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G01J3/4535
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PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
Current Industry
G01J3/4535
Devices with moving mirror
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Patents Grants
last 30 patents
Information
Patent Grant
High-speed Fourier-transform spectroscopy apparatus and spectroscop...
Patent number
11,892,354
Issue date
Feb 6, 2024
The University of Tokyo
Takuro Ideguchi
G01 - MEASURING TESTING
Information
Patent Grant
Mirror unit and optical module
Patent number
11,879,731
Issue date
Jan 23, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Fourier transform infrared spectrophotometer
Patent number
11,874,172
Issue date
Jan 16, 2024
Shimadzu Corporation
Hideaki Katsu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods using active FTIR spectroscopy for detection of...
Patent number
11,867,618
Issue date
Jan 9, 2024
Heriot-Watt University
Derryck Telford Reid
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer element, spectrometer and method for operating an in...
Patent number
11,754,445
Issue date
Sep 12, 2023
Robert Bosch GmbH
Ralf Noltemeyer
G01 - MEASURING TESTING
Information
Patent Grant
Microelectromechanical system (MEMS) and (MEM) optical interferomet...
Patent number
11,725,989
Issue date
Aug 15, 2023
Green Vision Systems Ltd.
Danny S. Moshe
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical module
Patent number
11,635,290
Issue date
Apr 25, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical device
Patent number
11,629,947
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,629,946
Issue date
Apr 18, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Mirror unit and optical module
Patent number
11,624,605
Issue date
Apr 11, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical module
Patent number
11,579,438
Issue date
Feb 14, 2023
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical module
Patent number
11,487,104
Issue date
Nov 1, 2022
Hamamatsu Photonics K.K.
Tomofumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Method for imaging or spectroscopy with a non-linear interferometer
Patent number
11,454,541
Issue date
Sep 27, 2022
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
Fabian Steinlechner
G01 - MEASURING TESTING
Information
Patent Grant
Retro-interferometer having active readjustment
Patent number
11,326,950
Issue date
May 10, 2022
BRUKER OPTICS GMBH & CO. KG
Axel Keens
G02 - OPTICS
Information
Patent Grant
Technologies for high resolution and wide swath spectrometer
Patent number
11,307,097
Issue date
Apr 19, 2022
ABB Schweiz AG
Florent M. Prel
G01 - MEASURING TESTING
Information
Patent Grant
Optical spectroscopy using the fourier transform
Patent number
11,280,676
Issue date
Mar 22, 2022
The Regents of the University of California
Brandon Hong
G02 - OPTICS
Information
Patent Grant
Optical module having high-accuracy spectral analysis
Patent number
11,209,260
Issue date
Dec 28, 2021
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Optical device
Patent number
11,187,579
Issue date
Nov 30, 2021
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Housing system for Michelson interferometer
Patent number
11,162,775
Issue date
Nov 2, 2021
Agency for Defense Development
Jongmin Lee
G01 - MEASURING TESTING
Information
Patent Grant
Self-referenced spectrometer
Patent number
11,085,825
Issue date
Aug 10, 2021
Si-Ware Systems
Mostafa Medhat
G01 - MEASURING TESTING
Information
Patent Grant
Fourier spectroscopic analyzer
Patent number
11,073,424
Issue date
Jul 27, 2021
Yokogawa Electric Corporation
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Mirror alignment in optical scientific instruments
Patent number
10,983,334
Issue date
Apr 20, 2021
Thermo Electron Scientific Instruments LLC
John Magie Coffin
G01 - MEASURING TESTING
Information
Patent Grant
Mirror bearing for an interferometer
Patent number
10,921,554
Issue date
Feb 16, 2021
Thermo Electron Scientific Instruments LLC
John Magie Coffin
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Apparatus and methods for facial recognition and video analytics to...
Patent number
10,900,772
Issue date
Jan 26, 2021
15 Seconds of Fame, Inc.
Ruslan Sabitov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fourier transform spectrophotometer
Patent number
10,837,829
Issue date
Nov 17, 2020
Shimadzu Corporation
Tadafusa Kamikake
G01 - MEASURING TESTING
Information
Patent Grant
Device for providing variable sized aperture for a sample
Patent number
10,823,614
Issue date
Nov 3, 2020
Thermo Electron Scientific Instruments LLC
John Magie Coffin
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for acquiring image using terahertz wave
Patent number
10,732,045
Issue date
Aug 4, 2020
Electronics and Telecommunications Research Institute
Sang-Pil Han
G01 - MEASURING TESTING
Information
Patent Grant
Push-broom Fourier transform spectrometer
Patent number
10,704,956
Issue date
Jul 7, 2020
Eagle Technology, LLC
Paul Maurer
G01 - MEASURING TESTING
Information
Patent Grant
System and method for an interferometer resistant to externally app...
Patent number
10,670,462
Issue date
Jun 2, 2020
Thermo Electron Scientific Instruments LLC
John Magie Coffin
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform infrared spectrophotometer
Patent number
10,670,518
Issue date
Jun 2, 2020
Shimadzu Corporation
Daijiro Kato
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
QUANTUM-ENHANCED ALL-OPTICAL PHOTOACOUSTIC SIGNAL DETECTION DEVICE...
