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G01N23/20008

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20008Constructional details; Accessories

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction imaging detector having multiple angled input faces
- Patent number 12,339,239
- Issue date Jun 24, 2025
- BRUKER TECHNOLOGIES LTD.
- Richard Thake Bytheway
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for real-time configurable backscatter scanners
- Patent number 12,332,191
- Issue date Jun 17, 2025
- Smiths Detection Inc.
- Joseph Bendahan
- G01 - MEASURING TESTING
Information Patent Grant
Alpha diffractometer
- Patent number 12,332,192
- Issue date Jun 17, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- G01 - MEASURING TESTING
Information Patent Grant
Targeted collimation of detectors using rear collimators
- Patent number 12,259,341
- Issue date Mar 25, 2025
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspecting device, and nondestructive inspecting method
- Patent number 12,259,340
- Issue date Mar 25, 2025
- Riken
- Kunihiro Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Combined scatter and transmission multi-view imaging system
- Patent number 12,235,226
- Issue date Feb 25, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for efficient high harmonic generation
- Patent number 12,196,688
- Issue date Jan 14, 2025
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 12,188,883
- Issue date Jan 7, 2025
- Industrial Technology Research Institute
- Bo-Ching He
- G01 - MEASURING TESTING
Information Patent Grant
X-ray system
- Patent number 12,181,427
- Issue date Dec 31, 2024
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scanning system and method for inspecting an object
- Patent number 12,111,271
- Issue date Oct 8, 2024
- Seethru AI, Inc.
- Omar Al-Kofahi
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
- Patent number 12,106,867
- Issue date Oct 1, 2024
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-limited extreme ultraviolet coherent diffraction imaging
- Patent number 12,085,520
- Issue date Sep 10, 2024
- Regents of the Univ of Colorado
- Henry C. Kapteyn
- G01 - MEASURING TESTING
Information Patent Grant
Open midplane, high magnetic field solenoid system and method for n...
- Patent number 12,051,538
- Issue date Jul 30, 2024
- Particle Beam Lasers, Inc.
- Ramesh Gupta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptable X-ray analysis apparatus
- Patent number 12,031,925
- Issue date Jul 9, 2024
- Malvern Panalytical B.V.
- Detlef Beckers
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi-arm robot used for tunnel lining inspection and defect diagno...
- Patent number 12,031,922
- Issue date Jul 9, 2024
- Shandong University
- Bin Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement arrangement for X-ray radiation for gap-free 1D measure...
- Patent number 12,031,924
- Issue date Jul 9, 2024
- Jürgen Fink
- G01 - MEASURING TESTING
Information Patent Grant
Soft x-ray optics with improved filtering
- Patent number 12,025,575
- Issue date Jul 2, 2024
- KLA Corporation
- Alexander Kuznetsov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
CONTROL APPARATUS, SYSTEM, METHOD AND PROGRAM
- Publication number 20250198953
- Publication date Jun 19, 2025
- Rigaku Corporation
- Takashi SATO
- G01 - MEASURING TESTING
Information Patent Application
Combined Scatter and Transmission Multi-View Imaging System
- Publication number 20250180494
- Publication date Jun 5, 2025
- Rapiscan Systems, Inc.
- Edward James Morton
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
ANALYSIS APPARATUS, ANALYSIS METHOD, AND PROGRAM FOR ANALYZING SCAT...
- Publication number 20250155384
- Publication date May 15, 2025
- SAMSUNG ELECTRONICS CO., LTD.
- Koji MURATA
- G01 - MEASURING TESTING
Information Patent Application
RAIL DIAGNOSTIC INSPECTION APPARATUS
- Publication number 20250155383
- Publication date May 15, 2025
- TESMEC S.P.A.
- Silvestro Di Gioia
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT
- Publication number 20250146962
- Publication date May 8, 2025
- Seethru AI Inc.
- OMAR AL-KOFAHI
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...
- Publication number 20250137946
- Publication date May 1, 2025
- The Boeing Company
- Morteza Safai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH RESOLUTION X-RAY REFLECTOMETER
- Publication number 20250110068
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Raymond P. Conley
- G01 - MEASURING TESTING
Information Patent Application
Hard X-ray Compatible Chamber for High Temperature In-Situ Material...
- Publication number 20250109498
- Publication date Apr 3, 2025
- UChicago Argonne, LLC
- Katherine J. Harmon
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METAL OXIDATION DETERMINING APPARATUS
- Publication number 20250076226
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Robert Cernik
- G01 - MEASURING TESTING
Information Patent Application
EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF
- Publication number 20250076222
- Publication date Mar 6, 2025
- UIH AMERICA, INC.
- Hongdi LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adaptable X-Ray Analysis Apparatus
- Publication number 20250020601
- Publication date Jan 16, 2025
- MALVERN PANALYTICAL B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-Ray diffraction imaging detector having multiple angled input faces
- Publication number 20240361259
- Publication date Oct 31, 2024
- BRUKER TECHNOLOGIES LTD.
- Richard Thake Bytheway
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...
- Publication number 20240302302
- Publication date Sep 12, 2024
- Sumitomo Chemical Company, Limited
- Takehiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Soft X-Ray Optics With Improved Filtering
- Publication number 20240288388
- Publication date Aug 29, 2024
- KLA Corporation
- Alexander Kuznetsov
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...
- Publication number 20240280714
- Publication date Aug 22, 2024
- Rigaku Corporation
- Kunitoshi YANAGIHARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
DETECTOR STAND AND X-RAY DIFFRACTION APPARATUS
- Publication number 20240255446
- Publication date Aug 1, 2024
- Rigaku Corporation
- Yuji SHIRAMATA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...
- Publication number 20240255447
- Publication date Aug 1, 2024
- Eldico Scientific AG
- Francesco Garbuglia
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
- Publication number 20240248050
- Publication date Jul 25, 2024
- XENOCS SAS
- Peter HOGHOJ
- G01 - MEASURING TESTING
Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20240201112
- Publication date Jun 20, 2024
- GATAN, INC.
- Colin Geoffrey TREVOR
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND...
- Publication number 20240060911
- Publication date Feb 22, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
- Publication number 20240060913
- Publication date Feb 22, 2024
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Application
A SCREENING SYSTEM
- Publication number 20240044813
- Publication date Feb 8, 2024
- Halo X Ray Technologies Limited
- Anthony DICKEN
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20230393082
- Publication date Dec 7, 2023
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING

