Different kinds of radiation or particles

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/10Different kinds of radiation or particles

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray radioscope
- Patent number 12,360,061
- Issue date Jul 15, 2025
- BEAMSENSE Co., Ltd.
- Sueki Baba
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence system and x-ray source with electrically insula...
- Patent number 12,360,067
- Issue date Jul 15, 2025
- Sigray, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray identification of connections in a tubular string
- Patent number 12,345,664
- Issue date Jul 1, 2025
- Weatherford Technology Holdings, LLC
- Benjamin Sachtleben
- G01 - MEASURING TESTING
Information Patent Grant
Diffractive analyzer of patient tissue
- Patent number 12,336,851
- Issue date Jun 24, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Pulsed neutron apparatus and method for using same to analyze core...
- Patent number 12,332,193
- Issue date Jun 17, 2025
- Core Laboratories LP
- Derek Raymond Beckett
- G01 - MEASURING TESTING
Information Patent Grant
Alpha diffractometer
- Patent number 12,332,192
- Issue date Jun 17, 2025
- Arion Diagnostics, Inc.
- Alexander P. Lazarev
- G01 - MEASURING TESTING
Information Patent Grant
Lithium detection techniques using neutrons and/or alpha particles
- Patent number 12,332,400
- Issue date Jun 17, 2025
- Schlumberger Technology Corporation
- Shikha Prasad
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Device for closing the input opening in the sample chamber in an x-...
- Patent number 12,298,262
- Issue date May 13, 2025
- Wolfgang Gehrlein
- G01 - MEASURING TESTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,292,395
- Issue date May 6, 2025
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis system and method with multi-source design
- Patent number 12,292,396
- Issue date May 6, 2025
- SHENZHEN ANGSTROM EXCELLENCE TECHNOLOGY CO. LTD
- Xuena Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,285,656
- Issue date Apr 29, 2025
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Correction amount specifying apparatus, method, program, and jig
- Patent number 12,287,301
- Issue date Apr 29, 2025
- Rigaku Corporation
- Takuya Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Single piece droplet generation and injection device for serial cry...
- Patent number 12,287,299
- Issue date Apr 29, 2025
- Arizona Board of Regents on behalf of Arizona State University
- Alexandra Ros
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for analyzing diffraction pattern of mixture, and...
- Patent number 12,287,300
- Issue date Apr 29, 2025
- Rigaku Corporation
- Hideo Toraya
- G01 - MEASURING TESTING
Information Patent Grant
System and method for a specimen container for use in cabinet x-ray...
- Patent number 12,281,971
- Issue date Apr 22, 2025
- Kub Technologies Inc
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Grant
Downhole lithium detection systems and methods
- Patent number 12,282,136
- Issue date Apr 22, 2025
- Schlumberger Technology Corporation
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Grant
Handheld inspection device and method of inspecting an infrastructu...
- Patent number 12,259,342
- Issue date Mar 25, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,247,935
- Issue date Mar 11, 2025
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Grant
Sensitive detection of low doses of beta particles using quartz cry...
- Patent number 12,239,474
- Issue date Mar 4, 2025
- King Saud University
- Abdullah Nasser Alodhayb
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
Method for moisture measurement
- Patent number 12,228,530
- Issue date Feb 18, 2025
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Residual stress measurement method of curved surface block
- Patent number 12,209,926
- Issue date Jan 28, 2025
- Metal Industries Research & Development Centre
- Zong Rong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System for Measuring Microplastics in an Aquatic Environment
- Publication number 20250231115
- Publication date Jul 17, 2025
- Ely Oser
- G01 - MEASURING TESTING
Information Patent Application
COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY
- Publication number 20250231126
- Publication date Jul 17, 2025
- Gold Standard Radiation Detection, Inc.
- Mark DERZON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD
- Publication number 20250231124
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Yoshihiro ANAN
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE AND DIRECTION-SENSITIVE COSMOGENIC NEUTRON SENSORS
- Publication number 20250224346
- Publication date Jul 10, 2025
- QUAESTA INSTRUMENTS, LLC
- MAREK ZREDA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Inspection Method and Inspection Device
- Publication number 20250224349
- Publication date Jul 10, 2025
- Shimadzu Corporation
- Koichi TANABE
- G01 - MEASURING TESTING
Information Patent Application
X-BAND SMALL-FOCUS ACCELERATOR FOR NON-DESTRUCTIVE TESTING
- Publication number 20250227835
- Publication date Jul 10, 2025
- Nuctech Company Limited
- Yaohong LIU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
- Publication number 20250216346
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Ron MEIRY
- G01 - MEASURING TESTING
Information Patent Application
Analysis System, Analysis Method, and Analysis Program
- Publication number 20250208076
- Publication date Jun 26, 2025
- Hitachi High-Tech Corporation
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...
- Publication number 20250203744
- Publication date Jun 19, 2025
- Siemens Healthineers AG
- Joerg FREUDENBERGER
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...
- Publication number 20250198950
- Publication date Jun 19, 2025
- Illinois Tool Works Inc.
- Nicole Wilson
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...
- Publication number 20250198955
- Publication date Jun 19, 2025
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Bruno Schroth
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS
- Publication number 20250189469
- Publication date Jun 12, 2025
- FEI Company
- Sean M. Kellogg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION FLOW DETERMINATION DEVICE, CHARGED PARTICLE BEAM DEVICE,...
- Publication number 20250189462
- Publication date Jun 12, 2025
- HITACHI HIGH-TECH CORPORATION
- Norifumi KAMESHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE
- Publication number 20250180497
- Publication date Jun 5, 2025
- PHOTOELECTRON INTELLECTUAL PROPERTY HOLDINGS LLC
- Peter Cumpson
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION DATA PROCESSING DEVICE AND X-RAY ANALYSIS DEVICE
- Publication number 20250180495
- Publication date Jun 5, 2025
- Rigaku Corporation
- Aya Ogi
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING
- Publication number 20250172511
- Publication date May 29, 2025
- Siemens Healthineers AG
- Philipp ROSER
- G01 - MEASURING TESTING
Information Patent Application
X-Ray System for Generating Multi-Spectrum Image Data
- Publication number 20250172512
- Publication date May 29, 2025
- Teledyne Dalsa B.V.
- Korthout Alouisius Wilhelmus Marinus
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250172510
- Publication date May 29, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING
- Publication number 20250164416
- Publication date May 22, 2025
- GE Precision Healthcare LLC
- Johannes Loberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROMETER
- Publication number 20250164421
- Publication date May 22, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250164415
- Publication date May 22, 2025
- Rayence Co., Ltd.
- Seungman YUN
- G01 - MEASURING TESTING
Information Patent Application
RADIATION-MEASUREMENT-INSTRUMENT SUPPORT DEVICE, RADIATION MEASUREM...
- Publication number 20250146956
- Publication date May 8, 2025
- Kabushiki Kaisha Toshiba
- Ryoutaro MASUDA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...
- Publication number 20250146960
- Publication date May 8, 2025
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
Nanophotonic Scintillators for High-Energy Particles Detection, Ima...
- Publication number 20250137942
- Publication date May 1, 2025
- Massachusetts Institute of Technology
- Marin Soljacic
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF
- Publication number 20250137948
- Publication date May 1, 2025
- Hyundai Motor Company
- Jun Young Shin
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...
- Publication number 20250130183
- Publication date Apr 24, 2025
- Applied Materials, Inc.
- Alexander Buhse Brady
- G01 - MEASURING TESTING
Information Patent Application
DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS
- Publication number 20250102699
- Publication date Mar 27, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Christian Stoller
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING

