Coils or antennae arrangements

Industry

CPC
G01R27/267

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/267Coils or antennae arrangements

Industries

Patents Grantslast 30 patents

Information Patent Grant
Inductive sensor and method for the operation thereof
- Patent number 11,815,537
- Issue date Nov 14, 2023
- BALLUFF GMBH
- Pascal Gaggero
- G01 - MEASURING TESTING
Information Patent Grant
TDR measuring apparatus for determining the dielectric constant
- Patent number 11,656,194
- Issue date May 23, 2023
- IMKO Micromodultechnik GmbH
- Timo Camek
- G01 - MEASURING TESTING
Information Patent Grant
High speed calibration method for impedance tuner
- Patent number 11,604,224
- Issue date Mar 14, 2023
- Christos Tsironis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tuning of narrowband near-field probes
- Patent number 11,585,840
- Issue date Feb 21, 2023
- Raytheon Company
- Thomas G. Lavedas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Anisotropic constitutive parameters for launching a Zenneck surface...
- Patent number 11,555,840
- Issue date Jan 17, 2023
- CPG TECHNOLOGIES, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Grant
Anisotropic constitutive parameters for launching a Zenneck surface...
- Patent number 11,340,275
- Issue date May 24, 2022
- CPG TECHNOLOGIES, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Grant
Resonant phase sensing of resistive-inductive-capacitive sensors
- Patent number 10,908,200
- Issue date Feb 2, 2021
- Cirrus Logic, Inc.
- Zhong You
- G01 - MEASURING TESTING
Information Patent Grant
Electrical probe structure
- Patent number 10,670,627
- Issue date Jun 2, 2020
- CHROMA ATE INC.
- Mao-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric measurement probe for curved surfaces
- Patent number 10,649,016
- Issue date May 12, 2020
- The United States of America as represented by the Secretary of the Navy
- David F Rivera
- G01 - MEASURING TESTING
Information Patent Grant
Printed wireless inductive-capacitive (LC) sensor for heavy metal d...
- Patent number 10,466,287
- Issue date Nov 5, 2019
- The Board of Trustees of Western Michigan University
- Massood Zandi Atashbar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for testing a metal detection apparatus and metal detection...
- Patent number 10,444,174
- Issue date Oct 15, 2019
- Mettler-Toledo Safeline Ltd.
- Daren Butterworth
- G01 - MEASURING TESTING
Information Patent Grant
Sensor arrangement for the contactless sensing of angles of rotatio...
- Patent number 10,330,498
- Issue date Jun 25, 2019
- Robert Bosch GmbH
- Stefan Leidich
- G01 - MEASURING TESTING
Information Patent Grant
Guided wave radar level gauge system with dual transmission line pr...
- Patent number 10,295,393
- Issue date May 21, 2019
- ROSEMOUNT TANK RADAR AB
- Mikael Eriksson
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Non-cooperative automatic security screening with antennas for high...
- Patent number 10,162,075
- Issue date Dec 25, 2018
- APSTEC SYSTEMS USA LLC
- Andrey Kuznetsov
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining at least one physical parameter using a sens...
- Patent number 9,995,839
- Issue date Jun 12, 2018
- Gerd Reime
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring system for determining specific electrical conductivity
- Patent number 9,885,678
- Issue date Feb 6, 2018
- Endress + Hauser Conducta GmbH + Co. KG
- Hendrik Zeun
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic input device and coil detection circuit thereof
- Patent number 9,778,777
- Issue date Oct 3, 2017
- Wacom Co., Ltd.
- Chia-Jui Yeh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Metal detector for production and packaging lines
- Patent number 9,494,539
- Issue date Nov 15, 2016
- METTLER-TOLEDO SAFELINE LTD.
- Daren Butterworth
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining the position of a mobile unit and installati...
- Patent number 9,453,933
- Issue date Sep 27, 2016
- Sew-Eurodrive GmbH & Co. KG
- Zhidong Hua
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution, nondestructive imaging of dielectric materials
- Patent number 8,035,400
- Issue date Oct 11, 2011
- Jack R. Little, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution, nondestructive imaging of dielectric materials
- Patent number 7,777,499
- Issue date Aug 17, 2010
- Jack R. Little, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for resonant high-speed microscopic impedance probe
- Patent number 7,451,646
- Issue date Nov 18, 2008
- The Regents of the University of California
- Andrew N. Cleland
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measurement of dielectric constant of thin fi...
- Patent number 7,285,963
- Issue date Oct 23, 2007
- Solid State Measurements, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant measuring apparatus, dielectric constant measur...
- Patent number 7,218,600
- Issue date May 15, 2007
- Pioneer Corporation
- Yasuo Cho
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for non-contact measurement of microwave capacita...
- Patent number 7,102,363
- Issue date Sep 5, 2006
- Neocera, Inc.
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Grant
Capacitive level detector with optimized electrode geometry
- Patent number 6,318,172
- Issue date Nov 20, 2001
- ABB Research Ltd.
- John Anthony Byatt
- G01 - MEASURING TESTING
Information Patent Grant
Bulls-eye mid-frequency impedance probe
- Patent number 6,201,400
- Issue date Mar 13, 2001
- The Boeing Company
- Arthur C. Lind
