Membership
Tour
Register
Log in
by counting of standard pulses
Follow
Industry
CPC
G01R25/08
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R25/00
Arrangements for measuring phase angle between a voltage and a current, or between voltages or currents
Current Industry
G01R25/08
by counting of standard pulses
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
Counter unit
Patent number
11,640,197
Issue date
May 2, 2023
Omron Corporation
Hitoshi Oba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Phase measurement
Patent number
10,914,772
Issue date
Feb 9, 2021
SOCIONEXT INC.
Albert Hubert Dorner
G01 - MEASURING TESTING
Information
Patent Grant
Phase measurement device and instrument in which phase measurement...
Patent number
10,634,563
Issue date
Apr 28, 2020
National Institute of Advanced Industrial Science and Technology
Wataru Kokuyama
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Phase identification on a grounded electrical power system
Patent number
9,927,474
Issue date
Mar 27, 2018
Walter S. Bierer
G01 - MEASURING TESTING
Information
Patent Grant
Phase detection circuit
Patent number
9,774,319
Issue date
Sep 26, 2017
SK hynix Inc.
Myeong Jae Park
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
System and method for measuring phase attributes of electrical grid...
Patent number
9,164,135
Issue date
Oct 20, 2015
Honeywell International Inc.
Adishesha Cs
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for determining variation in a predetermined p...
Patent number
8,779,787
Issue date
Jul 15, 2014
ARM Limited
Yves Thomas Laplanche
G01 - MEASURING TESTING
Information
Patent Grant
Digital sensing apparatus and digital readout module thereof
Patent number
8,736,251
Issue date
May 27, 2014
National Chiao Tung University
Kelvin Yi-Tse Lai
G01 - MEASURING TESTING
Information
Patent Grant
Time-to-digital converter
Patent number
8,736,327
Issue date
May 27, 2014
Fujitsu Limited
Atsushi Matsuda
G01 - MEASURING TESTING
Information
Patent Grant
Fractional-rate phase frequency detector
Patent number
8,497,708
Issue date
Jul 30, 2013
National Semiconductor Corporation
Tonmoy Shankar Mukherjee
G01 - MEASURING TESTING
Information
Patent Grant
555 timer-based phase-to-voltage converter
Patent number
8,188,734
Issue date
May 29, 2012
King Fahd University of Petroleum & Minerals
Muhammad Taher Abuelma'atti
G01 - MEASURING TESTING
Information
Patent Grant
Digital phase locked loop
Patent number
8,102,197
Issue date
Jan 24, 2012
Amlogic Co., Ltd.
Weicheng Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Digital phase and frequency detector
Patent number
8,081,013
Issue date
Dec 20, 2011
Amlogic Co., Ltd.
Weicheng Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Transmitter phase shift determination and compensation
Patent number
8,055,212
Issue date
Nov 8, 2011
ST-Erisson SA
Jonas Persson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Phase difference detector and phase difference detection method
Patent number
7,795,925
Issue date
Sep 14, 2010
Fujitsu Limited
Masazumi Marutani
G01 - MEASURING TESTING
Information
Patent Grant
Time aligned bussed triggering using synchronized time-stamps and p...
Patent number
7,352,189
Issue date
Apr 1, 2008
Agilent Technologies, Inc.
Duaine C. Wood
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for phase determination
Patent number
7,212,930
Issue date
May 1, 2007
Veris Industries, LLC
David A. Bruno
G01 - MEASURING TESTING
Information
Patent Grant
Phase and frequency detector with high resolution
Patent number
6,194,918
Issue date
Feb 27, 2001
Telefonaktiebolaget LM Ericsson (publ)
Clarence Jörn Niklas Fransson
G01 - MEASURING TESTING
Information
Patent Grant
Phase and frequency detector with high resolution
Patent number
6,172,533
Issue date
Jan 9, 2001
Telefonaktiebolaget LM Ericsson
Clarence Jörn Niklas Fransson
G01 - MEASURING TESTING
Information
Patent Grant
Phase digitizer for radio communications
Patent number
6,148,050
Issue date
Nov 14, 2000
Ericsson Inc.
Peter Bo Holmqvist
G01 - MEASURING TESTING
Information
Patent Grant
Digital phase detector device ultilizing dither generator
Patent number
5,883,536
Issue date
Mar 16, 1999
Hewlett-Packard Company
Jeffery S. Patterson
G01 - MEASURING TESTING
Information
Patent Grant
Digital phase detector
Patent number
5,818,265
Issue date
Oct 6, 1998
Robert Bosch GmbH
Wolfgang Meller
G01 - MEASURING TESTING
Information
Patent Grant
Phase-measurement device
Patent number
5,723,989
Issue date
Mar 3, 1998
Robert Bosch GmbH
Siegbert Steinlechner
G01 - MEASURING TESTING
Information
Patent Grant
Pulse phase difference encoding circuit
Patent number
5,568,071
Issue date
Oct 22, 1996
Nippon Soken Inc.
