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G01N23/20008
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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G01N23/20008
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,977,038
Issue date
May 7, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Sample inspection system comprising a beam former to project a poly...
Patent number
11,971,371
Issue date
Apr 30, 2024
The Nottingham Trent University
Paul Evans
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,394
Issue date
Mar 26, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
Patent number
11,933,747
Issue date
Mar 19, 2024
University of Maryland, College Park
Peter Zavalij
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Grant
Shielding strategy for mitigation of stray field for permanent magn...
Patent number
11,927,549
Issue date
Mar 12, 2024
KLA Corporation
Qian Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,927,554
Issue date
Mar 12, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for cosmogenic neutron sensing moisture detecti...
Patent number
11,927,552
Issue date
Mar 12, 2024
QUAESTA INSTRUMENTS, LLC
Peter Shifflett
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,921,059
Issue date
Mar 5, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Screening system
Patent number
11,913,890
Issue date
Feb 27, 2024
Halo X Ray Technologies Limited
Anthony Dicken
G01 - MEASURING TESTING
Information
Patent Grant
Electron diffraction intensity from single crystal silicon in a pho...
Patent number
11,915,837
Issue date
Feb 27, 2024
Arizona Board of Regents on behalf of Arizona State University
William Graves
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Controlling process parameters by means of radiographic online dete...
Patent number
11,898,971
Issue date
Feb 13, 2024
SMS group GMBH
Christian Klinkenberg
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-ray sequential array wavelength dispersive spectrometer
Patent number
11,885,755
Issue date
Jan 30, 2024
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Grant
Advanced X-ray emission spectrometers
Patent number
11,874,239
Issue date
Jan 16, 2024
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
Patent number
11,867,595
Issue date
Jan 9, 2024
Industrial Technology Research Institute
Chun-Ting Liu
G01 - MEASURING TESTING
Information
Patent Grant
X-ray collimator and related X-ray inspection apparatus
Patent number
11,854,712
Issue date
Dec 26, 2023
DUE2LAB S.R.L.
Nicola Zambelli
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Ball-mapping system comprising a sample stage and a sample holder f...
Patent number
11,846,593
Issue date
Dec 19, 2023
PROTO PATENTS LTD.
James Pineault
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction device and method for non-destructive testing of intern...
Patent number
11,846,595
Issue date
Dec 19, 2023
THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
Lin Zheng
G01 - MEASURING TESTING
Information
Patent Grant
Method for identifying molecular structure
Patent number
11,815,475
Issue date
Nov 14, 2023
The University of Tokyo
Makoto Fujita
C30 - CRYSTAL GROWTH
Information
Patent Grant
X-ray spectrometer and methods for use
Patent number
11,796,490
Issue date
Oct 24, 2023
University of Washington
Gerald Todd Seidler
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Nanopatterned electron beams for temporal coherence and determinist...
Patent number
11,798,706
Issue date
Oct 24, 2023
Arizona Board of Regents on behalf of Arizona State University
William Graves
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Systems and methods for eliminating cross-talk signals in one or mo...
Patent number
11,796,489
Issue date
Oct 24, 2023
Rapiscan Systems, Inc.
Neil Duncan Carrington
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction analysis device and method for full-field x-ray fluores...
Patent number
11,774,380
Issue date
Oct 3, 2023
Sichuan University
Yuanjun Xu
G01 - MEASURING TESTING
Information
Patent Grant
Non-destructive inspection system comprising neutron radiation sour...
Patent number
11,747,288
Issue date
Sep 5, 2023
Topcon Corporation
Shigenori Nagano
G01 - MEASURING TESTING
Information
Patent Grant
Sample inspection apparatus employing a diffraction detector
Patent number
11,726,048
Issue date
Aug 15, 2023
The Nottingham Trent University
Paul Evans
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor metrology and inspection based on an x-ray source wit...
Patent number
11,719,652
Issue date
Aug 8, 2023
KLA Corporation
Yung-Ho Alex Chuang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Quantum mechanical/X-ray crystallography diagnostic for proteins
Patent number
11,688,488
Issue date
Jun 27, 2023
Quantumbio, Inc.
Lance Michael Westerhoff
G01 - MEASURING TESTING
Information
Patent Grant
X-ray imaging apparatus and method
Patent number
11,681,068
Issue date
Jun 20, 2023
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
X-ray diffraction measurement apparatus and method
Patent number
11,674,912
Issue date
Jun 13, 2023
Honda Motor Co., Ltd.
Junji Kuwabara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
Publication number
20240094148
Publication date
Mar 21, 2024
Industrial Technology Research Institute
Bo-Ching HE
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND...
Publication number
20240060911
Publication date
Feb 22, 2024
PROTO PATENTS LTD.
Mohammed BELASSEL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
Publication number
20240060913
Publication date
Feb 22, 2024
Rapiscan Systems, Inc.