Publication number
20240077457
Publication date
Mar 7, 2024
SHANXI UNIVERSITY
Kuanshou ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Optical Device And Spectrometer
Publication number
20240045199
Publication date
Feb 8, 2024
SEIKO EPSON CORPORATION
Kohei YAMADA
G01 - MEASURING TESTING
Information
Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
Publication number
20230408337
Publication date
Dec 21, 2023
WUHAN UNIVERSITY
Ruyi WEI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE
Publication number
20230221106
Publication date
Jul 13, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SPECTROMETER
Publication number
20230146740
Publication date
May 11, 2023
JASCO CORPORATION
Kenichi AKAO
G01 - MEASURING TESTING
Information
Patent Application
HANDHELD OPTICAL SPECTROSCOPY SCANNER
Publication number
20230076993
Publication date
Mar 9, 2023
SI-WARE SYSTEMS
Botros George Iskander Shenouda
G01 - MEASURING TESTING
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20230003504
Publication date
Jan 5, 2023
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INFRARED LIGHT SOURCE DEVICE AND FOURIER TRANSFORM INFRARED SPECTRO...
Publication number
20220381613
Publication date
Dec 1, 2022
Shimadzu Corporation
Tadafumi KAMIKAKE
G01 - MEASURING TESTING
Information
Patent Application
SPECTRUM MEASUREMENT DEVICE
Publication number
20220341785
Publication date
Oct 27, 2022
NEC Corporation
Takeshi AKAGAWA
G01 - MEASURING TESTING
Information
Patent Application
Fourier Transform Infrared Spectrophotometer
Publication number
20220276096
Publication date
Sep 1, 2022
Shimadzu Corporation
Hideaki KATSU
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS USING ACTIVE FTIR SPECTROSCOPY FOR DETECTION OF...
Publication number
20220205904
Publication date
Jun 30, 2022
HERIOT-WATT UNIVERSITY
Derryck Telford Reid
G01 - MEASURING TESTING
Information
Patent Application
TECHNOLOGIES FOR HIGH RESOLUTION AND WIDE SWATH SPECTROMETER
Publication number
20220113192
Publication date
Apr 14, 2022
ABB Schweiz AG
Florent M. Prel
G01 - MEASURING TESTING
Information
Patent Application
Interferometer Element, Spectrometer and Method for Operating an In...
Publication number
20210356321
Publication date
Nov 18, 2021
ROBERT BOSCH GmbH
Ralf Noltemeyer
G01 - MEASURING TESTING
Information
Patent Application
Method For Imaging Or Spectroscopy With A Non-Linear Interferometer
Publication number
20210270671
Publication date
Sep 2, 2021
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Fabian Steinlechner
G01 - MEASURING TESTING
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20210132364
Publication date
May 6, 2021
Hamamatsu Photonics K.K.
Tomofumi SUZUKI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER
Publication number
20200400503
Publication date
Dec 24, 2020
Shimadzu Corporation
Hiromasa MARUNO
G01 - MEASURING TESTING
Information
Patent Application
FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER
Publication number
20200400504
Publication date
Dec 24, 2020
Shimadzu Corporation
Hiromasa MARUNO
G01 - MEASURING TESTING
Information
Patent Application
FOURIER SPECTROSCOPIC ANALYZER
Publication number
20200278256
Publication date
Sep 3, 2020
YOKOGAWA ELECTRIC CORPORATION
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHODS FOR FACIAL RECOGNITION AND VIDEO ANALYTICS TO...
Publication number
20200217645
Publication date
Jul 9, 2020
15 Seconds of Fame, Inc.
Ruslan SABITOV
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL MODULE
Publication number
20200049977
Publication date
Feb 13, 2020
Hamamatsu Photonics K.K.
Tomofumi SUZUKI
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
On-Board Processing of Hyperspectral Data
Publication number
20190331528
Publication date
Oct 31, 2019
Eagle Technology, LLC
Paul MAURER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
APPARATUS FOR ACQUIRING IMAGE USING TERAHERTZ WAVE
Publication number
20190285475
Publication date
Sep 19, 2019
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Sang-Pil HAN
G02 - OPTICS
Information
Patent Application
MICROELECTROMECHANICAL SYSTEM (MEMS) AND (MEM) OPTICAL INTERFEROMET...
Publication number
20190277698
Publication date
Sep 12, 2019
Green Vision Systems Ltd.
Danny S. Moshe
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Push-Broom Fourier Transform Spectrometer
Publication number
20190277700
Publication date
Sep 12, 2019
Eagle Technology, LLC
Paul MAURER
G01 - MEASURING TESTING
Information
Patent Application
Mirror Alignment in Optical Scientific Instruments
Publication number
20190204585
Publication date
Jul 4, 2019
Thermo Electron Scientific Instruments LLC
John Magie COFFIN
G01 - MEASURING TESTING
Information
Patent Application
FOURIER TRANSFORM SPECTROPHOTOMETER
Publication number
20190162591
Publication date
May 30, 2019
Shimadzu Corporation
Tadafusa KAMIKAKE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT APPARATUS AND RECORDING MEDIUM
Publication number
20190120692
Publication date
Apr 25, 2019
YOKOGAWA ELECTRIC CORPORATION
Manabu Kojima
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MODULE
Publication number
20190033136
Publication date
Jan 31, 2019
Hamamatsu Photonics K.K.
Yoshihisa WARASHINA
G02 - OPTICS
Information
Patent Application
MIRROR BEARING FOR AN INTERFEROMETER
Publication number
20190018219
Publication date
Jan 17, 2019
Thermo Electron Scientific Instruments LLC
John Magie COFFIN
G02 - OPTICS
Information
Patent Application
A SPECTROMETER SYSTEM AND A METHOD FOR COMPENSATING FOR TIME PERIOD...
Publication number
20180328788
Publication date
Nov 15, 2018
Foss Analytical A/S
Steen Kjaer ANDERSEN
G01 - MEASURING TESTING