electromagnetic radiation

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CPC
G01N2223/101

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/101electromagnetic radiation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of detecting internal stress distribution of transparent mat...
- Patent number 12,203,881
- Issue date Jan 21, 2025
- Zhejiang University
- Haikuo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and computer program products for determining a p...
- Patent number 12,181,459
- Issue date Dec 31, 2024
- Troxler Electronic Laboratories INC.
- Robert Ernest Troxler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Nitride semiconductor substrate, laminated structure, and method fo...
- Patent number 12,174,132
- Issue date Dec 24, 2024
- Sumitomo Chemical Company, Limited
- Takehiro Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 12,163,903
- Issue date Dec 10, 2024
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative analysis method of carbon based hybrid negative electrode
- Patent number 12,163,904
- Issue date Dec 10, 2024
- LG ENERGY SOLUTION, LTD.
- Hyo-Jung Yoon
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 12,135,299
- Issue date Nov 5, 2024
- Shimadzu Corporation
- Takuro Izumi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Scan procedure generation systems and methods to generate scan proc...
- Patent number 12,092,591
- Issue date Sep 17, 2024
- Illinois Tool Works Inc.
- Jackson Turner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,053,675
- Issue date Aug 6, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- G01 - MEASURING TESTING
Information Patent Grant
X-ray automated calibration and monitoring
- Patent number 12,044,634
- Issue date Jul 23, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Systems, apparatuses, and methods for measuring submerged surfaces
- Patent number 12,025,573
- Issue date Jul 2, 2024
- DELTA SUBSEA LLC
- Scott P. Dingman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Inspection device
- Patent number 12,013,351
- Issue date Jun 18, 2024
- ISHIDA CO., LTD.
- Ryota Hatano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Serial synchrotron crystallography sample holding system
- Patent number 12,007,342
- Issue date Jun 11, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Grant
X-ray beam shaping apparatus and method
- Patent number 12,007,343
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Milen Gateshki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
Patterned x-ray emitting target
- Patent number 11,996,259
- Issue date May 28, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray unit technology modules and automated application training
- Patent number 11,988,617
- Issue date May 21, 2024
- John Bean Technologies Corporation
- Jeffrey C. Gill
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,977,038
- Issue date May 7, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,971,370
- Issue date Apr 30, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multi-physical field imaging method and system based on PET-CT and DAS
- Patent number 11,965,995
- Issue date Apr 23, 2024
- Yibo Wang
- G01 - MEASURING TESTING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation detection device, recording medium, and positioning method
- Patent number 11,940,397
- Issue date Mar 26, 2024
- Horiba, Ltd.
- Tomoki Aoyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,940,394
- Issue date Mar 26, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for in-situ X-ray diffraction-based real-time mon...
- Patent number 11,933,747
- Issue date Mar 19, 2024
- University of Maryland, College Park
- Peter Zavalij
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Sample mounting system for an X-ray analysis apparatus
- Patent number 11,927,550
- Issue date Mar 12, 2024
- Malvern Panalytical B.V.
- Jaap Boksem
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,927,554
- Issue date Mar 12, 2024
- Canon Anelva Corporation
- Takeo Tsukamoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR IMPROVED ANALYSIS OF ELECTROMAGNETIC SPECTRA
- Publication number 20250027892
- Publication date Jan 23, 2025
- Fusion Energy Solutions, Inc.
- Ian Shawn Horvath
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...
- Publication number 20250027891
- Publication date Jan 23, 2025
- Saudi Arabian Oil Company
- Mohamed SOUA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...
- Publication number 20250020602
- Publication date Jan 16, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Hyeon KANG
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...
- Publication number 20250003892
- Publication date Jan 2, 2025
- Anritsu Corporation
- Takeshi YAMAZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNED X-RAY EMITTING TARGET
- Publication number 20250006451
- Publication date Jan 2, 2025
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...
- Publication number 20240393266
- Publication date Nov 28, 2024
- Sigray, Inc.
- David Vine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240369502
- Publication date Nov 7, 2024
- Canon ANELVA Corporation
- Takeo TSUKAMOTO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD
- Publication number 20240361256
- Publication date Oct 31, 2024
- Konica Minolta, Inc.
- Mika Matsusaka
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240361263
- Publication date Oct 31, 2024
- Rigaku Corporation
- Yasuhiko Nagoshi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...
- Publication number 20240345007
- Publication date Oct 17, 2024
- Zhejiang University
- Haikuo WANG
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240328969
- Publication date Oct 3, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM
- Publication number 20240319120
- Publication date Sep 26, 2024
- MITEGEN, LLC
- Robert E. Thorne
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...
- Publication number 20240310308
- Publication date Sep 19, 2024
- Helmut Fischer GmbH Institut fuer Elektronik und Messtechnik
- Martin Leibfritz
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20240310304
- Publication date Sep 19, 2024
- TSINGHUA UNIVERSITY
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...
- Publication number 20240302302
- Publication date Sep 12, 2024
- Sumitomo Chemical Company, Limited
- Takehiro YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
PIPELINE INSPECTION APPARATUS
- Publication number 20240302295
- Publication date Sep 12, 2024
- Under Cover Technologies Corp.
- RICHARD MAIKLEM
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...
- Publication number 20240295508
- Publication date Sep 5, 2024
- The Boeing Company
- Nicholas C. Reasoner
- G01 - MEASURING TESTING
Information Patent Application
MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS
- Publication number 20240295510
- Publication date Sep 5, 2024
- GILARDONI S.P.A.
- Davide Baratto
- G01 - MEASURING TESTING
Information Patent Application
Non-Destructive Inspection Device
- Publication number 20240295511
- Publication date Sep 5, 2024
- Riken
- Yasuo WAKABAYASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240288592
- Publication date Aug 29, 2024
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...
- Publication number 20240255444
- Publication date Aug 1, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi MATSUBARA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT
- Publication number 20240210333
- Publication date Jun 27, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING IN A CABINET X...
- Publication number 20240201110
- Publication date Jun 20, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IDENTIFICATION OF CONNECTIONS IN A TUBULAR STRING
- Publication number 20240201108
- Publication date Jun 20, 2024
- Weatherford Technology Holdings, LLC.
- Benjamin SACHTLEBEN
- G01 - MEASURING TESTING