Kouichi Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Ring oscillator and pulse phase difference encoding circuit
Patent number
5,528,200
Issue date
Jun 18, 1996
Nippondenso Co., Ltd.
Shigenori Yamauchi
G01 - MEASURING TESTING
Information
Patent Grant
Phase detetion method for flow measurement and other applications
Patent number
5,504,789
Issue date
Apr 2, 1996
Hyok S. Lew
G01 - MEASURING TESTING
Information
Patent Grant
Phase differential measurement circuit
Patent number
5,440,251
Issue date
Aug 8, 1995
Harris Corporation
Alex Knight
G01 - MEASURING TESTING
Information
Patent Grant
Phase difference measuring device
Patent number
5,438,254
Issue date
Aug 1, 1995
Edmond Y. Ho
G01 - MEASURING TESTING
Information
Patent Grant
Digital phase comparator and phase-locked loop
Patent number
5,432,826
Issue date
Jul 11, 1995
Alcatel N.V.
Klaus-Hartwig Rieder
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic flowmeter determining flow rate from phase angle difference
Patent number
5,417,118
Issue date
May 23, 1995
Hyok S. Lew
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SIGNAL ANALYSIS METHOD, AND APPARATUS FOR THREE-PHASE SYSTEM, AND P...
Publication number
20220283209
Publication date
Sep 8, 2022
NEC Corporation
Murtuza PETLADWALA
G01 - MEASURING TESTING
Information
Patent Application
COUNTER UNIT
Publication number
20220121266
Publication date
Apr 21, 2022
Omron Corporation
Hitoshi OBA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PHASE MEASUREMENT DEVICE AND INSTRUMENT IN WHICH PHASE MEASUREMENT...
Publication number
20190086270
Publication date
Mar 21, 2019
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Wataru KOKUYAMA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PHASE MEASUREMENT
Publication number
20190033355
Publication date
Jan 31, 2019
SOCIONEXT INC.
Albert Hubert DORNER
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PHASE ANGLE DETERMINATION OF AC SIGNALS
Publication number
20170254841
Publication date
Sep 7, 2017
QUALCOMM Incorporated
Saeed Nejatali
G01 - MEASURING TESTING
Information
Patent Application
PHASE DETECTION CIRCUIT
Publication number
20170179938
Publication date
Jun 22, 2017
SK HYNIX INC.
Myeong Jae PARK
G01 - MEASURING TESTING
Information
Patent Application
ON-DIE ALL-DIGITAL DELAY MEASUREMENT CIRCUIT
Publication number
20140203798
Publication date
Jul 24, 2014
Frank O'Mahony
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL SENSING APPARATUS AND DIGITAL READOUT MODULE THEREOF
Publication number
20130249615
Publication date
Sep 26, 2013
Kelvin Yi-Tse LAI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR DETERMINING VARIATION IN A PREDETERMINED P...
Publication number
20130120009
Publication date
May 16, 2013
ARM Limited
Yves Thomas LAPLANCHE
G01 - MEASURING TESTING
Information
Patent Application
A SYSTEM AND METHOD FOR MEASURING PHASE ATTRIBUTES OF ELECTRICAL GR...
Publication number
20130066576
Publication date
Mar 14, 2013
Adishesha CS
G01 - MEASURING TESTING
Information
Patent Application
Fractional-Rate Phase Frequency Detector
Publication number
20120280716
Publication date
Nov 8, 2012
Tonmoy Shankar Mukherjee
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
TIME-TO-DIGITAL CONVERTER
Publication number
20120092052
Publication date
Apr 19, 2012
FUJITSU LIMITED
Atsushi MATSUDA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Digital Phase Locked Loop
Publication number
20120013377
Publication date
Jan 19, 2012
AMLOGIC CO., LTD.
Weicheng Zhang
G01 - MEASURING TESTING
Information
Patent Application
Transmitter Phase Shift Determination and Compensation
Publication number
20100304695
Publication date
Dec 2, 2010
Jonas Persson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Phase Difference Detector And Phase Difference Detection Method
Publication number
20090267666
Publication date
Oct 29, 2009
FUJITSU LIMITED
Masazumi MARUTANI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Time aligned bussed triggering using synchronized time-stamps and p...
Publication number
20060202672
Publication date
Sep 14, 2006
Duaine C. Wood
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for phase determination
Publication number
20060069522
Publication date
Mar 30, 2006
Veris Industries, LLC
David A. Bruno
G01 - MEASURING TESTING
Information
Patent Application
Method and device for digitally measuring the phase of a signal
Publication number
20060061393
Publication date
Mar 23, 2006
ALCATEL
Maurizio Skerlj
H04 - ELECTRIC COMMUNICATION TECHNIQUE