calibrating, standardising

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CPC
G01N2223/303

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/303calibrating, standardising

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
- Patent number 12,140,552
- Issue date Nov 12, 2024
- Konica Minolta, Inc.
- Sumiya Nagatsuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation imaging apparatus, radiation imaging system, control meth...
- Patent number 12,102,468
- Issue date Oct 1, 2024
- Canon Kabushiki Kaisha
- Kazuaki Umekawa
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring properties of X-ray beam during X-ray analysis
- Patent number 12,078,604
- Issue date Sep 3, 2024
- BRUKER TECHNOLOGIES LTD.
- Alexander Krokhmal
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography
- Patent number 12,004,885
- Issue date Jun 11, 2024
- XenseLab, LLC
- Ying Zhao
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
CT scanner calibration
- Patent number 11,988,616
- Issue date May 21, 2024
- James R. Glidewell Dental Ceramics, Inc.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Lateral recess measurement in a semiconductor specimen
- Patent number 11,921,063
- Issue date Mar 5, 2024
- Applied Materials Israel Ltd.
- Michael Chemama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration method and device therefor
- Patent number 11,885,752
- Issue date Jan 30, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Grant
Two-step material decomposition calibration method for a full size...
- Patent number 11,879,856
- Issue date Jan 23, 2024
- Canon Medical Systems Corporation
- Xiaohui Zhan
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Control apparatus, system, method, and program
- Patent number 11,788,974
- Issue date Oct 17, 2023
- Rigaku Corporation
- Shintaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Bad detector calibration methods and workflow for a small pixelated...
- Patent number 11,782,176
- Issue date Oct 10, 2023
- Canon Medical Systems Corporation
- Xiaohui Zhan
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,782,000
- Issue date Oct 10, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Phantom for evaluating CT device
- Patent number 11,761,911
- Issue date Sep 19, 2023
- Shimadzu Corporation
- Shuhei Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic crack image quality indicator system and method
- Patent number 11,747,287
- Issue date Sep 5, 2023
- Ajay M Koshti
- G01 - MEASURING TESTING
Information Patent Grant
Verification plates with automated evaluation of melt performance
- Patent number 11,733,187
- Issue date Aug 22, 2023
- Arcam AB
- David Svensson
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
X-ray instrument with ambient temperature detector
- Patent number 11,719,654
- Issue date Aug 8, 2023
- Evident Scientific, Inc.
- Peter Hardman
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,698,353
- Issue date Jul 11, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Portable XRF data screening method for heavy metal contaminated soil
- Patent number 11,698,354
- Issue date Jul 11, 2023
- BEIJING MUNICIPAL RESEARCH INSTITUTE OF ENVIRONMENTAL PROTECTION
- Lina Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Pixel summing scheme and methods for material decomposition calibra...
- Patent number 11,644,587
- Issue date May 9, 2023
- Canon Medical Systems Corporation
- Xiaohui Zhan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for calibrating a PET scanner
- Patent number 11,619,755
- Issue date Apr 4, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu Lyu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray tomography
- Patent number 11,602,315
- Issue date Mar 14, 2023
- XenseLab, LLC
- Ying Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 11,598,206
- Issue date Mar 7, 2023
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- E21 - EARTH DRILLING MINING
Information Patent Grant
CT scanner calibration
- Patent number 11,585,766
- Issue date Feb 21, 2023
- James R. Glidewell Dental Ceramics, Inc.
- Sergey Nikolskiy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS
- Publication number 20240402102
- Publication date Dec 5, 2024
- FEI Company
- Scott Connors
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM
- Publication number 20240374223
- Publication date Nov 14, 2024
- GE Precision Healthcare LLC
- Björn Cederström
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240361258
- Publication date Oct 31, 2024
- VAREX IMAGING CORPORATION
- Rajashekar Venkatachalam
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...
- Publication number 20240328965
- Publication date Oct 3, 2024
- Baker Hughes Holdings LLC
- Thomas Mayer
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...
- Publication number 20240310302
- Publication date Sep 19, 2024
- ISHIDA CO., LTD.
- Kazuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...
- Publication number 20240302549
- Publication date Sep 12, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND METHOD
- Publication number 20240298400
- Publication date Sep 5, 2024
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...
- Publication number 20240295512
- Publication date Sep 5, 2024
- AKTSIONERNOE OBSHCHESTVO "CHEPETSKIJ MEKHANICHESKIJ ZAVOD
- Olga Alekseevna KARAVAEVA
- G01 - MEASURING TESTING
Information Patent Application
CT SCANNER CALIBRATION
- Publication number 20240272095
- Publication date Aug 15, 2024
- JAMES R. GLIDEWELL DENTAL CERAMICS, INC.
- Sergey Nikolskiy
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR COMPUTED TOMOGRAPHY SYSTEM CALIBRATION
- Publication number 20240264096
- Publication date Aug 8, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF
- Publication number 20240248051
- Publication date Jul 25, 2024
- Samsung Electronics Co., Ltd.
- Jaehyung AHN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Target for calibrating and determining the spatial resolution, SNR...
- Publication number 20240159693
- Publication date May 16, 2024
- The University of Manchester
- Tristan James Lowe
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
FLUOROSCOPIC IMAGE CAPTURING APPARATUS
- Publication number 20240151659
- Publication date May 9, 2024
- Hitachi, Ltd
- Hiroyuki TAKAGI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...
- Publication number 20240151521
- Publication date May 9, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Qiangjun WANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNT...
- Publication number 20240142393
- Publication date May 2, 2024
- NeuroLogica Corporation, a subsidiary of Samsung Electronics Co., Ltd.
- Duhgoon Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD
- Publication number 20240125715
- Publication date Apr 18, 2024
- TOTALENERGIES ONETECH
- Michel N'GUYEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...
- Publication number 20240077434
- Publication date Mar 7, 2024
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240068961
- Publication date Feb 29, 2024
- Anritsu Corporation
- Takeshi YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
Method For Density Measurement Of Materials Using Computed Tomograp...
- Publication number 20240003797
- Publication date Jan 4, 2024
- DigiM Solution LLC
- Andrew Garrison Clark
- G01 - MEASURING TESTING
Information Patent Application
Pattern Measurement Device
- Publication number 20230375338
- Publication date Nov 23, 2023
- Hitachi High-Tech Corporation
- Long ZHANG
- G01 - MEASURING TESTING
Information Patent Application
GLASS COMPOSITION AND METHOD FOR PRODUCING GLASS COMPOSITION
- Publication number 20230365455
- Publication date Nov 16, 2023
- Nikon Corporation
- Kohei YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TOMOGRAPHY
- Publication number 20230363723
- Publication date Nov 16, 2023
- Xenselab, LLC
- Ying Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE TOOL, CALIBRATION METHOD, INSPECTION METHOD
- Publication number 20230324318
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPUTED TOMOGRAPHY SCATTER AND CROSSTALK CORRECTION
- Publication number 20230281888
- Publication date Sep 7, 2023
- GENERAL ELECTRIC COMPANY
- Mingye Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS
- Publication number 20230273135
- Publication date Aug 31, 2023
- Chrysos Corporation Limited
- James Tickner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEMS AND METHODS FOR ADAPTIVELY CONTROLLING FILAMENT CURRENT IN...
- Publication number 20230251210
- Publication date Aug 10, 2023
- HOLOGIC, INC.
- Guoyun Ru
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
- Publication number 20230243988
- Publication date Aug 3, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu LYU
- G01 - MEASURING TESTING

