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G01R31/2863
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/2863
Contacting devices
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus for semiconductor package
Patent number
11,940,484
Issue date
Mar 26, 2024
TSE CO., LTD.
Sol Lee
G01 - MEASURING TESTING
Information
Patent Grant
Probe test card and method of manufacturing the same
Patent number
11,933,818
Issue date
Mar 19, 2024
SK hynix Inc.
Gyung Jin Kim
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor test device including temperature control module and...
Patent number
11,927,623
Issue date
Mar 12, 2024
SK Hynix Inc.
Nack Hyun Kim
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in board including strip socket with integrated heating for hi...
Patent number
11,913,989
Issue date
Feb 27, 2024
Microchip Technology Incorporated
Joseph Rascon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Testing machine and testing method
Patent number
11,892,499
Issue date
Feb 6, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Kang Lv
G01 - MEASURING TESTING
Information
Patent Grant
Test device for electrical lines
Patent number
11,867,743
Issue date
Jan 9, 2024
ADAPTRONIC PRÜFTECHNIK GMBH
Hans-Peter Hieser
G01 - MEASURING TESTING
Information
Patent Grant
Vision system for an automated test system
Patent number
11,867,749
Issue date
Jan 9, 2024
Teradyne, Inc.
Jianfa Pei
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing electronic devices
Patent number
11,860,221
Issue date
Jan 2, 2024
AEHR Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Active thermal interposer device
Patent number
11,846,669
Issue date
Dec 19, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
Patent number
11,841,392
Issue date
Dec 12, 2023
Advantest Test Solutiions, Inc.
Karthik Ranganathan
G01 - MEASURING TESTING
Information
Patent Grant
Thermal array with gimbal features and enhanced thermal performance
Patent number
11,835,549
Issue date
Dec 5, 2023
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor testing apparatus for wafer probing testing and final...
Patent number
11,835,574
Issue date
Dec 5, 2023
TEST21 TAIWAN CORPORATION
Shun-Bon Ho
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus
Patent number
11,828,798
Issue date
Nov 28, 2023
Advantest Corporation
Naoyoshi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Test board and test apparatus including the same
Patent number
11,828,791
Issue date
Nov 28, 2023
Samsung Electronics Co., Ltd.
Kijae Song
G01 - MEASURING TESTING
Information
Patent Grant
System level test device for memory
Patent number
11,802,905
Issue date
Oct 31, 2023
ATECO INC.
Taek Seon Lee
G01 - MEASURING TESTING
Information
Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
Patent number
11,802,904
Issue date
Oct 31, 2023
Advantest Corporation
Natsuki Shiota
G01 - MEASURING TESTING
Information
Patent Grant
Test system including active thermal interposer device
Patent number
11,774,492
Issue date
Oct 3, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing a semiconductor chip
Patent number
11,774,491
Issue date
Oct 3, 2023
NANYA TECHNOLOGY CORPORATION
Yi-Kai Chao
G01 - MEASURING TESTING
Information
Patent Grant
Multi-layer probes having longitudinal axes and preferential probe...
Patent number
11,768,227
Issue date
Sep 26, 2023
Microfabrica Inc.
Ming Ting Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test site configuration in an automated test system
Patent number
11,754,596
Issue date
Sep 12, 2023
Teradyne, Inc.
Michael O. McKenna
G01 - MEASURING TESTING
Information
Patent Grant
DUT placement and handling for active thermal interposer device
Patent number
11,754,620
Issue date
Sep 12, 2023
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Grant
Carrier based high volume system level testing of devices with pop...
Patent number
11,742,055
Issue date
Aug 29, 2023
ADVANTEST TEST SOLUTIONS, INC.
Karthik Ranganathan
G11 - INFORMATION STORAGE
Information
Patent Grant
Flexible sideband support systems and methods
Patent number
11,733,290
Issue date
Aug 22, 2023
Advantest Corporation
Srdjan Malisic
G01 - MEASURING TESTING
Information
Patent Grant
Chip socket for testing semiconductor chip
Patent number
11,733,291
Issue date
Aug 22, 2023
NANYA TECHNOLOGY CORPORATION
Yi-Kai Chao
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses for characterizing system channels and associated metho...
Patent number
11,728,001
Issue date
Aug 15, 2023
Micron Technology, Inc.
Markus H. Geiger
G11 - INFORMATION STORAGE
Information
Patent Grant
Thermal conditioning of electronic devices under test based on exte...
Patent number
11,726,137
Issue date
Aug 15, 2023
ELES Semiconductor Equipment S.p.A.
Fabrizio Scocchetti
G01 - MEASURING TESTING
Information
Patent Grant
Burn-in board and burn-in apparatus
Patent number
11,719,741
Issue date
Aug 8, 2023
Advantest Corporation
Hiroaki Takeuchi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for conducting burn-in testing of semiconducto...
Patent number
11,719,743
Issue date
Aug 8, 2023
Kes Systems, Inc.
Ballson Gopal
G01 - MEASURING TESTING
Information
Patent Grant
Housing with anti-dislodge capability
Patent number
11,674,998
Issue date
Jun 13, 2023
Johnstech International Corporation
Bob Chartrand
G01 - MEASURING TESTING
Information
Patent Grant
Contact and socket device for burning-in and testing semiconductor IC
Patent number
11,668,744
Issue date
Jun 6, 2023
Dong Weon Hwang
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SOCKET FOR TESTING SEMICONDUCTOR DEVICE
Publication number
20240142493
Publication date
May 2, 2024
Samsung Electronics Co., Ltd.
