number 12,031,924
- Issue date Jul 9, 2024
- Jürgen Fink
- G01 - MEASURING TESTING
Information Patent Grant
Ionizing radiation detector with reduced street width and improved...
- Patent number 11,953,452
- Issue date Apr 9, 2024
- Redlen Technologies, Inc.
- Pramodha Marthandam
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector with automatic exposure control and a method of...
- Patent number 11,944,483
- Issue date Apr 2, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Static CT detection device
- Patent number 11,925,183
- Issue date Mar 12, 2024
- Tsinghua University
- Zhiqiang Chen
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation detector
- Patent number 11,918,394
- Issue date Mar 5, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and device therefor
- Patent number 11,885,752
- Issue date Jan 30, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Grant
Detection system for X-ray inspection of an object
- Patent number 11,817,231
- Issue date Nov 14, 2023
- Carl Zeiss SMT GmbH
- Johannes Ruoff
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Systems and methods for eliminating cross-talk signals in one or mo...
- Patent number 11,796,489
- Issue date Oct 24, 2023
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 11,796,479
- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Absorption imaging apparatus and detector array therefor
- Patent number 11,754,513
- Issue date Sep 12, 2023
- Mettler-Toledo, LLC
- Guido Mahnke
- G01 - MEASURING TESTING
Information Patent Grant
Method of phase contrast imaging
- Patent number 11,740,188
- Issue date Aug 29, 2023
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Substance identification device and method for extracting statistic...
- Patent number 11,619,599
- Issue date Apr 4, 2023
- Tsinghua University
- Zhi Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handheld backscatter imaging systems with primary and secondary det...
- Patent number 11,579,327
- Issue date Feb 14, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiographic imaging apparatus
- Patent number 11,567,016
- Issue date Jan 31, 2023
- FUJIFILM HEALTHCARE CORPORATION
- Masafumi Onouchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for sensor configuration
- Patent number 11,479,459
- Issue date Oct 25, 2022
- Karthik Katingari
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Radiation detector module with insulating shield
- Patent number 11,474,050
- Issue date Oct 18, 2022
- Redlen Technologies, Inc.
- Christopher Read
- G01 - MEASURING TESTING
Information Patent Grant
System and method for x-ray absorption spectroscopy using a crystal...
- Patent number 11,428,651
- Issue date Aug 30, 2022
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Device for producing high resolution backscatter images
- Patent number 11,409,019
- Issue date Aug 9, 2022
- MICRO-X LIMITED
- Brian Gonzales
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...
- Publication number 20250035569
- Publication date Jan 30, 2025
- NUCTECH (BEIJING) COMPANY LIMITED
- Yuanjing LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION
- Publication number 20240420386
- Publication date Dec 19, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...
- Publication number 20240418659
- Publication date Dec 19, 2024
- Politecnico Di Milano
- Carlo Ettore FIORINI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240402101
- Publication date Dec 5, 2024
- Shimadzu Corporation
- Tetsuya YONEDA
- G01 - MEASURING TESTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240361258
- Publication date Oct 31, 2024
- VAREX IMAGING CORPORATION
- Rajashekar Venkatachalam
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...
- Publication number 20240302549
- Publication date Sep 12, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
PIPELINE INSPECTION APPARATUS
- Publication number 20240302295
- Publication date Sep 12, 2024
- Under Cover Technologies Corp.
- RICHARD MAIKLEM
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248048
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248049
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...
- Publication number 20240219323
- Publication date Jul 4, 2024
- SMITHS DETECTION GERMANY GMBH
- Philipp FISCHER
- G01 - MEASURING TESTING
Information Patent Application
MOBILE X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD
- Publication number 20240183802
- Publication date Jun 6, 2024
- JST POWER EQUIPMENT, INC.
- Haoning Liang
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNT...
- Publication number 20240142393
- Publication date May 2, 2024
- NeuroLogica Corporation, a subsidiary of Samsung Electronics Co., Ltd.
- Duhgoon Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD
- Publication number 20240125715
- Publication date Apr 18, 2024
- TOTALENERGIES ONETECH
- Michel N'GUYEN
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
- Publication number 20240060913
- Publication date Feb 22, 2024
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Application
Rotational X-ray Inspection System and Method
- Publication number 20240044812
- Publication date Feb 8, 2024
- Viken Detection Corporation
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF MATERIAL
- Publication number 20240003831
- Publication date Jan 4, 2024
- Smiths Detection France S.A.S.
- Serge MAITREJEAN
- G01 - MEASURING TESTING
Information Patent Application
BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM
- Publication number 20230288350
- Publication date Sep 14, 2023
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE DIGITAL DETECTOR ARRAY
- Publication number 20230280288
- Publication date Sep 7, 2023
- Baker Hughes Holdings LLC
- Kwang Hyup An
- G01 - MEASURING TESTING
Information Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
- Publication number 20230221457
- Publication date Jul 13, 2023
- American Science and Engineering, Inc.
- Aaron J. Couture
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING A STRUCTURE ACROSS A COVER LAYER C...
- Publication number 20230184701
- Publication date Jun 15, 2023
- INVERSA SYSTEMS LTD.
- Peter Marc CABOT
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC IMAGING APPARATUS AND RADIATION DETECTOR
- Publication number 20230076183
- Publication date Mar 9, 2023
- FUJIFILM Healthcare Corporation
- Masafumi Onouchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT
- Publication number 20230046280
- Publication date Feb 16, 2023
- Carl Zeiss SMT GMBH
- Johannes Ruoff
- G01 - MEASURING TESTING
Information Patent Application
LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230023363
- Publication date Jan 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Michael CHEMAMA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...
- Publication number 20220412901
- Publication date Dec 29, 2022
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin ZHENG
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE DETECTION FOR SPECTROSCOPIC TECHNIQUES
- Publication number 20220381713
- Publication date Dec 1, 2022
- VG System Limited
- Bryan Barnard
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Imaging systems and methods of operating the same

