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G01R31/318552
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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G01R31/318552
Clock circuits details
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Patents Grants
last 30 patents
Information
Patent Grant
Detection system for SlimSAS slot and method thereof
Patent number
11,953,549
Issue date
Apr 9, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Kai Zou
G01 - MEASURING TESTING
Information
Patent Grant
Hold time improved low area flip-flop architecture
Patent number
11,946,973
Issue date
Apr 2, 2024
Texas Instruments Incorporated
Arnab Khawas
G01 - MEASURING TESTING
Information
Patent Grant
Using scan chains to read out data from integrated sensors during s...
Patent number
11,921,160
Issue date
Mar 5, 2024
Synopsys, Inc.
Bartosz Grzegorz Gajda
G01 - MEASURING TESTING
Information
Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
Patent number
11,899,064
Issue date
Feb 13, 2024
Taiwan Semiconductor Manufacturing Co., Ltd.
Sandeep Kumar Goel
G01 - MEASURING TESTING
Information
Patent Grant
Ring transport employing clock wake suppression
Patent number
11,829,196
Issue date
Nov 28, 2023
Advanced Micro Devices, Inc.
William L. Walker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Built in self test (BIST) for clock generation circuitry
Patent number
11,821,946
Issue date
Nov 21, 2023
NXP USA, INC.
Jorge Arturo Corso Sarmiento
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Split-scan sense amplifier flip-flop
Patent number
11,789,075
Issue date
Oct 17, 2023
Advanced Micro Devices, Inc.
Nur Mohammad Baksh
G01 - MEASURING TESTING
Information
Patent Grant
Scan test device and scan test method
Patent number
11,789,073
Issue date
Oct 17, 2023
Realtek Semiconductor Corporation
Po-Lin Chen
G01 - MEASURING TESTING
Information
Patent Grant
Pseudo-random binary sequences (PRBS) generator for performing on-c...
Patent number
11,774,496
Issue date
Oct 3, 2023
INDIAN INSTITUTE OF TECHNOLOGY
Mahendra Sakare
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for timing-annotated scan-chain testing using...
Patent number
11,768,239
Issue date
Sep 26, 2023
MARVELL ASIA PTE. LTD.
Balaji Upputuri
G01 - MEASURING TESTING
Information
Patent Grant
3D TAP and scan port architectures
Patent number
11,762,014
Issue date
Sep 19, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Scan chain circuit and corresponding method
Patent number
11,747,398
Issue date
Sep 5, 2023
STMicroelectronics S.r.l.
Marco Casarsa
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and semiconductor device examination method
Patent number
11,740,287
Issue date
Aug 29, 2023
Kioxia Corporation
Isao Ooigawa
G01 - MEASURING TESTING
Information
Patent Grant
Localization of multiple scan chain defects per scan chain
Patent number
11,740,288
Issue date
Aug 29, 2023
Synopsys, Inc.
Emil I. Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit die test architecture
Patent number
11,726,135
Issue date
Aug 15, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Circuit and method for scan testing
Patent number
11,714,131
Issue date
Aug 1, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Venkata Narayanan Srinivasan
G01 - MEASURING TESTING
Information
Patent Grant
Transition fault testing of functionally asynchronous paths in an i...
Patent number
11,709,203
Issue date
Jul 25, 2023
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Signal toggling detection and correction circuit
Patent number
11,686,769
Issue date
Jun 27, 2023
NXP B.V.
Shikhar Makkar
G01 - MEASURING TESTING
Information
Patent Grant
Falling clock edge JTAG bus routers
Patent number
11,680,985
Issue date
Jun 20, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
System and method for selecting a clock
Patent number
11,644,504
Issue date
May 9, 2023
STMicroelectronics S.r.l.
Mirko Dondini
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method, apparatus and storage medium for testing chip, and chip the...