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic inductive probe
- Patent number 5,793,214
- Issue date Aug 11, 1998
- Hewlett-Packard Company
- Hideki Wakamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Soil penetrometer
- Patent number 5,663,649
- Issue date Sep 2, 1997
- Her Majesty The Queen in right of Canada, as represented by Agriculture and A...
- Clarke Topp
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Grant
Electromagnetic inductive probe
- Patent number 5,659,251
- Issue date Aug 19, 1997
- Hewlett-Packard Company
- Hideki Wakamatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Metasurface for Complex Permittivity Characterization of Dielectric...
- Publication number 20240264094
- Publication date Aug 8, 2024
- Georgia Tech Research Corporation
- Christopher T. Howard
- G01 - MEASURING TESTING
Information Patent Application
In-situ evaluation method and system for loess collapsibility based...
- Publication number 20230251221
- Publication date Aug 10, 2023
- CHINA JIKAN RESEARCH INSTITUTE OF ENGINEERING INVESTIGATIONS AND DESIGN, Co.,Ltd
- Jie Cao
- G01 - MEASURING TESTING
Information Patent Application
SENSOR APPARATUS AND WATER AMOUNT MEASUREMENT APPARATUS
- Publication number 20230003668
- Publication date Jan 5, 2023
- SONY GROUP CORPORATION
- Atsushi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...
- Publication number 20220214389
- Publication date Jul 7, 2022
- CPG Technologies, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Application
TUNING OF NARROWBAND NEAR-FIELD PROBES
- Publication number 20220065911
- Publication date Mar 3, 2022
- Raytheon Company
- Thomas G. Lavedas
- G01 - MEASURING TESTING
Information Patent Application
TDR MEASURING APPARATUS FOR DETERMINING THE DIELECTRIC CONSTANT
- Publication number 20210270761
- Publication date Sep 2, 2021
- Imko Micromodultechnik GmbH
- Timo CAMEK
- G01 - MEASURING TESTING
Information Patent Application
ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...
- Publication number 20210172988
- Publication date Jun 10, 2021
- CPG Technologies, LLC
- Buford Randall Jean
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE SENSOR AND METHOD FOR THE OPERATION THEREOF
- Publication number 20200256907
- Publication date Aug 13, 2020
- Balluff GmbH.
- Pascal Gaggero
- G01 - MEASURING TESTING
Information Patent Application
Non-Invasive System for Determining Fluid Characteristics Within a...
- Publication number 20200049639
- Publication date Feb 13, 2020
- Cote Capital LLC
- Stephen Quirk
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING SOLIDS CONTENT USING DIELECTRIC PROPERTIES
- Publication number 20190025234
- Publication date Jan 24, 2019
- Halliburton Energy Services, Inc.
- Glenn Howard Weightman
- E21 - EARTH DRILLING MINING
Information Patent Application
NON-COOPERATIVE AUTOMATIC SECURITY SCREENING WITH ANTENNAS FOR HIGH...
- Publication number 20180172871
- Publication date Jun 21, 2018
- Andrey KUZNETSOV
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR MEASURING MICRO-CAPACITANCE
- Publication number 20170336451
- Publication date Nov 23, 2017
- MiraMEMS Sensing Technology Co., Ltd.
- YUE HONG CHEN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PRINTED WIRELESS INDUCTIVE-CAPACITIVE (LC) SENSOR FOR HEAVY METAL D...
- Publication number 20170328941
- Publication date Nov 16, 2017
- WESTERN MICHIGAN UNIVERSITY RESEARCH FOUNDATION
- Massood Zandi Atashbar
- B82 - NANO-TECHNOLOGY
Information Patent Application
Measuring System for Determining Specific Electrical Conductivity
- Publication number 20160274045
- Publication date Sep 22, 2016
- Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG
- Hendrik Zeun
- G01 - MEASURING TESTING
Information Patent Application
METAL DETECTOR FOR PRODUCTION AND PACKAGING LINES
- Publication number 20140340099
- Publication date Nov 20, 2014
- Daren Butterworth
- G01 - MEASURING TESTING
Information Patent Application
Metamaterial Particles for Near-Field Sensing Applications
- Publication number 20120086463
- Publication date Apr 12, 2012
- Muhammed S. Boybay
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND A METHOD FOR DETERMINING TISSUE PARAMETERS
- Publication number 20110077509
- Publication date Mar 31, 2011
- ROHDE &SCHWARZ GMBH & CO. KG
- Martin Leibfritz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
High-Resolution, Nondestructive Imaging of Dielectric Materials
- Publication number 20100283483
- Publication date Nov 11, 2010
- Jack R. Little, JR.
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution, Nondestructive Imaging of Dielectric Materials
- Publication number 20090009191
- Publication date Jan 8, 2009
- Jack R. Little, JR.
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR RESONANT HIGH-SPEED MICROSCOPIC IMPEDANCE PROBE
- Publication number 20080224922
- Publication date Sep 18, 2008
- The Regents of the University of California.
- Andrew N. Cleland
- G01 - MEASURING TESTING
Information Patent Application
Method and system for measurement of dielectric constant of thin fi...
- Publication number 20050230619
- Publication date Oct 20, 2005
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-contact measurement of microwave capacita...
- Publication number 20050225333
- Publication date Oct 13, 2005
- Vladimir V. Talanov
- G01 - MEASURING TESTING
Information Patent Application
Dielectric constant measuring apparatus, dielectric constant measur...
- Publication number 20040263185
- Publication date Dec 30, 2004
- Yasuo Cho
- G01 - MEASURING TESTING