Sanguk Han
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRC...
Publication number
20240142513
Publication date
May 2, 2024
Antares Advanced Test Technologies (Suzhou) Limited
Jiachun Zhou
G01 - MEASURING TESTING
Information
Patent Application
MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...
Publication number
20240133945
Publication date
Apr 25, 2024
Mohanraj Prabhugoud
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
Publication number
20240133943
Publication date
Apr 25, 2024
ADVANTEST TEST SOLUTIONS, INC.
Karthik RANGANATHAN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
Publication number
20240103068
Publication date
Mar 28, 2024
Aehr Test Systems
Donald P. Richmond
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TEST SOCKET AND METHOD OF MANUFACTURING THE SAME
Publication number
20240069066
Publication date
Feb 29, 2024
LEENO INDUSTRIAL INC.
Woesuk YANG
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...
Publication number
20240053397
Publication date
Feb 15, 2024
MSV SYSTEMS & SERVICES PTE LTD
Teck Huat TAN
G01 - MEASURING TESTING
Information
Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
Publication number
20240036104
Publication date
Feb 1, 2024
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...
Publication number
20240027519
Publication date
Jan 25, 2024
Advantest Corporation
Natsuki Shiota
G01 - MEASURING TESTING
Information
Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
Publication number
20240003967
Publication date
Jan 4, 2024
ADVANTEST TEST SOLUTIONS, INC.
Samer Kabbani
G01 - MEASURING TESTING
Information
Patent Application
BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD
Publication number
20240003966
Publication date
Jan 4, 2024
Meritech Co., Ltd.
BYUNG GOOK CHANG
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE CONTACTOR AND METHOD OF MANUFACTURING THE SAME
Publication number
20230411889
Publication date
Dec 21, 2023
WITHMEMS CO., LTD.
Hwang Sub KOO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST BOARD AND TEST DEVICE INCLUDING THE SAME
Publication number
20230408576
Publication date
Dec 21, 2023
Samsung Electronics Co., Ltd.
Hyung Il KIM
G01 - MEASURING TESTING
Information
Patent Application
Flexible Sideband Support Systems and Methods
Publication number
20230400505
Publication date
Dec 14, 2023
Srdjan Malisic
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM
Publication number
20230400514
Publication date
Dec 14, 2023
KIOXIA Corporation
Kazuhiko NAKAHARA
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE CONTROL SYSTEM AND METHOD FOR ELECTRONIC DEVICE-TESTING...
Publication number
20230400506
Publication date
Dec 14, 2023
CHROMA ATE INC.
Chin-Yi OUYANG
G01 - MEASURING TESTING
Information
Patent Application
TENSION-BASED SOCKET GIMBAL FOR ENGAGING DEVICE UNDER TEST WITH THE...
Publication number
20230393188
Publication date
Dec 7, 2023
Advantest Test Solutions, Inc.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR PACKAGE
Publication number
20230384364
Publication date
Nov 30, 2023
TSE CO., LTD.
Min Cheol Kim
G01 - MEASURING TESTING
Information
Patent Application
TUBULAR BODY, CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPA...
Publication number
20230349946
Publication date
Nov 2, 2023
Nidec-Read Corporation
Norihiro OTA
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICE AND METHOD FOR TESTING A DEVICE UNDER TEST
Publication number
20230333139
Publication date
Oct 19, 2023
Advanced Semiconductor Engineering, Inc.
Jia Jin LIN
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR TESTING SEMICONDUCTOR DEVICES AND A ROLLING CONTACTOR...
Publication number
20230314502
Publication date
Oct 5, 2023
INFINEON TECHNOLOGIES AG
Nee Wan KHOO
G01 - MEASURING TESTING
Information
Patent Application
CONTACT PINS FOR TEST SOCKETS AND TEST SOCKETS COMPRISING THE SAME
Publication number
20230314472
Publication date
Oct 5, 2023
OKINS ELECTRONICS CO.,LTD
Jin Kook JUN
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM SUPPORT COMPONENT EXCHANGE SYSTEM AND METHOD
Publication number
20230314499
Publication date
Oct 5, 2023
ADVANTEST TEST SOLUTIONS, INC.
Paul Ferrari
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
Publication number
20230305053
Publication date
Sep 28, 2023
Advantest Corporation
Yuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
CHIP RELIABILITY TEST ASSEMBLY
Publication number
20230258710
Publication date
Aug 17, 2023
Luxsentek Microelectronics Corp.
CHAO-YANG HSIAO
G01 - MEASURING TESTING
Information
Patent Application
LEAK TESTING SYSTEMS AND METHODS THEREOF
Publication number
20230258711
Publication date
Aug 17, 2023
Sciemetric Instruments Inc.
Steven WHITE
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, TRANSFER METHOD, CHAMBER AND FRAME FOR SEMICONDUCTOR BUR...
Publication number
20230251305
Publication date
Aug 10, 2023
MSV SYSTEMS & SERVICES PTE LTD
Teck Huat TAN
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
Publication number
20230251304
Publication date
Aug 10, 2023
Advantest Corporation
Yuya Yamada
G01 - MEASURING TESTING
Information
Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
Publication number
20230236241
Publication date
Jul 27, 2023
ADVANTEST TEST SOLUTIONS, INC.
Gregory Cruzan
G01 - MEASURING TESTING
Information
Patent Application
TEST SOCKET
Publication number
20230228808
Publication date
Jul 20, 2023
LENO INDUSTRIAL INC.
Young taek SHIN
G01 - MEASURING TESTING