Contacting devices

Industry

CPC
G01R31/2863

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2863Contacting devices

Industries

Patents Grantslast 30 patents

Information Patent Grant
Contact probe, probe holder and probe unit
- Patent number 12,188,977
- Issue date Jan 7, 2025
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a semiconductor package
- Patent number 12,169,219
- Issue date Dec 17, 2024
- TSE CO., LTD.
- Min Cheol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 12,163,999
- Issue date Dec 10, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system, test method, and non-transitory computer readable medium
- Patent number 12,146,910
- Issue date Nov 19, 2024
- Kioxia Corporation
- Kazuhiko Nakahara
- G01 - MEASURING TESTING
Information Patent Grant
Module substrate for semiconductor module, semiconductor module and...
- Patent number 12,130,306
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Kwangkyu Bang
- G01 - MEASURING TESTING
Information Patent Grant
Test socket
- Patent number 12,105,138
- Issue date Oct 1, 2024
- Leeno Industrial Inc.
- Young taek Shin
- G01 - MEASURING TESTING
Information Patent Grant
Testing devices and method for testing semiconductor devices
- Patent number 12,092,655
- Issue date Sep 17, 2024
- NANYA TECHNOLOGY CORPORATION
- Wu-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Heat spreaders for use in semiconductor device testing, such as bur...
- Patent number 12,078,672
- Issue date Sep 3, 2024
- Micron Technology, Inc.
- Xiaopeng Qu
- G01 - MEASURING TESTING
Information Patent Grant
Socket for electrical component
- Patent number 12,066,482
- Issue date Aug 20, 2024
- Enplas Corporation
- Yoshinobu Hagiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket for performing a test on an electronic device
- Patent number 12,038,473
- Issue date Jul 16, 2024
- Samsung Electronics Co., Ltd.
- Kiljoong Yun
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and method for testing a device under test
- Patent number 12,032,001
- Issue date Jul 9, 2024
- Advanced Semiconductor Engineering, Inc.
- Jia Jin Lin
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component testing apparatus, sockets, and replacement pa...
- Patent number 12,025,654
- Issue date Jul 2, 2024
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Test socket having an automated lid
- Patent number 12,007,411
- Issue date Jun 11, 2024
- Teradyne, Inc.
- John P. Toscano
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in board seating
- Patent number 12,007,434
- Issue date Jun 11, 2024
- Micro Control Company
- Aidan Michael Fawcett
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in board and burn-in apparatus
- Patent number 11,994,552
- Issue date May 28, 2024
- Advantest Corporation
- Hiroaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,994,554
- Issue date May 28, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, transfer method, chamber and frame for semiconductor bur...
- Patent number 11,982,706
- Issue date May 14, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat Tan
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact and test socket with same
- Patent number 11,982,688
- Issue date May 14, 2024
- Hicon Co., Ltd.
- Dong Weon Hwang
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an integrated circuit of a device and its method...
- Patent number 11,977,098
- Issue date May 7, 2024
- AEHR Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for semiconductor package
- Patent number 11,940,484
- Issue date Mar 26, 2024
- TSE CO., LTD.
- Sol Lee
- G01 - MEASURING TESTING
Information Patent Grant
Probe test card and method of manufacturing the same
- Patent number 11,933,818
- Issue date Mar 19, 2024
- SK hynix Inc.
- Gyung Jin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test device including temperature control module and...
- Patent number 11,927,623
- Issue date Mar 12, 2024
- SK Hynix Inc.
- Nack Hyun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in board including strip socket with integrated heating for hi...
- Patent number 11,913,989
- Issue date Feb 27, 2024
- Microchip Technology Incorporated
- Joseph Rascon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing machine and testing method
- Patent number 11,892,499
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Kang Lv
- G01 - MEASURING TESTING
Information Patent Grant
Test device for electrical lines
- Patent number 11,867,743
- Issue date Jan 9, 2024
- ADAPTRONIC PRÜFTECHNIK GMBH
- Hans-Peter Hieser
- G01 - MEASURING TESTING
Information Patent Grant
Vision system for an automated test system
- Patent number 11,867,749
- Issue date Jan 9, 2024
- Teradyne, Inc.
- Jianfa Pei
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing electronic devices
- Patent number 11,860,221
- Issue date Jan 2, 2024
- AEHR Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Active thermal interposer device
- Patent number 11,846,669
- Issue date Dec 19, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Grant
Integrated test cell using active thermal interposer (ATI) with par...
- Patent number 11,841,392
- Issue date Dec 12, 2023
- Advantest Test Solutiions, Inc.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Grant
Thermal array with gimbal features and enhanced thermal performance
