Constructional details; Accessories

Industry

CPC
G01N23/20008

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/20008Constructional details; Accessories

Industries

Patents Grantslast 30 patents

Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scanning system and method for inspecting an object
- Patent number 12,111,271
- Issue date Oct 8, 2024
- Seethru AI, Inc.
- Omar Al-Kofahi
- G01 - MEASURING TESTING
Information Patent Grant
Method for scanning a sample by means of X-ray optics and an appara...
- Patent number 12,106,867
- Issue date Oct 1, 2024
- Bruker Nano GmbH
- Ulrich Waldschläger
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-limited extreme ultraviolet coherent diffraction imaging
- Patent number 12,085,520
- Issue date Sep 10, 2024
- Regents of the Univ of Colorado
- Henry C. Kapteyn
- G01 - MEASURING TESTING
Information Patent Grant
Open midplane, high magnetic field solenoid system and method for n...
- Patent number 12,051,538
- Issue date Jul 30, 2024
- Particle Beam Lasers, Inc.
- Ramesh Gupta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptable X-ray analysis apparatus
- Patent number 12,031,925
- Issue date Jul 9, 2024
- Malvern Panalytical B.V.
- Detlef Beckers
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi-arm robot used for tunnel lining inspection and defect diagno...
- Patent number 12,031,922
- Issue date Jul 9, 2024
- Shandong University
- Bin Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement arrangement for X-ray radiation for gap-free 1D measure...
- Patent number 12,031,924
- Issue date Jul 9, 2024
- Jürgen Fink
- G01 - MEASURING TESTING
Information Patent Grant
Soft x-ray optics with improved filtering
- Patent number 12,025,575
- Issue date Jul 2, 2024
- KLA Corporation
- Alexander Kuznetsov
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sample inspection system comprising a beam former to project a poly...
- Patent number 11,971,371
- Issue date Apr 30, 2024
- The Nottingham Trent University
- Paul Evans
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Shielding strategy for mitigation of stray field for permanent magn...
- Patent number 11,927,549
- Issue date Mar 12, 2024
- KLA Corporation
- Qian Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for cosmogenic neutron sensing moisture detecti...
- Patent number 11,927,552
- Issue date Mar 12, 2024
- QUAESTA INSTRUMENTS, LLC
- Peter Shifflett
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,921,059
- Issue date Mar 5, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Electron diffraction intensity from single crystal silicon in a pho...
- Patent number 11,915,837
- Issue date Feb 27, 2024
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Controlling process parameters by means of radiographic online dete...
- Patent number 11,898,971
- Issue date Feb 13, 2024
- SMS group GMBH
- Christian Klinkenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray sequential array wavelength dispersive spectrometer
- Patent number 11,885,755
- Issue date Jan 30, 2024
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Grant
Advanced X-ray emission spectrometers
- Patent number 11,874,239
- Issue date Jan 16, 2024
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry apparatus and method thereof for measuring thre...
- Patent number 11,867,595
- Issue date Jan 9, 2024
- Industrial Technology Research Institute
- Chun-Ting Liu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray collimator and related X-ray inspection apparatus
- Patent number 11,854,712
- Issue date Dec 26, 2023
- DUE2LAB S.R.L.
- Nicola Zambelli
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-Ray diffraction imaging detector having multiple angled input faces
- Publication number 20240361259
- Publication date Oct 31, 2024
- BRUKER TECHNOLOGIES LTD.
- Richard Thake Bytheway
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...
- Publication number 20240302302
- Publication date Sep 12, 2024
- Sumitomo Chemical Company, Limited
- Takehiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Soft X-Ray Optics With Improved Filtering
- Publication number 20240288388
- Publication date Aug 29, 2024
- KLA Corporation
- Alexander Kuznetsov
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...
- Publication number 20240280714
- Publication date Aug 22, 2024
- Rigaku Corporation
- Kunitoshi YANAGIHARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
DETECTOR STAND AND X-RAY DIFFRACTION APPARATUS
- Publication number 20240255446
- Publication date Aug 1, 2024
- Rigaku Corporation
- Yuji SHIRAMATA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...
- Publication number 20240255447
- Publication date Aug 1, 2024
- Eldico Scientific AG
- Francesco Garbuglia
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
- Publication number 20240248050
- Publication date Jul 25, 2024
- XENOCS SAS
- Peter HOGHOJ
- G01 - MEASURING TESTING
Information Patent Application
Laboratory crystallographic x-ray diffraction analysis system
- Publication number 20240219328
- Publication date Jul 4, 2024
- Carl Zeiss X-ray Microscopy, Inc.
- Christian HOLZNER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER
- Publication number 20240201112
- Publication date Jun 20, 2024
- GATAN, INC.
- Colin Geoffrey TREVOR
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...
- Publication number 20240094148
- Publication date Mar 21, 2024
- Industrial Technology Research Institute
- Bo-Ching HE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND...
- Publication number 20240060911
- Publication date Feb 22, 2024
- PROTO PATENTS LTD.
- Mohammed BELASSEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...
- Publication number 20240060913
- Publication date Feb 22, 2024
- Rapiscan Systems, Inc.
- Neil Duncan Carrington
- G01 - MEASURING TESTING
Information Patent Application
A SCREENING SYSTEM
- Publication number 20240044813
- Publication date Feb 8, 2024
- Halo X Ray Technologies Limited
- Anthony DICKEN
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD
- Publication number 20230393082
- Publication date Dec 7, 2023
- Riken
- Kunihiro FUJITA
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT RESIDUAL STRESS TESTING PLATFORM BASED ON NEUTRON DIFFRAC...
- Publication number 20230358693
- Publication date Nov 9, 2023
- NCS TESTING TECHNOLOGY CO., LTD
- LIXIA YANG
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349843
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349845
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
- Publication number 20230349842
- Publication date Nov 2, 2023
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20230349844
- Publication date Nov 2, 2023
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
ALPHA DIFFRACTOMETER
- Publication number 20230341339
- Publication date Oct 26, 2023
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20230324316
- Publication date Oct 12, 2023
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Hitomi ADACHI
- G01 - MEASURING TESTING
Information Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
- Publication number 20230314348
- Publication date Oct 5, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Byron Freelon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Configurable Detector Panel for an X-Ray Imaging System
- Publication number 20230314347
- Publication date Oct 5, 2023
- Viken Detection Corporation
- James P. Ryan
- G01 - MEASURING TESTING
Information Patent Application
SCREENING METHOD
- Publication number 20230317203
- Publication date Oct 5, 2023
- University of Leeds
- Elton Zeqiraj
- G01 - MEASURING TESTING
Information Patent Application
DRONE-BASED NEUTRON BACKSCATTER INSPECTION SYSTEM
- Publication number 20230296537
- Publication date Sep 21, 2023
- Saudi Arabian Oil Company
- Ahmad A. Al-Shammari
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
FUSION BOND BASED WAFER-LEVEL-PACKAGE FOR MID-INFRARED GAS SENSOR S...
- Publication number 20230296502
- Publication date Sep 21, 2023
- INFINEON TECHNOLOGIES AG
- Christoph Kovatsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...
- Publication number 20230296536
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Vladimir Kogan
- G01 - MEASURING TESTING
Information Patent Application
Advanced X-Ray Emission Spectrometers
- Publication number 20230288352
- Publication date Sep 14, 2023
- UChicago Argonne, LLC
- Chengjun Sun
- G01 - MEASURING TESTING