Patent number
11,639,964
Issue date
May 2, 2023
Beijing Baidu Netcom Science and Technology Co., Ltd
Ziyu Guo
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for monitoring data and timing signals in integra...
Patent number
11,635,465
Issue date
Apr 25, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Rohit Goel
G01 - MEASURING TESTING
Information
Patent Grant
Multi-capture at-speed scan test based on a slow clock signal
Patent number
11,614,487
Issue date
Mar 28, 2023
SIEMENS INDUSTRY SOFTWARE INC.
Jean-Francois Cote
G01 - MEASURING TESTING
Information
Patent Grant
Data gating using scan enable pin
Patent number
11,609,270
Issue date
Mar 21, 2023
Apple Inc.
FNU Rajeev Kumar
G01 - MEASURING TESTING
Information
Patent Grant
Clock self-testing method and associated circuit
Patent number
11,609,271
Issue date
Mar 21, 2023
Chengdu Monolithic Power Systems Co., Ltd.
Changxian Zhong
G01 - MEASURING TESTING
Information
Patent Grant
Clock control system for scan chains
Patent number
11,604,223
Issue date
Mar 14, 2023
NXP USA, INC.
Himanshu Mangal
G01 - MEASURING TESTING
Information
Patent Grant
Scan architecture for interconnect testing in 3D integrated circuits
Patent number
11,549,984
Issue date
Jan 10, 2023
Taiwan Semiconductor Manufacturing Co., Ltd.
Sandeep Kumar Goel
G01 - MEASURING TESTING
Information
Patent Grant
3D tap and scan port architectures
Patent number
11,549,983
Issue date
Jan 10, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Phase controlled codec block scan of a partitioned circuit device
Patent number
11,519,964
Issue date
Dec 6, 2022
Texas Instruments Incorporated
Prakash Narayanan
G01 - MEASURING TESTING
Information
Patent Grant
Testing memory elements using an internal testing interface
Patent number
11,500,017
Issue date
Nov 15, 2022
Xilinx, Inc.
Albert Shih-Huai Lin
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
META-STABILITY-FREE TWO-CLOCK-DOMAIN SYNCHRONOUS LATCH
Publication number
20240146285
Publication date
May 2, 2024
VIETTEL GROUP
Thai Ha Le
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
Publication number
20240133951
Publication date
Apr 25, 2024
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Sandeep Kumar GOEL
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR SCAN CHAIN INTERFACE FOR NON-VOLATILE STORA...
Publication number
20240112713
Publication date
Apr 4, 2024
EVERSPIN TECHNOLOGIES, INC.
Syed M. ALAM
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC VOLTAGE FREQUENCY SCALING TO REDUCE TEST TIME
Publication number
20240110979
Publication date
Apr 4, 2024
MEDIATEK INC.
Anshul Varma
G01 - MEASURING TESTING
Information
Patent Application
REGISTERS
Publication number
20240003971
Publication date
Jan 4, 2024
NORDIC SEMICONDUCTOR ASA
Matti Samuli Leinonen
G01 - MEASURING TESTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230417831
Publication date
Dec 28, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
USING SCAN CHAINS TO READ OUT DATA FROM INTEGRATED SENSORS DURING S...
Publication number
20230393199
Publication date
Dec 7, 2023
Synopsys, Inc.
Bartosz Grzegorz Gajda
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND SCAN TESTING METHOD
Publication number
20230384378
Publication date
Nov 30, 2023
RENESAS ELECTRONICS CORPORATION
Yucong ZHANG
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
Publication number
20230366920
Publication date
Nov 16, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
BUILDING DATA PLATFORM WITH DIGITAL TWIN DIAGNOSTICS
Publication number
20230359176
Publication date
Nov 9, 2023
Johnson Controls Tyco IP Holdings LLP
Rajiv Ramanasankaran
G01 - MEASURING TESTING
Information
Patent Application
SCAN CHAIN CIRCUIT AND CORRESPONDING METHOD
Publication number
20230358806
Publication date
Nov 9, 2023
STMicroelectronics S.r.l.