- Patent number 11,835,549
- Issue date Dec 5, 2023
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...
- Publication number 20250012853
- Publication date Jan 9, 2025
- Intel Corporation
- David Daniel Wieneke
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...
- Publication number 20250012854
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Jihyun CHOI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED
- Publication number 20240377454
- Publication date Nov 14, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Raffy CELIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST SOCKET AND ASSEMBLY DEVICE THEREOF
- Publication number 20240361352
- Publication date Oct 31, 2024
- okins electronics Co.,Ltd
- Jin Kook JUN
- G01 - MEASURING TESTING
Information Patent Application
WORK PRESS ASSEMBLY FOR TEST HANDLER
- Publication number 20240353477
- Publication date Oct 24, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yi-Neng Chang
- G01 - MEASURING TESTING
Information Patent Application
PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...
- Publication number 20240310433
- Publication date Sep 19, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE
- Publication number 20240295600
- Publication date Sep 5, 2024
- SEMIGHT INSTRUMENTS CO., LTD
- Zhe LIAN
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME
- Publication number 20240264223
- Publication date Aug 8, 2024
- PAMTEK Co., Ltd.
- Jae Woong KIM
- G01 - MEASURING TESTING
Information Patent Application
CONTACT INSPECTION DEVICE
- Publication number 20240248117
- Publication date Jul 25, 2024
- SAMSUNG DISPLAY CO., LTD.
- Byungsu KIM
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING ALIGNMENT DURING A THERMAL CYCLE
- Publication number 20240230714
- Publication date Jul 11, 2024
- Aehr Test Systems
- Scott E. Lindsey
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...
- Publication number 20240219452
- Publication date Jul 4, 2024
- Intel Corporation
- Prasoon JOSHI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES
- Publication number 20240201249
- Publication date Jun 20, 2024
- Bouchaib Hraimel
- G01 - MEASURING TESTING
Information Patent Application
MULTIPHASE THERMAL INTERFACE COMPONENT, METHOD OF FORMING THE SAME...
- Publication number 20240192268
- Publication date Jun 13, 2024
- CHROMA ATE INC.
- Yu-Wei Chuang
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES
- Publication number 20240183898
- Publication date Jun 6, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik Ranganathan
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT
- Publication number 20240175917
- Publication date May 30, 2024
- Intel Corporation
- Ruben NUNEZ BLANCO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS FOR IMAGE SENSOR PACKAGE
- Publication number 20240151769
- Publication date May 9, 2024
- TSE CO., LTD
- Min Cheol KIM
- G01 - MEASURING TESTING
Information Patent Application
SOCKET FOR TESTING SEMICONDUCTOR DEVICE
- Publication number 20240142493
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- Sanguk Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRC...
- Publication number 20240142513
- Publication date May 2, 2024
- Antares Advanced Test Technologies (Suzhou) Limited
- Jiachun Zhou
- G01 - MEASURING TESTING
Information Patent Application
MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...
- Publication number 20240133945
- Publication date Apr 25, 2024
- Mohanraj Prabhugoud
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20240133943
- Publication date Apr 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING ELECTRONIC DEVICES
- Publication number 20240103068
- Publication date Mar 28, 2024
- Aehr Test Systems
- Donald P. Richmond
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST SOCKET AND METHOD OF MANUFACTURING THE SAME
- Publication number 20240069066
- Publication date Feb 29, 2024
- LEENO INDUSTRIAL INC.
- Woesuk YANG
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...
- Publication number 20240053397
- Publication date Feb 15, 2024
- MSV SYSTEMS & SERVICES PTE LTD
- Teck Huat TAN
- G01 - MEASURING TESTING
Information Patent Application
THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE
- Publication number 20240036104
- Publication date Feb 1, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Gregory Cruzan
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...
- Publication number 20240027519
- Publication date Jan 25, 2024
- Advantest Corporation
- Natsuki Shiota
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE THERMAL INTERPOSER DEVICE
- Publication number 20240003967
- Publication date Jan 4, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Samer Kabbani
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD
- Publication number 20240003966
- Publication date Jan 4, 2024
- Meritech Co., Ltd.
- BYUNG GOOK CHANG
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE CONTACTOR AND METHOD OF MANUFACTURING THE SAME
- Publication number 20230411889
- Publication date Dec 21, 2023
- WITHMEMS CO., LTD.
- Hwang Sub KOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST BOARD AND TEST DEVICE INCLUDING THE SAME
- Publication number 20230408576
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Hyung Il KIM
- G01 - MEASURING TESTING

Contacting devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Contact probe, probe holder and probe unit

Apparatus for testing a semiconductor package

Apparatus for testing electronic devices

Test system, test method, and non-transitory computer readable medium

Module substrate for semiconductor module, semiconductor module and...

Test socket

Testing devices and method for testing semiconductor devices

Heat spreaders for use in semiconductor device testing, such as bur...

Socket for electrical component

Test socket for performing a test on an electronic device

Testing device and method for testing a device under test

Electronic component testing apparatus, sockets, and replacement pa...

Test socket having an automated lid

Burn-in board seating

Burn-in board and burn-in apparatus

Test apparatus for semiconductor package

Apparatus, transfer method, chamber and frame for semiconductor bur...

Spring contact and test socket with same

System for testing an integrated circuit of a device and its method...

Test apparatus for semiconductor package

Probe test card and method of manufacturing the same

Semiconductor test device including temperature control module and...

Burn-in board including strip socket with integrated heating for hi...

Testing machine and testing method

Test device for electrical lines

Vision system for an automated test system

Apparatus for testing electronic devices

Active thermal interposer device

Integrated test cell using active thermal interposer (ATI) with par...

Thermal array with gimbal features and enhanced thermal performance

Patents Applicationslast 30 patents

METHODS AND APPARATUS TO DISENGAGE A TEST HEAD FROM AN INTEGRATED C...

TEST DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS INCLUDING TES...

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

CONTACTOR FOR MULTI DEVICE SOCKETS AND RELATED

TEST SOCKET AND ASSEMBLY DEVICE THEREOF

WORK PRESS ASSEMBLY FOR TEST HANDLER

PROBE MOUNTING STRUCTURE AND RELIABILITY TEST SYSTEM FOR WAFER-LEVE...

CHIP TESTING DEVICE AND PACKAGE TESTING MACHINE

INTEGRATED ACTUATOR TEST SYSTEM AND METHOD FOR OPERATING THE SAME

CONTACT INSPECTION DEVICE

CONTROLLING ALIGNMENT DURING A THERMAL CYCLE

METHOD AND SYSTEM FOR A VACUUM COMPATIBLE ELECTRICAL INTERFACE, ENA...

SYSTEMS AND METHODS FOR TESTING OPTICAL COMMUNICATION DEVICES

MULTIPHASE THERMAL INTERFACE COMPONENT, METHOD OF FORMING THE SAME...

ACTIVE THERMAL INTERPOSER DEVICE WITH THERMAL ISOLATION STRUCTURES

ENHANCED JET IMPINGEMENT LEAK PREVENTION FOR INTEGRATED CIRCUIT

TEST APPARATUS FOR IMAGE SENSOR PACKAGE

SOCKET FOR TESTING SEMICONDUCTOR DEVICE

LIQUID COOLED TEST SYSTEM FOR TESTING SEMICONDUCTOR INTEGRATED CIRC...

MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

APPARATUS FOR TESTING ELECTRONIC DEVICES

TEST SOCKET AND METHOD OF MANUFACTURING THE SAME

APPARATUS AND METHOD FOR BURN-IN BOARD ALIGNMENT AND SEALING BETWEE...

THERMAL ARRAY WITH GIMBAL FEATURES AND ENHANCED THERMAL PERFORMANCE

ELECTRONIC COMPONENT TESTING APPARATUS, SOCKETS, AND REPLACEMENT PA...

ACTIVE THERMAL INTERPOSER DEVICE

BURN-IN SYSTEM WITH MULTIPLE PLUGS ON THE TEST BOARD

FLEXIBLE CONTACTOR AND METHOD OF MANUFACTURING THE SAME

TEST BOARD AND TEST DEVICE INCLUDING THE SAME