electromagnetic radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of detecting internal stress distribution of transparent mat...

Method and system for inspecting a structure across a cover layer c...

Methods, systems, and computer program products for determining a p...

Nitride semiconductor substrate, laminated structure, and method fo...

System, method, and apparatus for x-ray backscatter inspection of p...

Quantitative analysis method of carbon based hybrid negative electrode

X-ray fluorescence analyzer

X-ray spectrometer and pulse height prediction program

Device and method for measuring short-wavelength characteristic X-r...

Scan procedure generation systems and methods to generate scan proc...

Rotational X-ray inspection system and method

Method and system utilizing imaging analysis for golf balls

X-ray automated calibration and monitoring

Systems, apparatuses, and methods for measuring submerged surfaces

Inspection device

Serial synchrotron crystallography sample holding system

X-ray beam shaping apparatus and method

Apparatus and method for x-ray fluorescence analysis

Patterned x-ray emitting target

X-ray unit technology modules and automated application training

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Multi-physical field imaging method and system based on PET-CT and DAS

Ore component analysis device and method

System and method for crack detection

Radiation detection device, recording medium, and positioning method

Inspection apparatus and inspection method

System and method for in-situ X-ray diffraction-based real-time mon...

Sample mounting system for an X-ray analysis apparatus

Inspection apparatus and inspection method

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR IMPROVED ANALYSIS OF ELECTROMAGNETIC SPECTRA

DIFFERENTIATION OF CLASTIC SEDIMENTARY SYSTEMS USING MARCH-DOLLASE...

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATE...

X-RAY INSPECTION APPARATUS, ARTICLE INSPECTION SYSTEM, X-RAY IMAGE...

PATTERNED X-RAY EMITTING TARGET

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

HIGH THROUGHPUT 3D X-RAY IMAGING SYSTEM USING A TRANSMISSION X-RAY...

INSPECTION APPARATUS AND INSPECTION METHOD

X-RAY TALBOT IMAGING APPARATUS AND X-RAY TALBOT IMAGING METHOD

X-RAY FLUORESCENCE SPECTROMETER

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

METHOD FOR DETECTING INTERNAL STRESS DISTRIBUTION OF TRANSPARENT MA...

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

SERIAL SYNCHROTRON CRYSTALLOGRAPHY SAMPLE HOLDING SYSTEM

MEASUREMENT OBJECT AND METHOD FOR VERIFYING A CALIBRATION OF AN X-R...

Systems and Methods for Monitoring Output Energy of a High-Energy X...

INSPECTION SYSTEM AND INSPECTION METHOD

NITRIDE SEMICONDUCTOR SUBSTRATE, LAMINATED STRUCTURE, AND METHOD FO...

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

PIPELINE INSPECTION APPARATUS

METHOD AND SYSTEM FOR INSPECTING AND MEASURING INSTALLED ONE-SIDED...

MACHINE FOR THE COMPOSITE SCANNING OF OBJECTS

Non-Destructive Inspection Device

X-RAY INSPECTION APPARATUS

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...

RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT

SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING IN A CABINET X...

X-RAY IDENTIFICATION OF CONNECTIONS IN A TUBULAR STRING