Devices with moving mirror

Industry

CPC
G01J3/4535

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J3/00Spectrometry Spectrophotometry Monochromators Measuring colour

Current Industry

G01J3/4535Devices with moving mirror

Industries

Patents Grantslast 30 patents

Information Patent Grant
Infrared light source device and fourier transform infrared spectro...
- Patent number 12,216,006
- Issue date Feb 4, 2025
- Shimadzu Corporation
- Tadafumi Kamikake
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 12,152,878
- Issue date Nov 26, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Spectrometer
- Patent number 12,031,864
- Issue date Jul 9, 2024
- Jasco Corporation
- Kenichi Akao
- G01 - MEASURING TESTING
Information Patent Grant
Quadrilateral common-path time-modulated interferometric spectral i...
- Patent number 11,971,303
- Issue date Apr 30, 2024
- WUHAN UNIVERSITY
- Ruyi Wei
- G01 - MEASURING TESTING
Information Patent Grant
High-speed Fourier-transform spectroscopy apparatus and spectroscop...
- Patent number 11,892,354
- Issue date Feb 6, 2024
- The University of Tokyo
- Takuro Ideguchi
- G01 - MEASURING TESTING
Information Patent Grant
Mirror unit and optical module
- Patent number 11,879,731
- Issue date Jan 23, 2024
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Fourier transform infrared spectrophotometer
- Patent number 11,874,172
- Issue date Jan 16, 2024
- Shimadzu Corporation
- Hideaki Katsu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods using active FTIR spectroscopy for detection of...
- Patent number 11,867,618
- Issue date Jan 9, 2024
- Heriot-Watt University
- Derryck Telford Reid
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer element, spectrometer and method for operating an in...
- Patent number 11,754,445
- Issue date Sep 12, 2023
- Robert Bosch GmbH
- Ralf Noltemeyer
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical system (MEMS) and (MEM) optical interferomet...
- Patent number 11,725,989
- Issue date Aug 15, 2023
- Green Vision Systems Ltd.
- Danny S. Moshe
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical module
- Patent number 11,635,290
- Issue date Apr 25, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,629,947
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,629,946
- Issue date Apr 18, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Mirror unit and optical module
- Patent number 11,624,605
- Issue date Apr 11, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical module
- Patent number 11,579,438
- Issue date Feb 14, 2023
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical module
- Patent number 11,487,104
- Issue date Nov 1, 2022
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method for imaging or spectroscopy with a non-linear interferometer
- Patent number 11,454,541
- Issue date Sep 27, 2022
- Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
- Fabian Steinlechner
- G01 - MEASURING TESTING
Information Patent Grant
Retro-interferometer having active readjustment
- Patent number 11,326,950
- Issue date May 10, 2022
- BRUKER OPTICS GMBH & CO. KG
- Axel Keens
- G02 - OPTICS
Information Patent Grant
Technologies for high resolution and wide swath spectrometer
- Patent number 11,307,097
- Issue date Apr 19, 2022
- ABB Schweiz AG
- Florent M. Prel
- G01 - MEASURING TESTING
Information Patent Grant
Optical spectroscopy using the fourier transform
- Patent number 11,280,676
- Issue date Mar 22, 2022
- The Regents of the University of California
- Brandon Hong
- G02 - OPTICS
Information Patent Grant
Optical module having high-accuracy spectral analysis
- Patent number 11,209,260
- Issue date Dec 28, 2021
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device
- Patent number 11,187,579
- Issue date Nov 30, 2021
- Hamamatsu Photonics K.K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Housing system for Michelson interferometer
- Patent number 11,162,775
- Issue date Nov 2, 2021
- Agency for Defense Development
- Jongmin Lee
- G01 - MEASURING TESTING
Information Patent Grant
Self-referenced spectrometer
- Patent number 11,085,825
- Issue date Aug 10, 2021
- Si-Ware Systems
- Mostafa Medhat
- G01 - MEASURING TESTING
Information Patent Grant
Fourier spectroscopic analyzer
- Patent number 11,073,424
- Issue date Jul 27, 2021
- Yokogawa Electric Corporation
- Yasuyuki Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Mirror alignment in optical scientific instruments
- Patent number 10,983,334
- Issue date Apr 20, 2021
- Thermo Electron Scientific Instruments LLC
- John Magie Coffin
- G01 - MEASURING TESTING
Information Patent Grant
Mirror bearing for an interferometer
- Patent number 10,921,554
- Issue date Feb 16, 2021
- Thermo Electron Scientific Instruments LLC
- John Magie Coffin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Apparatus and methods for facial recognition and video analytics to...
- Patent number 10,900,772
- Issue date Jan 26, 2021
- 15 Seconds of Fame, Inc.
- Ruslan Sabitov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fourier transform spectrophotometer
- Patent number 10,837,829
- Issue date Nov 17, 2020
- Shimadzu Corporation
- Tadafusa Kamikake
- G01 - MEASURING TESTING
Information Patent Grant
Device for providing variable sized aperture for a sample
- Patent number 10,823,614
- Issue date Nov 3, 2020
- Thermo Electron Scientific Instruments LLC
- John Magie Coffin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20250044074
