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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R33/00
Arrangements or instruments for measuring magnetic variables
Current Industry
G01R33/098
comprising tunnel junctions
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic sensor
Patent number
11,977,136
Issue date
May 7, 2024
TDK Corporation
Hirokazu Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor with increased SNR
Patent number
11,971,462
Issue date
Apr 30, 2024
EVERSPIN TECHNOLOGIES, INC.
Phillip G. Mather
G01 - MEASURING TESTING
Information
Patent Grant
Temperature compensated MTJ-based sensing circuit for measuring an...
Patent number
11,971,463
Issue date
Apr 30, 2024
ALLEGRO MICROSYSTEMS, LLC
Anuraag Mohan
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,965,941
Issue date
Apr 23, 2024
TDK Corporation
Yuta Saito
G01 - MEASURING TESTING
Information
Patent Grant
Sensor unit
Patent number
11,959,979
Issue date
Apr 16, 2024
TDK Corporation
Kunihiro Ueda
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic multi-turn sensor and method of manufacture
Patent number
11,953,567
Issue date
Apr 9, 2024
Analog Devices International Unlimited Company
Peter Meehan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wide-range perpendicular sensitive magnetic sensor and method for m...
Patent number
11,953,568
Issue date
Apr 9, 2024
DIGITAL GRID RES. INST., CHINA SOUTHERN PWR. GRID
Peng Li
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor device and magnetic sensor system
Patent number
11,946,989
Issue date
Apr 2, 2024
TDK Corporation
Norikazu Ota
G01 - MEASURING TESTING
Information
Patent Grant
Vehicle battery current sensing system
Patent number
11,946,988
Issue date
Apr 2, 2024
Purdue Research Foundation
Kaushik Roy
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,940,506
Issue date
Mar 26, 2024
TDK Corporation
Kenzo Makino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic sensor with an elongated element
Patent number
11,940,300
Issue date
Mar 26, 2024
TDK Corporation
Keisuke Uchida
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic-field closed-loop sensors with diagnostics
Patent number
11,927,650
Issue date
Mar 12, 2024
ALLEGRO MICROSYSTEMS, LLC
Hernan D. Romero
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor structure integrated with magnetic tunneling junction
Patent number
11,930,645
Issue date
Mar 12, 2024
Taiwan Semiconductor Manufacturing Company Ltd.
Alexander Kalnitsky
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic field measuring apparatus
Patent number
11,927,646
Issue date
Mar 12, 2024
Asahi Kasei Microdevices Corporation
Shigeki Okatake
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistance effect element
Patent number
11,927,649
Issue date
Mar 12, 2024
TDK Corporation
Shogo Yonemura
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic current sensor comprising a magnetoresistive differential...
Patent number
11,906,553
Issue date
Feb 20, 2024
Crocus Technology S.A.
Andrey Timopheev
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,892,527
Issue date
Feb 6, 2024
TDK Corporation
Hidekazu Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensing system for multiple door appliances
Patent number
11,892,525
Issue date
Feb 6, 2024
Littelfuse, Inc.
Todd Sabotta
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Grant
Magnetoresistive sensor and fabrication method for a magnetoresisti...
Patent number
11,892,526
Issue date
Feb 6, 2024
Infineon Technologies AG
Bernhard Endres
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic sensor
Patent number
11,874,346
Issue date
Jan 16, 2024
TDK Corporation
Hidekazu Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistance effect element
Patent number
11,871,681
Issue date
Jan 9, 2024
TDK Corporation
Tomoyuki Sasaki
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic angular sensor device for sensing high magnetic fields wit...
Patent number
11,860,250
Issue date
Jan 2, 2024
Crocus Technology S.A.
Andrey Timopheev
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor
Patent number
11,860,251
Issue date
Jan 2, 2024
TDK Corporation
Hirokazu Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic element having an improved measurement range
Patent number
11,852,700
Issue date
Dec 26, 2023
Crocus Technology S.A.
Salim Dounia
G01 - MEASURING TESTING
Information
Patent Grant
Current sensor and electric control device
Patent number
11,852,697
Issue date
Dec 26, 2023
TDK Corporation
Hiroyuki Hirano
G01 - MEASURING TESTING
Information
Patent Grant
Linear sensor with dual spin valve element having reference layers...
Patent number
11,852,699
Issue date
Dec 26, 2023
ALLEGRO MICROSYSTEMS, LLC
Rémy Lassalle-Balier
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic field calibration device and method of calibrating magneti...
Patent number
11,846,693
Issue date
Dec 19, 2023
TDK Corporation
Tomohiko Shibuya
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive magnetic field sensor bridge with compensated cros...
Patent number
11,835,601
Issue date
Dec 5, 2023
Robert Bosch GmbH
Brad Engel
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive random access memory and method for fabricating th...
Patent number
11,821,964
Issue date
Nov 21, 2023
United Microelectronics Corp.
Hui-Lin Wang
G11 - INFORMATION STORAGE
Information
Patent Grant
Pseudo force sense generation apparatus
Patent number
11,815,572
Issue date
Nov 14, 2023
Nippon Telegraph and Telephone Corporation
Ryoma Tanase
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
MAGNETIC SENSOR ELEMENT, MAGNETIC SENSOR, AND MAGNETIC SENSOR DEVICE
Publication number
20240142549
Publication date
May 2, 2024
Mitsubishi Electric Corporation
Kaito TAKESHIMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMMUNOSENSING ON A LIPID LAYER USING MAGNETIC TUNNEL JUN...
Publication number
20240142441
Publication date
May 2, 2024
Roche Diagnostics Operations, Inc.
Regina Baranowski
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING MAGNETORESISTANCE ELEMENT USING LASER PINNI...
