characterised by the acceleration optics and/or the extraction fields

Industry

CPC
H01J49/403

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/403characterised by the acceleration optics and/or the extraction fields

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 12,020,920
- Issue date Jun 25, 2024
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
Mass analyzer with 3D electrostatic field
- Patent number 11,942,318
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometer
- Patent number 11,862,451
- Issue date Jan 2, 2024
- Shimadzu Corporation
- Takuya Suzumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,848,187
- Issue date Dec 19, 2023
- Micromass UK Limited
- Frank Buckley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-pass mass spectrometer
- Patent number 11,705,320
- Issue date Jul 18, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for confirming charged-particle generation in an instrument...
- Patent number 11,640,904
- Issue date May 2, 2023
- bioMeriuex, Inc
- James Arthur VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed accelerator for time of flight mass spectrometers
- Patent number 11,527,398
- Issue date Dec 13, 2022
- HGSG LTD
- John Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,443,935
- Issue date Sep 13, 2022
- Shimadzu Corporation
- Shiro Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer and method of mass spectrometry
- Patent number 11,387,094
- Issue date Jul 12, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,367,607
- Issue date Jun 21, 2022
- Micromass UK Limited
- Frank Buckley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometers
- Patent number 11,309,175
- Issue date Apr 19, 2022
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-pass mass spectrometer
- Patent number 11,211,238
- Issue date Dec 28, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometer and lead-i...
- Patent number 11,201,046
- Issue date Dec 14, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,152,202
- Issue date Oct 19, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer coupled to a core sample source
- Patent number 11,145,500
- Issue date Oct 12, 2021
- Zeteo Tech, Inc.
- Timothy Cornish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector system for targeted analysis by distance-of-flight mass sp...
- Patent number 11,127,580
- Issue date Sep 21, 2021
- UNM Rainforest Innovations
- Christie Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide within pulsed converters
- Patent number 11,081,332
- Issue date Aug 3, 2021
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source-detector synchronization in multiplexed secondary ion mass s...
- Patent number 11,056,331
- Issue date Jul 6, 2021
- IONpath, Inc.
- David Stumbo
- G01 - MEASURING TESTING
Information Patent Grant
Driver condition detection system
- Patent number 10,970,572
- Issue date Apr 6, 2021
- Toyota Jidosha Kabushiki Kaisha
- Takeshi Matsumura
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Wide-range high mass resolution in reflector time-of-flight mass sp...
- Patent number 10,937,642
- Issue date Mar 2, 2021
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal acceleration time-of-flight mass spectrometry
- Patent number 10,923,339
- Issue date Feb 16, 2021
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MALDI-TOF mass spectrometers with delay time variations and related...
- Patent number 10,910,209
- Issue date Feb 2, 2021
- bioMerieux, Inc.
- James VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for confirming charged-particle generation in an instrument...
- Patent number 10,903,063
- Issue date Jan 26, 2021
- bioMerieux, Inc.
- James Arthur VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Desorption beam control with virtual axis tracking in time-of-fligh...
- Patent number 10,796,896
- Issue date Oct 6, 2020
- Sebastian Böhm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,790,132
- Issue date Sep 29, 2020
- Shimadzu Corporation
- Yusuke Sakagoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion optical device with orthogonal ion barriers
- Patent number 10,763,098
- Issue date Sep 1, 2020
- Shimadzu Corporation
- Gongyu Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Homogenization of the pulsed electric field created in a ring stack...
- Patent number 10,734,212
- Issue date Aug 4, 2020
- DH Technologies Development Pte. Ltd.
- Robert Haufler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for time-of-flight mass spectrometry
- Patent number 10,727,039
- Issue date Jul 28, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Stewart Hamish
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with a laser desorption ion source, and laser sys...
- Patent number 10,699,891
- Issue date Jun 30, 2020
- Andreas Haase
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS AND/OR ION MOBILITY SPECTROMETRY