- Publication date Feb 6, 2025
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
LENS UNIT, OPTICAL SYSTEM, AND SPECTRAL CHARACTERISTIC MEASURING DE...
- Publication number 20240411116
- Publication date Dec 12, 2024
- NIPPON ELECTRIC GLASS CO., LTD.
- Mitsuru TOMITA
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL HYPERSPECTRAL IMAGING SYSTEM AND METHOD THEREOF
- Publication number 20240402011
- Publication date Dec 5, 2024
- National Tsing Hua University
- Wei-Chih Wang
- G01 - MEASURING TESTING
Information Patent Application
Interferometer
- Publication number 20240393180
- Publication date Nov 28, 2024
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATING A SPECTROMETER DEVICE
- Publication number 20240393178
- Publication date Nov 28, 2024
- trinamiX GmbH
- Robert LOVRINCIC
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
REFERENCE METHOD FOR SPECTROMETER
- Publication number 20240319010
- Publication date Sep 26, 2024
- Thermo Electron Scientific Instruments LLC
- John Iverson
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...
- Publication number 20240271999
- Publication date Aug 15, 2024
- Tsubasa SAITO
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM-ENHANCED ALL-OPTICAL PHOTOACOUSTIC SIGNAL DETECTION DEVICE...
- Publication number 20240077457
- Publication date Mar 7, 2024
- SHANXI UNIVERSITY
- Kuanshou ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Optical Device And Spectrometer
- Publication number 20240045199
- Publication date Feb 8, 2024
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
- Publication number 20230408337
- Publication date Dec 21, 2023
- WUHAN UNIVERSITY
- Ruyi WEI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE
- Publication number 20230221106
- Publication date Jul 13, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SPECTROMETER
- Publication number 20230146740
- Publication date May 11, 2023
- JASCO CORPORATION
- Kenichi AKAO
- G01 - MEASURING TESTING
Information Patent Application
HANDHELD OPTICAL SPECTROSCOPY SCANNER
- Publication number 20230076993
- Publication date Mar 9, 2023
- SI-WARE SYSTEMS
- Botros George Iskander Shenouda
- G01 - MEASURING TESTING
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20230003504
- Publication date Jan 5, 2023
- HAMAMATSU PHOTONICS K. K.
- Tomofumi Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INFRARED LIGHT SOURCE DEVICE AND FOURIER TRANSFORM INFRARED SPECTRO...
- Publication number 20220381613
- Publication date Dec 1, 2022
- Shimadzu Corporation
- Tadafumi KAMIKAKE
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASUREMENT DEVICE
- Publication number 20220341785
- Publication date Oct 27, 2022
- NEC Corporation
- Takeshi AKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
Fourier Transform Infrared Spectrophotometer
- Publication number 20220276096
- Publication date Sep 1, 2022
- Shimadzu Corporation
- Hideaki KATSU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS USING ACTIVE FTIR SPECTROSCOPY FOR DETECTION OF...
- Publication number 20220205904
- Publication date Jun 30, 2022
- HERIOT-WATT UNIVERSITY
- Derryck Telford Reid
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGIES FOR HIGH RESOLUTION AND WIDE SWATH SPECTROMETER
- Publication number 20220113192
- Publication date Apr 14, 2022
- ABB Schweiz AG
- Florent M. Prel
- G01 - MEASURING TESTING
Information Patent Application
Interferometer Element, Spectrometer and Method for Operating an In...
- Publication number 20210356321
- Publication date Nov 18, 2021
- ROBERT BOSCH GmbH
- Ralf Noltemeyer
- G01 - MEASURING TESTING
Information Patent Application
Method For Imaging Or Spectroscopy With A Non-Linear Interferometer
- Publication number 20210270671
- Publication date Sep 2, 2021
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Fabian Steinlechner
- G01 - MEASURING TESTING
Information Patent Application
MIRROR UNIT AND OPTICAL MODULE
- Publication number 20210132364
- Publication date May 6, 2021
- Hamamatsu Photonics K.K.
- Tomofumi SUZUKI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER
- Publication number 20200400503
- Publication date Dec 24, 2020
- Shimadzu Corporation
- Hiromasa MARUNO
- G01 - MEASURING TESTING
Information Patent Application
FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER
- Publication number 20200400504
- Publication date Dec 24, 2020
- Shimadzu Corporation
- Hiromasa MARUNO
- G01 - MEASURING TESTING
Information Patent Application
FOURIER SPECTROSCOPIC ANALYZER
- Publication number 20200278256
- Publication date Sep 3, 2020
- YOKOGAWA ELECTRIC CORPORATION
- Yasuyuki Suzuki
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR FACIAL RECOGNITION AND VIDEO ANALYTICS TO...
- Publication number 20200217645
- Publication date Jul 9, 2020
- 15 Seconds of Fame, Inc.
- Ruslan SABITOV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MODULE
- Publication number 20200049977
- Publication date Feb 13, 2020
- Hamamatsu Photonics K.K.
- Tomofumi SUZUKI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
On-Board Processing of Hyperspectral Data
- Publication number 20190331528
- Publication date Oct 31, 2019
- Eagle Technology, LLC
- Paul MAURER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR ACQUIRING IMAGE USING TERAHERTZ WAVE
- Publication number 20190285475
- Publication date Sep 19, 2019
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Sang-Pil HAN
- G02 - OPTICS