Constructional details; Accessories

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System, method, and apparatus for x-ray backscatter inspection of p...

X-ray fluorescence analyzer

X-ray scanning system and method for inspecting an object

Method for scanning a sample by means of X-ray optics and an appara...

Device and method for measuring short-wavelength characteristic X-r...

Quantum-limited extreme ultraviolet coherent diffraction imaging

Open midplane, high magnetic field solenoid system and method for n...

Adaptable X-ray analysis apparatus

Multi-arm robot used for tunnel lining inspection and defect diagno...

Measurement arrangement for X-ray radiation for gap-free 1D measure...

Soft x-ray optics with improved filtering

X-ray beam shaping apparatus and method

Patterned x-ray emitting target

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Sample inspection system comprising a beam former to project a poly...

Method for improving an EBSD/TKD map

Inspection apparatus and inspection method

System and method for in-situ X-ray diffraction-based real-time mon...

Shielding strategy for mitigation of stray field for permanent magn...

Inspection apparatus and inspection method

Systems and methods for cosmogenic neutron sensing moisture detecti...

Inspection apparatus and inspection method

Screening system

Electron diffraction intensity from single crystal silicon in a pho...

Controlling process parameters by means of radiographic online dete...

X-ray sequential array wavelength dispersive spectrometer

Advanced X-ray emission spectrometers

X-ray reflectometry apparatus and method thereof for measuring thre...

X-ray collimator and related X-ray inspection apparatus

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION METHOD

X-Ray diffraction imaging detector having multiple angled input faces

NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...

Soft X-Ray Optics With Improved Filtering

RADIATION DETECTOR, RADIATION MEASURING APPARATUS, AND METHOD FOR S...

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

DETECTOR STAND AND X-RAY DIFFRACTION APPARATUS

ELECTRON DIFFRACTION SYSTEM FOR CHARACTERIZING NANOCRYSTALLINE STRU...

X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD

Laboratory crystallographic x-ray diffraction analysis system

SYSTEM AND METHOD OF OPERATING AN ELECTRON ENERGY LOSS SPECTROMETER

X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THRE...

X-RAY SOURCE FOR X-RAY DIFFRACTION APPARATUS, RELATED APPARATUS AND...

Systems and Methods for Eliminating Cross-Talk Signals in One or Mo...

A SCREENING SYSTEM

NONDESTRUCTIVE INSPECTING DEVICE, AND NONDESTRUCTIVE INSPECTING METHOD

COMPONENT RESIDUAL STRESS TESTING PLATFORM BASED ON NEUTRON DIFFRAC...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER

INSPECTION APPARATUS AND INSPECTION METHOD

ALPHA DIFFRACTOMETER

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION

Configurable Detector Panel for an X-Ray Imaging System

SCREENING METHOD

DRONE-BASED NEUTRON BACKSCATTER INSPECTION SYSTEM

FUSION BOND BASED WAFER-LEVEL-PACKAGE FOR MID-INFRARED GAS SENSOR S...

PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE...

Advanced X-Ray Emission Spectrometers