- Publication number 20240047191
- Publication date Feb 8, 2024
- Micromass UK Limited
- Jason Wildgoose
- G01 - MEASURING TESTING
Information Patent Application
MULTI-PASS MASS SPECTROMETER
- Publication number 20230386818
- Publication date Nov 30, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20230207302
- Publication date Jun 29, 2023
- ASCEND DIAGNOSTICS LIMITED
- John ALLISON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ACTIVATION AND FRAGMENTATION IN SUB-AMBIENT PRESSURE FOR ION MO...
- Publication number 20230126290
- Publication date Apr 27, 2023
- Agilent Technologies, Inc.
- Ruwan T. KURULUGAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER WITH MULTIPLE REFLECTION
- Publication number 20230096197
- Publication date Mar 30, 2023
- Bruker Daltonics GmbH & Co. KG
- Claus KÖSTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20230022148
- Publication date Jan 26, 2023
- Shimadzu Corporation
- Takuya SUZUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20220246418
- Publication date Aug 4, 2022
- Micromass UK Limited
- Frank Buckley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
- Publication number 20220181137
- Publication date Jun 9, 2022
- IONpath, Inc.
- David Stumbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-PASS MASS SPECTROMETER
- Publication number 20220093384
- Publication date Mar 24, 2022
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamically Concentrating Ion Packets in the Extraction Region of a...
- Publication number 20210366701
- Publication date Nov 25, 2021
- DH Technologies Development Pte. Ltd.
- Nic BLOOMFIELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSED ACCELERATOR FOR TIME OF FLIGHT MASS SPECTROMETERS
- Publication number 20210313164
- Publication date Oct 7, 2021
- HGSG LTD
- John HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210233762
- Publication date Jul 29, 2021
- SHIMADZU CORPORATION
- Shiro MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CONFIRMING CHARGED-PARTICLE GENERATION IN AN INSTRUMENT...
- Publication number 20210142998
- Publication date May 13, 2021
- bioMerieux, Inc.
- James Arthur VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS ANALYSER
- Publication number 20210020421
- Publication date Jan 21, 2021
- Shimadzu Corporation
- Vyacheslav SHCHEPUNOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRIVER CONDITION DETECTION SYSTEM
- Publication number 20200381242
- Publication date Dec 3, 2020
- Toyota Jidosha Kabushiki Kaisha
- Takeshi Matsumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-PASS MASS SPECTROMETER
- Publication number 20200365383
- Publication date Nov 19, 2020
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector System for Targeted Analysis by Distance-of-Flight Mass Sp...
- Publication number 20200357624
- Publication date Nov 12, 2020
- STC.UNM
- Christie Enke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20200357625
- Publication date Nov 12, 2020
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MALDI-TOF MASS SPECTROMETERS WITH DELAY TIME VARIATIONS AND RELATED...
- Publication number 20200350152
- Publication date Nov 5, 2020
- bioMerieux, Inc.
- James VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Space Focus Time of Flight Mass Spectrometer
- Publication number 20200243321
- Publication date Jul 30, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20200219714
- Publication date Jul 9, 2020
- SHIMADZU CORPORATION
- Yusuke SAKAGOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE WITHIN PULSED CONVERTERS
- Publication number 20200168447
- Publication date May 28, 2020
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...
- Publication number 20200152439
- Publication date May 14, 2020
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY
- Publication number 20200152441
- Publication date May 14, 2020
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETERS
- Publication number 20200083034
- Publication date Mar 12, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESORPTION BEAM CONTROL WITH VIRTUAL AXIS TRACKING IN TIME-OF-FLIGH...
- Publication number 20190362958
- Publication date Nov 28, 2019
- Bruker Daltonik GmbH
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...
- Publication number 20190267227
- Publication date Aug 29, 2019
- IONpath, Inc.
- David Stumbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR CONFIRMING CHARGED-PARTICLE GENERATION IN AN INSTRUMENT...
- Publication number 20190252176
- Publication date Aug 15, 2019
- bioMerieux, Inc.
- James Arthur VanGordon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20190244801
- Publication date Aug 8, 2019
- Shimadzu Corporation
- Ryo FUJITA
- H01 - BASIC ELECTRIC ELEMENTS

characterised by the acceleration optics and/or the extraction fields

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Source-detector synchronization in multiplexed secondary ion mass s...