Neil Duncan Carrington
G01 - MEASURING TESTING
Information
Patent Application
A SCREENING SYSTEM
Publication number
20240044813
Publication date
Feb 8, 2024
Halo X Ray Technologies Limited
Anthony DICKEN
G01 - MEASURING TESTING
Information
Patent Application
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
Publication number
20230393082
Publication date
Dec 7, 2023
Riken
Kunihiro FUJITA
G01 - MEASURING TESTING
Information
Patent Application
COMPONENT RESIDUAL STRESS TESTING PLATFORM BASED ON NEUTRON DIFFRAC...
Publication number
20230358693
Publication date
Nov 9, 2023
NCS TESTING TECHNOLOGY CO., LTD
LIXIA YANG
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349843
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349845
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
Publication number
20230349842
Publication date
Nov 2, 2023
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349844
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
ALPHA DIFFRACTOMETER
Publication number
20230341339
Publication date
Oct 26, 2023
Arion Diagnostics, Inc.
Alexander P. Lazarev
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Publication number
20230324316
Publication date
Oct 12, 2023
Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
Hitomi ADACHI
G01 - MEASURING TESTING
Information
Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
Publication number
20230314348
Publication date
Oct 5, 2023
UNIVERSITY OF HOUSTON SYSTEM
Byron Freelon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Configurable Detector Panel for an X-Ray Imaging System
Publication number
20230314347
Publication date
Oct 5, 2023
Viken Detection Corporation
James P. Ryan
G01 - MEASURING TESTING
Information
Patent Application
SCREENING METHOD
Publication number
20230317203
Publication date
Oct 5, 2023
University of Leeds
Elton Zeqiraj
G01 - MEASURING TESTING
Information
Patent Application
FUSION BOND BASED WAFER-LEVEL-PACKAGE FOR MID-INFRARED GAS SENSOR S...
Publication number
20230296502
Publication date
Sep 21, 2023
INFINEON TECHNOLOGIES AG
Christoph Kovatsch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DRONE-BASED NEUTRON BACKSCATTER INSPECTION SYSTEM
Publication number
20230296537
Publication date
Sep 21, 2023
Saudi Arabian Oil Company
Ahmad A. Al-Shammari
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...
Publication number
20230296536
Publication date
Sep 21, 2023
MALVERN PANALYTICAL B.V.
Vladimir Kogan
G01 - MEASURING TESTING
Information
Patent Application
Advanced X-Ray Emission Spectrometers
Publication number
20230288352
Publication date
Sep 14, 2023
UChicago Argonne, LLC
Chengjun Sun
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES AND METHODS FOR A PENCIL BEAM X-RAY SCANNER
Publication number
20230280481
Publication date
Sep 7, 2023
Seethru Al Inc.
Omar Al-Kofahi
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
Publication number
20230273134
Publication date
Aug 31, 2023
PROTO PATENTS LTD.
Vedran Nicholas VUKOTIC
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS
Publication number
20230236141
Publication date
Jul 27, 2023
SMITHS DETECTION INC.
Joseph BENDAHAN
G01 - MEASURING TESTING
Information
Patent Application
Handheld Backscatter Scanning Systems With Different Detector Panel...
Publication number
20230221457
Publication date
Jul 13, 2023
American Science and Engineering, Inc.
Aaron J. Couture
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CABLE INSPECTION DEVICE AND CABLE INSPECTION METHOD
Publication number
20230213462
Publication date
Jul 6, 2023
Riken
Yoshie OTAKE
G01 - MEASURING TESTING
Information
Patent Application
HIGH THROUGHPUT MICROCRYSTAL SOAKING FOR STRUCTURAL ANALYSIS OF PRO...
Publication number
20230213463
Publication date
Jul 6, 2023
California Institute of Technology
Jessica Burch
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR IN-SITU X-RAY DIFFRACTION-BASED REAL-TIME MON...
Publication number
20230194445
Publication date
Jun 22, 2023
ADVANCED ANALYZER LABS, INC.
PETER ZAVALIJ
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING A STRUCTURE ACROSS A COVER LAYER C...
Publication number
20230184701
Publication date
Jun 15, 2023
INVERSA SYSTEMS LTD.
Peter Marc CABOT
G01 - MEASURING TESTING
Information
Patent Application
COMPOUND REFRACTIVE X-RAY LENS AND PHOTON COUNTING DETECTOR DEVICE
Publication number
20230175989
Publication date
Jun 8, 2023
Cobham Advanced Electronic Solutions Inc.
Michael Simon
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF R...
Publication number
20230160843
Publication date
May 25, 2023
SINTOKOGIO, LTD.
Yuji KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC STATE OBSERVATION SYSTEM
Publication number
20230150393
Publication date
May 18, 2023
NISSAN ARC, LTD.
Takashi MATSUMOTO
B60 - VEHICLES IN GENERAL