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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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G01N23/20008
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Patents Grants
last 30 patents
Information
Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
Patent number
12,163,903
Issue date
Dec 10, 2024
The Boeing Company
Morteza Safai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray fluorescence analyzer
Patent number
12,135,299
Issue date
Nov 5, 2024
Shimadzu Corporation
Takuro Izumi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray scanning system and method for inspecting an object
Patent number
12,111,271
Issue date
Oct 8, 2024
Seethru AI, Inc.
Omar Al-Kofahi
G01 - MEASURING TESTING
Information
Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
Patent number
12,106,867
Issue date
Oct 1, 2024
Bruker Nano GmbH
Ulrich Waldschläger
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
Patent number
12,099,025
Issue date
Sep 24, 2024
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Quantum-limited extreme ultraviolet coherent diffraction imaging
Patent number
12,085,520
Issue date
Sep 10, 2024
Regents of the Univ of Colorado
Henry C. Kapteyn
G01 - MEASURING TESTING
Information
Patent Grant
Open midplane, high magnetic field solenoid system and method for n...
Patent number
12,051,538
Issue date
Jul 30, 2024
Particle Beam Lasers, Inc.
Ramesh Gupta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adaptable X-ray analysis apparatus
Patent number
12,031,925
Issue date
Jul 9, 2024
Malvern Panalytical B.V.
Detlef Beckers
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Multi-arm robot used for tunnel lining inspection and defect diagno...
Patent number
12,031,922
Issue date
Jul 9, 2024
Shandong University
Bin Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Measurement arrangement for X-ray radiation for gap-free 1D measure...
Patent number
12,031,924
Issue date
Jul 9, 2024
Jürgen Fink
G01 - MEASURING TESTING
Information
Patent Grant
Soft x-ray optics with improved filtering
Patent number
12,025,575
Issue date
Jul 2, 2024
KLA Corporation
Alexander Kuznetsov
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray beam shaping apparatus and method
Patent number
12,007,343
Issue date
Jun 11, 2024
Malvern Panalytical B.V.
Milen Gateshki
G01 - MEASURING TESTING
Information
Patent Grant
Patterned x-ray emitting target
Patent number
11,996,259
Issue date
May 28, 2024
NOVA MEASURING INSTRUMENTS INC.
David A. Reed
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,977,038
Issue date
May 7, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Sample inspection system comprising a beam former to project a poly...
Patent number
11,971,371
Issue date
Apr 30, 2024
The Nottingham Trent University
Paul Evans
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,394
Issue date
Mar 26, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
Patent number
11,933,747
Issue date
Mar 19, 2024
University of Maryland, College Park
Peter Zavalij
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Grant
Shielding strategy for mitigation of stray field for permanent magn...
Patent number
11,927,549
Issue date
Mar 12, 2024
KLA Corporation
Qian Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,927,554
Issue date
Mar 12, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for cosmogenic neutron sensing moisture detecti...
Patent number
11,927,552
Issue date
Mar 12, 2024
QUAESTA INSTRUMENTS, LLC
Peter Shifflett
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,921,059
Issue date
Mar 5, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Screening system
Patent number
11,913,890
Issue date
Feb 27, 2024
Halo X Ray Technologies Limited
Anthony Dicken
G01 - MEASURING TESTING
Information
Patent Grant
Electron diffraction intensity from single crystal silicon in a pho...
Patent number
11,915,837
Issue date
Feb 27, 2024
Arizona Board of Regents on behalf of Arizona State University
William Graves
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Controlling process parameters by means of radiographic online dete...
Patent number
11,898,971
Issue date
Feb 13, 2024
SMS group GMBH
Christian Klinkenberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray sequential array wavelength dispersive spectrometer
Patent number
11,885,755
Issue date
Jan 30, 2024
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
Advanced X-ray emission spectrometers
Patent number
11,874,239
Issue date
Jan 16, 2024
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
Patent number
11,867,595
Issue date
Jan 9, 2024
Industrial Technology Research Institute
Chun-Ting Liu
G01 - MEASURING TESTING
Information
Patent Grant
X-ray collimator and related X-ray inspection apparatus
Patent number
11,854,712
Issue date
Dec 26, 2023
DUE2LAB S.R.L.
Nicola Zambelli
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Patents Applications
last 30 patents
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240369502
Publication date
Nov 7, 2024
Canon ANELVA Corporation
Takeo TSUKAMOTO
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
X-Ray diffraction imaging detector having multiple angled input faces
Publication number
20240361259
Publication date
Oct 31, 2024
BRUKER TECHNOLOGIES LTD.