Method and system for inspecting a structure across a cover layer c...

System, method, and apparatus for x-ray backscatter inspection of p...

Charged particle detection for spectroscopic techniques

Device and method for measuring short-wavelength characteristic X-r...

Rotational X-ray inspection system and method

X-ray automated calibration and monitoring

Contact imaging sensor head for computed radiography

Measurement arrangement for X-ray radiation for gap-free 1D measure...

Ionizing radiation detector with reduced street width and improved...

Radiation detector with automatic exposure control and a method of...

Device for hosting a probe solution of molecules in a plurality of...

Static CT detection device

Lateral recess measurement in a semiconductor specimen

Radiation detector

Calibration method and device therefor

Detection system for X-ray inspection of an object

X-ray spectrometer and methods for use

Systems and methods for eliminating cross-talk signals in one or mo...

System and method for material characterization

Apparatuses and methods for combined simultaneous analyses of mater...

Absorption imaging apparatus and detector array therefor

Method of phase contrast imaging

Substance identification device and method for extracting statistic...

Handheld backscatter imaging systems with primary and secondary det...

Radiographic imaging apparatus

Method and system for sensor configuration

Radiation detector module with insulating shield

System and method for x-ray absorption spectroscopy using a crystal...

Device for producing high resolution backscatter images

Patents Applicationslast 30 patents

SECURITY INSPECTION DEVICE, SECURITY INSPECTION SYSTEM, AND SECURIT...

SYSTEMS AND METHODS FOR COMPUTED TOMOGRAPHY INACCURACY COMPENSATION

DEVICE AND SYSTEM FOR DETECTING RADIATION EMITTED BY A SAMPLE IRRAD...

X-RAY ANALYZER

Analysis Device and Analysis Method

RAY SCANNING APPARATUS

INSPECTION SYSTEM

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...

PIPELINE INSPECTION APPARATUS

RAY SCANNING APPARATUS

RAY SCANNING APPARATUS

X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...

MOBILE X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD

METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNT...

Calibration Method and Device Therefor

DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD

Systems and Methods for Generating High-Energy Three-Dimensional Co...

Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...

Rotational X-ray Inspection System and Method

DETERMINATION OF MATERIAL

BACKSCATTER IMAGING DEVICE, CONTROL METHOD AND INSPECTION SYSTEM

FLEXIBLE DIGITAL DETECTOR ARRAY

Handheld Backscatter Scanning Systems With Different Detector Panel...

METHOD AND SYSTEM FOR INSPECTING A STRUCTURE ACROSS A COVER LAYER C...

RADIOGRAPHIC IMAGING APPARATUS AND RADIATION DETECTOR

DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT

LATERAL RECESS MEASUREMENT IN A SEMICONDUCTOR SPECIMEN

DEVICE AND METHOD FOR MEASURING SHORT-WAVELENGTH CHARACTERISTIC X-R...

CHARGED PARTICLE DETECTION FOR SPECTROSCOPIC TECHNIQUES