Devices with moving mirror

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Infrared light source device and fourier transform infrared spectro...

Mirror unit and optical module

Spectrometer

Quadrilateral common-path time-modulated interferometric spectral i...

High-speed Fourier-transform spectroscopy apparatus and spectroscop...

Mirror unit and optical module

Fourier transform infrared spectrophotometer

Systems and methods using active FTIR spectroscopy for detection of...

Interferometer element, spectrometer and method for operating an in...

Microelectromechanical system (MEMS) and (MEM) optical interferomet...

Optical module

Optical device

Mirror unit and optical module

Mirror unit and optical module

Optical module

Optical module

Method for imaging or spectroscopy with a non-linear interferometer

Retro-interferometer having active readjustment

Technologies for high resolution and wide swath spectrometer

Optical spectroscopy using the fourier transform

Optical module having high-accuracy spectral analysis

Optical device

Housing system for Michelson interferometer

Self-referenced spectrometer

Fourier spectroscopic analyzer

Mirror alignment in optical scientific instruments

Mirror bearing for an interferometer

Apparatus and methods for facial recognition and video analytics to...

Fourier transform spectrophotometer

Device for providing variable sized aperture for a sample

Patents Applicationslast 30 patents

MIRROR UNIT AND OPTICAL MODULE

LENS UNIT, OPTICAL SYSTEM, AND SPECTRAL CHARACTERISTIC MEASURING DE...

TWO-DIMENSIONAL HYPERSPECTRAL IMAGING SYSTEM AND METHOD THEREOF

Interferometer

METHOD FOR CALIBRATING A SPECTROMETER DEVICE

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

REFERENCE METHOD FOR SPECTROMETER

SPECTROSCOPIC ANALYSIS DEVICE AND INTERFERING LIGHT FORMATION MECHA...

QUANTUM-ENHANCED ALL-OPTICAL PHOTOACOUSTIC SIGNAL DETECTION DEVICE...

Optical Device And Spectrometer

QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...

OPTICAL DEVICE

SPECTROMETER

HANDHELD OPTICAL SPECTROSCOPY SCANNER

MIRROR UNIT AND OPTICAL MODULE

INFRARED LIGHT SOURCE DEVICE AND FOURIER TRANSFORM INFRARED SPECTRO...

SPECTRUM MEASUREMENT DEVICE

Fourier Transform Infrared Spectrophotometer

SYSTEMS AND METHODS USING ACTIVE FTIR SPECTROSCOPY FOR DETECTION OF...

TECHNOLOGIES FOR HIGH RESOLUTION AND WIDE SWATH SPECTROMETER

Interferometer Element, Spectrometer and Method for Operating an In...

Method For Imaging Or Spectroscopy With A Non-Linear Interferometer

MIRROR UNIT AND OPTICAL MODULE

FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER

FIXED MIRROR, INTERFEROMETER, AND FOURIER TRANSFORM SPECTROPHOTOMETER

FOURIER SPECTROSCOPIC ANALYZER

APPARATUS AND METHODS FOR FACIAL RECOGNITION AND VIDEO ANALYTICS TO...

OPTICAL MODULE

On-Board Processing of Hyperspectral Data

APPARATUS FOR ACQUIRING IMAGE USING TERAHERTZ WAVE