Publication number
20240133977
Publication date
Apr 25, 2024
ALLEGRO MICROSYSTEMS, LLC
Samridh Jaiswal
G01 - MEASURING TESTING
Information
Patent Application
SPIN VALVE DEVICE AND METHOD FOR FORMING A SPIN VALVE DEVICE
Publication number
20240133982
Publication date
Apr 25, 2024
INFINEON TECHNOLOGIES AG
Dieter SUESS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240125873
Publication date
Apr 18, 2024
TDK Corporation
Hidekazu KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIZATION ROTATIONAL ELEMENT AND MAGNETORESISTIVE EFFECT ELEMENT
Publication number
20240130247
Publication date
Apr 18, 2024
TDK Corporation
Tomoyuki SASAKI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE SENSOR
Publication number
20240125872
Publication date
Apr 18, 2024
Analog Devices International Unlimited Company
Fernando Franco
G01 - MEASURING TESTING
Information
Patent Application
LINEAR TUNNEL MAGNETORESISTIVE SENSOR INCLUDING AN INTEGRATED BACK-...
Publication number
20240118111
Publication date
Apr 11, 2024
INFINEON TECHNOLOGIES AG
Simon HAINZ
G01 - MEASURING TESTING
Information
Patent Application
WIDE-RANGE PERPENDICULAR SENSITIVE MAGNETIC SENSOR AND METHOD FOR M...
Publication number
20240118355
Publication date
Apr 11, 2024
DIGITAL GRID RES. INST., CHINA SOUTHERN PWR. GRID
Peng LI
G01 - MEASURING TESTING
Information
Patent Application
TUNNEL MAGNETORESISTIVE MULTI-TURN SENSOR
Publication number
20240111005
Publication date
Apr 4, 2024
Analog Devices International Unlimited Company
Onur Necdet Urs
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR TUNNEL MAGNETORESISTANCE MULTI-TURN SENSOR MANUFACTURE...
Publication number
20240111006
Publication date
Apr 4, 2024
Analog Devices International Unlimited Company
Onur Necdet Urs
G01 - MEASURING TESTING
Information
Patent Application
OFFSET CORRECTION IN A VOLTAGE CONTROLLED MAGNETORESISTIVE SENSOR
Publication number
20240103102
Publication date
Mar 28, 2024
INFINEON TECHNOLOGIES AG
Bernhard ENDRES
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240094315
Publication date
Mar 21, 2024
TDK Corporation
Hirokazu TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240094312
Publication date
Mar 21, 2024
TDK Corporation
Hidekazu KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE COBALT IRON BORON LAYERS IN A FREE LAYER OF A MAGNETORESIS...
Publication number
20240094314
Publication date
Mar 21, 2024
INFINEON TECHNOLOGIES AG
Bernhard ENDRES
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF MANUFACTURING A MAGNETIC FIELD SENSOR
Publication number
20240090335
Publication date
Mar 14, 2024
EVERSPIN TECHNOLOGIES, INC.
Renu WHIG
G01 - MEASURING TESTING
Information
Patent Application
Magnetoresistive Device Comprising A Synthetic Antiferromagnetic Co...
Publication number
20240087785
Publication date
Mar 14, 2024
Western Digital Technologies, Inc.
Susumu OKAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC SENSOR DEVICE AND METHOD OF MANUFACTURING THE SAME
Publication number
20240085499
Publication date
Mar 14, 2024
TDK Corporation
Kazuma YAMAWAKI
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR COMPENSATING FOR SENSITIVITY FLUCTUATIONS...
Publication number
20240069122
Publication date
Feb 29, 2024
INFINEON TECHNOLOGIES AG
Edwin Mario MOTZ
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240045003
Publication date
Feb 8, 2024
TDK Corporation
Kazuya WATANABE
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
Publication number
20240027550
Publication date
Jan 25, 2024
UNITED MICROELECTRONICS CORP.
Hui-Lin Wang
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
Publication number
20240027549
Publication date
Jan 25, 2024
UNITED MICROELECTRONICS CORP.
Hui-Lin Wang
G11 - INFORMATION STORAGE
Information
Patent Application
MAGNETORESISTIVE ELEMENT FOR SENSING A MAGNETIC FIELD IN A Z-AXIS
Publication number
20240027551
Publication date
Jan 25, 2024
CROCUS TECHNOLOGY SA
Jeffrey Childress
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING OUT-OF-PLANE ANISOTROPY IN AN MR SENSOR WITH FREE LAYER...
Publication number
20240027547
Publication date
Jan 25, 2024
ALLEGRO MICROSYSTEMS, LLC
Samridh Jaiswal
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETORESISTIVE SENSOR ELEMENT HAVING A WIDE LINEAR RESPONSE AND R...
Publication number
20240019509
Publication date
Jan 18, 2024
CROCUS TECHNOLOGY SA
Jeffrey Childress
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SENSOR OUTPUT COMPENSATION CIRCUIT
Publication number
20240003992
Publication date
Jan 4, 2024
Murata Manufacturing Co., Ltd.
Aritsugu YAJIMA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR
Publication number
20240004000
Publication date
Jan 4, 2024
Murata Manufacturing Co., Ltd.
Takahiro IBUSUKI
G01 - MEASURING TESTING
Information
Patent Application
SENSOR OUTPUT COMPENSATION CIRCUIT
Publication number
20240003991
Publication date
Jan 4, 2024
Murata Manufacturing Co., Ltd.
Aritsugu YAJIMA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR OUTPUT COMPENSATION CIRCUIT
Publication number
20230408604
Publication date
Dec 21, 2023
Murata Manufacturing Co., Ltd.
Aritsugu YAJIMA
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD DETECTION DEVICE
Publication number
20230408605
Publication date
Dec 21, 2023
TDK Corporation
Yoshiaki TANAKA
G01 - MEASURING TESTING