Different kinds of radiation or particles

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/10Different kinds of radiation or particles

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Sensitive detection of low doses of beta particles using quartz cry...
- Patent number 12,239,474
- Issue date Mar 4, 2025
- King Saud University
- Abdullah Nasser Alodhayb
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Spectrometer
- Patent number 12,235,228
- Issue date Feb 25, 2025
- EasyXAFS, LLC
- William Holden
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive detection method and system for Conopomorpha sinens...
- Patent number 12,228,529
- Issue date Feb 18, 2025
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Grant
Method for moisture measurement
- Patent number 12,228,530
- Issue date Feb 18, 2025
- Chrysos Corporation Limited
- James Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...
- Patent number 12,209,978
- Issue date Jan 28, 2025
- Danmarks Tekniske Universitet
- Yubin Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray detector system with at least two stacked flat Bragg diffractors
- Patent number 12,209,977
- Issue date Jan 28, 2025
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Residual stress measurement method of curved surface block
- Patent number 12,209,926
- Issue date Jan 28, 2025
- Metal Industries Research & Development Centre
- Zong Rong Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer program products for determining a p...
- Patent number 12,181,459
- Issue date Dec 31, 2024
- Troxler Electronic Laboratories INC.
- Robert Ernest Troxler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
- Patent number 12,163,904
- Issue date Dec 10, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo-Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
Component residual stress testing platform based on neutron diffrac...
- Patent number 12,146,845
- Issue date Nov 19, 2024
- NCS TESTING TECHNOLOGY CO., LTD
- Lixia Yang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quantum-limited extreme ultraviolet coherent diffraction imaging
- Patent number 12,085,520
- Issue date Sep 10, 2024
- Regents of the Univ of Colorado
- Henry C. Kapteyn
- G01 - MEASURING TESTING
Information Patent Grant
Method for temperature monitoring in cryo-electron microscopy
- Patent number 12,070,753
- Issue date Aug 27, 2024
- FEI Company
- Jakub Drahotsky
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,053,675
- Issue date Aug 6, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- G01 - MEASURING TESTING
Information Patent Grant
Locating mining sites using neutron detection
- Patent number 12,044,636
- Issue date Jul 23, 2024
- LUNAR HELIUM-3 MINING, LLC
- Chris Salvino
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection device
- Patent number 12,013,351
- Issue date Jun 18, 2024
- ISHIDA CO., LTD.
- Ryota Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20250067689
- Publication date Feb 27, 2025
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...
- Publication number 20250067685
- Publication date Feb 27, 2025
- Thermo EGS Gauging LLC
- Carter WATSON
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
- Publication number 20250062048
- Publication date Feb 20, 2025
- UNIVERSITAET HAMBURG
- Jonas BAUMANN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Non-destructive Detection Method and System for Conopomorpha Sinens...
- Publication number 20250060322
- Publication date Feb 20, 2025
- Institute of Facility Agriculture, Guangdong Academy of agricultural Sciences
- Sai Xu
- G01 - MEASURING TESTING
Information Patent Application
LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
- Publication number 20250044476
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Shikha Prasad
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR IMPROVED ANALYSIS OF ELECTROMAGNETIC SPECTRA
- Publication number 20250027892
- Publication date Jan 23, 2025
- Fusion Energy Solutions, Inc.
- Ian Shawn Horvath
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...
- Publication number 20250003892
- Publication date Jan 2, 2025
- Anritsu Corporation
- Takeshi YAMAZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD
- Publication number 20240361256
- Publication date Oct 31, 2024
- Konica Minolta, Inc.
- Mika Matsusaka
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
Radiation Effects Testing System with a Beam Accelerator
- Publication number 20240353358
- Publication date Oct 24, 2024
- SHINE Technologies, LLC
- Craig Jacobson
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
- Publication number 20240345007
- Publication date Oct 17, 2024
- Zhejiang University
- Haikuo WANG
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240319112
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Bicheng LIU
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240310304
- Publication date Sep 19, 2024
- TSINGHUA UNIVERSITY
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...
- Publication number 20240302302
- Publication date Sep 12, 2024
- Sumitomo Chemical Company, Limited
- Takehiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
PIPELINE INSPECTION APPARATUS
- Publication number 20240302295
- Publication date Sep 12, 2024
- Under Cover Technologies Corp.
- RICHARD MAIKLEM
- G01 - MEASURING TESTING

Different kinds of radiation or particles

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Sensitive detection of low doses of beta particles using quartz cry...

Inspection apparatus and inspection method

Spectrometer

Non-destructive detection method and system for Conopomorpha sinens...

Method for moisture measurement

Laboratory-based 3D scanning X-ray Laue micro-diffraction system an...

X-ray detector system with at least two stacked flat Bragg diffractors

Residual stress measurement method of curved surface block

Method of detecting internal stress distribution of transparent mat...

Method and system for inspecting a structure across a cover layer c...

Methods, systems, and computer program products for determining a p...

Nitride semiconductor substrate, laminated structure, and method fo...

System, method, and apparatus for x-ray backscatter inspection of p...

Quantitative analysis method of carbon based hybrid negative electrode

Component residual stress testing platform based on neutron diffrac...

X-ray fluorescence analyzer

X-ray spectrometer and pulse height prediction program

Device and method for measuring short-wavelength characteristic X-r...

Scan procedure generation systems and methods to generate scan proc...

Quantum-limited extreme ultraviolet coherent diffraction imaging

Method for temperature monitoring in cryo-electron microscopy

Rotational X-ray inspection system and method

Method and system utilizing imaging analysis for golf balls

Locating mining sites using neutron detection

X-ray automated calibration and monitoring

Systems, apparatuses, and methods for measuring submerged surfaces

Inspection device

Serial synchrotron crystallography sample holding system

X-ray beam shaping apparatus and method

Apparatus and method for x-ray fluorescence analysis

Patents Applicationslast 30 patents

ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

METHOD AND SYSTEM FOR MATCHING CALIBRATIONS OF DETECTORS IN A DETEC...

X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...

Non-destructive Detection Method and System for Conopomorpha Sinens...

LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES

SYSTEMS AND METHODS FOR IMPROVED ANALYSIS OF ELECTROMAGNETIC SPECTRA

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

PATTERNED X-RAY EMITTING TARGET

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD

X-RAY FLUORESCENCE SPECTROMETER

Radiation Effects Testing System with a Beam Accelerator

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

INSPECTION SYSTEM AND METHOD

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

Systems and Methods for Monitoring Output Energy of a High-Energy X...

INSPECTION SYSTEM AND INSPECTION METHOD

NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

PIPELINE INSPECTION APPARATUS