calibrating, standardising

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Dynamic imaging quality control device, storage medium, and dynamic...

Radiation imaging apparatus, radiation imaging system, control meth...

Device and method for measuring short-wavelength characteristic X-r...

Monitoring properties of X-ray beam during X-ray analysis

X-ray automated calibration and monitoring

X-ray tomography

Apparatus and method for x-ray fluorescence analysis

CT scanner calibration

Ore component analysis device and method

System and method for crack detection

System and method for in-situ X-ray diffraction-based real-time mon...

Lateral recess measurement in a semiconductor specimen

Calibration method and device therefor

Two-step material decomposition calibration method for a full size...

X-ray collimator and related X-ray inspection apparatus

Control apparatus, system, method, and program

Bad detector calibration methods and workflow for a small pixelated...

Quantitative analysis method, quantitative analysis program, and X-...

Phantom for evaluating CT device

Radiographic crack image quality indicator system and method

Verification plates with automated evaluation of melt performance

X-ray instrument with ambient temperature detector

Apparatus for inspecting semiconductor device and method for inspec...

Quantitative analysis method, quantitative analysis program, and X-...

Portable XRF data screening method for heavy metal contaminated soil

Pixel summing scheme and methods for material decomposition calibra...

System and method for calibrating a PET scanner

X-ray tomography

Detecting downhole fluid composition utilizing photon emission

CT scanner calibration

Patents Applicationslast 30 patents

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

AUTOMATED BEAM ON EDGE VIBRATION ANALYSIS

SYSTEMS AND METHODS FOR CT DETECTOR CALIBRATION USING A WIRE PHANTOM

INSPECTION SYSTEM

APPARATUS FOR FULLY AUTOMATED X-RAY TOMOGRAPHY SYSTEM PERFORMANCE V...

X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-...

RADIATION DETECTORS HAVING IMPROVED OUTPUT COUNT RATE EQUALIZATION...

X-RAY ANALYSIS APPARATUS AND METHOD

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALL...

CT SCANNER CALIBRATION

APPARATUS AND METHOD FOR COMPUTED TOMOGRAPHY SYSTEM CALIBRATION

WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF

Target for calibrating and determining the spatial resolution, SNR...

FLUOROSCOPIC IMAGE CAPTURING APPARATUS

DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...

METHOD FOR CORRECTING THE NONLINEARITY ASSOCIATED WITH PHOTON COUNT...

Calibration Method and Device Therefor

DEVICE FOR ANALYZING A FLUID IN A SAMPLE AND RELATED METHOD

METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...

X-RAY INSPECTION APPARATUS

Method For Density Measurement Of Materials Using Computed Tomograp...

Pattern Measurement Device

GLASS COMPOSITION AND METHOD FOR PRODUCING GLASS COMPOSITION

X-RAY TOMOGRAPHY

CHARGED PARTICLE TOOL, CALIBRATION METHOD, INSPECTION METHOD

COMPUTED TOMOGRAPHY SCATTER AND CROSSTALK CORRECTION

IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS

SYSTEMS AND METHODS FOR ADAPTIVELY CONTROLLING FILAMENT CURRENT IN...

SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER