Electron guns using field emission, photo emission, or secondary emission electron sources

Industry

CPC
H01J37/073

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/073Electron guns using field emission, photo emission, or secondary emission electron sources

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Electron gun, electron beam applicator, and method for controlling...
- Patent number 12,198,889
- Issue date Jan 14, 2025
- Photo electron Soul Inc.
- Atsushi Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dielectric coated plasmonic photoemitter
- Patent number 12,183,535
- Issue date Dec 31, 2024
- Board of Trustees of Michigan State University
- Peng Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and imaging method
- Patent number 12,183,542
- Issue date Dec 31, 2024
- HITACHI HIGH-TECH CORPORATION
- Hiroki Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Joint electron-optical columns for flood-charging and image-forming...
- Patent number 12,165,838
- Issue date Dec 10, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam gun control systems and methods
- Patent number 12,145,006
- Issue date Nov 19, 2024
- Varian Medical Systems, Inc.
- Mark Everett Trail
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emitter and device provided with same
- Patent number 12,125,663
- Issue date Oct 22, 2024
- DENKA COMPANY LIMITED
- Daisuke Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, electron beam applicator, emission axis verification...
- Patent number 12,080,507
- Issue date Sep 3, 2024
- Photo electron Soul Inc.
- Hokuto Iijima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photocathode kit, electron gun, and electron beam applicator
- Patent number 12,033,827
- Issue date Jul 9, 2024
- Photo electron Soul Inc.
- Haruka Shikano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source and charged particle beam device
- Patent number 11,990,311
- Issue date May 21, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahiro Fukuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation generation apparatus and radiation generation method
- Patent number 11,990,310
- Issue date May 21, 2024
- MITSUBISHI HEAVY INDUSTRIES MACHINERY SYSTEMS, LTD.
- Nobuyuki Shigeoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and charged particle beam device equipped with electro...
- Patent number 11,978,609
- Issue date May 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Minoru Kaneda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source and charged particle beam device
- Patent number 11,929,230
- Issue date Mar 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo Kasuya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput multi-electron beam system
- Patent number 11,869,743
- Issue date Jan 9, 2024
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun, electron gun component, electron beam applicator, and...
- Patent number 11,842,879
- Issue date Dec 12, 2023
- Photo electron Soul Inc.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold-field-emitter electron gun with self-cleaning extractor using...
- Patent number 11,830,699
- Issue date Nov 28, 2023
- KLA Corporation
- Luca Grella
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam source for optical device fabrication using a segmented io...
- Patent number 11,810,755
- Issue date Nov 7, 2023
- Applied Materials, Inc.
- Ludovic Godet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam apparatus
- Patent number 11,784,022
- Issue date Oct 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanically-stable electron source
- Patent number 11,749,492
- Issue date Sep 5, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam writing apparatus and cathode life span prediction me...
- Patent number 11,749,491
- Issue date Sep 5, 2023
- NuFlare Technology, Inc.
- Satoshi Nakahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrafast electron diffraction apparatus
- Patent number 11,728,125
- Issue date Aug 15, 2023
- Korea Atomic Energy Research Institute
- Young Uk Jeong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emitter, electron gun using same, and electronic device
- Patent number 11,721,516
- Issue date Aug 8, 2023
- National Institute for Materials Science
- Han Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light modulated electron source
- Patent number 11,715,615
- Issue date Aug 1, 2023
- KLA Corporation
- Edgardo Garcia Berrios
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Schottky thermal field emitter with integrated beam splitter
- Patent number 11,699,564
- Issue date Jul 11, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emitter and method of fabricating same
- Patent number 11,688,579
- Issue date Jun 27, 2023
- ASML Netherlands B.V.
- Juying Dou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus of electron beam comprising pinnacle limiting plate and m...
- Patent number 11,664,186
- Issue date May 30, 2023
- BORRIES PTE. LTD.
- Zhongwei Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and image acquisition method
- Patent number 11,664,190
- Issue date May 30, 2023
- Kioxia Corporation
- Ryoji Yoshikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing microrods for electron emitters, and associated...
- Patent number 11,651,924
- Issue date May 16, 2023
- FEI Company
- Kun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source and charged particle beam device
- Patent number 11,651,929
- Issue date May 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Masahiro Fukuta
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERA...
- Publication number 20250022676
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...
- Publication number 20240412938
- Publication date Dec 12, 2024
- ATTOLIGHT AG
- Nicolas Tappy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE AND METHOD FOR CREATING DETECTION...
- Publication number 20240412939
- Publication date Dec 12, 2024
- PHOTO ELECTRON SOUL INC.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR
- Publication number 20240395499
- Publication date Nov 28, 2024
- RINKEN
- Takahiro SHIMOJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240379318
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Gun, Electron Beam Applying Device, and Irradiation Positi...
- Publication number 20240222062
- Publication date Jul 4, 2024
- Photo electron Soul, Inc.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun and Charged Particle Beam Apparatus
- Publication number 20240212966
- Publication date Jun 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomoya IGARI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON BEAM APPLICATOR, AND EMISSION METHOD OF ELEC...
- Publication number 20240212967
- Publication date Jun 27, 2024
- PHOTO ELECTRON SOUL INC.
- Tomohiro NISHITANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN CHAMBER FOR SCANNING ELECTRON MICROSCOPE, ELECTRON GUN...
- Publication number 20240212971
- Publication date Jun 27, 2024
- National Institute for Materials Science
- Han ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION DEVICE
- Publication number 20240161997
- Publication date May 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMITTER AND DEVICE PROVIDED WITH SAME
- Publication number 20240153730
- Publication date May 9, 2024
- Denka Company Limited
- Daisuke ISHIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20240120168
- Publication date Apr 11, 2024
- Hitachi High-Tech Corporation
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BE...
- Publication number 20240038481
- Publication date Feb 1, 2024
- CARL ZEISS MICROSCOPY GMBH
- Josef Biberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20230402246
- Publication date Dec 14, 2023
- HITACHI HIGH-TECH CORPORATION
- Hideo MORISHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Creating Multiple Electron Beams with a Photocathode Film
- Publication number 20230395349
- Publication date Dec 7, 2023
- KLA Corporation
- Xinrong Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20230352262
- Publication date Nov 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Keigo KASUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Source, Method of Manufacturing the Same, And Electron Bea...
- Publication number 20230317401
- Publication date Oct 5, 2023
- Hitachi High-Tech Corporation
- Toshiaki KUSUNOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON MICROSCOPE
- Publication number 20230298847
- Publication date Sep 21, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION
- Publication number 20230253178
- Publication date Aug 10, 2023
- NUFLARE TECHNOLOGY, INC.
- Victor KATSAP
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Source and Charged Particle Beam Device
- Publication number 20230238205
- Publication date Jul 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Masahiro FUKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJE...
- Publication number 20230230794
- Publication date Jul 20, 2023
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN, ELECTRON GUN COMPONENT, ELECTRON BEAM APPLICATION DEV...
- Publication number 20230207249
- Publication date Jun 29, 2023
- PHOTO ELECTRON SOUL INC.
- Tomohiro Nishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE, ELECTRON SOURCE FOR ELECTRON MICROSCOPE, AND M...
- Publication number 20230197399
- Publication date Jun 22, 2023
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Pavel ADAMEC
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ESTIMATING CATHODE LIFETIME OF ELECTRON GUN, AND ELECTRO...
- Publication number 20230154720
- Publication date May 18, 2023
- NuFlare Technology, Inc.
- Nobuo MIYAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR ELECTRON CRYOMICROSCOPY
- Publication number 20230135352
- Publication date May 4, 2023
- United Kingdom Research and Innovation
- Greg MCMULLAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUASI-MACROSCOPIC COLD CATHODE FIELD EMISSION ELECTRON GUN AND MANU...
- Publication number 20230133255
- Publication date May 4, 2023
- Zhengzhou University of Aeronautics
- Fanguang ZENG
- B22 - CASTING POWDER METALLURGY
Information Patent Application
Electron Gun, Electron Beam Applicator, and Method for Controlling...
- Publication number 20230131413
- Publication date Apr 27, 2023
- PHOTO ELECTRON SOUL INC.
- Atsushi KOIZUMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dielectric Coated Plasmonic Photoemitter
- Publication number 20230103140
- Publication date Mar 30, 2023
- Board of Trustees of Michigan State University
- Peng ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM WITH MULTI-SOURCE SYSTEM AND MULTI-BEAM PARTIC...
- Publication number 20230065475
- Publication date Mar 2, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM GUN CONTROL SYSTEMS AND METHODS
- Publication number 20230040534
- Publication date Feb 9, 2023
- Varian Medical Systems, Inc.
- Mark Everett Trail
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Electron guns using field emission, photo emission, or secondary emission electron sources

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron gun, electron beam applicator, and method for controlling...

Dielectric coated plasmonic photoemitter

Transmission electron microscope and imaging method

Joint electron-optical columns for flood-charging and image-forming...

Method and apparatus for Schottky TFE inspection

Electron gun and electron beam application apparatus

Particle beam gun control systems and methods

Emitter and device provided with same

Electron gun, electron beam applicator, emission axis verification...

Photocathode kit, electron gun, and electron beam applicator

Charged particle source and charged particle beam device

Radiation generation apparatus and radiation generation method

Electron gun and charged particle beam device equipped with electro...

Electron source and charged particle beam device

High throughput multi-electron beam system

Electron gun, electron gun component, electron beam applicator, and...

Cold-field-emitter electron gun with self-cleaning extractor using...

Ion beam source for optical device fabrication using a segmented io...

Electron beam apparatus

Mechanically-stable electron source

Electron beam writing apparatus and cathode life span prediction me...

Ultrafast electron diffraction apparatus

Emitter, electron gun using same, and electronic device

Light modulated electron source

Schottky thermal field emitter with integrated beam splitter

Electron emitter and method of fabricating same

Apparatus of electron beam comprising pinnacle limiting plate and m...

Electron beam device and image acquisition method

Method of producing microrods for electron emitters, and associated...

Charged particle source and charged particle beam device

Patents Applicationslast 30 patents

ELECTRON BEAM DEVICE INCLUDING SCHOTTKY EMITTER AND METHOD OF OPERA...

SEMICONDUCTING COLD PHOTOCATHODE DEVICE USING ELECTRIC FIELD TO CON...

ELECTRON BEAM APPLICATION DEVICE AND METHOD FOR CREATING DETECTION...

FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR

CHARGED PARTICLE BEAM DEVICE

Electron Gun, Electron Beam Applying Device, and Irradiation Positi...

Charged Particle Gun and Charged Particle Beam Apparatus

ELECTRON GUN, ELECTRON BEAM APPLICATOR, AND EMISSION METHOD OF ELEC...

ELECTRON GUN CHAMBER FOR SCANNING ELECTRON MICROSCOPE, ELECTRON GUN...

ELECTRON BEAM APPLICATION DEVICE

EMITTER AND DEVICE PROVIDED WITH SAME

ELECTRON GUN AND ELECTRON BEAM APPLICATION APPARATUS

IMAGING, PROCESSING, AND/OR ANALYZING AN OBJECT USING A PARTICLE BE...

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

Creating Multiple Electron Beams with a Photocathode Film

ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE

Electron Source, Method of Manufacturing the Same, And Electron Bea...

ELECTRON GUN AND ELECTRON MICROSCOPE

METHOD AND APPARATUS FOR SCHOTTKY TFE INSPECTION

Charged Particle Source and Charged Particle Beam Device

ELECTRON GUN, ELECTRON RAY APPLYING DEVICE, AND ELECTRON BEAM PROJE...

ELECTRON GUN, ELECTRON GUN COMPONENT, ELECTRON BEAM APPLICATION DEV...

ELECTRON MICROSCOPE, ELECTRON SOURCE FOR ELECTRON MICROSCOPE, AND M...

METHOD FOR ESTIMATING CATHODE LIFETIME OF ELECTRON GUN, AND ELECTRO...

SYSTEM AND METHOD FOR ELECTRON CRYOMICROSCOPY

QUASI-MACROSCOPIC COLD CATHODE FIELD EMISSION ELECTRON GUN AND MANU...

Electron Gun, Electron Beam Applicator, and Method for Controlling...

Dielectric Coated Plasmonic Photoemitter

PARTICLE BEAM SYSTEM WITH MULTI-SOURCE SYSTEM AND MULTI-BEAM PARTIC...

PARTICLE BEAM GUN CONTROL SYSTEMS AND METHODS