Mass analyzer with 3D electrostatic field

Orthogonal acceleration time-of-flight mass spectrometer

Mass spectrometer

Accelerator for multi-pass mass spectrometers

Multi-pass mass spectrometer

Methods for confirming charged-particle generation in an instrument...

Pulsed accelerator for time of flight mass spectrometers

Time-of-flight mass spectrometer

Time of flight mass spectrometer and method of mass spectrometry

Mass spectrometer

Multi-reflecting time-of-flight mass spectrometers

Multi-pass mass spectrometer

Orthogonal acceleration time-of-flight mass spectrometer and lead-i...

Time-of-flight mass spectrometer

Time of flight mass spectrometer coupled to a core sample source

Detector system for targeted analysis by distance-of-flight mass sp...

Ion guide within pulsed converters

Source-detector synchronization in multiplexed secondary ion mass s...

Driver condition detection system

Wide-range high mass resolution in reflector time-of-flight mass sp...

Orthogonal acceleration time-of-flight mass spectrometry

MALDI-TOF mass spectrometers with delay time variations and related...

Methods for confirming charged-particle generation in an instrument...

Desorption beam control with virtual axis tracking in time-of-fligh...

Time-of-flight mass spectrometer

Ion optical device with orthogonal ion barriers

Homogenization of the pulsed electric field created in a ring stack...

Mass spectrometer and method for time-of-flight mass spectrometry

Mass spectrometer with a laser desorption ion source, and laser sys...

Patents Applicationslast 30 patents

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

MASS AND/OR ION MOBILITY SPECTROMETRY

MULTI-PASS MASS SPECTROMETER

MASS SPECTROMETER

ION ACTIVATION AND FRAGMENTATION IN SUB-AMBIENT PRESSURE FOR ION MO...

TIME-OF-FLIGHT MASS SPECTROMETER WITH MULTIPLE REFLECTION

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER

MASS SPECTROMETER

SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...

MULTI-PASS MASS SPECTROMETER

Dynamically Concentrating Ion Packets in the Extraction Region of a...

PULSED ACCELERATOR FOR TIME OF FLIGHT MASS SPECTROMETERS

TIME-OF-FLIGHT MASS SPECTROMETER

METHODS FOR CONFIRMING CHARGED-PARTICLE GENERATION IN AN INSTRUMENT...

MASS ANALYSER

DRIVER CONDITION DETECTION SYSTEM

MULTI-PASS MASS SPECTROMETER

Detector System for Targeted Analysis by Distance-of-Flight Mass Sp...

MASS SPECTROMETER AND METHOD FOR TIME-OF-FLIGHT MASS SPECTROMETRY

MALDI-TOF MASS SPECTROMETERS WITH DELAY TIME VARIATIONS AND RELATED...

Space Focus Time of Flight Mass Spectrometer

TIME-OF-FLIGHT MASS SPECTROMETER

ION GUIDE WITHIN PULSED CONVERTERS

WIDE-RANGE HIGH MASS RESOLUTION IN REFLECTOR TIME-OF-FLIGHT MASS SP...

ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETRY

MULTI-REFLECTING TIME-OF-FLIGHT MASS SPECTROMETERS

DESORPTION BEAM CONTROL WITH VIRTUAL AXIS TRACKING IN TIME-OF-FLIGH...

SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS S...

METHODS FOR CONFIRMING CHARGED-PARTICLE GENERATION IN AN INSTRUMENT...

TIME-OF-FLIGHT MASS SPECTROMETER