Marco CASARSA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FALLING CLOCK EDGE JTAG BUS ROUTERS
Publication number
20230333163
Publication date
Oct 19, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
DATA CORRECTION AND PHASE OPTIMIZATION IN HIGH-SPEED RECEIVERS
Publication number
20230314510
Publication date
Oct 5, 2023
Diodes Incorporated
Yu-Wei Lin
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION DATA GENERATION CIRCUIT AND ASSOCIATED METHOD
Publication number
20230236246
Publication date
Jul 27, 2023
REALTEK SEMICONDUCTOR CORPORATION
CHUN-YI KUO
G01 - MEASURING TESTING
Information
Patent Application
COMMANDED JTAG TEST ACCESS PORT OPERATIONS
Publication number
20230221368
Publication date
Jul 13, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL TOGGLING DETECTION AND CORRECTION CIRCUIT
Publication number
20230213580
Publication date
Jul 6, 2023
NXP B.V.
Shikhar Makkar
G01 - MEASURING TESTING
Information
Patent Application
Data Gating Using Scan Enable Pin
Publication number
20230194606
Publication date
Jun 22, 2023
Apple Inc.
FNU Rajeev Kumar
G01 - MEASURING TESTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230160958
Publication date
May 25, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS
Publication number
20230113905
Publication date
Apr 13, 2023
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Sandeep Kumar GOEL
G01 - MEASURING TESTING
Information
Patent Application
BUILT IN SELF TEST (BIST) FOR CLOCK GENERATION CIRCUITRY
Publication number
20230079000
Publication date
Mar 16, 2023
NXP USA, Inc.
Jorge Arturo Corso Sarmiento
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUTOR DEVCE EXAMINATION METHOD
Publication number
20230079823
Publication date
Mar 16, 2023
KIOXIA Corporation
Isao OOIGAWA
G01 - MEASURING TESTING
Information
Patent Application
Data Gating Using Scan Enable Pin
Publication number
20230019009
Publication date
Jan 19, 2023
Apple Inc.
FNU Rajeev Kumar
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT DIE TEST ARCHITECTURE
Publication number
20220341985
Publication date
Oct 27, 2022
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
TRANSISTION FAULT TESTING OF FUNTIONALLY ASYNCHRONOUS PATHS IN AN I...
Publication number
20220196738
Publication date
Jun 23, 2022
TEXAS INSTRUMENTS INCORPORATED
PRAKASH NARAYANAN
G01 - MEASURING TESTING
Information
Patent Application
CLOCK SELF-TESTING METHOD AND ASSOCIATED CIRCUIT
Publication number
20220146576
Publication date
May 12, 2022
Chengdu Monolithic Power Systems Co., Ltd.
Changxian Zhong
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR MONITORING DATA AND TIMING SIGNALS IN INTEGRA...
Publication number
20220137133
Publication date
May 5, 2022
STMicroelectronics International N.V.
Rohit GOEL
G01 - MEASURING TESTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20220107362
Publication date
Apr 7, 2022
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT AND TESTING CIRCUIT THEREOF
Publication number
20220099740
Publication date
Mar 31, 2022
Shanghai Zhaoxin Semiconductor Co., Ltd.
Yunhao XING
G01 - MEASURING TESTING
Information
Patent Application
MULTI-CAPTURE AT-SPEED SCAN TEST BASED ON A SLOW CLOCK SIGNAL
Publication number
20220018902
Publication date
Jan 20, 2022
Siemens Industry Software Inc.
Jean-Francois Cote
G01 - MEASURING TESTING
Information
Patent Application
Switch-Mode Based Interposer Enabling Self-Testing Of An MCM Withou...
Publication number
20210333326
Publication date
Oct 28, 2021
Peter Shun Shen Wang
G01 - MEASURING TESTING