Richard Thake Bytheway
G01 - MEASURING TESTING
Information
Patent Application
NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...
Publication number
20240302302
Publication date
Sep 12, 2024
Sumitomo Chemical Company, Limited
Takehiro YOSHIDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Soft X-Ray Optics With Improved Filtering
Publication number
20240288388
Publication date
Aug 29, 2024
KLA Corporation
Alexander Kuznetsov
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...
Publication number
20240280714
Publication date
Aug 22, 2024
Rigaku Corporation
Kunitoshi YANAGIHARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
Publication number
20240280515
Publication date
Aug 22, 2024
Sigray, Inc.
Wenbing Yun
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
DETECTOR STAND AND X-RAY DIFFRACTION APPARATUS
Publication number
20240255446
Publication date
Aug 1, 2024
Rigaku Corporation
Yuji SHIRAMATA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...
Publication number
20240255447
Publication date
Aug 1, 2024
Eldico Scientific AG
Francesco Garbuglia
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
Publication number
20240248050
Publication date
Jul 25, 2024
XENOCS SAS
Peter HOGHOJ
G01 - MEASURING TESTING
Information
Patent Application
Laboratory crystallographic x-ray diffraction analysis system
Publication number
20240219328
Publication date
Jul 4, 2024
Carl Zeiss X-ray Microscopy, Inc.
Christian HOLZNER
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER
Publication number
20240201112
Publication date
Jun 20, 2024
GATAN, INC.
Colin Geoffrey TREVOR
G01 - MEASURING TESTING
Information
Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
Publication number
20240094148
Publication date
Mar 21, 2024
Industrial Technology Research Institute
Bo-Ching HE
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND...
Publication number
20240060911
Publication date
Feb 22, 2024
PROTO PATENTS LTD.
Mohammed BELASSEL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
Publication number
20240060913
Publication date
Feb 22, 2024
Rapiscan Systems, Inc.
Neil Duncan Carrington
G01 - MEASURING TESTING
Information
Patent Application
A SCREENING SYSTEM
Publication number
20240044813
Publication date
Feb 8, 2024
Halo X Ray Technologies Limited
Anthony DICKEN
G01 - MEASURING TESTING
Information
Patent Application
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
Publication number
20230393082
Publication date
Dec 7, 2023
Riken
Kunihiro FUJITA
G01 - MEASURING TESTING
Information
Patent Application
COMPONENT RESIDUAL STRESS TESTING PLATFORM BASED ON NEUTRON DIFFRAC...
Publication number
20230358693
Publication date
Nov 9, 2023
NCS TESTING TECHNOLOGY CO., LTD
LIXIA YANG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349843
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349845
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
Publication number
20230349842
Publication date
Nov 2, 2023
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349844
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
ALPHA DIFFRACTOMETER
Publication number
20230341339
Publication date
Oct 26, 2023
Arion Diagnostics, Inc.
Alexander P. Lazarev
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20230324316
Publication date
Oct 12, 2023
Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
Hitomi ADACHI
G01 - MEASURING TESTING
Information
Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
Publication number
20230314348
Publication date
Oct 5, 2023
UNIVERSITY OF HOUSTON SYSTEM
Byron Freelon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Configurable Detector Panel for an X-Ray Imaging System
Publication number
20230314347
Publication date
Oct 5, 2023
Viken Detection Corporation
James P. Ryan
G01 - MEASURING TESTING
Information
Patent Application
SCREENING METHOD
Publication number
20230317203
Publication date
Oct 5, 2023
University of Leeds
Elton Zeqiraj
G01 - MEASURING TESTING
Information
Patent Application
DRONE-BASED NEUTRON BACKSCATTER INSPECTION SYSTEM
Publication number
20230296537
Publication date
Sep 21, 2023
Saudi Arabian Oil Company
Ahmad A. Al-Shammari
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
FUSION BOND BASED WAFER-LEVEL-PACKAGE FOR MID-INFRARED GAS SENSOR S...
Publication number
20230296502
Publication date
Sep 21, 2023
INFINEON TECHNOLOGIES AG
Christoph Kovatsch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...
Publication number
20230296536
Publication date
Sep 21, 2023
MALVERN PANALYTICAL B.V.
Vladimir Kogan
G01 - MEASURING TESTING
Information
Patent Application
Advanced X-Ray Emission Spectrometers
Publication number
20230288352
Publication date
Sep 14, 2023
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING