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G01R31/318555
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R31/00
Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Current Industry
G01R31/318555
Control logic
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Interface system for interconnected die and MPU and communication m...
Patent number
11,971,446
Issue date
Apr 30, 2024
Jinghe Wei
G01 - MEASURING TESTING
Information
Patent Grant
Dummy dual in-line memory module (DIMM) testing system based on bou...
Patent number
11,965,931
Issue date
Apr 23, 2024
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Yuan Sang
G01 - MEASURING TESTING
Information
Patent Grant
Shadow access port method and apparatus
Patent number
11,906,582
Issue date
Feb 20, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Joint test action group transmission system capable of transmitting...
Patent number
11,892,508
Issue date
Feb 6, 2024
Realtek Semiconductor Corp.
Chen-Tung Lin
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit, test assembly and method for testing an integra...
Patent number
11,874,325
Issue date
Jan 16, 2024
Infineon Technologies AG
Tobias Kilian
G01 - MEASURING TESTING
Information
Patent Grant
Reduced signaling interface method and apparatus
Patent number
11,867,756
Issue date
Jan 9, 2024
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit chip testing interface with reduced signal wires
Patent number
11,860,228
Issue date
Jan 2, 2024
Xilinx, Inc.
Albert Shih-Huai Lin
G01 - MEASURING TESTING
Information
Patent Grant
Device testing architecture, method, and system
Patent number
11,846,673
Issue date
Dec 19, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Multiplexer for SDFQ having differently-sized scan and data transis...
Patent number
11,821,947
Issue date
Nov 21, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Huaixin Xian
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
AT-speed test access port operations
Patent number
11,808,810
Issue date
Nov 7, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan testing in a processor
Patent number
11,802,911
Issue date
Oct 31, 2023
Graphcore Limited
Natalie Narkonski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Smart storage of shutdown LBIST status
Patent number
11,796,591
Issue date
Oct 24, 2023
Ambarella International LP
Praveen Jaini
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device comprising a memory accessible via a JTAG interfa...
Patent number
11,789,078
Issue date
Oct 17, 2023
STMicroelectronics S.r.l.
Filippo Minnella
G01 - MEASURING TESTING
Information
Patent Grant
Scan compression through pin data encoding
Patent number
11,782,092
Issue date
Oct 10, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Sandeep Jain
G01 - MEASURING TESTING
Information
Patent Grant
Wafer scale testing using a 2 signal JTAG interface
Patent number
11,782,091
Issue date
Oct 10, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit with reduced signaling interface
Patent number
11,768,238
Issue date
Sep 26, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
3D TAP and scan port architectures
Patent number
11,762,014
Issue date
Sep 19, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Controller for a memory component
Patent number
11,755,350
Issue date
Sep 12, 2023
Micron Technology, Inc.
Antonino Mondello
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of converting a serial vector format (SVF) file to a vector...
Patent number
11,747,400
Issue date
Sep 5, 2023
The United States of America, as represented by the Secretary of the Navy
Daniel M. Dosado
G01 - MEASURING TESTING
Information
Patent Grant
Addressable test access port apparatus
Patent number
11,747,397
Issue date
Sep 5, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Scan test control decoder with storage elements for use within inte...
Patent number
11,747,399
Issue date
Sep 5, 2023
Texas Instruments Incorporated
Mudasir Shafat Kawoosa
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and semiconductor device examination method
Patent number
11,740,287
Issue date
Aug 29, 2023
Kioxia Corporation
Isao Ooigawa
G01 - MEASURING TESTING
Information
Patent Grant
In-system test of chips in functional systems
Patent number
11,726,139
Issue date
Aug 15, 2023
NVIDIA Corporation
Shantanu Sarangi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic test pattern generation circuitry in multi power domain s...
Patent number
11,680,982
Issue date
Jun 20, 2023
STMICROELECTRONICS INTERNATIONAL N.V.
Venkata Narayanan Srinivasan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Falling clock edge JTAG bus routers
Patent number
11,680,985
Issue date
Jun 20, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Test access port with address and command capability
Patent number
11,680,981
Issue date
Jun 20, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
3D stacked die test architecture
Patent number
11,675,007
Issue date
Jun 13, 2023
Texas Instruments Incorporated
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Grant
Method of updating firmware of chip stably and effectively, firmwar...
Patent number
11,630,732
Issue date
Apr 18, 2023
Fulian Precision Electronics (Tianjin) Co., LTD.
Li-Yun Hao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit with self-test circuit, method for operating an...
Patent number
11,619,668
Issue date
Apr 4, 2023
Infineon Technologies AG
Daniel Tille
G11 - INFORMATION STORAGE
Information
Patent Grant
Multi-capture at-speed scan test based on a slow clock signal
Patent number
11,614,487
Issue date
Mar 28, 2023
SIEMENS INDUSTRY SOFTWARE INC.
Jean-Francois Cote
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Scan Flip-Flops With Pre-Setting Combinational Logic
Publication number
20240077534
Publication date
Mar 7, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Johnny Chiahao Li
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ACCESS CONTROL OF A PLURALITY OF INSTRUMENTS...
Publication number
20240061041
Publication date
Feb 22, 2024
Erik Larsson
G01 - MEASURING TESTING
Information
Patent Application
AT-SPEED TEST ACCESS PORT OPERATIONS
Publication number
20240061038
Publication date
Feb 22, 2024
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR TESTING SEMICONDUCTOR CIRCUITS
Publication number
20240003972
Publication date
Jan 4, 2024
Ampere Computing LLC
Kha NGUYEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230417831
Publication date
Dec 28, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLEXER FOR SDFQ HAVING DIFFERENTLY-SIZED SCAN AND DATA TRANSIS...
Publication number
20230408582
Publication date
Dec 21, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Huaixin XIAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTERFACE/UNICAST FOR TEST CONTENT, FIRMWARE, AND SOFTWARE DELIVERY
Publication number
20230408581
Publication date
Dec 21, 2023
Intel Corporation
Rakesh Kandula
G01 - MEASURING TESTING
Information
Patent Application
ADDRESSABLE TEST ACCESS PORT
Publication number
20230400513
Publication date
Dec 14, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SCAN COMPRESSION THROUGH PIN DATA ENCODING
Publication number
20230375617
Publication date
Nov 23, 2023
STMicroelectronics International N.V.
Sandeep Jain
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT CHIP TESTING INTERFACE WITH REDUCED SIGNAL WIRES
Publication number
20230366929
Publication date
Nov 16, 2023
Xilinx, Inc.
Albert Shih-Huai LIN
G01 - MEASURING TESTING
Information
Patent Application
Wrapper Cell Design and Built-In Self-Test Architecture for 3DIC Te...
Publication number
20230366930
Publication date
Nov 16, 2023
Taiwan Semiconductor Manufacturing Company, Ltd.
Anshuman Chandra
G01 - MEASURING TESTING
Information
Patent Application
IN SYSTEM TEST OF CHIPS IN FUNCTIONAL SYSTEMS
Publication number
20230349970
Publication date
Nov 2, 2023
NVIDIA Corporation
Shantanu Sarangi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FALLING CLOCK EDGE JTAG BUS ROUTERS
Publication number
20230333163
Publication date
Oct 19, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
TEST ACCESS PORT WITH ADDRESS AND COMMAND CAPABILITY
Publication number
20230333159
Publication date
Oct 19, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SHADOW ACCESS PORT METHOD AND APPARATUS
Publication number
20230194603
Publication date
Jun 22, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
AT-SPEED TEST ACCESS PORT OPERATIONS
Publication number
20230194604
Publication date
Jun 22, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER SCALE TESTING USING A 2 SIGNAL JTAG INTERFACE
Publication number
20230160959
Publication date
May 25, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D TAP & SCAN PORT ARCHITECTURES
Publication number
20230160958
Publication date
May 25, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
SCAN CORRELATION-AWARE SCAN CLUSTER REORDERING METHOD AND APPARATUS...
Publication number
20230125568
Publication date
Apr 27, 2023
UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY
Sung Ho KANG
G01 - MEASURING TESTING
Information
Patent Application
Stacked Integrated Circuit Device
Publication number
20230116320
Publication date
Apr 13, 2023
Graphcore Limited
Stephen FELIX
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT, TEST ASSEMBLY AND METHOD FOR TESTING AN INTEGRA...
Publication number
20230079599
Publication date
Mar 16, 2023
INFINEON TECHNOLOGIES AG
Tobias Kilian
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF UPDATING FIRMWARE OF CHIP STABLY AND EFFECTIVELY, FIRMWAR...
Publication number
20230063485
Publication date
Mar 2, 2023
Fulian Precision Electronics (Tianjin) Co., LTD.
LI-YUN HAO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
REDUCED SIGNALING INTERFACE METHOD & APPARATUS
Publication number
20230058458
Publication date
Feb 23, 2023
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scan Testing in a Processor
Publication number
20230031250
Publication date
Feb 2, 2023
Graphcore Limited
Natalie NARKONSKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CONVERTING A SERIAL VECTOR FORMAT (SVF) FILE TO A VECTOR...
Publication number
20230027456
Publication date
Jan 26, 2023
The United States of America, as represented by the Secretary of the Navy
Daniel M. Dosado
G01 - MEASURING TESTING
Information
Patent Application
3D STACKED DIE TEST ARCHITECTURE
Publication number
20220381821
Publication date
Dec 1, 2022
TEXAS INSTRUMENTS INCORPORATED
Lee D. Whetsel
G01 - MEASURING TESTING
Information
Patent Application
RECONFIGURABLE JTAG ARCHITECTURE FOR IMPLEMENTATION OF PROGRAMMABLE...
Publication number
20220357394
Publication date
Nov 10, 2022
University of Florida Research Foundation, Incorporated
Swarup Bhunia
G01 - MEASURING TESTING
Information
Patent Application
SCAN TEST CONTROL DECODER WITH STORAGE ELEMENTS FOR USE WITHIN INTE...
Publication number
20220326302
Publication date
Oct 13, 2022
TEXAS INSTRUMENTS INCORPORATED
Mudasir Shafat KAWOOSA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE COMPRISING A MEMORY ACCESSIBLE VIA A JTAG INTERFA...
Publication number
20220326305
Publication date
Oct 13, 2022
STMicroelectronics S.r.l
Filippo MINNELLA
G01 - MEASURING TESTING
Information
Patent Application
INTERFACE SYSTEM FOR INTERCONNECTED DIE AND MPU AND COMMUNICATION M...
Publication number
20220276304
Publication date
Sep 1, 2022
58th Research Institute of China Electronics Technology Group Corporation
Jinghe Wei
G01 - MEASURING TESTING