Coils or antennae arrangements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Inductive sensor and method for the operation thereof

TDR measuring apparatus for determining the dielectric constant

High speed calibration method for impedance tuner

Tuning of narrowband near-field probes

Anisotropic constitutive parameters for launching a Zenneck surface...

Anisotropic constitutive parameters for launching a Zenneck surface...

Resonant phase sensing of resistive-inductive-capacitive sensors

Electrical probe structure

Dielectric measurement probe for curved surfaces

Printed wireless inductive-capacitive (LC) sensor for heavy metal d...

Method for testing a metal detection apparatus and metal detection...

Sensor arrangement for the contactless sensing of angles of rotatio...

Guided wave radar level gauge system with dual transmission line pr...

Non-cooperative automatic security screening with antennas for high...

Method for determining at least one physical parameter using a sens...

Measuring system for determining specific electrical conductivity

Electromagnetic input device and coil detection circuit thereof

Metal detector for production and packaging lines

Method for determining the position of a mobile unit and installati...

High-resolution, nondestructive imaging of dielectric materials

High-resolution, nondestructive imaging of dielectric materials

Device and method for resonant high-speed microscopic impedance probe

Method and system for measurement of dielectric constant of thin fi...

Dielectric constant measuring apparatus, dielectric constant measur...

Method and system for non-contact measurement of microwave capacita...

Capacitive level detector with optimized electrode geometry

Bulls-eye mid-frequency impedance probe

Electromagnetic inductive probe

Soil penetrometer

Electromagnetic inductive probe

Patents Applicationslast 30 patents

Metasurface for Complex Permittivity Characterization of Dielectric...

In-situ evaluation method and system for loess collapsibility based...

SENSOR APPARATUS AND WATER AMOUNT MEASUREMENT APPARATUS

ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...

TUNING OF NARROWBAND NEAR-FIELD PROBES

TDR MEASURING APPARATUS FOR DETERMINING THE DIELECTRIC CONSTANT

ANISOTROPIC CONSTITUTIVE PARAMETERS FOR LAUNCHING A ZENNECK SURFACE...

INDUCTIVE SENSOR AND METHOD FOR THE OPERATION THEREOF

Non-Invasive System for Determining Fluid Characteristics Within a...

DETERMINING SOLIDS CONTENT USING DIELECTRIC PROPERTIES

NON-COOPERATIVE AUTOMATIC SECURITY SCREENING WITH ANTENNAS FOR HIGH...

PROBE CARD FOR MEASURING MICRO-CAPACITANCE

PRINTED WIRELESS INDUCTIVE-CAPACITIVE (LC) SENSOR FOR HEAVY METAL D...

Measuring System for Determining Specific Electrical Conductivity

METAL DETECTOR FOR PRODUCTION AND PACKAGING LINES

Metamaterial Particles for Near-Field Sensing Applications

MEASURING DEVICE AND A METHOD FOR DETERMINING TISSUE PARAMETERS

High-Resolution, Nondestructive Imaging of Dielectric Materials

High-Resolution, Nondestructive Imaging of Dielectric Materials

DEVICE AND METHOD FOR RESONANT HIGH-SPEED MICROSCOPIC IMPEDANCE PROBE

Method and system for measurement of dielectric constant of thin fi...

Method and system for non-contact measurement of microwave capacita...

Dielectric constant measuring apparatus, dielectric constant measur...