Different kinds of radiation or particles

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray radioscope

X-ray fluorescence system and x-ray source with electrically insula...

X-ray identification of connections in a tubular string

Diffractive analyzer of patient tissue

Pulsed neutron apparatus and method for using same to analyze core...

Alpha diffractometer

Lithium detection techniques using neutrons and/or alpha particles

Method for quantitatively characterizing dendrite segregation and d...

Customizable axes of rotation for industrial radiography systems

Device for closing the input opening in the sample chamber in an x-...

Serial synchrotron crystallography sample holding system

X-ray analysis system and method with multi-source design

Method and system utilizing imaging analysis for golf balls

Correction amount specifying apparatus, method, program, and jig

Single piece droplet generation and injection device for serial cry...

Device and method for analyzing diffraction pattern of mixture, and...

System and method for a specimen container for use in cabinet x-ray...

Downhole lithium detection systems and methods

Handheld inspection device and method of inspecting an infrastructu...

X-ray fluorescence spectrometer

Sensitive detection of low doses of beta particles using quartz cry...

Inspection apparatus and inspection method

Spectrometer

Non-destructive detection method and system for Conopomorpha sinens...

Method for moisture measurement

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray detector system with at least two stacked flat Bragg diffractors

Residual stress measurement method of curved surface block

Method of detecting internal stress distribution of transparent mat...

Method and system for inspecting a structure across a cover layer c...

Patents Applicationslast 30 patents

System for Measuring Microplastics in an Aquatic Environment

COUNTER COUNTERFEIT AND EMBEDDED BARCODE TECHNOLOGY

INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD

DISTANCE AND DIRECTION-SENSITIVE COSMOGENIC NEUTRON SENSORS

Inspection Method and Inspection Device

X-BAND SMALL-FOCUS ACCELERATOR FOR NON-DESTRUCTIVE TESTING

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

Analysis System, Analysis Method, and Analysis Program

CHANGING THE ORIENTATION OF THE X-RAY EMITTER IN ORDER TO VARY THE...

MULTI-ROTATIONAL FIXTURES FOR RADIOGRAPHY SYSTEMS AND RADIOGRAPHY S...

ADJUSTING UNIT FOR AN X-RAY OPTICAL ELEMENT IN AN X-RAY FLUORESCENC...

PARTICLE-INDUCED X-RAY EMISSION USING LIGHT AND HEAVY PARTICLE BEAMS

INSPECTION FLOW DETERMINATION DEVICE, CHARGED PARTICLE BEAM DEVICE,...

IMPROVED SURFACE ANALYSIS PROCESS AND DEVICE

X-RAY DIFFRACTION DATA PROCESSING DEVICE AND X-RAY ANALYSIS DEVICE

MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING

X-Ray System for Generating Multi-Spectrum Image Data

X-RAY INSPECTION APPARATUS

MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING

SPECTROMETER

X-RAY IMAGING APPARATUS

RADIATION-MEASUREMENT-INSTRUMENT SUPPORT DEVICE, RADIATION MEASUREM...

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING SPECTRAL...

Nanophotonic Scintillators for High-Energy Particles Detection, Ima...

APPARATUS FOR ANALYZING COMPOSITION AND METHOD THEREOF

DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...

DOWNHOLE LITHIUM DETECTION SYSTEMS AND METHODS

ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...