Constructional details; Accessories

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray diffraction imaging detector having multiple angled input faces

Systems and methods for real-time configurable backscatter scanners

Alpha diffractometer

Targeted collimation of detectors using rear collimators

Nondestructive inspecting device, and nondestructive inspecting method

Inspection apparatus and inspection method

Combined scatter and transmission multi-view imaging system

X-ray detector system with at least two stacked flat Bragg diffractors

Method and apparatus for efficient high harmonic generation

Method and system for inspecting a structure across a cover layer c...

X-ray reflectometry apparatus and method thereof for measuring thre...

X-ray system

Nitride semiconductor substrate, laminated structure, and method fo...

System, method, and apparatus for x-ray backscatter inspection of p...

X-ray fluorescence analyzer

X-ray scanning system and method for inspecting an object

Method for scanning a sample by means of X-ray optics and an appara...

Device and method for measuring short-wavelength characteristic X-r...

Quantum-limited extreme ultraviolet coherent diffraction imaging

Open midplane, high magnetic field solenoid system and method for n...

Adaptable X-ray analysis apparatus

Multi-arm robot used for tunnel lining inspection and defect diagno...

Measurement arrangement for X-ray radiation for gap-free 1D measure...

Soft x-ray optics with improved filtering

X-ray beam shaping apparatus and method

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Sample inspection system comprising a beam former to project a poly...

Method for improving an EBSD/TKD map

Patents Applicationslast 30 patents

CONTROL APPARATUS, SYSTEM, METHOD AND PROGRAM

Combined Scatter and Transmission Multi-View Imaging System

ANALYSIS APPARATUS, ANALYSIS METHOD, AND PROGRAM FOR ANALYZING SCAT...

RAIL DIAGNOSTIC INSPECTION APPARATUS

X-RAY SCANNING SYSTEM AND METHOD FOR INSPECTING AN OBJECT

INTEGRATED BACKSCATTER X-RAY ASSEMBLIES FOR DETECTING BACKSCATTER X...

HIGH RESOLUTION X-RAY REFLECTOMETER

Hard X-ray Compatible Chamber for High Temperature In-Situ Material...

METAL OXIDATION DETERMINING APPARATUS

EMISSION COMPUTED TOMOGRAPHY DETECTOR ASSEMBLIES AND METHODS THEREOF

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

Adaptable X-Ray Analysis Apparatus

PATTERNED X-RAY EMITTING TARGET

AN X-RAY SYSTEM

INSPECTION APPARATUS AND INSPECTION METHOD

X-Ray diffraction imaging detector having multiple angled input faces

NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...

Soft X-Ray Optics With Improved Filtering

RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

DETECTOR STAND AND X-RAY DIFFRACTION APPARATUS

ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...

X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD

Laboratory crystallographic x-ray diffraction analysis system

SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND...

Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...

A SCREENING SYSTEM

NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD